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本文(IEEE 575-2014 en Guide for Bonding Shields and Sheaths of Single-Conductor Power Cables Rated 5 kV through 500 kV《额定功率5 kV至500 kV的单芯电缆结合护盾和护套指南》.pdf)为本站会员(Iclinic170)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

IEEE 575-2014 en Guide for Bonding Shields and Sheaths of Single-Conductor Power Cables Rated 5 kV through 500 kV《额定功率5 kV至500 kV的单芯电缆结合护盾和护套指南》.pdf

1、 IEEE Guide for Bonding Shields and Sheaths of Single-Conductor Power Cables Rated 5 kV through 500 kV Sponsored by the Insulated Conductors Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA IEEE Power and Energy Society IEEE Std 575-2014 (Revision of IEEE Std 575-1988) IEEE Std 575-2014 (Rev

2、ision of IEEE Std 575-1988) IEEE Guide for Bonding Shields and Sheaths of Single-Conductor Power Cables Rated 5 kV through 500 kV Sponsor Insulated Conductors Committee of the IEEE Power and Energy Society Approved 12 June 2014 IEEE-SA Standards Board Abstract: The most common shield/sheath-bonding

3、systems now in use on medium through extra high-voltage (5 kV to 500 kV) single-conductor shielded power cables and the methods of calculating the corresponding shield/sheath voltages and currents, when the cables are operated as part of a three-phase system, with the neutral grounded directly or th

4、rough an impedance, are described in this guide. Keywords: bonding, cross bonding, distribution cable, grounding, high-voltage cable, IEEE 575, medium-voltage cable, power cable, sheath, sheath bonding, sheath voltage limiters, shield, shield bonding, shield voltage limiters, single-point bonding, s

5、pecial bonding, SVL, transmission cable The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2014 by The Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 18 September 2014. Printed in the United States

6、 of America. IEEE, National Electrical Safety Code, and NESC are registered trademarks in the U.S. Patent fitness for a particular purpose; non-infringement; and quality, accuracy, effectiveness, currency, or completeness of material. In addition, IEEE disclaims any and all conditions relating to: r

7、esults; and workmanlike effort. IEEE standards documents are supplied “AS IS” and “WITH ALL FAULTS.” Use of an IEEE standard is wholly voluntary. The existence of an IEEE standard does not imply that there are no other ways to produce, test, measure, purchase, market, or provide other goods and serv

8、ices related to the scope of the IEEE standard. Furthermore, the viewpoint expressed at the time a standard is approved and issued is subject to change brought about through developments in the state of the art and comments received from users of the standard. In publishing and making its standards

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11、EQUENTIAL DAMAGES (INCLUDING, BUT NOT LIMITED TO: PROCUREMENT OF SUBSTITUTE GOODS OR SERVICES; LOSS OF USE, DATA, OR PROFITS; OR BUSINESS INTERRUPTION) HOWEVER CAUSED AND ON ANY THEORY OF LIABILITY, WHETHER IN CONTRACT, STRICT LIABILITY, OR TORT (INCLUDING NEGLIGENCE OR OTHERWISE) ARISING IN ANY WAY

12、 OUT OF THE PUBLICATION, USE OF, OR RELIANCE UPON ANY STANDARD, EVEN IF ADVISED OF THE POSSIBILITY OF SUCH DAMAGE AND REGARDLESS OF WHETHER SUCH DAMAGE WAS FORESEEABLE. Translations The IEEE consensus development process involves the review of documents in English only. In the event that an IEEE sta

13、ndard is translated, only the English version published by IEEE should be considered the approved IEEE standard. Official statements A statement, written or oral, that is not processed in accordance with the IEEE-SA Standards Board Operations Manual shall not be considered or inferred to be the offi

14、cial position of IEEE or any of its committees and shall not be considered to be, or be relied upon as, a formal position of IEEE. At lectures, symposia, seminars, or educational courses, an individual presenting information on IEEE standards shall make it clear that his or her views should be consi

