ImageVerifierCode 换一换
格式:PDF , 页数:47 ,大小:3.17MB ,
资源ID:1248457      下载积分:10000 积分
快捷下载
登录下载
邮箱/手机:
温馨提示:
如需开发票,请勿充值!快捷下载时,用户名和密码都是您填写的邮箱或者手机号,方便查询和重复下载(系统自动生成)。
如填写123,账号就是123,密码也是123。
特别说明:
请自助下载,系统不会自动发送文件的哦; 如果您已付费,想二次下载,请登录后访问:我的下载记录
支付方式: 支付宝扫码支付 微信扫码支付   
注意:如需开发票,请勿充值!
验证码:   换一换

加入VIP,免费下载
 

温馨提示:由于个人手机设置不同,如果发现不能下载,请复制以下地址【http://www.mydoc123.com/d-1248457.html】到电脑端继续下载(重复下载不扣费)。

已注册用户请登录:
账号:
密码:
验证码:   换一换
  忘记密码?
三方登录: 微信登录  

下载须知

1: 本站所有资源如无特殊说明,都需要本地电脑安装OFFICE2007和PDF阅读器。
2: 试题试卷类文档,如果标题没有明确说明有答案则都视为没有答案,请知晓。
3: 文件的所有权益归上传用户所有。
4. 未经权益所有人同意不得将文件中的内容挪作商业或盈利用途。
5. 本站仅提供交流平台,并不能对任何下载内容负责。
6. 下载文件中如有侵权或不适当内容,请与我们联系,我们立即纠正。
7. 本站不保证下载资源的准确性、安全性和完整性, 同时也不承担用户因使用这些下载资源对自己和他人造成任何形式的伤害或损失。

版权提示 | 免责声明

本文(IEEE 1734-2011 en Quality of Electronic and Software Intellectual Property Used in System and System on Chip (SoC) Designs (IEEE Computer Society)《电子及软件知识产权在系统和.pdf)为本站会员(cleanass300)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

IEEE 1734-2011 en Quality of Electronic and Software Intellectual Property Used in System and System on Chip (SoC) Designs (IEEE Computer Society)《电子及软件知识产权在系统和.pdf

1、 IEC 62014-5 Edition 1.0 2015-03 INTERNATIONAL STANDARD Quality of Electronic and Software Intellectual Property Used in System and System on Chip (SoC) Designs IEC 62014-5:2015-03(en)IEEE Std1734-2011IEEE Std 1734-2011 THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2011 IEEE All rights reserved.

2、 IEEE is a registered trademark in the U.S. Patent any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEEE Standards docum

3、ents are developed within IEEE Societies and Standards Coordinating Committees of the IEEE Standards Association (IEEE-SA) Standards Board. IEEE develops its standards through a consensus development process, which brings together volunteers representing varied viewpoints and interests to achieve th

4、e final product. Volunteers are not necessarily members of IEEE and serve without compensation. While IEEE administers the process and establishes rules to promote fairness in the consensus development process, IEEE does not independently evaluate, test, or verify the accuracy of any of the informat

5、ion contained in its standards. Use of IEEE Standards documents is wholly voluntary. IEEE documents are made available for use subject to important notices and legal disclaimers (see http:/standards.ieee.org/IPR/disclaimers.html for more information). IEC collaborates closely with IEEE in accordance

6、 with conditions determined by agreement between the two organizations. 2) The formal decisions of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC Nationa

7、l Committees. The formal decisions of IEEE on technical matters, once consensus within IEEE Societies and Standards Coordinating Committees has been reached, is determined by a balanced ballot of materially interested parties who indicate interest in reviewing the proposed standard. Final approval o

8、f the IEEE standards document is given by the IEEE Standards Association (IEEE-SA) Standards Board. 3) IEC/IEEE Publications have the form of recommendations for international use and are accepted by IEC National Committees/IEEE Societies in that sense. While all reasonable efforts are made to ensur

9、e that the technical content of IEC/IEEE Publications is accurate, IEC or IEEE cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications (inc

10、luding IEC/IEEE Publications) transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC/IEEE Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC and IEEE do not provide any

11、attestation of conformity. Independent certification bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity. IEC and IEEE are not responsible for any services carried out by independent certification bodies. 6) All users should ensure that they have the l

12、atest edition of this publication. 7) No liability shall attach to IEC or IEEE or their directors, employees, servants or agents including individual experts and members of technical committees and IEC National Committees, or volunteers of IEEE Societies and the Standards Coordinating Committees of

