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本文(IEEE 933-2013 en Guide for the Definition of Reliability Program Plans for Nuclear Generating Stations and Other Nuclear Facilities《核电站个其它核设施可靠性计划方案定义用IEEE指南》.pdf)为本站会员(fatcommittee260)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

IEEE 933-2013 en Guide for the Definition of Reliability Program Plans for Nuclear Generating Stations and Other Nuclear Facilities《核电站个其它核设施可靠性计划方案定义用IEEE指南》.pdf

1、 IEEE Guide for the Definition of Reliability Program Plans for Nuclear Generating Stations and Other Nuclear Facilities Sponsored by the Nuclear Power Engineering Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA IEEE Power and Energy SocietyIEEE Std 933-2013(Revision ofIEEE Std 933-1999) IE

2、EE Std 933-2013 (Revision of IEEE Std 933-1999) IEEE Guide for the Definition of Reliability Program Plans for Nuclear Generating Stations and Other Nuclear Facilities Sponsor Nuclear Power Engineering Committee of the IEEE Power and Energy Society Approved 11 December 2013 IEEE-SA Standards Board A

3、bstract: Guidelines for the definition of a reliability program at nuclear generating stations and other nuclear facilities are provided. The document emphasizes reliability programs during the operating phase of such stations; however, the general approach applies to all phases of the nuclear power

4、 generating station life cycle (e.g., design, construction, start-up, operating, and decommissioning). Keywords: IEEE 933, problem analysis, reliability analysis, reliability program plan The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyrigh

5、t 2014 by The Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 10 January 2014. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent fitness for a particular purpose; non-infringement; and quality, accuracy, effectiveness, c

6、urrency, or completeness of material. In addition, IEEE disclaims any and all conditions relating to: results; and workmanlike effort. IEEE standards documents are supplied “AS IS” and “WITH ALL FAULTS.” Use of an IEEE standard is wholly voluntary. The existence of an IEEE standard does not imply th

7、at there are no other ways to produce, test, measure, purchase, market, or provide other goods and services related to the scope of the IEEE standard. Furthermore, the viewpoint expressed at the time a standard is approved and issued is subject to change brought about through developments in the sta

8、te of the art and comments received from users of the standard. In publishing and making its standards available, IEEE is not suggesting or rendering professional or other services for, or on behalf of, any person or entity nor is IEEE undertaking to perform any duty owed by any other person or enti

9、ty to another. Any person utilizing any IEEE Standards document, should rely upon his or her own independent judgment in the exercise of reasonable care in any given circumstances or, as appropriate, seek the advice of a competent professional in determining the appropriateness of a given IEEE stand

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11、 WHETHER IN CONTRACT, STRICT LIABILITY, OR TORT (INCLUDING NEGLIGENCE OR OTHERWISE) ARISING IN ANY WAY OUT OF THE PUBLICATION, USE OF, OR RELIANCE UPON ANY STANDARD, EVEN IF ADVISED OF THE POSSIBILITY OF SUCH DAMAGE AND REGARDLESS OF WHETHER SUCH DAMAGE WAS FORESEEABLE. Translations The IEEE consen

12、sus development process involves the review of documents in English only. In the event that an IEEE standard is translated, only the English version published by IEEE should be considered the approved IEEE standard. Copyright 2014 IEEE. All rights reserved. iv Official statements A statement, writte

13、n or oral, that is not processed in accordance with the IEEE-SA Standards Board Operations Manual shall not be considered or inferred to be the official position of IEEE or any of its committees and shall not be considered to be, or be relied upon as, a formal position of IEEE. At lectures, symposia

14、 seminars, or educational courses, an individual presenting information on IEEE standards shall make it clear that his or her views should be considered the personal views of that individual rather than the formal position of IEEE. Comments on standards Comments for revision of IEEE Standards docum

15、ents are welcome from any interested party, regardless of membership affiliation with IEEE. However, IEEE does not provide consulting information or advice pertaining to IEEE Standards documents. Suggestions for changes in documents should be in the form of a proposed change of text, together with a

16、ppropriate supporting comments. Since IEEE standards represent a consensus of concerned interests, it is important that any responses to comments and questions also receive the concurrence of a balance of interests. For this reason, IEEE and the members of its societies and Standards Coordinating Co

