IEEE C135 61-1997 en Standard for the Testing of Overhead Transmission and Distribution Line Hardware《架空传输和配电线硬件试验》.pdf

1、The Institute of Electrical and Electronics Engineers, Inc.3 Park Avenue, New York, NY 10016-5997, USACopyright 1998 by the Institute of Electrical and Electronics Engineers, Inc.All rights reserved. Published 1998. Printed in the United States of AmericalISBN 1-55937-967-7No part of this publicatio

2、n may be reproduced in any form, in an electronic retrieval system or otherwise, without the priorwritten permission of the publisher.IEEE Std C135.61-1997 (R2006)IEEE Standard for the Testingof Overhead Transmission andDistribution Line HardwareSponsorTransformers and Distribution Committeeof theIE

3、EE Power Engineering SocietyApproved 16 September 1997Reaffirmed 5 December 2006IEEE-SA Standards BoardAbstract: Requirements for mechanically testing load-rated line hardware for use on transmissionand distribution facilities are described. Items specifically addressed in this standard include clev

4、isand eye fittings, Y-clevis fittings, socket fittings, ball fittings, chain links, shackles, triangular andrectangular yoke plates, suspension clamps, and strain clamps. This standard is intended to coverroutine acceptance testing. It is not intended for inital design tests.Keywords: acceptance tes

5、ting, load-rated line hardwareIEEE Standards documents are developed within the IEEE Societies and the Standards Coordinat-ing Committees of the IEEE Standards Board. Members of the committees serve voluntarily andwithout compensation. They are not necessarily members of the Institute. The standards

6、 developedwithin IEEE represent a consensus of the broad expertise on the subject within the Institute as wellas those activities outside of IEEE that have expressed an interest in participating in the develop-ment of the standard.Use of an IEEE Standard is wholly voluntary. The existence of an IEEE

7、 Standard does not implythat there are no other ways to produce, test, measure, purchase, market, or provide other goods andservices related to the scope of the IEEE Standard. Furthermore, the viewpoint expressed at thetime a standard is approved and issued is subject to change brought about through

8、 developments inthe state of the art and comments received from users of the standard. Every IEEE Standard is sub-jected to review at least every five years for revision or reaffirmation. When a document is morethan five years old and has not been reaffirmed, it is reasonable to conclude that its co

9、ntents,although still of some value, do not wholly reflect the present state of the art. Users are cautioned tocheck to determine that they have the latest edition of any IEEE Standard.Comments for revision of IEEE Standards are welcome from any interested party, regardless ofmembership affiliation

10、with IEEE. Suggestions for changes in documents should be in the form of aproposed change of text, together with appropriate supporting comments.Interpretations: Occasionally questions may arise regarding the meaning of portions of standards asthey relate to specific applications. When the need for

11、interpretations is brought to the attention ofIEEE, the Institute will initiate action to prepare appropriate responses. Since IEEE Standards rep-resent a consensus of all concerned interests, it is important to ensure that any interpretation hasalso received the concurrence of a balance of interest

12、s. For this reason, IEEE and the members of itssocieties and Standards Coordinating Committees are not able to provide an instant response tointerpretation requests except in those cases where the matter has previously received formalconsideration. Comments on standards and requests for interpretati

13、ons should be addressed to:Secretary, IEEE Standards Board445 Hoes LaneP.O. Box 1331Piscataway, NJ 08855-1331USAAuthorization to photocopy portions of any individual standard for internal or personal use isgranted by the Institute of Electrical and Electronics Engineers, Inc., provided that the appr

14、opriatefee is paid to Copyright Clearance Center. To arrange for payment of licensing fee, please contactCopyright Clearance Center, Customer Service, 222 Rosewood Drive, Danvers, MA 01923 USA;(508) 750-8400. Permission to photocopy portions of any individual standard for educational class-room use

15、can also be obtained through the Copyright Clearance Center.Note: Attention is called to the possibility that implementation of this standard mayrequire use of subject matter covered by patent rights. By publication of this standard,no position is taken with respect to the existence or validity of a

16、ny patent rights inconnection therewith. The IEEE shall not be responsible for identifying patents forwhich a license may be required by an IEEE standard or for conducting inquiries intothe legal validity or scope of those patents that are brought to its attention.Copyright 1998 IEEE. All rights res

17、erved.iiiIntroduction(This introduction is not part of IEEE Std C135.61-1997, IEEE Standard for the Testing of Overhead Transmission andDistribution Line Hardware.)This standard covers the requirements for the testing and acceptance of transmission and distribution linehardware. The standard covers

18、routine acceptance testing, and is not intended for use for initial design tests.At the time that this standard was completed, the Working Group on Pole-Line Hardware of the Transmis-sion and Distribution Committee of the IEEE Power Engineering Society had the following membership:Ronald J. Oedemann

