1、g3g3g3g3g3Sponsored by the Insulated Conductors Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA 5 June 2012 IEEE Power +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. iv C
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5、ocument available for use and adoption by public authorities and private users, the IEEE does not waive any rights in copyright to this document. Updating of IEEE documents Users of IEEE Standards documents should be aware that these documents may be superseded at any time by the issuance of new edi
6、tions or may be amended from time to time through the issuance of amendments, corrigenda, or errata. An official IEEE document at any point in time consists of the current edition of the document together with any amendments, corrigenda, or errata then in effect. In order to determine whether a give
7、n document is the current edition and whether it has been amended through the issuance of amendments, corrigenda, or errata, visit the IEEE-SA Website at http:/standards.ieee.org/index.html or contact the IEEE at the address listed previously. For more information about the IEEE Standards Associatio
8、n or the IEEE standards development process, visit the IEEE-SA Website at http:/standards.ieee.org/index.html. Errata Errata, if any, for this and all other standards can be accessed at the following URL: http:/standards.ieee.org/findstds/errata/index.html. Users are encouraged to check this URL for
9、 errata periodically. v Copyright 2012 IEEE. All rights reserved. Patents Attention is called to the possibility that implementation of this guide may require use of subject matter covered by patent rights. By publication of this guide, no position is taken by the IEEE with respect to the existence
10、or validity of any patent rights in connection therewith. If a patent holder or patent applicant has filed a statement of assurance via an Accepted Letter of Assurance, then the statement is listed on the IEEE-SA Website http:/standards.ieee.org/about/sasb/patcom/patents.html. Letters of Assurance m
11、ay indicate whether the Submitter is willing or unwilling to grant licenses under patent rights without compensation or under reasonable rates, with reasonable terms and conditions that are demonstrably free of any unfair discrimination to applicants desiring to obtain such licenses. Essential Paten
12、t Claims may exist for which a Letter of Assurance has not been received. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of Patents Claims, or determining whether any licensing terms o
13、r conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this guide are expressly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, i
14、s entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. vi Copyright 2012 IEEE. All rights reserved. Participants This guide was prepared by Working Group WG F01 of the IEEE Insulated Conductors Committee. At the time this guide was submitted to
15、IEEE-SA Standards Board for approval, the F01 Working Group had the following membership: Yingli Wen,* Chair Jacques Ct,* Vice Chair Mohammad Eyad Al-Sibai Martin Baur Bruce Bernstein Arvid J. Braun Vern L. Buchholz Wayne Chatterton Frank de Vries John Densley Jean-Francois Drapeau Mark Fenger Steff
16、en Fuchs Craig Goodwin Edward Gulski Nigel Hampton John Hans Wolfgang Hauschild Leeman Hong* Grace Jiang Jerry Landers Benjamin Lanz Eberhard Lemke Henning Oetjen Bruce Olson Ralph Patterson Joshua M. Perkel Brent Richardson Nagu N. Srinivas Rick Stagi Dexter Tarampi William A. Thue Richard Vencus*
17、Martin von Herrmann Mark D. Walton Robert Wiehe* Walter Zenger*Writing group members The following members of the individual balloting committee voted on this guide. Balloters may have voted for approval, disapproval, or abstention. Thomas Barnes Earle Bascom III Martin Baur Michael Bayer William Bl
18、oethe Kenneth Bow Arvid J. Braun Rudy Bright Andrew Brown Vern L. Buchholz William Byrd John Cancelosi Weijen Chen Robert Christman Kurt Clemente Jerry Corkran Jacques Ct Ray Davis John Densley Frank Di Guglielmo Gary Donner Donald Dunn Michael Edds Gary Engmann Michael Faulkenberry Rabiz Foda Steff
19、en Fuchs David Gilmer Steven Graham Randall Groves Edward Gulski Ajit Gwal Richard Harp Jeffrey Hartenberger Wolfgang Hauschild Lauri Hiivala Raymond Hill Werner Hoelzl David Horvath Dennis Johnson A. Jones John Kay Gael Kennedy Yuri Khersonsky Morteza Khodaie Joseph L. Koepfinger Robert Konnik Jim