17、mmittees are not able to provide an instant response to comments or questions except in those cases where the matter has previously been addressed. For the same reason, IEEE does not respond to interpretation requests. Any person who would like to participate in revisions to an IEEE standard is welc

18、ome to join the relevant IEEE working group. Comments on standards should be submitted to the following address: Secretary, IEEE-SA Standards Board 445 Hoes Lane Piscataway, NJ 08854 USA Laws and regulations Users of IEEE Standards documents should consult all applicable laws and regulations. Compli

19、ance with the provisions of any IEEE Standards document does not imply compliance to any applicable regulatory requirements. Implementers of the standard are responsible for observing or referring to the applicable regulatory requirements. IEEE does not, by the publication of its standards, intend t

20、o urge action that is not in compliance with applicable laws, and these documents may not be construed as doing so. Copyrights IEEE draft and approved standards are copyrighted by IEEE under U.S. and international copyright laws. They are made available by IEEE and are adopted for a wide variety of

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23、ly. To arrange for payment of licensing fees, please contact Copyright Clearance Center, Customer Service, 222 Rosewood Drive, Danvers, MA 01923 USA; +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright

24、Clearance Center. Copyright 2014 IEEE. All rights reserved. v Updating of IEEE Standards documents Users of IEEE Standards documents should be aware that these documents may be superseded at any time by the issuance of new editions or may be amended from time to time through the issuance of amendmen

25、ts, corrigenda, or errata. An official IEEE document at any point in time consists of the current edition of the document together with any amendments, corrigenda, or errata then in effect. Every IEEE standard is subjected to review at least every ten years. When a document is more than ten years ol

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27、r a given document is the current edition and whether it has been amended through the issuance of amendments, corrigenda, or errata, visit the IEEE-SA Website at http:/ieeexplore.ieee.org/xpl/standards.jsp or contact IEEE at the address listed previously. For more information about the IEEE SA or IE

28、EEs standards development process, visit the IEEE-SA Website at http:/standards.ieee.org. Errata Errata, if any, for all IEEE standards can be accessed on the IEEE-SA Website at the following URL: http:/standards.ieee.org/findstds/errata/index.html. Users are encouraged to check this URL for errata

29、periodically. Patents Attention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken by the IEEE with respect to the existence or validity of any patent rights in connection

30、 therewith. If a patent holder or patent applicant has filed a statement of assurance via an Accepted Letter of Assurance, then the statement is listed on the IEEE-SA Website at http:/standards.ieee.org/about/sasb/patcom/patents.html. Letters of Assurance may indicate whether the Submitter is willin

31、g or unwilling to grant licenses under patent rights without compensation or under reasonable rates, with reasonable terms and conditions that are demonstrably free of any unfair discrimination to applicants desiring to obtain such licenses. Essential Patent Claims may exist for which a Letter of As

32、surance has not been received. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of Patents Claims, or determining whether any licensing terms or conditions provided in connection with su

33、bmission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this standard are expressly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Fur

34、ther information may be obtained from the IEEE Standards Association. Copyright 2014 IEEE. All rights reserved. viParticipants At the time this guide was completed, the Nuclear Power Engineering Committee (NPEC) had the following membership: John D. McDonald, Chair Satish Aggarwal, Vice Chair Ijaz A

35、hmad George Attarian George A. Ballassi Farouk D. Baxter Mark Bowman Daniel F. Brosnan Nissen M. Burstein Robert C. Carruth John P. Carter Dennis Dellinger John Disosway Stephen Fleger Robert J. Fletcher Robert B. Fuld James Gleason Dale T. Goodney Daryl Harmon Dirk C. Hopp David A. Horvath Paul R.

