IEEE C62 62-2010 en Test Specifications for Surge-Protective Devices (SPDs) for Use on the Load Side of the Service Equipment in Low-Voltage (1000 V and Less) A.pdf

1、 IEEE Standard Test Specifications forSurge-Protective Devices (SPDs) for Use on the Load Side of the Service Equipment in Low-Voltage (1000 V and Less) AC Power Circuits Sponsored by the Surge Protective Devices Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA 11 March 2011 IEEE Power +1 97

2、8 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. iv Copyright 2011 IEEE. All rights reserved. Introduction This introduction is not part of IEEE Std C62.62-2010, IEEE Standard Test Speci

3、fications for Surge-Protective Devices (SPDs) for Use on the Load Side of the Service Equipment in Low-Voltage (1000 V and Less) AC Power Circuits. The purpose of this standard is to provide users, independent laboratories, and manufacturers with a test specification applicable to SPDs intended for

4、limiting transient overvoltages that can appear on alternating current (ac) power circuits of 1000 V (root mean squared rms) or less. The standard contains test specifications that allow the user to compare various SPDs. It is one of several documents based in part on IEEE Std C62.41.2TM-2002athat c

5、haracterizes the surge environment to which low-voltage ac power circuits are exposed. The surge tests described herein are not intended to duplicate lightning or other naturally occurring transients specifically; rather, they provide a method of evaluation and comparison of SPDs. The surge tests in

6、cluded in this standard have been time and application proven to provide a good and fair evaluation of SPDs. The interest in low-voltage ac SPDs has grown with the trend to protect sophisticated electrical and electronic equipment that is exposed and susceptible to surges from the environment and ge

7、nerated within the electrical system itself. This standard provides test methods for SPDs. This test specification has evolved from its original form, IEEE Std C62.62-2000, in that the title and scope have changed. The new title and scope limit the application of this document to SPDs intended for i

8、nstallation on the load side of the service equipment. IEEE Std C62.34TMB6bcovers test specifications for SPDs intended for installation on the line side of the service equipment (referred to as Type 1 SPDs by other standards). Furthermore, the following table summarizes a comparison of tests from t

9、he previous revision of the standard to this one: IEEE Std C62.62-2000 IEEE Std C62.62-2010 Surge Response Voltage Test: 100 kHz Ring Wave Test Combination Wave Test Other waveforms per IEEE Std C62.41-1991 Surge Tests: 100 kHz Ring Wave Test Combination Wave Test Current-Driven Tests Voltage-Surge

10、Tests Nominal Discharge Current Test Maximum Continuous Operating Voltage (MCOV) Test Maximum Continuous Operating Voltage (MCOV) Test Maximum Single Withstand Surge Current Test Nominal Discharge Current Test/Operational Duty Cycle Test Minimum Surge Life Test Nominal Discharge Current Test/Operati

11、onal Duty Cycle Test Voltage Regulation Test Voltage Regulation Test Load Current Capability Test Rated Load Current Test Protection Status Indication Test Standby Power Dissipation Test Standby Power Consumption Test (Informative Annex) Insulation Resistance Test Insulation Resistance Test (Informa

12、tive Annex) Dielectric Withstand Test Dielectric Withstand Test (Informative Annex) Failure Safety Mode Test Short-Circuit Current Rating Test Intermediate Current Test (Informative Annex) Limited Current Abnormal Overvoltage Test (Informative Annex) aInformation on references can be found in Clause

13、 2. bThe numbers in brackets correspond to those of the bibliography in Annex B. v Copyright 2011 IEEE. All rights reserved. Response to Front of Wave Test Front of Wave Test (Informative Annex) Maximum Operating Temperature Withstand Test Load-Side Short-Circuit Test Load-Side Surge Withstand Test

14、Operational Voltage Test (Informative Annex) Grounding Continuity Test (Informative Annex) Leakage Current Test (Informative Annex) Although a number of the tests from the previous revision also appear in this revision, many have been modified. Another important revision is the formatting of the tes

15、t specifications to include the rationale, purpose, test procedure and setup, and expected results. Annex A (informative) describes additional tests that may be used to establish particular application requirements but are not a requirement of this document and provides supplemental information rega

