IEEE 389-1996 en Recommended Practice for Testing Electronic Transformers and Inductors《测试电子变压器和电感器的推荐规程》.pdf

1、Recognized as anAmerican National Standard (ANSI)The Institute of Electrical and Electronics Engineers, Inc.345 East 47th Street, New York, NY 10017-2394, USACopyright 1997 by the Institute of Electrical and Electronics Engineers, Inc.All rights reserved. Published 1997. Printed in the United States

2、 of AmericaISBN 1-55937-761-5No part of this publication may be reproduced in any form, in an electronic retrieval system or otherwise, without the prior written permission of the publisher.IEEE Std 389-1996 (R2007)(Revision of IEEE Std 389-1990)IEEE Recommended Practice for Testing Electronics Tran

3、sformers and InductorsSponsorElectronics Transformer Technical Committeeof theIEEE Power Electronics SocietyReaffirmed 26 September 2007Approved 20 June 1996IEEE Standards BoardApproved 6 January 1997American National Standards InstituteAbstract: A number of tests are presented for use in determinin

4、g the significant parameters andperformance characteristics of electronics transformers and inductors. These tests are designedprimarily for transformers and inductors used in all types of electronics applications, but they mayapply to the other types of transformers of large apparent-power rating u

5、sed in the electric powerutility industry.Keywords: common-mode rejection tests, corona tests, current transformer tests, electronic induc-tors, electronic power transformers, inductance measurements, inrush-current evaluation, insula-tion tests, large rectifiers, noise tests, product rating, pulse

6、transformers, quality factor, resistancetests, self-resonance, temperature rise tests, terminated impedance measurements, transformercapacitance, voltage-time shieldingIEEE Standardsdocuments are developed within the IEEE Societies and the Standards Coordinat-ing Committees of the IEEE Standards Boa

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17、ject matter covered by patent rights. By publication of this standard,no position is taken with respect to the existence or validity of any patent rights inconnection therewith. The IEEE shall not be responsible for identifying patents forwhich a license may be required by an IEEE standard or for co

18、nducting inquiries intothe legal validity or scope of those patents that are brought to its attention.iiiIntroduction(This introduction is not part of IEEE Std 389-1996, IEEE Recommended Practice for Testing Electronics Transformersand Inductors.)This recommended practice has been prepared to serve

19、as a guide in the design, testing, and specifying ofelectronics transformers and inductors. This document contains many tests and experimental methods forevaluating almost every aspect of electronics transformer performance, including a number of tests for deter-mining transformer environmental char

20、acteristics such as audible-noise generation. The tests and specifica-tions included are aimed primarily at the testing and evaluation of transformers of relatively low apparent-power rating, such as those used in communications, instrumentation, control, small appliances, and com-puter applications

21、. However, most of these tests are perfectly applicable to transformers of any rating. A use-ful feature of this recommended practice is the listing, in clause 4, of all standard tests used in thespecification of a transformer. This clause will provide a useful starting point for many users of this

22、recom-mended practice.MKS units (Standard International or SI units) are used throughout this recommended practice; equivalentCGS units are sometimes given where their usage is still common practice. Definitions and symbols are inaccordance with those of the International Electrotechnical Commission

23、 (IEC) wherever possible.The Electronics Transformer Technical Committee (ETTC) wishes to acknowledge its indebtedness to thosewho have so freely given of their time and knowledge in the development of the original version of this rec-ommended practice. The fellowship of authors of the inaugural pub

24、lication, IEEE Std 389-1979, includesthe following distinguished members:Paul K. Goethe,ChairThis recommended practice was prepared by the Working Group on Transformer Tests of the Test CodesSubcommittee of the Electronics Transformer Technical Committee of the IEEE Power Electronics Society,which w

25、as comprised of the following membership:Robert B. Beers,ChairWhen the Electronics Transformer Technical Committee balloted and approved this recommended practice,the membership was as follows:Rohn R. Grant,ChairJ. AdamsR. P. CareyM. I. DistefanoR. C. FischerP. C. HillH. W. LordH. S. MitsanasJ. Tard