36、Johnson Thomas Koshy Harvey C. Leake J. Scott Malcolm Alexander Marion Michael H. Miller James Parello Mansoor H. Sanwarwalla Glen E. Schinzel James E. Stoner, Jr. Marek Tengler James E. Thomas Paul L. Yanosy, Sr. David J. Zaprazny At the time this guide was completed, the NPEC Operations, Maintenan

37、ce, Aging, Reliability and Testing Subcommittee (SC 3) had the following membership: Glen E. Schinzel, Chair Mansoor H. Sanwarwalla, Vice Chair Gopal Aravapalli George A. Ballassi John Beatty Tom Crawford Alireza Daneshpooy Rachel B. Gunnett Hamid Heidarisafa Sharon Honecker David A. Horvath Peter J

38、 Kang Jacob Kulangara Robert Lane James K. Liming G. Singh Matharu Kirklyn Melson Joseph Napper James Parello Ted Riccio Owen Scott Craig D. Sellers Barry Sloane John A. Stevens John H. Taylor Yvonne Williams Kiang Zee At the time this guide was completed, the Reliability (PE/NPE/WG_3.3) Working Gr

39、oup had the following membership: James K. Liming, Chair John A. Stevens, Vice Chair Gopal Aravapalli George A. Ballassi John Beatty Tom Crawford Alireza Daneshpooy Rachel B. Gunnett Hamid Heidarisafa Sharon Honecker David A. Horvath Peter J. Kang Jacob Kulangara Joseph Napper James Parello Ted Ricc

40、io Mansoor H. Sanwarwalla Glen E. Schinzel Owen Scott Craig D. Sellers Barry Sloane John H. Taylor Yvonne Williams Kiang Zee Copyright 2014 IEEE. All rights reserved. viiThe following members of the individual balloting committee voted on this guide. Balloters may have voted for approval, disapprova

41、l, or abstention. William Ackerman Satish Aggarwal Robert Austin George Ballassi William Bloethe Daniel Brosnan Robert Carruth Suresh Channarasappa Mark Clark Tom Crawford Gary Engmann Stephen Fleger Randall Groves Werner Hoelzl David A. Horvath Paul Johnson James Jones Piotr Karocki Yuri Khersonsky

42、 Chad Kiger Joseph L. Koepfinger Robert Konnik James Liming Greg Luri Kirklyn Melson Michael Newman Ted Riccio Bartien Sayogo Glen E. Schinzel Gil Shultz Rebecca Steinman John A. Stevens Gary Stoedter John Vergis When the IEEE-SA Standards Board approved this guide on 11 December 2013, it had the fo

43、llowing membership: John Kulick, Chair David J. Law, Vice Chair Richard H. Hulett, Past Chair Konstantinos Karachalios, Secretary Masayuki Ariyoshi Peter Balma Farooq Bari Ted Burse Stephen Dukes Jean-Philippe Faure Alexander Gelman Mark Halpin Gary Hoffman Paul Houz Jim Hughes Michael Janezic Josep

44、h L. Koepfinger* Oleg Logvinov Ron Petersen Gary Robinson Jon Walter Rosdahl Adrian Stephens Peter Sutherland Yatin Trivedi Phil Winston Yu Yuan *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Richard DeBlasio, DOE Representative Michael Janezic, NIST Rep

45、resentative Catherine Berger Senior Program Manager, IEEE-SA Content Publishing Malia Zaman Program Manager, IEEE-SA Technical Community viii Copyright 2014 IEEE. All rights reserved. Introduction This introduction is not part of IEEE Std 933-2013, IEEE Guide for the Definition of Reliability Progra

46、m Plans for Nuclear Generating Stations and Other Nuclear Facilities. The IEEE recognizes the importance of safe, reliable, and efficient nuclear power generation and seeks to provide guidance for constructing a reliability program to help achieve improved plant safety and performance. This guide is

47、 part of a continuing effort in which the IEEE and other industry groups have been engaged since the beginning of the commercial nuclear power industry. Related IEEE activities include the publication of the following guides and standards: IEEE Std 352, IEEE Guide for General Principles of Reliabili

48、ty Analysis of Nuclear Power Generating Stations Safety Systems (a basic reliability tutorial) IEEE Std 577, IEEE Standard Requirements for Reliability Analysis in the Design and Operation of Safety Systems for Nuclear Power Generating Stations This guides main objective, to provide a basic framewor

49、k for operational reliability programs, has been adapted to nuclear generating stations and other nuclear facilities. However, principles contained in the guide are not limited to these stations or the power industry exclusively. Other station types and industries are encouraged to tailor the guide to meet their specific needs. The guide has been developed to aid nuclear utilities in tailoring the principles of an effective reliability program to their own particular organization structure and approach. As an IEEE guide, it cannot establish specific r

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