16、rding the subject of SPDs. Recently, new terminology has been introduced to describe SPDsin particular, the SPD “Type.” This terminology is included and defined in this publication. To provide clarification to the user of this document, Type 1 SPDs (generally used for the line side of the service eq

17、uipmentseemingly out of the scope of this document) are included. The rationale for inclusion is that Type 1 SPDs are also permitted to be used on the load side of the service equipment (within the scope of this document) as well as the line side. Directly correlating the ANSI/UL 1449-2006 B2 SPD Ty

18、pes to the location categories as described in IEEE Std C62.41.2-2002 is sometimes complicated due to the overlap of the boundaries of the location categories. The illustration of the IEEE Location Categories Concept is included in A.15 for reference. Generally, Type 1 SPDs are intended for use in C

19、ategory C locations; however, application of Type 1 SPDs is not limited to the Category C location. They may also be used on the load side of the service equipment, which includes Category B and Category A. Furthermore, Type 2 SPDs are intended for the load side of the service equipment but can have

20、 the same ratings as a Type 1 SPD. The fuzzy boundary between Category C and Category B overlaps at the service equipment; therefore, Type 2 SPDs may be considered for both Category C and Category B. Type 3 SPDs are generally expected to be used in Category A locations. However, because Type 3 SPDs

21、are direct plug-in or cord-connected SPDs for use with convenience outlets, they may be located in the Category C/Category B boundary (a convenience outlet located close to the service equipment), and the corresponding tests for those locations may be considered. Type 4 SPDs may be intended as Type

22、1 SPDs, Type 2 SPDs, or Type 3 SPDs and must be considered based on their intended application. vi Copyright 2011 IEEE. All rights reserved. From Clause 1 of IEEE Std C62.41.2-2002: There are no specific models that are representative of all surge environments; the complexities of the real world nee

23、d to be simplified to produce a manageable set of standard surge tests. To this end, a surge environment classification location categories scheme is presented. This classification provides a practical basis for the selection of waveforms and amplitudes of surge voltages and surge currents that may

24、be applied to evaluate the surge withstand capability of equipment SPDs, in this case connected to these power circuits. It is most important to recognize that proper coordination of equipment capability and environment characteristics is required: each environment and the equipment to be protected

25、have to be characterized and the two reconciled. WARNING Surge testing of electrical or electronic equipment presents potentially hazardous situations for both personnel and equipment. The surge test equipment can generate potentially lethal voltage surges. Furthermore, a catastrophic failure of the

26、 EUT might result in a fire or explosion. Only qualified personnel should perform the tests, with safety precautions enforced according to all national codes as well as the applicable safety directives and prescriptions of the organization where the tests are performed. Testing should not be perform

27、ed unattended. More specific aspects of safety precautions are discussed in 5.1. Notice to users Laws and regulations Users of these documents should consult all applicable laws and regulations. Compliance with the provisions of this standard does not imply compliance to any applicable regulatory re

28、quirements. Implementers of the standard are responsible for observing or referring to the applicable regulatory requirements. IEEE does not, by the publication of its standards, intend to urge action that is not in compliance with applicable laws, and these documents may not be construed as doing s

29、o. Copyrights This document is copyrighted by the IEEE. It is made available for a wide variety of both public and private uses. These include both use, by reference, in laws and regulations, and use in private self-regulation, standardization, and the promotion of engineering practices and methods.

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33、ddress listed previously. For more information about the IEEE Standards Association or the IEEE standards development process, visit the IEEE-SA web site at http:/standards.ieee.org. Errata Errata, if any, for this and all other standards can be accessed at the following URL: http:/standards.ieee.or

34、g/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL for errata periodically. Interpretations Current interpretations can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/interp/ index.html. Patents Attention is called to the possibility that implem

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37、natory. Users of this standard are expressly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. viii Copyright 2011 IEEE. All righ

38、ts reserved. Participants During the development of this standard, Working Group 3.6.6 had the following members or contributors to this standard: Ronald W. Hotchkiss, Chair Andrea Haa, Vice Chair Kenneth Brown, Technical Editor Robert Ashton William Bush Richard Chadwick Bryan Cole Tom Conrad Josep