26、yH. I. TillingerA. A. ToppetoJ. S. AndresenI. D. BoltM. CareyJ. CronkJ. DeCramerC. J. ElliottP. K. GoetheW. D. GoetheR. R. GrantH. E. LeeD. N. RatliffR. L. SellJ. SilgailisB. ThackwrayM. A. WilkowskiH. YarpezeshkanJ. S. AndresenR. B. BeersM. CareyJ. CronkJ. DeCramerC. J. ElliottP. K. GoetheW. D. Goe

27、theD. N. RatliffR. L. SellJ. SilgailisB. ThackwrayM. A. Wilkowski*H. Yarpezeshkan*Current ETTC ChairivWhen the IEEE Standards Board approved this recommended practice on 20 June 1996, it had the followingmembership:Donald C. Loughry,ChairRichard J. Holleman,Vice ChairAndrew G. Salem,Secretary*Member

28、 EmeritusAlso included are the following nonvoting IEEE Standards Board liaisons:Satish K. AggarwalAlan H. CooksonChester C. TaylorValerie E. ZelentyIEEE Standards Project EditorGilles A. BarilClyde R. CampJoseph A. CannatelliStephen L. DiamondHarold E. EpsteinDonald C. FleckensteinJay Forster*Donal

29、d N. HeirmanBen C. JohnsonE. G. “Al” KienerJoseph L. Koepfinger*Stephen R. LambertLawrence V. McCallL. Bruce McClungMarco W. MigliaroMary Lou PadgettJohn W. PopeJose R. RamosArthur K. ReillyRonald H. ReimerGary S. RobinsonIngo RschJohn S. RyanChee Kiow TanLeonard L. TrippHoward L. WolfmanvContentsCL

30、AUSE PAGE1. Overview 11.1 Scope 11.2 Transformers and inductors . 12. References 23. Definitions 34. How to specify electronics transformers 35. Insulation and corona tests. 35.1 General. 35.2 Electric strength test (hi-pot test). 75.3 Induced potential test . 85.4 Corona tests 106. DC resistance te

31、sts . 136.1 General. 136.2 Resistance values under 1 WKelvin double-bridge method. 136.3 Resistance values from 1 Wto many kilohms . 146.4 Digital ohmmeterResistance values from under 1 Wto many kilohms . 177. Loss measurements 187.1 No-load loss . 187.2 Excitation apparent-power measurements . 227.

32、3 Stray-load losses 227.4 Short-circuit power test 247.5 Efficiency and power factor. 258. Ratio of transformation 268.1 General. 268.2 Measurement methods . 288.3 Impedance unbalance. 298.4 Balance tests. 318.5 Polarity tests. 319. Transformer capacitance 339.1 General. 339.2 Interwinding capacitan

33、ce . 349.3 Distributed capacitance 359.4 Bridge methods 36viCLAUSE PAGE10. Inductance measurements by impedance bridge method. 3610.1 General. 3610.2 Method of measurement 3711. Transformer response measurements. 4111.1 Transformer frequency response 4111.2 Transformer pulse response . 4312. Noise t

34、ests 4512.1 Test conditions for audible noise . 4512.2 Measurement of audible noise . 4513. Terminated impedance measurements. 4613.1 General. 4613.2 Return-loss method 4614. Temperature rise tests 4814.1 Test methods 4814.2 Notes on the technique of measurement 4915. Self-resonance 5015.1 General.

35、5015.2 Measurement 5016. Voltage-time product rating. 5116.1 General. 5116.2 Recommended voltage-time product test methods 5217. Shielding 5317.1 Electrostatic shielding 5317.2 Magnetic shielding. 5718. Measurement of quality factor Q. 5718.1 Definition . 5718.2 Methods 5818.3 Bridge measurements. 5

36、818.4Q-Meter measurements 5818.5 Transmission method. 5918.6 Damped oscillation method . 6019. Common-mode rejection test. 63viiCLAUSE PAGE20. Inrush-current evaluation and measurement 6420.1 Measurement 6420.2 Calculation . 6420.3 Other considerations 6521. Current transformer test . 6621.1 General

37、. 6621.2 Recommended test procedure for current-transformation ratio and phase angle 6622. Bibliography 67ANNEXAnnex A (informative) Instrumentation for voltage and current measurements on inductors andtransformers . 69Annex B (informative) AC High-potential dielectric testing 71Annex C (informative