13、the IEEE Standards Association (IEEE-SA) Standards Board, for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC/IEEE Publicatio

14、n or any other IEC or IEEE Publications. 8) Attention is drawn to the normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that implementation of this IEC/IEEE Pub

15、lication may require use of material covered by patent rights. By publication of this standard, no position is taken with respect to the existence or validity of any patent rights in connection therewith. IEC or IEEE shall not be held responsible for identifying Essential Patent Claims for which a l

16、icense may be required, for conducting inquiries into the legal validity or scope of Patent Claims or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Us

17、ers of this standard are expressly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. ,( design models; design implementation descriptions; verification coordinators, stimulus generators, checkers and as

18、sertion/constraint descriptions; soft design objects (such as embedded software and real-time operating systems); design and verification flow information and scripts. eXtensible Markup Language (XML): A simple, very flexible text format derived from SGML. NOTESee ISO/IEC 8879 B3.9IP provider: Creat

19、or and supplier of electronic design intellectual property (IP). IP repository: Database of electronic design intellectual property (IP). metadata: A tool-interpretable way of describing the design history, locality, object association, configuration options, constraints against, and integration req

20、uirements of an object. meta IP: Metadata description of an object. 6This specification is available at: http:/www.w3.org/2001/XMLSchema; http:/www.w3.org/2001/XMLSchema-instance. 7This specification is available at: http:/www.w3.org/TR/2004/REC-xmlschema-1-20041028. 8The IEEE Standards Dictionary:

21、Glossary of Terms there are three kinds of answers: a/o/n (a/o/n, Always, Often, Never), y/n (y/n, y, n), or empty for free text. The tool uses this attribute to propose the possible answer values for the assessment of the criterium. g127 The element class specifies the class of the criterium; there

22、 are four classes: Imperative, Rule, Guideline, or Optional. The tool uses this attribute to classify the criterium. g127 The element weight specifies the integer score of the criterium when satisfied. The tool uses this attribute for scoring and consolidation. g127 The element dependent specifies t

23、he integer id of another criterium from which the current criterium depends. If the referenced criterium is not satisfied then the current criterium is not relevant. The tool uses this attribute to identify the parent of the criterium. Figure 6 Criterium element 5.1.1.1 Example The following example

24、 shows the first lines of a golden XML listing the standard quality checks for a Vendor Assessment purpose: 13 Copyright 2011 IEEE. All rights reserved. Published by IEC under license from IEEE. 20 IEEE. All rights reserved. ,(&,(6WGIEEE Std 1734-2011 IEEE Standard for Quality of Electronic and Soft

25、ware Intellectual Property Used in System and System on Chip (SoC) Designs 5.2 QIP schema structure for the answer XML This second schema of the QIP specification is used to describe the answers to the IP quality metrics. The element qipAnswer, Figure 7, is the top level element of this schema. Figu

26、re 7 qipAnswer element 5.2.1 Description The top level element qipAnswer has an attribute version that specifies the version number of the golden XML file. This version number is used to keep a common reference between the different XML files: golden and answer XML files. 14 Copyright 2011 IEEE. All

27、 rights reserved. Published by IEC under license from IEEE. 20 IEEE. All rights reserved. ,(&,(6WG IEEE Std 1734-2011 IEEE Standard for Quality of Electronic and Software Intellectual Property Used in System and System on Chip (SoC) Designs The top level element qipAnswer contains one or multiple el

28、ements assessment. The element assessment, shown in Figure 8, represents the set of quality metrics used for a given type of quality assessment: Vendor, Soft IP Integration, Soft IP Development, Hard IP Integration, Hard IP Development, Verification IP, or Software IP. It has one attribute, as follo

29、ws: g127 The attribute id is unique and is used to strictly identify the assessment. The element assessment contains one or multiple elements criterium. The element criterium represents a Quality Check item. It has one attribute, as follows: g127 The attribute id is unique and is used to strictly id

30、entify the criterium. The element criterium contains the following elements: g127 The element answer contains answer to the criteria. The expected values for the answer are: a/o/n, Always, Often, Never, y/n, y, n, or empty for free text. The tool uses this attribute to write or read the answer of th

31、e criterium. g127 The element comment contains a text in natural language for comment. The tool uses this attribute to write or read the comment of the criterium. Figure 8 assessmentType element 5.2.1.1 Example The following example shows the first lines of an answer XML for an example of Hard IP De

