1、IEEE Std C57.13.5-2009(Revision ofIEEE Std C57.13.5-2003) IEEE Standard for Performance andTest Requirements for InstrumentTransformers of a Nominal SystemVoltage of 115 kV and AboveIEEE3 Park Avenue New York, NY 10016-5997, USA30 December 2009 Power +1 978 750 8400. Permission to photocopy portions
2、 of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. iv Copyright 2009 IEEE. All rights reserved. Introduction This introduction is not part of IEEE Std C57.13.5-2009, IEEE Standard for Performance and Test Requirements for Instrument
3、 Transformers of a Nominal System Voltage of 115 kV and Above. The mission of the IEEE PC57.13.5 Working Group is to develop a comprehensive set of performance and test requirements for instrument transformers of a nominal system voltage of 115 kV and above. The objective is to improve the performan
4、ce and safety of the instrument transformers in response to the concern indicated in the publication EPRI Workshop on Failed High Voltage Instrument Transformers, held in September 1990. The first edition was published in 2003. The main changes introduced in this revision are: Update of references A
5、ddition of temperature rise limits of terminals Additional requirements concerning the use of non-corrosive oil Revision of mechanical requirements Addition of a new annex related to current transformers used for the detection of unbalance current of capacitor banks Addition of a new annex related t
6、o current transformers having transient performance requirements Addition of a new informative annex giving additional information regarding the Electrical endurance test Suggestions for improvement gained in the use of this standard will be welcome. They should be sent to the IEEE Standards Departm
7、ent. Notice to users Laws and regulations Users of these documents should consult all applicable laws and regulations. Compliance with the provisions of this standard does not imply compliance to any applicable regulatory requirements. Implementers of the standard are responsible for observing or re
8、ferring to the applicable regulatory requirements. IEEE does not, by the publication of its standards, intend to urge action that is not in compliance with applicable laws, and these documents may not be construed as doing so. Copyrights This document is copyrighted by the IEEE. It is made available
9、 for a wide variety of both public and private uses. These include both use, by reference, in laws and regulations, and use in private self-regulation, standardization, and the promotion of engineering practices and methods. By making this document available for use and adoption by public authoritie
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11、rom time to time through the issuance of amendments, corrigenda, or errata. An official IEEE document at any point in time consists of the current edition of the document together with any amendments, corrigenda, or errata then in effect. In order to determine whether a given document is the current
12、 edition and whether it has been amended through the issuance of amendments, corrigenda, or errata, visit the IEEE Standards Association web site at http:/ieeexplore.ieee.org/xpl/standards.jsp, or contact the IEEE at the address listed previously. For more information about the IEEE Standards Associ
13、ation or the IEEE standards development process, visit the IEEE-SA web site at http:/standards.ieee.org. Errata Errata, if any, for this and all other standards can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this U
14、RL for errata periodically. Interpretations Current interpretations can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/interp/ index.html. Patents Attention is called to the possibility that implementation of this standard may require use of subject matter covered by patent
15、rights. By publication of this standard, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal valid
16、ity or scope of Patents Claims or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this standard are expressly advised that determination of the
17、 validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. Participants At the time this standard was submitted for sponsor ballot, the IEEE PC 57.13.5 Working Group had t
18、he following membership: Ross McTaggart , Co-Chair Pierre Riffon, Co-Chair Peter Balma Fred Elliott Joao Fernandes Marcel Fortin Eduardo Garcia Vicente Garcia-Colon Antony Jonnatti Vladimir M. Khalin Christopher Ten Haagen Joe Ma Bruce Magruder Paul Millward Thomas Nelson James E. Smith Loren B. Wag
19、enaar Peter Zhaovi Copyright 2009 IEEE. All rights reserved. The following members of the individual balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention. William J. Ackerman Steven Alexanderson Gary Arntson Ali Al Awazi Radoslav Barac G. Bart
