IEEE C57 12 31-2010 en Pole-Mounted Equipment-Enclosure Integrity《安装在电杆上的装置 壳体完整性》.pdf

1、g44g40g40g40g3g54g87g71g3g38g24g26g17g20g21g17g22g20g140g16g21g19g20g19g11g53g72g89g76g86g76g82g81g3g82g73g44g40g40g40g3g54g87g71g3g38g24g26g17g20g21g17g22g20g16g21g19g19g21g12g44g40g40g40g3g54g87g68g81g71g68g85g71g3g73g82g85g3g51g82g79g72g16g48g82g88g81g87g72g71g40g84g88g76g83g80g72g81g87g650g40g81

2、g70g79g82g86g88g85g72g3g44g81g87g72g74g85g76g87g92g44g40g40g40g3g51g82g90g72g85g3g9g3g40g81g72g85g74g92g3g54g82g70g76g72g87g92g3g54g83g82g81g86g82g85g72g71g3g69g92g3g87g75g72g55g85g68g81g86g73g82g85g80g72g85g86g3g38g82g80g80g76g87g87g72g72g3g44g40g40g40g22g3g51g68g85g78g3g36g89g72g81g88g72g3g49g72g9

3、0g3g60g82g85g78g15g3g49g60g3g20g19g19g20g25g16g24g28g28g26g15g3g56g54g36g3g3g21g19g3g54g72g83g87g72g80g69g72g85g3g21g19g20g19g38g24g26g17g20g21g17g22g20g55g48IEEE Std C57.12.31-2010 (Revision of IEEE Std C57.12.31-2002) IEEE Standard for Pole-Mounted EquipmentEnclosure Integrity Sponsor Transformers

4、 Committee of the IEEE Power +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. Introduction This introduction is not part of IEEE Std C57.12.31-2010, IEEE Standard for Pole-Mounted E

5、quipmentEnclosure Integrity. The Accredited Standards Committee on Transformers, Regulators, and Reactors, C57, has for a number of years been developing and correlating standards on these products. The data used in this work have been gathered from many sources, including the standards of the Insti

6、tute of Electrical and Electronics Engineers (IEEE) and the National Electrical Manufacturers Association (NEMA), reports of committees of the Edison Electric Institute (EEI), and others. This IEEE standard is a voluntary consensus standard. Its use becomes mandatory only when required by a duly con

7、stituted legal authority or when specified in a contractual relationship. To meet specialized needs and to allow innovation, specific changes are permissible when mutually determined by the user and the producer, provided such changes do not violate existing laws and are considered technically adequ

8、ate for the function intended. This standard was originally prepared by the Joint C57/C37 Working Group on Enclosures with Joseph Martin and then Robert C. Olen as chairmen. This group is now the Enclosure Integrity Working Group of the IEEE Transformers Committee. Notice to users Laws and regulatio

9、ns Users of these documents should consult all applicable laws and regulations. Compliance with the provisions of this standard does not imply compliance to any applicable regulatory requirements. Implementers of the standard are responsible for observing or referring to the applicable regulatory re

10、quirements. IEEE does not, by the publication of its standards, intend to urge action that is not in compliance with applicable laws, and these documents may not be construed as doing so. Copyrights This document is copyrighted by the IEEE. It is made available for a wide variety of both public and

11、private uses. These include both use, by reference, in laws and regulations, and use in private self-regulation, standardization, and the promotion of engineering practices and methods. By making this document available for use and adoption by public authorities and private users, the IEEE does not

12、waive any rights in copyright to this document. iv Copyright 2010 IEEE. All rights reserved. Updating of IEEE documents Users of IEEE standards should be aware that these documents may be superseded at any time by the issuance of new editions or may be amended from time to time through the issuance

13、of amendments, corrigenda, or errata. An official IEEE document at any point in time consists of the current edition of the document together with any amendments, corrigenda, or errata then in effect. In order to determine whether a given document is the current edition and whether it has been amend

14、ed through the issuance of amendments, corrigenda, or errata, visit the IEEE Standards Association web site at http:/ieeexplore.ieee.org/xpl/standards.jsp, or contact the IEEE at the address listed previously. For more information about the IEEE Standards Association or the IEEE standards developmen

15、t process, visit the IEEE-SA web site at http:/standards.ieee.org. Errata Errata, if any, for this and all other standards can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL for errata periodically. Interpreta

16、tions Current interpretations can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/interp/ index.html. Patents Attention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standar

17、d, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of Patents Claims or dete

18、rmining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this standard are expressly advised that determination of the validity of any patent rights, and th

19、e risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. v Copyright 2010 IEEE. All rights reserved. vi Copyright 2010 IEEE. All rights reserved. Participants At the time this standard was submitted to the I

20、EEE-SA Standards Board for approval, the Enclosure Integrity Working Group had the following membership: Robert C. Olen, Co-Chair Daniel H. Mulkey, Co-Chair Ignacio Ares Israel Barrientos-Torres Bikash Basu David Blew Paul Buchanan Thomas Callsen Joeseph Carulli Tommy Cooper John Crotty Kevin dela H

