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IEEE C37 41 CORR 1-2017 en Design Tests for High-Voltage ( 1000 V) Fuses and Accessories.pdf

1、IEEE Standard Design Tests for High-Voltage (1000 V) Fuses and Accessories Sponsored by the Switchgear Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA IEEE Power and Energy Society IEEE Std C37.41-2016/Cor 1-2017 (Corrigenda to IEEE Std C37.41-2016) IEEE Std C37.41-2016/Cor 1-2017 (Corrigen

2、da to IEEE Std C37.41-2016) IEEE Standard Design Tests for High-Voltage (1000 V) Fuses and Accessories Corrigenda 1 Sponsor Switchgear Committee of the IEEE Power and Energy Society Approved 6 December 2017 IEEE-SA Standards Board IEEE Std C37.41-2016/Cor 1-2017 IEEE Standard Design Tests for High-V

3、oltage (1000 V) Fuses and AccessoriesCorrigenda 1 2 Copyright 2018 IEEE. All rights reserved. Abstract: Corrigenda concerning required procedures for performing design tests for high- voltage fuses are specified. These design tests, are appropriate to expulsion fuses, and cover interrupting tests an

4、d fuses using polymeric insulators. Keywords: fuse accessories, fuse design tests, fuse disconnecting switches, fuse-enclosure package (FEP), high-voltage fuses, IEEE 37.41 The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2018 by The I

5、nstitute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 12 January 2018. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent fitness for a particular purpose; non-infringement; and quality, accuracy, effectiveness, currency, or com

6、pleteness of material. In addition, IEEE disclaims any and all conditions relating to: results; and workmanlike effort. IEEE standards documents are supplied “AS IS” and “WITH ALL FAULTS.” Use of an IEEE standard is wholly voluntary. The existence of an IEEE standard does not imply that there are no

7、 other ways to produce, test, measure, purchase, market, or provide other goods and services related to the scope of the IEEE standard. Furthermore, the viewpoint expressed at the time a standard is approved and issued is subject to change brought about through developments in the state of the art a

8、nd comments received from users of the standard. In publishing and making its standards available, IEEE is not suggesting or rendering professional or other services for, or on behalf of, any person or entity nor is IEEE undertaking to perform any duty owed by any other person or entity to another.

9、Any person utilizing any IEEE Standards document, should rely upon his or her own independent judgment in the exercise of reasonable care in any given circumstances or, as appropriate, seek the advice of a competent professional in determining the appropriateness of a given IEEE standard. IN NO EVEN

10、T SHALL IEEE BE LIABLE FOR ANY DIRECT, INDIRECT, INCIDENTAL, SPECIAL, EXEMPLARY, OR CONSEQUENTIAL DAMAGES (INCLUDING, BUT NOT LIMITED TO: PROCUREMENT OF SUBSTITUTE GOODS OR SERVICES; LOSS OF USE, DATA, OR PROFITS; OR BUSINESS INTERRUPTION) HOWEVER CAUSED AND ON ANY THEORY OF LIABILITY, WHETHER IN CO

11、NTRACT, STRICT LIABILITY, OR TORT (INCLUDING NEGLIGENCE OR OTHERWISE) ARISING IN ANY WAY OUT OF THE PUBLICATION, USE OF, OR RELIANCE UPON ANY STANDARD, EVEN IF ADVISED OF THE POSSIBILITY OF SUCH DAMAGE AND REGARDLESS OF WHETHER SUCH DAMAGE WAS FORESEEABLE. IEEE Std C37.41-2016/Cor 1-2017 IEEE Standa

12、rd Design Tests for High-Voltage (1000 V) Fuses and AccessoriesCorrigenda 1 4 Copyright 2018 IEEE. All rights reserved. Translations The IEEE consensus development process involves the review of documents in English only. In the event that an IEEE standard is translated, only the English version pub

13、lished by IEEE should be considered the approved IEEE standard. Official statements A statement, written or oral, that is not processed in accordance with the IEEE-SA Standards Board Operations Manual shall not be considered or inferred to be the official position of IEEE or any of its committees an

14、d shall not be considered to be, or be relied upon as, a formal position of IEEE. At lectures, symposia, seminars, or educational courses, an individual presenting information on IEEE standards shall make it clear that his or her views should be considered the personal views of that individual rathe

15、r than the formal position of IEEE. Comments on standards Comments for revision of IEEE Standards documents are welcome from any interested party, regardless of membership affiliation with IEEE. However, IEEE does not provide consulting information or advice pertaining to IEEE Standards documents. S

16、uggestions for changes in documents should be in the form of a proposed change of text, together with appropriate supporting comments. Since IEEE standards represent a consensus of concerned interests, it is important that any responses to comments and questions also receive the concurrence of a bal

17、ance of interests. For this reason, IEEE and the members of its societies and Standards Coordinating Committees are not able to provide an instant response to comments or questions except in those cases where the matter has previously been addressed. For the same reason, IEEE does not respond to int

18、erpretation requests. Any person who would like to participate in revisions to an IEEE standard is welcome to join the relevant IEEE working group. Comments on standards should be submitted to the following address: Secretary, IEEE-SA Standards Board 445 Hoes Lane Piscataway, NJ 08854 USA Laws and r

19、egulations Users of IEEE Standards documents should consult all applicable laws and regulations. Compliance with the provisions of any IEEE Standards document does not imply compliance to any applicable regulatory requirements. Implementers of the standard are responsible for observing or referring

