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IEEE C57 130-2015 en Guide for the Use of Dissolved Gas Analysis Applied to Factory Temperature Rise Tests for the Evaluation of Mineral Oil-Immersed Transforme.pdf

1、IEEE Guide for the Use of Dissolved Gas Analysis Applied to Factory Temperature Rise Tests for the Evaluation of Mineral Oil-Immersed Transformers and ReactorsIEEE Std C57.130-2015IEEE Power and Energy SocietySponsored by the Transformers CommitteeIEEE3 Park AvenueNew York, NY 10016-5997USAIEEE Std

2、C57.130-2015IEEE Guide for the Use of Dissolved Gas Analysis Applied to Factory Temperature Rise Tests for the Evaluation of Mineral Oil-Immersed Transformers and ReactorsSponsorTransformers Committeeof theIEEE Power and Energy SocietyApproved 26 October 2015IEEE-SA Standards BoardAbstract: Applicat

3、ion of dissolved gas analysis (DGA) techniques on oil-immersed transformers and reactors applied during factory temperature rise tests is addressed in this guide. It contains recommended procedures for sampling, recommended actions based on interpretation of results, and a bibliography of related li

4、terature.Keywords: dissolved gas analysis, factory temperature rise tests, IEEE C57.130The Institute of Electrical and Electronics Engineers, Inc.3 Park Avenue, New York, NY 10016-5997, USACopyright 2016 by The Institute of Electrical and Electronics Engineers, Inc.All rights reserved. Published 19

5、February 2016. Printed in the United States of America.IEEE is a registered trademark in the U.S. Patent fi tness for a particular purpose; non-infringement; and quality, accuracy, effectiveness, currency, or completeness of material. In addition, IEEE disclaims any and all conditions relating to: r

6、esults; and workmanlike effort. IEEE standards documents are supplied “AS IS” and “WITH ALL FAULTS.”Use of an IEEE standard is wholly voluntary. The existence of an IEEE standard does not imply that there are no other ways to produce, test, measure, purchase, market, or provide other goods and servi

7、ces related to the scope of the IEEE standard. Furthermore, the viewpoint expressed at the time a standard is approved and issued is subject to change brought about through developments in the state of the art and comments received from users of the standard.In publishing and making its standards av

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14、 the personal views of that individual rather than the formal position of IEEE.Comments on standardsComments for revision of IEEE Standards documents are welcome from any interested party, regardless of membership affi liation with IEEE. However, IEEE does not provide consulting information or advic

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27、act IEEE at the address listed previously. For more information about the IEEE SA or IEEEs standards development process, visit the IEEE-SA Website at http:/standards.ieee.org.ErrataErrata, if any, for all IEEE standards can be accessed on the IEEE-SA Website at the following URL: http:/standards.ie

28、ee.org/fi ndstds/errata/index.html. Users are encouraged to check this URL for errata periodically.PatentsAttention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken by t

29、he IEEE with respect to the existence or validity of any patent rights in connection therewith. If a patent holder or patent applicant has fi led a statement of assurance via an Accepted Letter of Assurance, then the statement is listed on the IEEE-SA Website at http:/standards.ieee.org/about/sasb/p

30、atcom/patents.html. Letters of Assurance may in-dicate whether the Submitter is willing or unwilling to grant licenses under patent rights without compensa-tion or under reasonable rates, with reasonable terms and conditions that are demonstrably free of any unfair discrimination to applicants desir

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32、or determining whether any licensing terms or condi-tions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this standard are expressly advised that determination of the validity of any patent rights

33、 and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association.6Copyright 2016 IEEE. All rights reserved.ParticipantsAt the time this IEEE guide was completed, the Insulating Fluids-DGA During Thermal Test

34、Working Group had the following membership:James A. Thompson, ChairTom Prevost, Vice ChairJuan Castellanos, SecretaryScott DigbyWilliam DarovnyVijayan KrishnamurphyMark McNallySue McNellyDon PlattsSubhas SarkarJin SimRyan ThompsonMel WrightThe following members of the individual balloting committee

35、voted on this guide. Balloters may have voted for approval, disapproval, or abstention.Stephen AntoszJavier ArteagaRoberto AsanoPeter BalmaThomas BarnesChristopher BaumgartnerBarry BeasterW.J. (Bill) BergmanWallace BinderThomas BlackburnDaniel BlaydonW. BoettgerChris BrooksPaul BuchananPaul Cardinal