21、oussaye Charles Drexler Michael Faulkenberry Carlos Gaytan Ali Ghafourian Myron Gruber Said Hachichi Kenneth Hanus Michael Hardin Richard Hollingsworth Gael Kennedy Gary King Stan Linsenbardt Jerry Murphy Carl Niemann Tim Olson Dwight Parkinson Mahesh Sampat Stephen Shull Ed Smith Ron Stahara Giusep

22、pe Termini Alan Traut Donnie Trivitt Shelby Walters Alan Wilks William Wimmer Zuoqing Xu The following members of the individual balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention. Satish K. Aggarwal Peter Agliata Samuel H. Aguirre Steven Al

23、exanderson Chris Ambrose Robert Behl Steven Bezner Wallace Binder Thomas Blackburn Harvey Bowles Paul Buchanan Suresh Channarasappa Yunxiang Chen Kevin dela Houssaye Randall Dotson Charles Drexler Dana Dufield Edgar Dullni Gary Engmann Michael Faulkenberry Bruce Forsyth Marcel Fortin James Gardner J

24、alal Gohari Edwin Goodwin Randall Groves Said Hachichi Gary Heuston Werner Hoelzl George House Andrew Jones Gael Kennedy Gary King Joseph L. Koepfinger Jim Kulchisky Chung-Yiu Lam John Leach Deni Lee John W. Matthews Lee Matthews Steven Meiners Peter Meyer Georges Montillet Daniel H. Mulkey Michael

25、S. Newman Carl Niemann Robert C. Olen Tim Olson Donald Parker Bansi Patel Alvaro Portillo Michael Roberts Robert Robinson Charles Rogers Ken Romano John Rossetti Bartien Sayogo Stephen Shull Gil Shultz Hyeong Sim James Smith Jerry Smith Steve Snyder Ronald Stahara Gary Stoedter John Sullivan James S

26、wank Alan Traut John Vergis Waldemar Von Miller William H. Walter Alan Wilks William WimmerWhen the IEEE-SA Standards Board approved this standard on 17 June 2010, it had the following membership: Robert M. Grow, Chair Richard H. Hulett, Vice Chair Steve M. Mills, Past Chair Judith Gorman, Secretary

27、 Karen Bartleson Victor Berman Ted Burse Clint Chaplin Andy Drozd Alexander Gelman Jim Hughes Young Kyun Kim Joseph L. Koepfinger* John Kulick David J. Law Hung Ling Oleg Logvinov Ted Olsen Ronald C. Petersen Thomas Prevost Jon Walter Rosdahl Sam Sciacca Mike Seavey Curtis Siller Don Wright *Member

28、Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Satish K. Aggarwal, NRC Representative Richard DeBlasio, DOE Representative Michael Janezic, NIST Representative Michelle Turner IEEE Standards Program Manager, Document Development Mathew J. Ceglia IEEE Standards P

29、rogram Manager, Technical Program Development vii Copyright 2010 IEEE. All rights reserved. Contents 1. Overview 1 1.1 Scope . 1 1.2 Purpose 1 2. Normative references 2 3. Definitions 2 4. Enclosure design and coating system requirements . 3 4.1 Enclosure design requirementsObjective. 3 4.2 Substrat

30、e requirements. 4 4.3 Coating system requirements. 4 4.4 Coating system test specimens 4 4.5 Coating system performance requirements 5 5. General . 9 5.1 Shipment 9 5.2 Coating repair procedure . 9 Annex A (normative) Scab procedure 10 Annex B (informative) Bibliography 11 viii Copyright 2010 IEEE.

31、All rights reserved. IEEE Standard for Pole-Mounted EquipmentEnclosure Integrity IMPORTANT NOTICE: This standard is not intended to ensure safety, security, health, or environmental protection. Implementers of the standard are responsible for determining appropriate safety, security, environmental,

32、and health practices or regulatory requirements. This IEEE document is made available for use subject to important notices and legal disclaimers. These notices and disclaimers appear in all publications containing this document and may be found under the heading “Important Notice” or “Important Noti

33、ces and Disclaimers Concerning IEEE Documents.” They can also be obtained on request from IEEE or viewed at http:/standards.ieee.org/IPR/disclaimers.html. 1. Overview 1.1 Scope This standard covers conformance tests and requirements for the enclosure integrity of pole-mounted equipment containing ap

34、paratus energized in excess of 600 V, typically not accessible to the general public, such as but not limited to the following types of equipment: a) Pole-mounted distribution transformers b) Pole-mounted switches c) Pole-mounted regulators d) Pole-mounted metering equipment e) Pole-mounted recloser

35、s/sectionalizers f) Pole-mounted capacitors 1.2 Purpose The purpose of this standard is to describe the requirements for a comprehensive system for pole-mounted enclosures providing long service life with minimum maintenance. 1 Copyright 2010 IEEE. All rights reserved. IEEE Std C57.12.31-2010 IEEE S