32、velopment quality checks: 15 Copyright 2011 IEEE. All rights reserved. Published by IEC under license from IEEE. 20 IEEE. All rights reserved. ,(&,(6WGIEEE Std 1734-2011 IEEE Standard for Quality of Electronic and Software Intellectual Property Used in System and System on Chip (SoC) Designs 5.3 Too

33、ling requirements for operating on golden XML The golden XML file contains the complete list of quality criteria (or questions) classified by topic and assessment type. The XML elements criterium, topic, and assessment contain attributes and subelements, used to store the relevant data and informati

34、on to enable automation of the QIP management with tools. The golden XML can be downloaded from the online IEEE repository.11The tool shall read and parse the golden XML file, check the semantic of the imported XML file with the golden XML schema, and translate the XML structure in a proprietary dat

35、a structure format. The golden XML schema file is accessible from the online IEEE repository.12If an error is detected during the golden XML file import, the tool shall display an explicit message with the detailed information for debugging and stop the import operation without creating or updating

36、its internal data structure. By way of example, an error shall be generated if a wrong value is supplied for a field subType. See Figure 9 for an example of a means for displaying this information. 11Available at http:/standards.ieee.org/downloads/1734/1734-2011/ieee-qip-golden.xml. 12Available at h

37、ttp:/standards.ieee.org/downloads/1734/1734-2011/qip_golden.xsd. 16 Copyright 2011 IEEE. All rights reserved. Published by IEC under license from IEEE. 20 IEEE. All rights reserved. ,(&,(6WG IEEE Std 1734-2011 IEEE Standard for Quality of Electronic and Software Intellectual Property Used in System

38、and System on Chip (SoC) Designs Figure 9 Golden XML import error If no errors are detected during the golden XML file import, the tool shall create or update its internal data structure with the information provided in the golden XML file. The tool shall interpret the different XML elements and att

39、ributes as described in 4.3.1. The tool shall operate on the QIP criteria following the rules described in the Annex B. 5.3.1 QIP checklist table construction using the golden XML The top level element of the golden XML file holds the version number of the golden XML file and the URL for XML schemas

40、. The tool shall use the attributes xmlns:* to search for the golden XML schema. The tool should store the float attribute version in its internal data structure to later check the coherence with imported answer XML files version. Example: 5.3.2 Assessments The second level elements of the golden XM

41、L file represent the highest level topical areas of the QIP: the types of assessment. These are: Vendor, Soft IP Integration, Soft IP Development, Hard IP Integration, Hard IP Development, Verification IP, Software IP. Example: . 17 Copyright 2011 IEEE. All rights reserved. Published by IEC under li

42、cense from IEEE. 20 IEEE. All rights reserved. ,(&,(6WGIEEE Std 1734-2011 IEEE Standard for Quality of Electronic and Software Intellectual Property Used in System and System on Chip (SoC) Designs The tool shall create a specific assessment table for each second level element of the golden XML. The

43、text attribute title shall be used by the tool to display the title of the assessment table. 5.3.3 Top level topics The third level elements of the golden XML file represent the top level topical areas of the QIP assessment. These are: Vendor Assessment, IP Ease of Reuse, Design & Verification Quali

44、ty. Example: The tool shall create a specific section for each third level element of the golden XML, within the assessment table. The attribute qipId shall be used by the tool to form and display a unique name for the section header row. The text attribute title shall be used by the tool to display

45、 the title of the top level topical area in the header row of the corresponding section. The float attribute order shall be used by the tool to display the different top level topical areas in the proper order. 5.3.4 Topics The fourth level elements of the golden XML file represent the topical areas

46、 within the top level topical areas of the QIP assessment. These are for example: Configurability and Parameterization, Build Environment, Portability Issues, and others. Example: The tool shall create a specific section for each fourth level element of the golden XML, within the parent top level to

47、pical area sections of the assessment table. The attribute qipId shall be used by the tool to form and display a unique name for the section header row. The text attribute title shall be used by the tool to display the title of the topical area in the header row of the corresponding section. The flo

48、at attribute order shall be used by the tool to display the different topical areas in the proper order. 5.3.5 Questions The fifth level elements of the golden XML file represent either the final topical sub-areas or questions (criterium elements). The sixth level elements of the golden XML file, if any, represent questions (criterium elements). The criterium elements are the leaves of the tree structure. Example: 18 Copyright 2011 IEEE. All rights reserved. Published by IEC under license from IEEE. 20 IEEE. All rights reserved. ,(&

copyright@ 2008-2019 麦多课文库(www.mydoc123.com)网站版权所有
备案/许可证编号:苏ICP备17064731号-1