1、IEEE Std 592-2007(Revision ofIEEE Std 592-1990)IEEE Standard for Exposed SemiconductingShields on High-Voltage Cable Joints andSeparable ConnectorsIEEE3 Park AvenueNew York, NY 10016-5997, USA8 May 2008IEEE Power Engineering SocietySponsored by theInsulated Conductors Committee592TMIEEE Std 592TM-20
2、07 (Revision of IEEE Std 592-1990) IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Connectors Sponsor Insulated Conductors Committee of the IEEE Power Engineering Society Approved 5 December 2007 IEEE-SA Standards Board Abstract: Design test for shield res
3、istance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV are provided in this standard. Keywords: fault-current initiation, shield resistance The Institute of Electr
4、ical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2008 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 8 May 2008. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent +1 978
5、750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center.iv Copyright 2008 IEEE. All rights reserved. Introduction This introduction is not part of IEEE Std 592-2007, IEEE Standard for Exposed Semi
6、conducting Shields on High-Voltage Cable Joints and Separable Connectors. Cable accessories, specifically separable insulated connectors system and joints, used with extruded dielectric cable rated 15 kV and above, are required to have an outer semiconducting shield covering their insulation surface
7、s. The shield is intended to protect the insulation, provide voltage stress relief, maintain the accessory surface at or near ground potential under normal operating conditions, and initiate fault-current arcing if the accessory insulation should fail. This standard sets forth tests and requirements
8、 to demonstrate that the shield will perform these duties. One of the requirements in this standard specifies a maximum shield-resistance performance. This requirement is to assure that the accessory shield provides stress relief and that the shield surface is maintained at or near ground potential.
9、 Another requirement in this standard specifies a shield fault-current initiation test. This test is designed to demonstrate the ability of the accessory shield to initiate fault-current arcs to ground that will cause overcurrent protective devices to operate, should the accessory insulation fail. I
10、n this test, special connections and procedures are specified to assure that full circuit voltage will be applied to the shield during the test. The test specifications do not, however, attempt to simulate all service conditions nor field assembly. This revision changes only the dated references in
11、IEEE-592-1990. The revision of IEEE Std 592-1977 reduced the fault initiation time from 3 min to 3 s, reflecting the present day performance. Also, the minimum rating of devices was raised from 5 kV to 15 kV to provide consistency with other applicable standards. This standard was prepared by a work
12、ing group of the Accessories Subcommittee of the Insulated Conductors Committee of the IEEE Power Engineering Society. Notice to users Laws and regulations Users of these documents should consult all applicable laws and regulations. Compliance with the provisions of this standard does not imply comp
13、liance to any applicable regulatory requirements. Implementers of the standard are responsible for observing or referring to the applicable regulatory requirements. IEEE does not, by the publication of its standards, intend to urge action that is not in compliance with applicable laws, and these doc
14、uments may not be construed as doing so. Copyrights This document is copyrighted by the IEEE. It is made available for a wide variety of both public and private uses. These include both use, by reference, in laws and regulations, and use in private self-regulation, standardization, and the promotion
15、 of engineering practices and methods. By making this document available for use and adoption by public authorities and private users, the IEEE does not waive any rights in copyright to this document. v Copyright 2008 IEEE. All rights reserved. Updating of IEEE documents Users of IEEE standards shou
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17、ny amendments, corrigenda, or errata then in effect. In order to determine whether a given document is the current edition and whether it has been amended through the issuance of amendments, corrigenda, or errata, visit the IEEE Standards Association Web site at http:/ieeexplore.ieee.org/xpl/standar