19、 ChairThe following persons were on the balloting committee:Nick S. AnnasJames E. ApplequistFrederick W. BurtelsonRick ChapelBill CundiffEdward DziedzicDale EasleyJohn FarringtonJohn E. FlynnDonald G. HealdRichard W. HenselNunally JohnsonRalph JonesEd KiernozekDavid J. KouryKeith E. LindseyAndy Mey

20、erTom MurphyRobert C. PetersPatrick D. QuinnSteve D. ScholfieldDick SerockiChris SeversDoug ShermanSteve SmithRon SpeesJohn TrostleNevins WilburnTomas J. AldertonNick S. AnnasJames E. ApplequistJoseph F. BuchJames J. BurkeFrederick W. BurtelsonDon CannonVernon L. ChartierLeonard F. ConsalvoWilliam T

21、 CrokerGlenn A. DavidsonDennis DossDale A. DouglassJohn FarringtonJon M. FergusonJohn E. FlynnGeorge GelaDonald A. GilliesEdwin J. GoodwinStan GrzybowskiDonald G. HealdRichard W. HenselChristopher HickmanRobert O. KlugeNestor KolcioDavid J. KourySamy KrishnasamyRobert C. LathamKeith E. LindseySarma

22、 P. MaruvadaMike McCaffertyJ. D. MitchellHideki MotoyamaAbdul M. MousaJay L. NichollsRonald J. OedemannMark OstendorpRobert G. OswaldMohammad A. PashaRobert C. PetersPatrick D. QuinnParvez RashidJerry L. RedingDennis ReisingerJoseph RenowdenStephen J. RodickJohn S. RumbleDonald SandellNeil P. Schmid

23、tSteve D. ScholfieldChris SeversMohamed H. ShwehdiGlen SmithStephen F. SmithGary E. StemlerDave SunkleRichard B. TaylorJohn TorokDaniel J. WardThomas L. WeaverWilliam B. ZollarsivCopyright 1998 IEEE. All rights reserved.When the IEEE Standards Board approved this standard on 16 September 1997, it ha

24、d the following mem-bership:Donald C. Loughry,ChairRichard J. Holleman,Vice ChairAndrew G. Salem,Secretary*Member EmeritusAlso included are the following nonvoting IEEE Standards Board liaisons:Satish K. AggarwalAlan H. CooksonAdam SickerIEEE Standards Project EditorClyde R. CampStephen L. DiamondHa

25、rold E. EpsteinDonald C. FleckensteinJay Forster*Thomas F. GarrityDonald N. HeirmanJim IsaakBen C. JohnsonLowell JohnsonRobert KennellyE. G. “Al” KienerJoseph L. Koepfinger*Stephen R. LambertLawrence V. McCallL. Bruce McClungMarco W. MigliaroLoius-Franois PauGerald H. PetersonJohn W. PopeJose R. Ram

26、osRonald H. ReimerIngo RschJohn S. RyanChee Kiow TanHoward L. WolfmanCopyright 1998 IEEE. All rights reserved.vContents1. Overview 11.1 Scope 11.2 Purpose. 11.3 Application. 12. References 13. Technical definitions 24. Requirements . 25. Determination of acceptability. 36. Test procedure and test re

27、ports 3viCopyright 1998 IEEE. All rights reserved.Copyright 1998 IEEE. All rights reserved.1IEEE Standard for the Testingof Overhead Transmission and Distribution Line Hardware1. Overview1.1 ScopeThis standard covers the requirements for mechanically testing load-rated line hardware for use on trans

28、mis-sion and distribution facilities. This standard is intended to cover routine acceptance testing. It is notintended for initial design tests. This standard specifically addresses, but is not limited to, clevis and eye fit-tings, Y-clevis fittings, socket fittings, ball fittings, chain links, shac

29、kles, triangular and rectangular yokeplates, suspension clamps, and strain clamps. This standard may be applied to other line hardware as agreedupon by the manufacturer and the end user.1.2 PurposeAll load-rated line hardware conforming to the requirements of this standard shall, in all respects, me

30、et theacceptance criteria in Clause 5, when tested in accordance with the procedures outlined in Clause 6.1.3 ApplicationThe routine acceptance tests covered by this standard test the “as-manufactured” condition of the product. Itis expected that the user will select suitable safety factors in apply

31、ing these devices, based on experience anda knowledge of the associated codes and materials involved. Assurance of compliance with this standard is amatter to be agreed upon by the purchaser and the supplier.2. ReferencesThis standard shall be used in conjunction with the following publication. When

32、 the following publication issuperseded by an approved revision, the revision shall apply.ANSI/ASQC Z1.4-1993, Sampling Procedures and Tables for Inspection by Attributes.11ANSI publications are available from the Sales Department, American National Standards Institute, 11 West 42nd Street, 13th Flo