20、ok David Bassett Philip Beaumont Kenneth Behrendt Gabriel Benmouyal Steven Bezner Wallace Binder Kenneth Birt Oscar Bolado Chris Brooks Gustavo Brunello John Burger William Byrd Hyder Do Carmo Arvind K. Chaudhary He Chun Stephen Conrad James Cornelison Luis Coronado Randall Crellin Kevin Donahoe Gar
21、y L. Donner Michael Dood Randall Dotson Neal Dowling Donald Dunn Ahmed Elneweihi Gary Engmann Dominick Fontana Fredric Friend Jeffrey Gilbert Jalal Gohari James Graham Stephen Grier Randall Groves Ajit Gwal R. Haas Jeffrey Hauber Roger Hedding Hamidreza Heidarisafa Charles Henville Jerry Hohn David
22、Horvath James Huddleston, III Gerald Johnson James Jones Bogdan Kasztenny Tanuj Khandelwal Yuri Khersonsky James Kinney Joseph L. Koepfinger Boris Kogan Ljubomir Kojovic David W. Krause Jim Kulchisky Saumen Kundu Chung-Yiu Lam Raluca Lascu Albert Livshitz Federico Lopez G. Luri Bruce Mackie Vahid Ma
23、dani Omar Mazzoni Walter Mccannon Michael Mcdonald David Mcginn Gary Michel Wade Midkiff Dean Miller Brian Mugalian Randolph Mullikin Jerry Murphy Pratap Mysore Bradley Nelson Rhonda Netzel Michael S. Newman Joe Nims Gary Nissen James M. OBrien Alexandre Parisot Russell Patterson Robert Pettigrew Br
24、uce Pickett Ryland Revelle Michael Roberts Charles Rogers Steven Sano Bartien Sayogo Thomas Schossig Gregory Sessler Donald Sevcik Lubomir Sevov Gil Shultz Tarlochan Sidhu Veselin Skendzic Douglas Smith James E. Smith Jerry Smith Kevin Stephan Gary Stoedter Allan St Peter Richard Taylor John Tengdin
25、 Damien Tholomier Michael Thompson Demetrios Tziouvaras Joe Uchiyama Eric Udren John Vergis Ilia Voloh Jialong Wang D. Weers Roger Whittaker Thomas Wiedman Richard Young Luis Zambrano Karl Zimmermanvii Copyright 2009 IEEE. All rights reserved. When the IEEE-SA Standards Board approved this standard
26、on 11 September 2009, it had the following membership: Robert M. Grow, Chair Thomas Prevost, Vice Chair Steve M. Mills, Past Chair Judith Gorman, Secretary John Barr Karen Bartleson Victor Berman Ted Burse Richard DeBlasio Andy Drozd Mark Epstein Alexander Gelman Jim Hughes Richard H. Hulett Young K
27、yun Kim Joseph L. Koepfinger* John Kulick David J. Law Ted Olsen Glenn Parsons Ronald C. Petersen Narayanan Ramachandran Jon Walter Rosdahl Sam Sciacca *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Howard L. Wolfman, TAB Representative Michael Janezic,
28、NIST Representative Satish K. Aggarwal, NRC Representative Michelle Turner IEEE Standards Program Manager, Document Development Matthew Ceglia IEEE Standards Program Manager, Technical Program Development viii Copyright 2009 IEEE. All rights reserved. Contents 1. Overview 1 1.1 Scope . 1 1.1 Purpose
29、 1 2. Normative references 2 3. Definitions 2 4. General . 3 4.1 Insulation requirements . 3 4.2 Mineral oil requirements 8 4.3 Requirements for accuracy and accuracy calibration systems. 8 4.4 Mechanical performance requirements 9 4.5 Thermal performance requirements. 11 4.6 Ground shield requireme
30、nts. 11 4.7 Dissolved gas and water content requirements for new oil-immersed transformers 11 4.8 Endurance capability for fast high voltage transient 12 4.9 Performance of internal arc protection 12 4.10 Identification of test sample in the type test report 12 4.11 Secondary short-circuit capabilit
31、y for voltage transformers 12 5. Test conditions . 12 6. Classification of test . 13 6.1 Routine tests and test sequences 13 6.2 Type tests and test sequences 16 6.3 Special tests . 19 7. Routine test procedures (applicable to instrument transformers) . 19 7.1 Verification of terminal markings and p
32、olarity 19 7.2 Capacitance and dissipation factor test 19 7.3 Applied voltage test on secondary windings . 20 7.4 Insulation resistance test on windings . 20 7.5 Lightning impulse voltage test on the primary winding 20 7.6 Power frequency voltage withstand test 21 7.7 Partial discharge test 21 7.8 D
33、issolved gas and water content analysis for oil-immersed transformers (of a nominal system voltage of 345 kV and above) 22 7.9 Sealing test. 22 7.10 Ground shield check 23 7.11 Tests on the mineral oil 23 8. Routine test procedures (applicable to current transformers) . 23 8.1 Inter-turn over-voltag
34、e test 23 8.2 Accuracy test for the metering rated current transformers. 24 8.3 Resistance measurement of relaying rated secondary windings 25 8.4 Performance characteristics of relaying rated current transformers. 25 9. Routine test procedures (applicable to voltage transformers). 26 9.1 Applied vo
