IEEE C37 09 CORR 1-2007 en Standard Test Procedure for AC High-Voltage Circuit Breakers Rated on a Symmetrical Current Basis《均匀电流基础上额定交流高压断路器的试验程序 勘误表1》.pdf

1、IEEE Std C37.09-1999/Cor 1-2007(Corrigendum to IEEE Std C37.09-1999)IEEE Standard Test Procedure for AC High-Voltage Circuit BreakersRated on a Symmetrical CurrentBasisCorrigendum 1I E E E3 Park Avenue New York, NY 10016-5997, USA2 May 2007IEEE Power Engineering SocietySponsored by theSwitchgear Com

2、mitteeIEEE Std C37.09-1999/Cor 1-2007(Corrigendum toIEEE Std C37.09-1999)IEEE Standard Test Procedure for AC High-Voltage Circuit Breakers Rated on a Symmetrical Current BasisCorrigendum 1Sponsor Switchgear Committeeof theIEEE Power Engineering SocietyApproved 8 March 2007IEEE SA-Standards BoardThe

3、Institute of Electrical and Electronics Engineers, Inc.3 Park Avenue, New York, NY 10016-5997, USACopyright 2007 by the Institute of Electrical and Electronics Engineers, Inc.All rights reserved. Published 2 May 2007. Printed in the United States of America.IEEE is a registered trademark in the U.S.

4、 Patent Errata to IEEE Std C37.09-1999 (edited 18 April 2007), which corrects typographical and edi-torial errors to the standard (note that these alterations have been made to the most currentelectronic version of the standard which is available onlinehttp:/shop.ieee.org/ieeestore/); IEEE Std C37.0

5、9a-2005, amendment to IEEE Std C37.09-1999, which adds additional contentto the standard; and this corrigendum, IEEE Std C37.09-1999/Cor 1-2007, which makes technical corrections toboth the original IEEE Std C37.09-1999 and the subsequently published errata.Keywords: fast transient recovery voltage,

6、 indoor, initial, mechanical endurance, operating duty,outdoor, power frequency, short-circuit current, short-line fault, single-phase testing, test data re-porting, three-phase testing, unit test, voltage distribution synthetic testIEEE Standards documents are developed within the IEEE Societies an

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22、use can also be obtained through the Copyright ClearanceCenter.ivCopyright 2007 IEEE. All rights reserved.IntroductionThis corrigendum corrects technical and other non-editorial errors printed in the text of the IEEE StdC37.09-1999, second printing 19 December 2005. It is recalled that IEEE Std C37.

23、09a-2005, IEEEStandard Test Procedure for AC High-Voltage Circuit Breakers Rated on a Symmetrical Current BasisAmendment 1: Capacitance Current Switching, which was printed and published on 16 September 2005,amends IEEE Std C37.09-1999.Notice to usersErrataErrata, if any, for this and all other stan

24、dards can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL for errata periodically.InterpretationsCurrent interpretations can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/interp/index.

25、html.PatentsAttention is called to the possibility that implementation of this standard may require use of subject mattercovered by patent rights. By publication of this standard, no position is taken with respect to the existence orvalidity of any patent rights in connection therewith. The IEEE sha

26、ll not be responsible for identifyingpatents or patent applications for which a license may be required to implement an IEEE standard or forconducting inquiries into the legal validity or scope of those patents that are brought to its attention.This introduction is not part of IEEE Std C37.09-1999/C

27、or 1-2007, IEEE Standard Test Procedure for AC High-Voltage Circuit Breakers Rated on a Symmetrical Current Basis, Corrigendum 1.vCopyright 2007 IEEE. All rights reserved.ParticipantsAt the time this corrigendum was completed, the Working Group had the following membership: Georges Montillet, ChairB

28、ill Bergman, Vice-ChairThe following members of the individual balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention. Roy W. AlexanderMauricio AristizabalFrank BlablockAnne BosmaTed A. BurseChih C. ChowVince ColettaMike CrawfordPat Di LilloDeni

29、s L. DufournetKenneth S. EdwardsLeslie T. FalkinghamThomas FieldMarcel FortinRick JacksonHua Y. LiuFranco Lo MonacoR. W. LongYasin I. MusaJeffrey H. NelsonT. W. OlsenCarl A. SchneiderDevki N. SharmaR. Kirkland SmithJohn WebbXi ZhuRoy W. AlexanderMauricio AristizabalRobert P. BarnettPaul D. BarnhartR

30、obert J. BehlW. J. Bill BergmanSteven BeznerStan BillingsWallace B. Binder, Jr.Frank BlalockWilliam G. BloetheAnne A. BosmaSteven R. BrockschinkTed A. BurseEldridge R. ByronChih C. ChowTommy P. CooperStephen DareGary L. DonnerRandall L. DotsonDana S. DufieldDenis L. DufournetDonald G. DunnKenneth S.

31、 EdwardsGary R. EngmannC. C. ErvenLeslie T. FalkinghamThomas E. FieldMarcel FortinFrank J. GerleveKenneth E. GettmanRobert E. GoodinKeith I. GrayRandall C. GrovesJohn E. HarderHelmut HeiermeierGary A. HeustonDavid A. HorvathDennis HorwitzAnders L. JohnsonGael KennedyJ. L. KoepfingerJim KulchiskyCarl

32、 R. KurinkoChung-Yiu LamStephen R. LambertGerald E. LeeHua Y. LiuAlbert LivshitzR. W. LongThomas G. LundquistG. L. LuriAntonio MannarinoFrank W. MayleKenneth L. McclenahanPeter J. MeyerGary L. MichelGeorges F. MontilletCharles A. MorseJerry R. MurphyYasin I. MusaJeffrey H. NelsonMichael S. NewmanT.