36、tandard for Pole-Mounted EquipmentEnclosure Integrity 2 Copyright 2010 IEEE. All rights reserved. 2. Normative references The following referenced documents are indispensable for the application of this document (i.e., they must be understood and used, so each referenced document is cited in text an

37、d its relationship to this document is explained). For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments or corrigenda) applies. ASTM B117, Standard Practice for Operating Salt Spray (Fog) Apparatus.1ASTM

38、 D523, Standard Test Method for Specular Gloss. ASTM D660, Standard Test Method for Evaluating Degree of Checking of Exterior Paint. ASTM D661, Standard Test Method for Evaluating Degree of Cracking of Exterior Paints. ASTM D714, Standard Test Method of Evaluating Degree of Blistering of Paints. AST

39、M D1654-2005, Standard Test Method for Evaluation of Painted or Coated Specimens Subjected to Corrosive Environments. ASTM D2794, Standard Test Method for Resistance of Organic Coatings to the Effects of Rapid Deformation (Impact). ASTM D3170, Standard Test Method for Chipping Resistance of Coatings

40、. ASTM D3359, Standard Test Methods for Measuring Adhesion by Tape Test. ASTM D3363, Standard Test Method for Film Hardness by Pencil Test. ASTM D4060, Standard Test Method for Abrasion Resistance of Organic Coatings by the Taber Abraser. ASTM D4585, Standard Practice for Testing Water Resistance of

41、 Coatings Using Controlled Condensation. ASTM D4587, Standard Practice for Fluorescent UV-Condensation Exposures of Paint and Related Coatings. SAE J400, Test for Chip Resistance of Surface Coatings.23. Definitions For the purposes of this document, the following terms and definitions apply. The IEE

42、E Standards Dictionary: Glossary of Terms High Voltage, 34 500 GrdY/19 920 Volts and Below; Low Voltage, 2400/120 Volts; 167 kVA and Smaller.8B3 ANSI C57.12.22, American National Standard for TransformersPad-Mounted Compartmental-Type Self-Cooled, Three-Phase Distribution Transformers with High-Volt

43、age Bushings, 2500 kVA and Smaller: High Voltage, 34 500 GrdY /19 920 Volts and Below; Low Voltage, 480 Volts and Below. B4 ANSI C57.12.25, American National Standard Requirements for Pad-Mounted Compartmental-Type Self-Cooled Single-Phase Distribution Transformers with Separable Insulated High-Volt

44、age Connectors, High Voltage, 34 500 GrdY/19 920 volts and Below; Low Voltage, 240/120; 167 kVA and Smaller. B5 Bringas, J. E., and Wayman, M. L., The Metals Black Book, Ferrous Metals, 3rd ed. Edmonton, AB: CASTI Publishing Inc., 1998. B6 IEEE C57.12.10, IEEE Std C57.12.10, Transformers230 kV and B

45、elow, 8333/10 417 kVA Three Phase without Load Tap Changing; 100 000 kVA with Load Tap ChangingSafety Requirements.9,10B7 IEEE C57.12.20, IEEE Standard for Overhead-Type Distribution Transformers, 500 kVA and ormers: 167 kVA and A and eparable Insulated High-Voltage Connectors (34 500 GrdY/ 2.29, IE

46、EE Standard for Pad-Mounted EquipmentEnclosure Integrity for .30, IEEE Standard for Pole-Mounted EquipmentEnclosure Integrity for , 34.5 kV Nominal System Voltage and Below; Low Voltage, 15 kV Nominal System Voltage and Below. Smaller: High Voltage, 34 500 V and Below; Low Voltage, 7970/13 800Y V an

47、d Below. B8 IEEE Std C57.12.23, IEEE Standard for Submersible Single-Phase TransfSmaller; High Voltage 25 000 V and Below; Low Voltage 600 V and Below. B9 IEEE Std C57.12.24, IEEE Standard for Submersible, Three-Phase Transformers, 3750 kVSmaller: High Voltage, 34 500 GrdY/19 920 Volts and Below; Lo

48、w Voltage, 600 Volts and Below. B10 IEEE Std C57.12.26, IEEE Standard for Pad-Mounted, Compartmental-Type, Self-Cooled, Three-Phase Distribution Transformers for Use with S19 920 V and Below; 2500 kVA and Smaller). B11 IEEE Std C57.12.28, IEEE Standard for Pad-Mounted EquipmentEnclosure Integrity. B

49、12 IEEE Std C57.1Coastal Environments. B13 IEEE Std C57.12Coastal Environments. B14 IEEE Std C57.12.32, IEEE Standard for Submersible EquipmentEnclosure Integrity. B15 IEEE Std C57.12.34, IEEE Standard Requirements for Pad-Mounted, Compartmental-Type, Self-Cooled, Three-Phase Distribution Transformers, 5 MVA and Smaller; High Voltage7The NESC is available from the Institute of Electrical and Electronics Engineers, 445 Hoes Lane, Piscataway, NJ 08854, USA (http:/standards.ieee.org). 8ANSI publications are available from the Cu