15、dered the personal views of that individual rather than the formal position of IEEE. Comments on standards Comments for revision of IEEE Standards documents are welcome from any interested party, regardless of membership affiliation with IEEE. However, IEEE does not provide consulting information or

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18、For the same reason, IEEE does not respond to interpretation requests. Any person who would like to participate in revisions to an IEEE standard is welcome to join the relevant IEEE working group. Comments on standards should be submitted to the following address: Secretary, IEEE-SA Standards Board

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24、; +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. Updating of IEEE Standards documents Users of IEEE Standards documents should be aware that these documents may be superseded at a

25、ny time by the issuance of new editions or may be amended from time to time through the issuance of amendments, corrigenda, or errata. An official IEEE document at any point in time consists of the current edition of the document together with any amendments, corrigenda, or errata then in effect. Ev

26、ery IEEE standard is subjected to review at least every ten years. When a document is more than ten years old and has not undergone a revision process, it is reasonable to conclude that its contents, although still of some value, do not wholly reflect the present state of the art. Users are cautione

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28、standards.jsp or contact IEEE at the address listed previously. For more information about the IEEE SA or IEEEs standards development process, visit the IEEE-SA Website at http:/standards.ieee.org. Errata Errata, if any, for all IEEE standards can be accessed on the IEEE-SA Website at the following

29、URL: http:/standards.ieee.org/findstds/errata/index.html. Users are encouraged to check this URL for errata periodically. Patents Attention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, n

30、o position is taken by the IEEE with respect to the existence or validity of any patent rights in connection therewith. If a patent holder or patent applicant has filed a statement of assurance via an Accepted Letter of Assurance, then the statement is listed on the IEEE-SA Website at http:/standard

31、s.ieee.org/about/sasb/patcom/patents.html. Letters of Assurance may indicate whether the Submitter is willing or unwilling to grant licenses under patent rights without compensation or under reasonable rates, with reasonable terms and conditions that are demonstrably free of any unfair discriminatio

32、n to applicants desiring to obtain such licenses. Essential Patent Claims may exist for which a Letter of Assurance has not been received. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scop

33、e of Patents Claims, or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this standard are expressly advised that determination of the validity

34、of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. Participants At the time this IEEE guide was completed, the C2 Cable System Bonding Working Group had the following member

35、ship: Michael D. Buckweitz, Chair Thomas C. Champion, Vice Chair Torben Aabo Richard W. Allen, Jr. Pierre Argaut Ray Awad Earle C. Bascom, III Mohamed Chaaban John H. Cooper Dennis F. DeCosta Swapan K. Dey Anthony Ernst William G. Hansen Wolfgang B. Haverkamp Dennis E. Johnson Arthur J. Kroese Frede

36、ric Lesur Allen MacPhail Neal K. Parker Ray E. Saccany William D. Wilkens Jay A. Williams The following members of the individual balloting committee voted on this guide. Balloters may have voted for approval, disapproval, or abstention. Saleman Alibhay Senthil Kumar Asok Kumar Peter Balma Thomas Ba

37、rnes G. Bartok Earle E. Bascom, III Wallace Binder William Bloethe Kenneth Bow Gustavo Brunello William Bush Mark Bushnell William Byrd John Cancelosi Paul Cardinal Weijen Chen Robert Christman Luis Coronado Frank Di Guglielmo Gary Donner Randall Dotson Dana Dufield Donald Dunn Gary Engmann Cliff Er

38、ven Dan Evans Jorge Fernandez Daher Rabiz Foda David Garrett David Gilmer Edwin Goodwin Todd Goyette Randall Groves Richard Harp Timothy Hayden Jeffrey Helzer Steven Hensley Lee Herron Gary Heuston Lauri Hiivala Robert Hoerauf Edward Jankowich Dennis E. Johnson A. Jones Gael Kennedy Yuri Khersonsky

