1、IEEE Std C57.21-2008(Revision of IEEE Std C57.21-1990) IEEE Standard Requirements,Terminology, and Test Code forShunt Reactors Rated Over 500 kVAIEEE3 Park Avenue New York, NY 10016-5997, USA1 August 2008IEEE Power Engineering SocietySponsored by theTransformers CommitteeC57.21TMIEEE Std C57.21-2008
2、 (Revision of IEEE Std C57.21-1990) IEEE Standard Requirements, Terminology, and Test Code for Shunt Reactors Rated Over 500 kVA Sponsor Transformers Committee of the IEEE Power Engineering Society Approved 27 March 2008 IEEE-SA Standards Board Abstract: All oil-immersed or dry-type, single-phase or
3、 three-phase, outdoor or indoor shunt reactors rated over 500 kVA are covered. Terminology and general requirements are stated, and the basis for rating shunt reactors is set forth. Routine, design, and other tests are described, and methods for performing them are given. Losses and impedance, tempe
4、rature rise, dielectric tests, and insulation levels are covered. Construction requirements for oil-immersed reactors and construction and installation requirements for dry-type reactors are presented. This standard also covers thyristor-controlled shunt reactors used in static var compensators. Key
5、words: dielectric tests, dry-type shunt reactor, oil-immersed shunt reactor The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2008 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 1 August 20
6、08. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. iv Copyright 2008 IEEE. All rights re
7、served. Introduction This introduction is not part of IEEE Std C57.21-2008, IEEE Standard Requirements, Terminology, and Test Code for Shunt Reactors Rated Over 500 kVA. IEEE Std C57.21 was first published in 1971. It was subsequently revised in 1981 and 1990 and reaffirmed in 1995 and 2004. The cur
8、rent revision process has focused on the following: a) Annex A (normative) has been added to cover the specific requirements for dry-type air-core thyristor-controlled shunt reactors, which are an important component of static var compensator systems. Specific clauses, subclauses, tables, etc., in t
9、he main body of IEEE Std C57.21-2008 are referenced regarding specification and test code. Other aspects of specification and test code are covered in Annex A. b) Annex B (informative) has been added to provide background information on dielectric stresses imposed on shunt reactors during switching.
10、 The objective of Annex B is to provide guidance regarding the application and design of shunt reactors, especially in consideration of the significant switching duty and the associated repetitive dielectric stresses. As a consequence of the switching stresses seen by shunt reactors, reduced BIL (ba
11、sic lightning-impulse insulation levels), which is common practice for power transformers, are no longer recommended and are not included in Table 5. Formal input regarding the content of this annex was requested of the IEEE Switchgear Committee and was provided. Input was also received from members
12、 of IEC MT32 on Inductive Load Switching. c) Table 5A and Table 5B in the previous version (IEEE Std C57.21-1990) have been combined into one table as Table 5 (insulation levels of shunt reactors). Separate tables for dry-type and oil-immersed shunt reactors were not deemed necessary as test levels
13、are network-dependent and are independent of shunt reactor technology. Maximum system voltage is introduced to be consistent with terminology in the IEC reactor standard (see IEC 60076-6:2007 B18).aNotice to users Laws and regulations Users of these documents should consult all applicable laws and r
14、egulations. Compliance with the provisions of this standard does not imply compliance to any applicable regulatory requirements. Implementers of the standard are responsible for observing or referring to the applicable regulatory requirements. IEEE does not, by the publication of its standards, inte
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16、lations, and use in private self-regulation, standardization, and the promotion of engineering practices and methods. By making this document available for use and adoption by public authorities and private users, the IEEE does not waive any rights in copyright to this document. aThe numbers in brac
17、kets correspond to those of the bibliography in Annex D. v Copyright 2008 IEEE. All rights reserved. Updating of IEEE documents Users of IEEE standards should be aware that these documents may be superseded at any time by the issuance of new editions or may be amended from time to time through the i
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19、en amended through the issuance of amendments, corrigenda, or errata, visit the IEEE Standards Association Web site at http:/ieeexplore.ieee.org/xpl/standards.jsp, or contact the IEEE at the address listed previously. For more information about the IEEE Standards Association or the IEEE standards de
20、velopment process, visit the IEEE-SA Web site at http:/standards.ieee.org. Errata Errata, if any, for this and all other standards can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL for errata periodically. In