18、ds.jsp, or contact the IEEE at the address listed previously. For more information about the IEEE Standards Association or the IEEE standards development process, visit the IEEE-SA Web site at http:/standards.ieee.org. Errata Errata, if any, for this and all other standards can be accessed at the fo
19、llowing URL: http:/standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL for errata periodically. Interpretations Current interpretations can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/interp/index.html. Patents Attention is ca
20、lled to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE is not responsible for ident
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22、ents are reasonable or non-discriminatory. Users of this standard are expressly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association
23、vi Copyright 2008 IEEE. All rights reserved. Participants At the time this standard was submitted to the IEEE-SA Standards Board for approval, the B3W Working group had the following membership: Michael W. Malia, Co-chair Robert C Benn, Vice-chair Thomas C. Champion John DuPont R. D. Fulcomer Rick H
24、arlein Roy Jazowski Dennis Jensen Gael R. Kennedy Glen Luzzi John Makal Frank Stepniak Craig Wahlgren Carl Wentzel Howard Winslow Harry Yaworski Tiebin Zhao Paul Zimmermann The following members of the individual balloting committee voted on this standard. Balloters may have voted for approval, disa
25、pproval, or abstention. Sateesh Aggarwal Roy Alexander Kraig Bader William Bloethe Steven Brockschink Kent Brown Vern Buchholz Weijen Chen Tommy Cooper J. Disciullo Gary Engmann Rabiz Foda Marcel Fortin R. Gear Waymon Goch, Randall Groves Frank Di Guglielmo Richard Harp Gary Heuston Dennis Horwitz D
26、avid Jackson Edward M. Jankowich A. S. Jones Gael R. Kennedy Yuri Khersonsky Jim Kulchisky Chung-Yiu Lam G. Luri Glenn Luzzi Michael W. Malia Eric Marsden John Merando Gary Michel Rachel I. Mosier Jerry Murphy Shantanu Nandi Michael S. Newman Iulian Profir Michael Roberts Bartien Sayogo Michael Smal
27、ley Nagu Srinivas Carl Wall James Wilson Luis Zambrano Tiebin Zhao Ahmed Zobaa When the IEEE-SA Standards Board approved this standard on 5 December 2007, it had the following membership: Steve M. Mills, Chair Robert M. Grow, Vice Chair Don Wright, Past Chair Judith Gorman, Secretary Richard DeBlasi
28、o Alex Gelman William R. Goldbach Arnold M. Greenspan Joanna N. Guenin Kenneth S. Hanus William B. Hopf Richard H. Hulett Hermann Koch Joseph L. Koepfinger* John Kulick David J. Law Glenn Parsons Ronald C. Petersen Tom A. Prevost Narayanan Ramachandran Greg Ratta Robby Robson Anne-Marie Sahazizian V
29、irginia C. Sulzberger Malcolm V. Thaden Richard L. Townsend Howard L. Wolfman vii Copyright 2008 IEEE. All rights reserved. *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Satish K. Aggarwal, NRC Representative Michael H. Kelley, NIST Representative Miche
30、lle D. Turner IEEE Standards Program Manager, Document Development Matthew J. Ceglia IEEE Standards Program Manager, Technical Program Development viii Copyright 2008 IEEE. All rights reserved. Contents 1. Scope 1 2. Normative references 1 3. Performance requirements 2 4. Test procedures. 2 4.1 Test
31、 specimens. 2 4.2 Shield resistance test 2 4.3 Fault-current initiation test 3 1 Copyright 2008 IEEE. All rights reserved. IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Connectors IMPORTANT NOTICE: This standard is not intended to assure safety, security
32、 health, or environmental protection in all circumstances. Implementers of the standard are responsible for determining appropriate safety, security, environmental, and health practices or regulatory requirements. This IEEE document is made available for use subject to important notices and legal d
33、isclaimers. These notices and disclaimers appear in all publications containing this document and may be found under the heading “Important Notice” or “Important Notices and Disclaimers Concerning IEEE Documents.” They can also be obtained on request from IEEE or viewed at http:/standards.ieee.org/I
34、PR/disclaimers.html. 1. Scope This standard covers design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV. 2. Normative references The f
35、ollowing referenced documents are indispensable for the application of this document (i.e., they must be understood and used, so each referenced document is cited in text and its relationship to this document is explained). For dated references, only the edition cited applies. For undated references