20、to the applicable regulatory requirements. IEEE does not, by the publication of its standards, intend to urge action that is not in compliance with applicable laws, and these documents may not be construed as doing so. Copyrights IEEE draft and approved standards are copyrighted by IEEE under U.S. a

21、nd international copyright laws. They are made available by IEEE and are adopted for a wide variety of both public and private uses. These include both use, by reference, in laws and regulations, and use in private self-regulation, standardization, and the promotion of engineering practices and meth

22、ods. By making these documents available for use and adoption by public authorities and private users, IEEE does not waive any rights in copyright to the documents. IEEE Std C37.41-2016/Cor 1-2017 IEEE Standard Design Tests for High-Voltage (1000 V) Fuses and AccessoriesCorrigenda 1 5 Copyright 2018

23、 IEEE. All rights reserved. Photocopies Subject to payment of the appropriate fee, IEEE will grant users a limited, non-exclusive license to photocopy portions of any individual standard for company or organizational internal use or individual, non-commercial use only. To arrange for payment of lice

24、nsing fees, please contact Copyright Clearance Center, Customer Service, 222 Rosewood Drive, Danvers, MA 01923 USA; +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. Updating of IEEE

25、 Standards documents Users of IEEE Standards documents should be aware that these documents may be superseded at any time by the issuance of new editions or may be amended from time to time through the issuance of amendments, corrigenda, or errata. An official IEEE document at any point in time cons

26、ists of the current edition of the document together with any amendments, corrigenda, or errata then in effect. Every IEEE standard is subjected to review at least every ten years. When a document is more than ten years old and has not undergone a revision process, it is reasonable to conclude that

27、its contents, although still of some value, do not wholly reflect the present state of the art. Users are cautioned to check to determine that they have the latest edition of any IEEE standard. In order to determine whether a given document is the current edition and whether it has been amended thro

28、ugh the issuance of amendments, corrigenda, or errata, visit the IEEE-SA Website at http:/ieeexplore.ieee.org/ or contact IEEE at the address listed previously. For more information about the IEEE SA or IEEEs standards development process, visit the IEEE-SA Website at http:/standards.ieee.org. Errat

29、a Errata, if any, for all IEEE standards can be accessed on the IEEE-SA Website at the following URL: http:/standards.ieee.org/findstds/errata/index.html. Users are encouraged to check this URL for errata periodically. Patents Attention is called to the possibility that implementation of this standa

30、rd may require use of subject matter covered by patent rights. By publication of this standard, no position is taken by the IEEE with respect to the existence or validity of any patent rights in connection therewith. If a patent holder or patent applicant has filed a statement of assurance via an Ac

31、cepted Letter of Assurance, then the statement is listed on the IEEE-SA Website at http:/standards.ieee.org/about/sasb/patcom/patents.html. Letters of Assurance may indicate whether the Submitter is willing or unwilling to grant licenses under patent rights without compensation or under reasonable r

32、ates, with reasonable terms and conditions that are demonstrably free of any unfair discrimination to applicants desiring to obtain such licenses. Essential Patent Claims may exist for which a Letter of Assurance has not been received. The IEEE is not responsible for identifying Essential Patent Cla

33、ims for which a license may be required, for conducting inquiries into the legal validity or scope of Patents Claims, or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non

34、-discriminatory. Users of this standard are expressly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association.IEEE Std C37.41-2016/Cor 1

35、-2017 IEEE Standard Design Tests for High-Voltage (1000 V) Fuses and AccessoriesCorrigenda 1 6 Copyright 2018 IEEE. All rights reserved. Participants At the time this draft standard was submitted to the IEEE-SA Standards Board for approval, the Revision of Fuse Standards Working Group had the follow

36、ing membership: John G. Leach, Chair James Wenzel, Secretary/Vice Chair Glenn R. Borchardt Chris Borck Samuel Chang Sterlin Cochran Raymond C. Darden Anil Dhawan Rodolfo Elizondo Emily Goss Gary Haynes Blake Henard Frank C. Lambert Chris Lettow Bradley Lewis Alex Lizardo Jim R. Marek Pete Marzec Sea

37、n Moody Bobby Moorhead Chris Morton Timothy Royster Jon Spencer Tom Stefanski Dustin Sullivan Randy Ward Alan Yerges The following members of the individual balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention. Chris Ambrose Glenn Borchardt Je

38、ffrey Brogdon Demetrio Bucaneg Jr Thomas Callsen Paul Cardinal Michael Chirico Sterlin Cochran Jonathan Deverick Gary Donner Edgar Dullni Rodolfo Elizondo Sergio Flores David Gilmer Edwin Goodwin Randall Groves Gary Haynes Werner Hoelzl Yuri Khersonsky Jim Kulchisky Frank Lambert John Leach Bradley

39、Lewis Alex Lizardo Sean Moody Joe Nims T. W. Olsen Bansi Patel Timothy Robirds Thomas Rozek Bartien Sayogo Jerry Smith Jon Spencer Tom Stefanski Gary Stoedter David Tepen Mark Tostrud James Van De Ligt John Vergis Alan Yerges When the IEEE-SA Standards Board approved this standard on 6 December 2017

40、, it had the following membership: Jean-Philippe Faure, Chair Gary Hoffman, Vice Chair John D. Kulick, Past Chair Konstantinos Karachalios, Secretary Chuck Adams Masayuki Ariyoshi Ted Burse Stephen Dukes Doug Edwards *Member Emeritus J. Travis Griffith Michael Janezic Thomas Koshy Joseph L. Koepfinger* Kevin Lu Daleep Mohla Damir Novosel Ronald C. Petersen Annette D. Reilly Robby Robson

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