38、) An ac magnetic field pickup probe 731IEEE Recommended Practice for Testing Electronics Transformers and Inductors1. Overview1.1 ScopeThis recommended practice presents a number of tests for use in determining the significant parameters andperformance characteristics of electronics transformers and

39、 inductors. These tests are designed primarily fortransformers and inductors used in all types of electronics applications, but they may apply to the other typesof transformers of large apparent-power rating used in the electric power utility industry. Some of the testsdescribed are intended for qua

40、lifying a product for a specific application, while others are test practices usedwidely for manufacturing and customer acceptance testing. Clause 4 is intended to serve as a guide forparticular application categories.The tests described in this recommended practice include those most commonly used

41、in the electronicstransformer industry: electric strength, resistance, power loss, inductance, impedance, balance, ratio oftransformation, and many others used less frequently.1.2 Transformers and inductorsThe following are the specific types of transformers and inductors to which this recommended p

42、ractice isapplicable:a) Electronic power1) Power2) Isolating3) Current limiting4) Rectifier5) Combination (rectifier and filament)6) Ferroresonant7) Converter8) Polyphase9) Switch mode10) Magnetic amplifiersb) Large rectifiersc) PulseIEEEStd 389-1996 IEEE RECOMMENDED PRACTICE FOR TESTING21) Voltage

43、stepdown2) Voltage stepup3) Low ratio inverting4) Low power pulse5) Square-loopd) Broadband1) Impedance matching2) DC insulating3) Common-mode rejection4) Potential transformers5) Current transformers6) Filter inductors7) Charging inductors8) Hybrid transformers2. ReferencesThis recommended practice

44、 shall be used in conjunction with the following publications. When the follow-ing standards are superseded by an approved revision, the revision shall apply.ANSI S1.4-1983, Specification for Sound Level Meters.1IEEE Std 4-1995, IEEE Standard Techniques for High-Voltage Testing (ANSI).2IEEE Std 100-

45、1996, IEEE Standard Dictionary of Electrical and Electronics Terms.IEEE Std 111-1984, IEEE Standard for Wide-Band Transformers (ANSI).3IEEE Std 119-1974, IEEE Recommended Practice for General Principles of Temperature Measurement asApplied to Electrical Apparatus.4IEEE Std 260.1-1993, IEEE Standard

46、Letter Symbols for Units of Measurement (SI Units, Customary Inch-Pound Units, and Certain Other Units) (ANSI).IEEE Std 272-1970 (Reaff 1976), IEEE Standard for Computer-Type (Square-Loop) Pulse Transformers.5IEEE Std 280-1985, IEEE Standard Letter Symbols for Quantities Used in Electrical Science a

47、nd ElectricalEngineering (ANSI).IEEE Std 295-1969 (Reaff 1993), IEEE Standard for Electronics Power Transformers (ANSI).IEEE Std 315-1975 (Reaff 1993), IEEE Standard Graphic Symbols for Electrical and Electronics Diagrams(ANSI/DoD).1ANSI publications are available from the Sales Department, American

48、 National Standards Institute, 11 West 42nd Street, 13th Floor,New York, NY 10036, USA.2IEEE publications are available from the Institute of Electrical and Electronics Engineers, 445 Hoes Lane, P.O. Box 1331, Piscataway,NJ 08855-1331, USA.3IEEE Std 111-1984 has been withdrawn; however, copies can b

49、e obtained from Global Engineering, 15 Inverness Way East, Engle-wood, CO 80112-5704, USA, tel. (303) 792-2181.4IEEE Std 119-1974 has been withdrawn; however, copies can be obtained from Global Engineering, 15 Inverness Way East, Engle-wood, CO 80112-5704, USA, tel. (303) 792-2181.5IEEE Std 272-1970 has been withdrawn; however, copies can be obtained from Global Engineering, 15 Inverness Way East, Engle-wood, CO 80112-5704, USA, tel. (303) 792-2181.IEEEELECTRONICS TRANSFORMERS AND INDUCTORS Std 389-19963IEEE Std 390-1987 (Reaff 1993), IEEE Standard for Pulse Transformers (ANSI).IEEE Std