36、 the latest edition of the referenced document (including any amendments or corrigenda) applies. IEEE Std 386, IEEE Standard for Separable Insulated Connector Systems for Power Distribution Systems Above 600 V.1, 2IEEE Std 404, IEEE Std, IEEE Standard for Extruded and Laminated Dielectric Shielded
37、Cable Joints Rated 2500 V to 500 000 V. 1IEEE publications are available from the Institute of Electrical and Electronics Engineers, 445 Hoes Lane, Piscataway, NJ 08854, USA (http:/standards/ieee.org/). 2The IEEE standards or products referred to in this clause are trademarks of the Institute of Ele
38、ctrical and Electronics Engineers, Inc. IEEE Std 592-2007 IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Connectors 2 Copyright 2008 IEEE. All rights reserved. 3. Performance requirements To comply with this standard, semiconducting shields shall successf
39、ully pass the following tests: 1) Shield resistance: The shield resistance measured between the cable entrance and the farthest extremity of the shield from the cable entrance shall be 5000 or less when measured as specified in 4.2. 2) Fault-current initiation: The semi-conducting shield shall be ca
40、pable of initiating two consecutive fault-current arcs to ground as specified in 4.3. 4. Test procedures 4.1 Test specimens Test speciments shall be clean and dry. A minimum number of two test specimens shall be subjected to each test, unless otherwise specified by this standard. 4.2 Shield resistan
41、ce test The resistance of the semiconducting shield shall be measured using the voltmeter-ammeter method, with either an ac or dc current supply. The current connections shall be as follows: For a separable insulated connector, the current connections shall be made on the shield at the cable entranc
42、e and at the farthest shield extremity, using a circumferential connection at both locations to give a uniform current distribution. For a joint, the current connections shall be made on the shield at the cable entrance and at the physical center of the shield, using a circumferential connection at
43、both points to give a uniform current distribution. The voltage shall be measured with the current adjusted to 1.0 mA 0.2 mA. Resistance measurements shall be made on test specimens that have had the following histories: a) Unaged b) Air oven aged for 504 h at 121 C 5 C Resistance measurements shall
44、 be made with the test specimen temperature at 20 C 5 C and at 90 C 5 C. IEEE Std 592-2007 IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Connectors 3 Copyright 2008 IEEE. All rights reserved. 4.3 Fault-current initiation test 1) The test specimen used in
45、 4.2 shall be assembled onto the cable(s) in conformance with the manufacturers instructions, with the exception that the metallic cable shield shall be extended over the accessory shield (see Figure 1 and Figure 2). 2) The fault rod shall be of an erosion resistant metal, such as copper-tungsten, 3
46、/8-in in diameter, and threaded at one end to engage the accessory connector through a drilled hole not to exceed 3/8-in in diameter (see Figure 1 and Figure 2). The rod shall be flush with the shield surface as shown in Figure 1 and Figure 2. 3) The fault rod placement and the attitude of the acces
47、sory during the fault initiation test shall be as shown in Figure 1 and Figure 2. For separable insulated connectors, the rod shall be as close to the shield extremity as practicable. For joints, the rod shall be in the physical center of the connector. 4) The voltage source shall be connected betwe
48、en specimen neutral ground and cable conductor. The test voltage shall be as specified in Table 1. With an available short circuit current of 10 000 A rms symmetrical, the test specimen shall be subjected to two tests that cause initiation of a fault-current arc to ground. Each operation shall have
49、a minimum current flow duration of 10 cycles at the normal power frequency used. After energizing the test circuit, the fault initiation must occur within 3 s. The second test shall be initiated in the shortest practical time. The test specimen must not be disturbed between operations. Table 1 Fault current test voltage requirements Separable Connector Joint Test Voltage Rating Phase-to-Ground * Voltage Rating Phase-to-Ground Voltage Phase-to- Ground (kV rms) (kV rms) (kV rms) (Fig 1) (Fig 2) 8.3 8.7 7.0 15.2 14.4 11.7 21.1 19.4 12.2 *Fo
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