21、terpretations Current interpretations can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/interp/ index.html. Patents Attention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this
22、 standard, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of Patents Claims
23、 or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this standard are expressly advised that determination of the validity of any patent rights
24、, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. Participants At the time this standard was submitted to the IEEE-SA Standards Board for approval, the Revision of C57.21 Working Group had the
25、 following membership: Richard F. Dudley, Chair Sten Andersson Carlo Arpino Peter Balma Gene Blackburn Alvazo Cancino Joseph Cultrera Fred E. Elliott Derek Foster Ramon Garcia Ramsis Girgis Lars-Erik Juhlin Klaus Papp Christoph Ploetner Paulette A. Payne Powell Ulf Radbrandt Les Recksiedler Pierre R
26、iffon Michael Sharp Subhash Tuli Tony Weekes Peter Zhao Waldemar Ziomek vi Copyright 2008 IEEE. All rights reserved. The following members of the individual balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention. William J. Ackerman Carlo Arpino
27、 Ali Al Awazi Peter Balma Wallace Binder Thomas Blackburn William Bloethe Steven Brockschink Carl Bush Donald Cash Jerry Corkran Alan Darwin Dieter Dohnal Richard F. Dudley Gearold O. H. Eidhin Fred E. Elliott Gary Engmann Joseph Foldi Marcel Fortin Edwin Goodwin Randall Groves Norman Haggerty Kenne
28、th Hanus Gary Heuston Philip Hopkinson John Horak John Houdek James Huddleston Charles Johnson Lars-Erik Juhlin Gael Kennedy Sheldon Kennedy J. Koepfinger Jim Kulchisky Saumen Kundu John Lackey Chung-Yiu Lam Stephen Lambert Gerald Lee Debra Longtin G. Luri J. Dennis Marlow John W. Matthews Susan McN
29、elly Joseph Melanson Jeffrey Merryman Jeffrey Nelson Michael S. Newman Klaus Papp CarlosA. Peixoto Alvaro Portillo Bertrand Poulin Iulian Profir Ryland Revelle Pierre Riffon Michael Roberts Oleg Roizman Thomas Rozek Bartien Sayogo Devki Sharma Hyeong Sim H. Smith James E. Smith John Vergis Loren Wag
30、enaar James Wilson Roland Youngberg When the IEEE-SA Standards Board approved this standard on 27 March 2008, it had the following membership: Robert M. Grow, Chair Thomas Prevost, Vice Chair Steve M. Mills, Past Chair Judith Gorman, Secretary Victor Berman Richard DeBlasio Andy Drozd Mark Epstein A
31、lexander Gelman William Goldbach Arnie Greenspan Ken Hanus Jim Hughes Richard Hulett Young Kyun Kim Joseph L. Koepfinger* John Kulick David J. Law Glenn Parsons Ron Petersen Chuck Powers Narayanan Ramachandran Jon Walter Rosdahl Anne-Marie Sahazizian Malcolm Thaden Howard Wolfman Don Wright *Member
32、Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Satish K. Aggarwal, NRC Representative Michael H. Kelley, NIST Representative Lisa Perry IEEE Standards Project Editor Matthew J. Ceglia IEEE Standards Program Manager, Technical Program Development vii Copyright 20
33、08 IEEE. All rights reserved. Contents 1. Overview 1 1.1 Scope . 1 1.2 Purpose 2 2. Normative references 2 3. Definitions 3 3.1 Shunt reactor 3 3.2 Rating of a shunt reactor 4 3.3 Insulation . 4 3.4 Losses and impedance . 4 3.5 Construction 4 3.6 Methods of cooling 5 4. General requirements 6 4.1 Se
34、rvice conditions 6 4.2 Effect of air density on flashover voltage 7 4.3 Frequency 7 4.4 Effect of altitude on temperature rise 8 4.5 Electrical properties of insulating oil . 9 4.6 Magnetic characteristics 9 5. Basis for rating shunt reactors 9 5.1 kVA ratings . 9 5.2 Terms in which rating is expres
35、sed 10 6. Tests . 11 6.1 General 11 6.2 Types of tests . 11 7. Losses and impedance 11 7.1 Total losses 11 7.2 Impedance 14 8. Temperature rise . 14 8.1 Life of insulating materials 14 8.2 Conditions under which temperature limits apply . 15 8.3 Limits of temperature rise for continuous ratings 15 9
36、. Dielectric tests and insulation levels. 15 9.1 Dielectric tests . 15 9.2 Dielectric tests for line terminals . 17 9.3 Basic lightning-impulse insulation levels and insulation test levels for neutral terminals . 21 viii Copyright 2008 IEEE. All rights reserved. 10. Test code . 21 10.1 General 21 10
37、.2 Resistance measurements 22 10.3 General dielectric tests . 24 10.4 Losses and impedance . 37 10.5 Temperature-rise tests 42 10.6 Audible-sound-level test 48 10.7 Vibration tests on oil-immersed shunt reactors . 55 10.8 Vibration tests on dry-type shunt reactors . 57 10.9 Magnetic characteristic m
38、easurements 57 10.10 Seismic performance verification on oil-immersed and dry-type shunt reactors . 58 11. Construction for oil-immersed shunt reactors 58 11.1 Bushings 58 11.2 Bushing-type current transformers 58 11.3 Accessories 59 11.4 Terminal markings . 65 11.5 Oil preservation . 65 11.6 Oil-pr
39、eservation systems . 65 11.7 Tanks . 66 11.8 Shunt reactor finish 66 11.9 Other equipment accessories . 67 12. Construction and installation of dry-type shunt reactors 67 12.1 General description 67 12.2 Safety . 68 12.3 Magnetic clearances. 68 12.4 Connections . 69 12.5 Installed sound level 69 12.