33、W. OlsenMiklos J. OroszLorraine K. PaddenDavid F. PeeloIulian E. ProfirJohannes RickmannMichael A. RobertsCharles W. RogersBartien SayogoCarl A. SchneiderThomas SchossigDevki N. SharmaH. M. SmithJames E. SmithJerry W. SmithR. Kirkland SmithDavid T. StoneJames M. SwankS. H. TelanderWilliam W. TerryMr

34、 Dennis R. ThonsgardNorbert TrappWaldemar G. VonMillerC. L. WagnerJames W. Wilson, Jr.Larry E. YonceRichard A. YorkJanusz A. ZawadzkiXi ZhuAhmed F. Zobaa viCopyright 2007 IEEE. All rights reserved.When the IEEE-SA Standards Board approved this standard on 8 March 2007, it had the following membershi

35、p:Steve M. Mills, ChairRobert M. Grow, Vice ChairDonald F.Wright, Past ChairJudith Gorman, Secretary*Member EmeritusAlso included are the following nonvoting IEEE-SA Standards Board liaisons:Satish K. Aggarwal, NRC RepresentativeAlan H. Cookson, NIST RepresentativeLorraine PatscoIEEE Standards Progr

36、am Manager, Document DevelopmentMatthew CegliaIEEE Standards Program Manager, Technical Program DevelopmentRichard DeBlasioAlexander D. GelmanWilliam R. GoldbachArnold M. GreenspanJoanna N. GueninJulian Forster*Kenneth S. HanusWilliam B. HopfRichard H. HulettHermann KochJoseph L. Koepfinger*John D.

37、KulickDavid J. LawGlenn ParsonsRonald C. PetersenTom A. PrevostNarayanan RamachandranGreg RattaRobby RobsonAnne-Marie SahazizianVirginia C. SulzbergerMalcolm V. ThadenRichard L. TownsendHoward L. WolfmanCopyright 2007 IEEE. All rights reserved. viiContents Abstract . 1 4. Design tests. 1 4.4 Dielect

38、ric withstand tests. 1 4.8 Short-circuit current interrupting tests. 2 4.16 Design tests on pressurized components 4 5. Production tests 5 5.4 Gas receiver tests. 5 7. Standard methods for determining the values of a sinusoidal current wave and a power-frequency recovery voltage . 5 7.2 Power-freque

39、ncy recovery voltage 5 Annex A (informative) Records and reports of type tests for making, breaking, and short-time current performance 6 A.2 Information to be included in the reports 6 Copyright 2007 IEEE. All rights reserved. 1IEEE Standard Test Procedure for AC High-Voltage Circuit Breakers Rated

40、 on a Symmetrical Current Basis Corrigendum 1 NOTEThe editing instructions contained in this corrigendum define how to merge the material contained therein into the existing base standard and its amendments to form the comprehensive standard. The editing instructions are shown in bold italic. Four e

41、diting instructions are used: change, delete, insert, and replace. Change is used to make corrections in existing text or tables. The editing instruction specifies the location of the change and describes what is being changed by using strikethrough (to remove old material) and underscore (to add ne

42、w material). Delete removes existing material. Insert adds new material without disturbing the existing material. Insertions may require renumbering. If so, renumbering instructions are given in the editing instruction. Replace is used to make changes in figures or equations by removing the existing

43、 figure or equation and replacing it with a new one. Editorial notes will not be carried over into future editions because the changes will be incorporated into the base standard. Abstract Change the last sentence of the first paragraph as follows: This standard does not cover generator circuit brea

44、kers as these are covered in IEEE Std C37.013-1993 1997. 4. Design tests 4.4 Dielectric withstand tests 4.4.7 Switching impulse voltage withstand tests 4.4.7.2 Condition of circuit breaker to be tested Change the last sentence of the second paragraph as follows: The conductors may be terminated in s

45、pheres or rings that have a diameter whose dimension in meters does not exceed an equivalent numerical value that is equal to the circuit breaker rated maximum voltage, in kV, rms divided by 655. IEEE Std C37.09-1999/Cor 1-2007 IEEE Standard Test Procedure for AC High-Voltage Circuit Breakers Rated

46、on a Symmetrical Current Basis Corrigendum 1 Copyright 2007 IEEE. All rights reserved. 24.8 Short-circuit current interrupting tests 4.8.1 Test conditions 4.8.1.3 Current asymmetry Replace Equation (1) with the following equation as follows: Delete: The defining equation for these curves is %dc 100e

47、 (1) where /2XRf=or tt = contact parting time = time constant Insert: The defining equation for these curves is (/ )% 100tdc e= (1) where: t = contact parting time in seconds = time constant = /2XRLRf=in seconds with L = Inductance of the short circuit impedance at the fault location 2Xf=and R = Re

48、sistance of the short circuit impedance at the fault location. IEEE Std C37.09-1999/Cor 1-2007 IEEE Standard Test Procedure for AC High-Voltage Circuit Breakers Rated on a Symmetrical Current Basis Corrigendum 1 Copyright 2007 IEEE. All rights reserved. 34.8.1.6 Short-line fault test conditions Remo

49、ve Table 1 listed under this paragraph. This table should be included under 4.8.3 titled “Test duties“ which covers the tests and the definitions of the symbols used in this Table 1. (Subclause 4.8.1.6 covers only short-line fault test conditions and is not applicable to Table 1 which covers the series of test duties.) 4.8.1.7 Initial TRV test conditions Change the fourth sentence of the first paragraph of page 20 as follows: The peak line-side test volt