39、Robert Kluge Robert Konnik Jim Kulchisky Saumen Kundu Chung-Yiu Lam Michael Lauxman Greg Luri Glenn Luzzi Arturo Maldonado Michael Maytum William McBride Gary Michel Daleep Mohla Rachel Mosier Jerry Murphy Arun Narang Dennis Neitzel Arthur Neubauer Michael Newman Joe Nims Gary Nissen Lorraine Padden

40、 Bansi Patel S. Patel Percy Pool Moises Ramos Robert Resuali Michael Roberts Lei Rong Thomas Rozek Bartien Sayogo Dennis Schlender Hamid Sharifnia Devki Sharma Gil Shultz Michael Smalley Jerry Smith John Spare Nagu Srinivas Gregory Stano Ryan Stargel Gary Stoedter Peter Sutherland David Tepen Peter

41、Tirinzoni James Tomaseski John Vergis Mark Walton Daniel Ward Lee Welch Yingli Wen Kenneth White Jonathan Woodworth Jian Yu Dawn Zhao Tiebin Zhao J. Zimnoch Copyright 2014 IEEE. All rights reserved. vi When the IEEE-SA Standards Board approved this guide on 12 June 2014, it had the following members

42、hip: John Kulick, Chair Jon Walter Rosdahl, Vice Chair Richard H. Hulett, Past Chair Konstantinos Karachalios, Secretary Peter Balma Farooq Bari Ted Burse Clint Chaplain Stephen Dukes Jean-Phillippe Faure Gary Hoffman Michael Janezic Jeffrey Katz Joseph L. Koepfinger* David J. Law Hung Ling Oleg Log

43、vinov Ted Olsen Glenn Parsons Ron Peterson Adrian Stephens Peter Sutherland Yatin Trivedi Phil Winston Don Wright Yu Yuan *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Richard DeBlasio, DOE Representative Michael Janezic, NIST Representative Don Messina

44、 IEEE-SA Standards Technical Community Malia Zaman IEEE-SA Standards Technical Community Copyright 2014 IEEE. All rights reserved. vii Introduction This introduction is not part of IEEE Std 575-2014, IEEE Guide for Bonding Shields and Sheaths of Single-Conductor Power Cables Rated 5 kV through 500 k

45、V. This document is a revision of IEEE 575-1988, which had been reaffirmed multiple times without change in years past. The current revision changes the document title to more appropriately reflect the intent of the guide. Most clauses of the guide were revised and updated to better clarify recommen

46、dations and procedures. Advances in computer technology now allow many of the equations to be programmed and solved rapidly using software that can analyze the corresponding circuit configuration and make recommendations for application of specialized bonding. Considerations for shield/sheath optimi

47、zation have been included in Clause 5. A major addition is Annex F, which provides new information on current and voltage distribution on cable shields/sheaths in situations involving installations with multiple cables per phase. Copyright 2014 IEEE. All rights reserved. viii Contents 1. Overview 1

48、1.1 Scope . 1 1.2 Purpose 2 2. Normative references 2 3. Definitions 2 3.1 Special terms 5 4. Background 5 5. Shield optimization . 6 6. Special bonding techniques 7 6.1 Design 9 6.2 Safety considerations for specially bonded cable systems . 10 6.3 Single-point bonding . 10 6.4 Impedance-bonding met

49、hods . 14 6.5 Cross bonding 15 6.6 Sheath sectionalizing joints . 20 6.7 Choice of bonding system . 20 6.8 Sheath standing voltage . 22 6.9 Transient voltage analysis 23 7. Sheath voltage limiters . 24 7.1 Introduction . 24 7.2 Nonlinear resistances . 25 7.3 Nonlinear resistances in series with spark gap 25 7.4 Spark gaps . 25 7.5 Selection of shield/sheath voltage limiters 26 7.6 Use of shield/sheath voltage limiters . 29 8. Effect on parallel communication and control cables . 29 8.1 Coupling 30 8.2 Shielding 30 8.3 Common-mode and metallic voltages . 30 Annex A (inform

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