20、Kulchisky Saumen Kundu Chung-Yiu Lam Benjamin Lanz William Larzelere Gerald Liskom Greg Luri Glenn Luzzi Arturo Maldonado John Mcalhaney, Jr William McDermid John Merando Gary Michel T. David Mills Daleep Mohla Rachel Mosier Adi Mulawarman Jerry Murphy Arthur Neubauer Michael S. Newman Charles Ngeth
21、e Joe Nims Stephen Norton Bruce Olson Lorraine Padden Dev Paul Serge Pelissou Howard Penrose Joshua M. Perkel Christopher Petrola Mark Pfeiffer Robert Resuali Johannes Rickmann Gary Savage Bartien Sayogo Dennis Schlender Suresh Shrimavle Gil Shultz Michael Smalley James Smith Jeremy Smith Jerry Smit
22、h Nagu N. Srinivas Gregory Stano Gary Stoedter Peter Tirinzoni John Vergis Martin von Herrmann Carl Wall Yingli Wen Ron Widup Richard Williamson Jonathan Woodworth Jian Yu Dawn Zhao Tiebin Zhao Hugh Zhu vii Copyright 2012 IEEE. All rights reserved. When the IEEE-SA Standards Board approved this guid
23、e on 29 March 2012, it had the following membership: Richard H. Hulett, Chair John Kulick, Vice Chair Robert M. Grow, Past Chair Judith Gorman, Secretary Satish Aggarwal Masayuki Ariyoshi Peter Balma William Bartley Ted Burse Clint Chaplin Wael Diab Jean-Philippe Faure Alexander Gelman Paul Houz Jim
24、 Hughes Young Kyun Kim Joseph L. Koepfinger* David J. Law Thomas Lee Hung Ling Oleg Logvinov Ted Olsen Gary Robinson Jon Walter Rosdahl Mike Seavey Yatin Trivedi Phil Winston Yu Yuan* Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Richard DeBlasio, DOE Re
25、presentative Michael Janezic, NIST Representative Catherine Berger IEEE Standards Senior Program Manager, Document Development Malia Zaman IEEE Standards Program Manager, Technical Program Development Acknowledgments Acknowledgements are given to NEETRAC for permission to use, in Clause 6 and Annex
26、C, information that was developed through collaboration between manufacturers, NEETRAC, service providers and utilities and reported as part of the Cable Diagnostic Focused Initiative administered by NEETRAC. viii Copyright 2012 IEEE. All rights reserved. Introduction This introduction is not part o
27、f IEEE Std 400-2012, IEEE Guide for Field Testing and Evaluation of the Insulation of Shielded Power Cable Systems Rated 5 kV and Above. This omnibus guide is a revision of the 2001 standard. It provides an overview of available methods for performing electrical tests in the field on shielded power
28、cable systems. It is intended to help the reader select a test that is appropriate for a specific situation of interest. It provides a brief description of all the known sources used to perform field tests with a short discussion of specific tests. The material presented is descriptive and tutorial
29、and does not address the evaluation of test results or the specification of test voltage levels and time of application. There are several principal changes from the 2001 standard. The document structure is rearranged. Instead of listing and discussing each test method in individual clauses, this ed
30、ition includes a clause that discusses general considerations for field testing of cable systems followed with another clause in which field testing methods are categorized by their functions and introduced as subclauses. Oscillating wave is renamed damped AC voltage in this edition. Advantages and
31、disadvantages of the test methods are tabulated by category, which makes it easier for comparison between tests with different types of voltage sources. A number of test methods are added in a category named “Dielectric Response” along with dissipation factor and DC leakage current: recovery voltage
32、, polarization/depolarization current, and dielectric spectroscopy. Time Domain Reflectometry and Thermal Infrared Imaging are also added as complementary insulation tests. Additional details are provided in “point” documents, such as IEEE Std 400.1,IEEE Guide for Field Testing of Laminated Dielectr
33、ic, Shielded Power Cable Systems Rated 5 kV and Above with High Direct Current Voltage; IEEE Std 400.2, IEEE Guide for Field Testing of Shielded Power Cable Systems Using Very Low Frequency (VLF); IEEE Std 400.3, IEEE Guide for Partial Discharge Testing of Shielded Power Cable Systems in a Field Env
34、ironment; and IEEE P400.4a, Draft Guide for Field-Testing of Shielded Power Cable Systems Rated 5 kV and Above with Damped Alternating Current Voltage (DAC). If there is a conflict between this document and the “point” documents, then the “point” documents should be considered as the definitive refe
35、rence. aThis IEEE standards project was not approved by the IEEE-SA Standards Board at the time this publication went to press. For information about obtaining a draft, contact the IEEE. ix Copyright 2012 IEEE. All rights reserved. Contents 1. Overview 1 1.1 Scope . 1 1.2 Purpose 1 2. Normative refe