39、h DeGregoria Douglas Dorr Lou Farquhar James Funke Ernie Gallo Randy Goodrich Martin Guy Raymond Hill Charles Jensen Dalibor Kladar Joseph L. Koepfinger Albert Martin Francois Martzloff George Mayle Dean Negrelli Richard Odenberg Thomas Phipps Joe Ramirez Alan Rebeck Mario Stolzenberg Antony Surtees

40、 Frank Waterer Mark Wingate The following members of the individual balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention. Robert Ashton Thomas Bishop William Bloethe Chris Brooks Kenneth Brown Daniel Buchanan William Bush William Byrd Michael

41、Champagne Suresh Channarasappa Peng Chen Bryan Cole Jerry Corkran Joseph DeGregoria F. Denbrock Douglas Dorr Randall Dotson Gary Engmann C. Erven Louis Farquhar James Funke Randall Groves Steven Hensley Raymond Hill Ronald W. Hotchkiss Charles Jensen Chad Kiger Joseph L. Koepfinger Saumen Kundu Paul

42、 Lindemulder Greg Luri Albert Martin William McBride Nigel McQuin Gary Michel Daleep Mohla Michael S. Newman Hans-Wolf Oertel Thomas Phipps Percy Pool Alan Rebeck Robert Resuali Johannes Rickmann Michael Roberts Charles Rogers Edward Rowe Thomas Rozek Bartien Sayogo Robert Schuerger Gil Shultz James

43、 Smith Jerry Smith Gary Stoedter Antony Surtees David Tepen James Timperley Michael Valenza John Vergis James Wilson Mark Wingate ix Copyright 2011 IEEE. All rights reserved. When the IEEE-SA Standards Board approved this standard on 8 December 2010, it had the following membership: Robert M. Grow,

44、Chair Richard H. Hulett, Vice Chair Steve M. Mills, Past Chair Judith Gorman, Secretary Karen Bartleson Victor Berman Ted Burse Clint Chaplin Andy Drozd Alexander Gelman Jim Hughes Richard H. Hulett Young Kyun Kim Joseph L. Koepfinger* John Kulick David J. Law Hung Ling Oleg Logvinov Ted Olsen Ronal

45、d C. Petersen Thomas Prevost Jon Walter Rosdahl Sam Sciacca Mike Seavey Curtis Siller Don Wright *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Satish Aggarwal, NRC Representative Richard DeBlasio, DOE Representative Michael Janezic, NIST Representative

46、Don Messina IEEE Standards Program Manager, Document Development Soo Kim IEEE Standards Program Manager, Technical Program Development x Copyright 2011 IEEE. All rights reserved. Contents 1. Overview 1 1.1 Scope . 1 1.2 Purpose 1 2. Normative references 2 3. Definitions, acronyms, and abbreviations

47、2 3.1 Definitions . 2 3.2 Acronyms and abbreviations . 3 4. Service conditions 4 4.1 Normal service conditions . 4 4.2 Nonstandard service conditions . 4 5. General test considerations . 4 5.1 Safety and electromagnetic interference (EMI) . 4 5.2 SPD test specimens 6 5.3 Connection . 6 5.4 Standard

48、test conditions . 6 5.5 Failure modes 6 6. Performance characteristics and test descriptions 7 6.1 Surge tests 7 6.2 Abnormal Overvoltage Tests . 23 6.3 Maximum Operating Temperature Withstand Test . 26 6.4 Rated Load Current Test 27 6.5 Load-Side Short-Circuit Test . 29 6.6 Load-Side Surge Withstan

49、d Test . 31 6.7 Voltage Regulation Test 32 6.8 Maximum Continuous Operating Voltage Test . 33 7. SPD Documentation . 34 Annex A (informative) Additional test and consideration information 35 Annex B (informative) Bibliography 48 1 Copyright 2011 IEEE. All rights reserved. IEEE Standard Test Specifications for Surge-Protective Devices (SPDs) for Use on the Load Side of the Service Equipment in Low-Voltage (1000 V and Less) AC Power Circuits IMPORTANT NOTICE: This standard is not intended to ensure safety, security, health, or environmental prote