IEEE C57 157-2015 en Guide for Conducting Functional Life Tests on Switch Contacts Used in Insulating Liquid CImmersed Transformers.pdf

1、 IEEE Guide for Conducting Functional Life Tests on Switch Contacts Used in Insulating Liquid-Immersed Transformers Sponsored by the Transformers Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA IEEE Power and Energy Society IEEE Std C57.157-2015IEEE Std C57.157-2015 IEEE Guide for Conductin

2、g Functional Life Tests on Switch Contacts Used in Insulating LiquidImmersed Transformers Sponsor Transformers Committee of the IEEE Power and Energy Society Approved 26 October 2015 IEEE-SA Standards Board Abstract: This guide is intended for use in establishing a methodology to evaluate expected l

3、ong-term performance of infrequently operated switch contacts used within insulating liquidimmersed transformers. These switch contacts are typically found in de-energized tapchangers, dual voltage switches, reversing switches, on-load tapchangers, and step-voltage regulators, but the test might pos

4、sibly be used to evaluate any contact that is used in insulating liquids with similar operating characteristics and within similar environments. Keywords: accelerated life simulation, Arrhenius relationship, contact aging phenomenon, IEEE C57.157, supertemperature The Institute of Electrical and Ele

5、ctronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2015 by The Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 20 November 2015. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent fitness for a

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34、ation may be obtained from the IEEE Standards Association. Copyright 2015 IEEE. All rights reserved. vi Participants At the time this IEEE guide was completed, the Functional Life Tests on Switch Contacts PC57.157 Working Group had the following membership: Philip Hopkinson, Chair Adam Sewell, Vice

35、Chair/Secretary James Campbell Craig Colopy Larry Dix Dieter Dohnal Eduardo Garcia Jeffrey Golarz Jose Izquierdo Marion Jaroszewski John K. John Axel Kraemer Bernhard Kurth Charles Patrick McShane Shawn Nunn Amitabh Sarkar Daniel Sauer Jeremy Sewell Hemchandra Shertukde Mahendrakumar Soni Bengt-Olof

36、 Stenestam Joe Watson Baitun YangThe following members of the individual balloting committee voted on this guide. Balloters may have voted for approval, disapproval, or abstention. Jim Antweiler Roberto Asano Donald Ayers Barry Beaster Wallace Binder William Bloethe William Boettger Paul Cardinal Cr

37、aig Colopy John Crouse Willaim Darovny Dieter Dohnal Gary Donner Randall Dotson Marcel Fortin Fredric Friend David Gilmer William Griesacker Randall Groves Jeffrey Helzer Philip Hopkinson Richard Jackson Laszlo Kadar Sheldon Kennedy Yuri Khersonsky Axel Kraemer Jim Kulchisky Chung-Yiu Lam Richard Ma

38、rek J. Dennis Marlow Lee Matthews Charles Patrick McShane Daniel Mulkey Jerry Murphy Ryan Musgrove K. R. M. Nair Kris K. Neild Joe Nims Bansi Patel Branimir Petosic Donald Platts Alvaro Portillo Lewis Powell Iulian Profir Jean-Christophe Riboud Michael Roberts Thomas Rozek Daniel Sauer Bartien Sayog

39、o Stephen Schroeder Ewald Schweiger Adam Sewell Jeremy Sewell Hyeong Sim Jeremy Smith Jerry Smith David Tepen Juan Thierry Roger Verdolin John Vergis Jane Verner Joe Watson Kipp Yule Copyright 2015 IEEE. All rights reserved. vii When the IEEE-SA Standards Board approved this guide on 26 October 2015

40、, it had the following membership: John D. Kulick, Chair Jon Walter Rosdahl, Vice Chair Richard H. Hulett, Past Chair Konstantinos Karachalios, Secretary Masayuki Ariyoshi Ted Burse Stephen Dukes Jean-Philippe Faure J. Travis Griffith Gary Hoffman Michael Janezic Joseph L. Koepfinger* David J. Law H

41、ung Ling Andrew Myles T. W. Olsen Glenn Parsons Ronald C. Petersen Annette D. Reilly Stephen J. Shellhammer Adrian P. Stephens Yatin Trivedi Philip Winston Don Wright Yu Yuan Daidi Zhong *Member Emeritus Copyright 2015 IEEE. All rights reserved. viii Introduction This introduction is not part of IEE

42、E Std C57.157-2015, IEEE Guide for Conducting Functional Life Tests on Switch Contacts Used in Insulating LiquidImmersed Transformers. This guide outlines a test method to simulate long-term life (minimum 30 years) of a de-energized tapchanger in a period of 30 test days by using a combination of el

43、evated liquid temperatures in conjunction with cyclically elevated load currents. The test is performed on specific switch bodies with specific contact materials, geometries, contact pressures in liquid baths so as to closely parallel conditions found in actual operation. The variable that provides

44、the accelerated life simulation is the switch contact temperatures. See Annex B for more background information. Copyright 2015 IEEE. All rights reserved. ix Contents 1. Overview 1 1.1 Scope . 1 1.2 Purpose 1 2. Normative references 2 3. Definitions 2 4. Background 2 4.1 Basis of 10 C rule and appli

45、cation of Arrhenius relationship. 3 4.2 Incorporation in test of IEEE transformer loading guide . 3 4.3 Incorporation in test of typical daily load cycle . 3 4.4 Derivation of desired aging temperatures 4 4.5 Application of specific switch characteristics to test . 5 5. General test setup . 5 5.1 Sa

46、fety considerations . 5 5.2 Items for test 5 5.3 Monitoring locations 6 6. Test procedure 9 7. Test data recording . 9 8. Pass/fail criteria .10 Annex A (informative) Bibliography 11 Annex B (informative) Contact aging phenomenon in insulating liquid .12 Copyright 2015 IEEE. All rights reserved. 1 I

47、EEE Guide for Conducting Functional Life Tests on Switch Contacts Used in Insulating LiquidImmersed Transformers IMPORTANT NOTICE: IEEE Standards documents are not intended to ensure safety, security, health, or environmental protection, or ensure against interference with or from other devices or n

48、etworks. Implementers of IEEE Standards documents are responsible for determining and complying with all appropriate safety, security, environmental, health, and interference protection practices and all applicable laws and regulations. This IEEE document is made available for use subject to importa

49、nt notices and legal disclaimers. These notices and disclaimers appear in all publications containing this document and may be found under the heading “Important Notice” or “Important Notices and Disclaimers Concerning IEEE Documents.” They can also be obtained on request from IEEE or viewed at http:/standards.ieee.org/IPR/disclaimers.html. 1. Overview 1.1 Scope This guide is intended for use in establishing a methodology to evaluate expected long-term performance of infrequently operated switch contacts used within insulating liquidimmersed transformers. These s