36、rences . 1 3. Definitions, acronyms, and abbreviations . 2 3.1 Definitions. 2 3.2 Acronyms and abbreviations . 4 3.3 Word usage (per IEEE Style Manual) . 4 4. Safety awareness 5 5. General considerations for field testing of cable systems 6 5.1 Introduction . 6 5.2 Testing objectives 6 5.3 Selection
37、 of test types 8 5.4 Cable system components and operating conditions . 9 5.5 Selection of testing method and application 10 5.6 Record information 10 6. Field testing methods . 12 6.1 Voltage withstand 13 6.2 Dielectric response 15 6.3 Partial discharge 25 6.4 Time-domain reflectometry. 30 6.5 Ther
38、mal infrared imaging 32 7. Applicability of testing methods 33 Annex A (informative) Bibliography . 34 Annex B (informative) Test voltage levels and durations 40 Annex C (informative) Information on applicability of field testing methods from CDFI 41 1 Copyright 2012 IEEE. All rights reserved. IEEE
39、Guide for Field Testing and Evaluation of the Insulation of Shielded Power Cable Systems Rated 5 kV and Above IMPORTANT NOTICE: IEEE Standards documents are not intended to ensure safety, health, or environmental protection, or ensure against interference with or from other devices or networks. Impl
40、ementers of IEEE Standards documents are responsible for determining and complying with all appropriate safety, security, environmental, health, and interference protection practices and all applicable laws and regulations. This IEEE document is made available for use subject to important notices an
41、d legal disclaimers. These notices and disclaimers appear in all publications containing this document and may be found under the heading “Important Notice” or “Important Notices and Disclaimers Concerning IEEE Documents.” They can also be obtained on request from IEEE or viewed at http:/standards.i
42、eee.org/IPR/disclaimers.html. 1. Overview 1.1 Scope This guide lists the various field test methods that are currently available or under development. The guide covers shielded, insulated power cable systems rated 5 kV and above. The guide describes the tests and gives advantages and disadvantages,
43、suggested applications, and typical results. Complete guides covering some of the test methods listed are available in the form of IEEE 400 “point” documents. 1.2 Purpose The purpose of this guide is to provide an overview of the various test methods available for evaluating the insulation of shield
44、ed cable systems in the field, and to assist cable owners in selecting one or more appropriate tests for a specific application. 2. Normative references The following referenced documents are indispensable for the application of this document (i.e., they must be understood and used, so each referenc
45、ed document is cited in text and its relationship to this document is explained). For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments or corrigenda) applies. IEEE Std 400-2012 IEEE Guide for Field Testi
46、ng and Evaluation of the Insulation of Shielded Power Cable Systems Rated 5 kV and Above 2 Copyright 2012 IEEE. All rights reserved. Accredited Standards Committee IEEE C2, National Electrical Safety Code (NESC). 1IEC 61230, Live WorkingPortable Equipment for Earthing or Earthing and Short-circuitin
47、g. IEEE Std 4, IEEE Standard Techniques for High Voltage Testing. 2, 3IEEE Std 510, IEEE Recommended Practices for Safety in High-Voltage and High-Power Testing. NFPA-70E, Standard for Electrical Safety Requirements for Employee Workplaces.43. Definitions, acronyms, and abbreviations 3.1 Definitions
48、 For the purposes of this document, the following terms and definitions apply. The IEEE Standards Dictionary: Glossary of Terms and Definitions5should be referenced for terms not defined in this clause. breakdown: Disruptive discharge through or along the insulation. cable system: One or more length
49、s of shielded power cable joined together, 5 kV and above, including cable accessories (joints and terminations). dielectric response: A collection of parameters, such as dissipation factor, DC leakage current, polarization current, etc., which characterize the overall behavior of the insulation of a power cable system under an applied voltage of various types and frequencies at various temperatures. NOTEThe definition of dielectric response in this document must not be confused with that of the same term used for semiconducting materials.6electrical t
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