33、or,New York, NY 10036, USA.IEEEStd C135.61 -1997 IEEE STANDARD FOR THE TESTING OF OVERHEAD2Copyright 1998 IEEE. All rights reserved.3. Definitions3.1 acceptance quality level (aql): The maximum percent defective (maximum number of defects per 100units) that, for the purpose of a sampling inspection,

34、 can be considered satisfactory as a process average.3.2 average test value ( ):where X1, X2,.,Xn, are individual test values and n is the total number of units tested.3.3 defect:Any nonconformance with specified requirements of the tested unit of product. For purposes ofthis standard, a defect is d

35、efined as a unit of product that, when tested, falls below its specified rated ultimatestrength.3.4 lot:A quantity of line hardware selected and agreed upon by the manufacturer and customer as beingrepresentative of a homogeneous population. Each lot, as far as is practicable, shall consist of units

36、 of prod-uct of a single type, grade, class, size, and composition that are manufactured at essentially the same timeand under essentially the same conditions. Consideration should be given to limit the lot size, where applica-ble, to each heat-treating and/or annealing process of a group of units.

37、As necessary, the manufacturer shallprovide adequate and suitable storage space for each lot and means for proper identification. Any lot shallnot exceed 35 000 units.3.5 major defect:A unit of product that, when tested, falls below 85% of its specified rated ultimatestrength.3.6 sample:One or more

38、units of product drawn from a lot, the units of sample being selected at randomwithout regard to their quality.3.7 sample size:Based on the lot size. Minimum sample sizes are given in Table 1.4. RequirementsThe inspection criteria used in this standard correspond to sample size code S-4 with a doubl

39、e sampling planfor normal inspection having an aql of 2.5% (see ANSI/ASQC-1993).Table 1Minimum sample sizeLot size Sample size129 330150 51511200 13120110 000 2010 00135 000 32XnXnX1X2X3. Xn+()n=IEEETRANSMISSION AND DISTRIBUTION LINE HARDWARE Std C135.61-1997Copyright 1998 IEEE. All rights reserved.

40、35. Determination of acceptabilityThe acceptability of a lot shall be determined by the use of Table 2.The lot shall be considered acceptable when the number of defects found in the first (or single) sample isequal to or less than the first acceptance number from Table 2. If this acceptance criterio

41、n is met on the firstsampling, a second sampling is not needed. If the number of defects found in the first or single sample isequal to or greater than the first rejection number, the lot shall be rejected without a second sampling beingallowed. If the number of defects found in the first sample is

42、between the first acceptance and rejection num-bers, a second sampling of the size given in Table 1 shall be tested. The number of defects found in the firstand second samples shall be accumulated. If the cumulative number of defects is equal to or less than thesecond acceptance number, the lot shal

43、l be considered acceptable. If the cumulative number of defects isequal to or greater than the second rejection number, the lot shall be rejected.Both the manufacturer and the end user shall reserve the right to reject the entire lot if a tested unit of prod-uct is found to have a major defect (i.e.

44、 falls below 85% rated ultimate strength).6. Test procedure and test reportsPulling hardware used in the application of the load shall be dimensional according to Exhibits AD (seeFigures 15). Pins or bolts that are normally furnished with the hardware shall be used during all tests. Thisstandard ap

45、plies to straight-line loading. Lower ultimate strengths may occur if loaded in a manner otherthan shown in this standard.In performing a tensile test, the load shall be started at zero and shall be brought up smoothly in a practicallystepless manner. The load may be increased rapidly to approximate

46、ly 75% of the rated strength of the hard-ware. Load shall then be smoothly applied at a rate of 25% of rated strength per minute, until the point offailure.All tests shall be recorded in a permanent and organized manner, and shall be maintained for a minimum of10 years. Each test write-up shall cont

47、ain the following:a) Date of test.b) Location of test.c) Catalog part number.d) Hardware rating.Table 2Acceptance/rejection criteriaTest sample Sample size Cumulative sample size Accept RejectSingle 3 0 1Single 5 0 1FirstSecond131313260122FirstSecond202020400334FirstSecond323232641445IEEEStd C135.61

48、 -1997 IEEE STANDARD FOR THE TESTING OF OVERHEAD4Copyright 1998 IEEE. All rights reserved.e) Description of test setup, including serial number of test equipment.f) Date of last calibration of test equipment.g) Any pertinent notes.h) Test values at which failure occurred, and a description of the fa

49、ilure (i.e., broken pin, fracture at cle-vis, etc.).i) Name of the inspector performing or witnessing the test. If any electronic data base is utilized, secu-rity shall be employed so that only the person witnessing the test may enter or alter the results.All test reports submitted to customers shall be typed and certified. Each test report shall contain the follow-ing:a) Date of test.b) Location of test.c) Supplier catalog part number.d) Description of the part including hardware rating.e) Object of test.f) Test procedure.g) Description of the test equipm