IEEE C37 302-2015 en Guide for Fault Current Limiter (FCL) Testing of FCLs Rated above 1000 V AC.pdf

1、 IEEE Guide for Fault Current Limiter (FCL) Testing of FCLs Rated above 1000 V AC Sponsored by the Switchgear Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA IEEE Power and Energy Society IEEE Std C37.302-2015 IEEE Std C37.302-2015 IEEE Guide for Fault Current Limiter (FCL) Testing of FCLs

2、Rated above 1000 V AC Sponsor Switchgear Committee of the IEEE Power and Energy Society Approved 5 December 2015 IEEE-SA Standards Board Abstract: The testing of fault current limiters (FCLs) operating on condition-based impedance increase for AC systems 1000 V and above is described in this guide.

3、Constant impedance series reactors and single fuses are not included in this guide. Keywords: asymmetrical short-circuit current, continuous current, electromagnetic compatibility, FCL testing, IEEE C37.302, insertion impedance, insulation resistance, inter-turns insulation, lightning impulse/BIL, l

4、ightning impulse voltage, loss measurement, partial discharge, peak withstand current, power frequency voltage withstand, recovery, short-circuit current limitation, short-time withstand current, temperature rise. The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, N

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34、Association Participants At the time this IEEE guide was completed, the AdsCom - FCL Testing Working Group had the following membership: Michael Steurer, Chair Frank Lambert, Vice Chair Ram Adapa Michael Andrus Simon Bird Curtis Birnbach Joachim Bock Andreas Brandt Landi Carfi Gilbert Carmona Tim Ch

35、iocchio Mark DAgostino Francisco DeLaRosa Prafulla Deo Patrick DiLillo Jerry Earl Ken Edwards Jim Houston Joanne Hu Swarn Kalsi John Kappenman Dvir Landwer Paul Leufkens Tim MacDonald Franco Moriconi Frank Muench Frank Mumford Raj Nayar Harsha Ravindra Isidor Sauers Christian Schacherer Gerald Schoo

36、nenberg Judith Schramm Mario Sciulli Tushar Shah David Syracuse Passinam Tatcho Alexander Usoskin Yoram Valent James van de Ligt Paul Williams Jan Zawadzki The Editorial Board of the AdsCom - FCL Testing Working Group had the following membership: Ram Adapa Michael Andrus Joachim Bock Andreas Brandt

37、 Gilbert Carmona Tim Chiocchio Francisco DeLaRosa Jerry Earl Frank Lambert Paul Leufkens Franco Moriconi Harsha Ravindra Christian Schacherer Judith Schramm Mario Sciulli Michael Steurer Passinam Tatcho James van de LigtThe following members of the individual balloting committee voted on this guide.

38、 Balloters may have voted for approval, disapproval, or abstention. Katrin Baeuml Robert Behl Andreas Brandt Ted Burse Eldridge Byron Thomas Callsen Paul Cardinal Suresh Channarasappa J. Arturo DelRio Carlo Donati Gary Donner Randall Dotson Edgar Dullni Jerry Earl Marcel Fortin Fredric Friend Frank

39、Gerleve Mietek Glinkowski Robert Goodin Edwin Goodwin Randall Groves Ajit Gwal David Harris Jeffrey Helzer Lee Herron Gary Heuston Werner Hoelzl John Kay Yuri Khersonsky Joseph L. Koepfinger Jim Kulchisky Marc Lacroix Chung-Yiu Lam Frank Lambert Michael Lauxman Roger Lawrence John Leach Albert Livsh

40、itz Homer Alan Mantooth Daleep Mohla Georges Montillet Arun Narang Michael Newman David Nichols T. W. Olsen Mirko Palazzo Christopher Petrola Michael Roberts Oleg Roizman Vincent Saporita Bartien Sayogo Thomas Schossig Devki Sharma Jerry Smith Michael Steurer Michael Swearingen Passinam Tatcho Eric

41、Udren James van de Ligt John Vergis Jane Verner Mark Waldron John Webb Larry Yonce vi Copyright 2016 IEEE. All rights reserved. vii Copyright 2016 IEEE. All rights reserved. When the IEEE-SA Standards Board approved this guide on 5 December 2015, it had the following membership: John D. Kulick, Chai

42、r Jon Walter Rosdahl, Vice Chair Richard H. Hulett, Past Chair Konstantinos Karachalios, Secretary Masayuki Ariyoshi Ted Burse Stephen Dukes Jean-Philippe Faure J. Travis Griffith Gary Hoffman Michael Janezic Joseph L. Koepfinger* David J. Law Hung Ling Andrew Myles T. W. Olsen Glenn Parsons Ronald

43、C. Petersen Annette D. Reilly Stephen J. Shellhammer Adrian P. Stephens Yatin Trivedi Philip Winston Don Wright Yu Yuan Daidi Zhong *Member Emeritus Introduction This introduction is not part of IEEE Std C37.302-2015, IEEE Guide for Fault Current Limiter (FCL) Testing of FCLs Rated above 1000 V AC.

44、Significant developments in the area of fault current limiters (FCLs) operating on the principle of condition-based impedance increase have resulted in products emerging on the market in the last decade. There are, however, no guidelines on how to test these new FCL technologies. Therefore, in June

45、2010 the IEEE Switchgear Committee established WG PC37.302 to develop such a guide. This Working Group was co-sponsored by the IEEE Power and Energy Society/Substations (PE/SUB) and the IEEE Power Electronics Society/Standards Committee (PEL/SC). This guide takes a technology-independent black-box a

46、pproach and intentionally avoids stating any performance criteria. It provides, however, a newly developed set of parameters (not values) to fully describe the behavior of any FCL for testing purposes. Overall, this guide has been written to inform the stakeholder community about all the aspects of

47、testing FCLs. viii Copyright 2016 IEEE. All rights reserved. Contents 1. Overview 1 1.1 Scope . 1 1.2 Purpose 2 2. Normative references 2 3. Definitions, acronyms, and abbreviations 3 3.1 General FCL definitions 3 3.2 Definitions related to voltages observed during fault current limitation . 4 3.3 D

48、efinitions related to prospective short-circuit currents 5 3.4 Definitions related to initiation of CCL transition . 5 3.5 Definitions related to currents without limitation by an FCL 6 3.6 Fault currents or over-currents with limitation by an FCL 6 3.7 FCL recovery processes and associated times .

49、7 4. FCL technical principles . 9 4.1 Type A FCLs 10 4.2 Type B FCLs 13 5. Sample specification parameters .16 5.1 Electrical performance 16 5.2 Rated fault current limitation voltage .18 5.3 Rated maximum prospective short-circuit current 18 5.4 Rated minimum prospective short-circuit current 18 5.5 Withstand current ratings in C mode 19 5.6 CCL Initiation criteria.19 5.7 Current ratings with FCL limitation .20 5.8 Insertion impedance 20 5.9 Physical and operational .21 5.10 Environmental 21 5.11 Safety 22 6. Design tests 22 6.1 Aspects of FCL behavior 22 6.2 Power frequency