40、6 Concrete foundations . 70 12.7 SwitchingCircuit breakers . 70 12.8 Protection practices for air-core shunt reactors 70 Annex A (normative) Specific requirements for dry-type air-core thyristor-controlled reactors . 72 Annex B (informative) Dielectric stresses imposed on shunt reactors during switc
41、hing . 88 Annex C (informative) Dielectric tests including information on wave shape control 94 Annex D (informative) Bibliography . 95 1 Copyright 2008 IEEE. All rights reserved. IEEE Standard Requirements, Terminology, and Test Code for Shunt Reactors Rated Over 500 kVA IMPORTANT NOTICE: This stan
42、dard is not intended to assure safety, security, health, or environmental protection in all circumstances. Implementers of the standard are responsible for determining appropriate safety, security, environmental, and health practices or regulatory requirements. This IEEE document is made available f
43、or use subject to important notices and legal disclaimers. These notices and disclaimers appear in all publications containing this document and may be found under the heading “Important Notice” or “Important Notices and Disclaimers Concerning IEEE Documents.” They can also be obtained on request fr
44、om IEEE or viewed at http:/standards.ieee.org/IPR/ disclaimers.html. 1. Overview 1.1 Scope This standard applies to all oil-immersed or dry-type, single-phase or three-phase, outdoor or indoor shunt reactors rated over 500 kVA. This standard also applies to thyristor-controlled shunt reactors used i
45、n static var compensators (SVCs). This standard does not apply to other devices such as the following: a) Shunt reactors, 500 kVA and smaller b) Current-limiting reactors (see IEEE Std C57.16-19961) c) Arc-suppression coils d) Neutral-grounding devices (see IEEE Std 32-1972) e) Saturable reactors f)
46、 Line-resonant reactors g) Filter reactors 1Information on references can be found in Clause 2. IEEE Std C57.21-2008 IEEE Standard Requirements, Terminology, and Test Code for Shunt Reactors Rated Over 500 kVA 2 Copyright 2008 IEEE. All rights reserved. 1.2 Purpose This standard specifies the requir
47、ements, terminology, and test code for oil-immersed and dry-type shunt reactors rated over 500 kVA and for thyristor-controlled shunt reactors used in SVCs. 2. Normative references The following referenced documents are indispensable for the application of this document (i.e., they must be understoo
48、d and used, so each referenced document is cited in text and its relationship to this document is explained). For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments or corrigenda) applies. ANSI S1.4-1983 (
49、Reaff 2006), American National Standard Specification for Sound Level Meters.2ANSI S1.11-2004, Specification for Octave-Band and Fractional-Octave-Band Analog and Digital Filters. ANSI/ASME B1.20.1-1983 (Reaff 2001), Pipe Threads, General Purpose (Inch). ANSI/CGA V-1-2005, Compressed Gas Cylinder Valve Outlet and Inlet Connections. ASTM A167-1999 (Reaff 2004), Standard Specification for Stainless and Heat-Resisting Chromium-Nickel Steel Plate, Sheet, and Strip.3IEEE Std 1-2000 (Reaff 2005), IEEE Recommended PracticeGeneral Principles for Temperature Limits in the
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