36、Juan CastellanosDonald CherryC. Clair ClaiborneJohn CrouseWillaim DarovnyAlan DarwinDieter DohnalGary DonnerDonald DunnFred ElliottJorge Fernandez DaherJoseph FoldiBruce ForsythGeorge FrimpongDoaa GalalRobert GanserFrank GerleveAli GhafourianEdwin GoodwinJames GrahamWilliam GriesackerRandall GrovesB

37、al GuptaJohn HarleyRoger HayesJoshua HerzPhilip HopkinsonRowland JamesJohn JohnLaszlo KadarJohn KayGael KennedySheldon KennedyJames KinneyNeil KranichJim KulchiskySaumen KunduJohn LackeyChung-Yiu LamJeffrey LaMarcaThomas La RoseThomas LundquistRichard MarekJ. Dennis MarlowLee MatthewsJames MciverMar

38、k McnallySusan McnellyCharles Mc ShaneJoseph MelansonDaleep MohlaDaniel MulkeyJerry MurphyR. MusilArthur NeubauerJoe NimsLorraine PaddenBansi PatelPaulette Payne PowellBrian PennyChristopher PetrolaAlvaro PortilloBertrand PoulinTom PrevostTimothy Charles RaymondJean-Christophe RiboudJohn RoachMichae

39、l RobertsOleg RoizmanJohn RossettiBartien SayogoStephen SchroederEwald SchweigerHyeong SimCharles SimmonsJerry SmithSteve SnyderBrian SparlingDavid StankesMalcolm ThadenJames ThompsonRobert ThompsonMel GeorgeJohn VergisLoren WagenaarDavid WallaceDavid WallachKenneth WhiteJennifer Yu7Copyright 2016 I

40、EEE. All rights reserved.When the IEEE-SA Standards Board approved this guide on 26 October 2015, it had the following membership:John D. Kulick, ChairJon Walter Rosdahl, Vice ChairRichard H. Hulett, Past ChairKonstantinos Karachalios, SecretaryMasayuki AriyoshiTed BurseStephen DukesJean-Philippe Fa

41、ureJ. Travis Griffi thGary HoffmanMichael JanezicJoseph L. Koepfi nger*David J. LawHung LingAndrew MylesT. W. OlsenGlenn ParsonsRonald C. PetersenAnnette D. ReillyStephen J. ShellhammerAdrian P. StephensYatin TrivediPhillip WinstonDon WrightYu YuanDaidi Zhong*Member Emeritus8Copyright 2016 IEEE. All

42、 rights reserved.IntroductionThis introduction is not part of IEEE Std C57.130-2015, IEEE Guide for the Use of Dissolved Gas Analysis Applied to Factory Temperature Rise Tests for the Evaluation of Mineral Oil-Immersed Transformers and Reactors.The evaluation of gases generated in oil-immersed trans

43、formers and reactors during factory temperature rise tests is a useful method of detecting thermal problems. These thermal problems may be due to abnormal leakage fl ux heating in the windings and leads, the magnetic circuit, or in structural elements. They may also be caused by inadequate heat diss

44、ipation or poor oil circulation within the core or windings, imperfect connections or contacts, excessive paper insulation, or clogged or inadequate cooling ducts.This guide was written with the understanding that, as additional experience is gained; periodic reviews will be made to ensure that reco

45、mmendations in this guide continue to be based on the most up-to- date information. The factory temperature rise test (formerly known as the heat run test) is performed in accor-dance with IEEE Std C57.12.90 to determine whether the temperature rises of the windings, oil, and other components meet d

46、esign values. When testing power transformers, it is normally performed by the short circuit method; therefore, the losses and corresponding heating produced by core fl ux are minimal and the superposition of core and leakage fl ux during actual loading are not accurately represented by this test. O

47、n the other hand, during much of this test, a transformer is operated at higher-than-rated current to simulate core losses. During factory temperature rise tests, only the more serious design or manufacturing defects become apparent and less severe conditions, which could lead to future problems in

48、service, can escape detection.This document is, in general, an advisory document that provides guidance on the subject of DGA as it applies to the factory temperature rise test. The ultimate decision on the evaluation of acceptable levels of gas generated during the temperature rise test should be m

49、ade by the user and manufacturer at the time of contract negotiation. This could include for instance reports of the factory DGA test data to be provided to the user upon request.9Copyright 2016 IEEE. All rights reserved.Contents1. Overview . 101.1 Scope 101.2 Purpose . 102. Normative references 113. Procedures for obtaining samples of oil from the transformer or reactor for laboratory analysis 114. Laboratory methods for analyzing the gas extracted from the oil 115. Description 126. Temperature rise test interval and oil sampling . 136.1 Oil sampling before temperature ris

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