35、ltage test on the neutral terminal 26 9.2 Accuracy test . 26 ix Copyright 2009 IEEE. All rights reserved. 9.3 Excitation characteristics with respect to rated voltage factor. 26 9.4 Resistance measurement of windings 27 10. Type test procedures (applicable to instrument transformers) 27 10.1 Dissolv
36、ed gas and water content anaylsis 27 10.2 Mechanical test 27 10.3 Lightning impulse voltage test on the primary winding 28 10.4 Switching impulse voltage test on the primary windingwet 29 10.5 External radio influence voltage (RIV) test . 29 10.6 Power frequency voltage withstand test wet 30 10.7 Po
37、wer frequency voltage withstand and partial discharge testdry . 30 10.8 Temperature rise test 31 10.9 Short-time mechanical and thermal rating test 32 10.10 Accuracy performance test 34 10.11 Creepage distance measurement 34 10.12 Sealing system test for gas-filled instrument transformers 35 11. Typ
38、e test procedure (applicable to current transformers) . 35 11.1 Secondary open-circuit voltage withstand test 35 12. Special test procedures . 36 12.1 Endurance chopped wave test 36 12.2 Internal arc test 36 12.3 Seismic qualification . 37 13. Identification of test sample in the type test report. 3
39、8 13.1 Document package related to transformer type . 38 13.2 Requirements of the document package 38 Annex A (normative) Test code . 40 Annex B (informative) Dielectric test performed at an altitude of 1000 m or less for instrument transformers designed for installation at altitudes greater than 10
40、00 m . 44 Annex C (informative) Dielectric tests, oil sampling, and other related measurements in the field. 46 Annex D (informative) Internal arc protection for instrument transformers 47 Annex E (normative) Validity of type test reports and guidance for reviewing the design comparison report for t
41、he modified design 48 Annex F (informative) Rated voltage factor. 50 Annex G (normative) Current transformers used for the detection of unbalance current of capacitor banks. 51 Annex H (informative) Current transformers having transient performance requirements 67 Annex I (informative) Electrical en
42、durance test, explanatory note 68 Annex J (informative) Bibliography. 69 1 Copyright 2009 IEEE. All rights reserved. IEEE Standard for Performance and Test Requirements for Instrument Transformers of a Nominal System Voltage of 115 kV and Above IMPORTANT NOTICE: This standard is not intended to ensu
43、re safety, security, health, or environmental protection in all circumstances. Implementers of the standard are responsible for determining appropriate safety, security, environmental, and health practices or regulatory requirements. This IEEE document is made available for use subject to important
44、notices and legal disclaimers. These notices and disclaimers appear in all publications containing this document and may be found under the heading “Important Notice” or “Important Notices and Disclaimers Concerning IEEE Documents.” They can also be obtained on request from IEEE or viewed at http:/s
45、tandards.ieee.org/IPR/ disclaimers.html 1. Overview 1.1 Scope This standard applies to single-phase instrument transformers of a nominal system voltage of 115 kV and above with capacitive insulation system for line-to-ground connection and for both indoor and outdoor application. This standard is in
46、tended for use as a supplement to IEEE Std C57.13-20081and as a basis for performance and safety of equipment. It also describes test sequences, criteria, methods and documentation for the test. 1.1 Purpose The purpose of this standard is to supplement the IEEE Std C57.13-2008, with specific require
47、ments to single-phase instrument transformers of a nominal system voltage of 115 kV and above, with capacitive insulation system for line-to-ground connection and for both indoor and outdoor applications. 1Information on reference can be found in Clause 2. IEEE Std C57.13.5-2009 IEEE Standard for Pe
48、rformance and Test Requirements for Intrument Transformers of a Nominal System Voltage of 115 kV and Above 2 Copyright 2009 IEEE. All rights reserved. 2. Normative references The following referenced documents are indispensable for the application of this document (i.e., they must be understood and
49、used, so each referenced document is cited in text and its relationship to this document is explained). For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments or corrigenda) applies. ASTM D1275-06, Standard Test Method for Corrosive Sulfur in Electrical Insulating Oils.2IEC 60270: 2000, High-Voltage Test Techniques Partial discharge measurements.3IEEE Std 4-1995, IEEE Standard Techniques for High Voltage Testing.4IEEE Std 693-2005, IEEE Recommended Practice
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