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本文(IEEE N323AB-2013 en Radiation Protection Instrumentation Test and Calibration Portable Survey Instruments《辐射防护仪器的试验和校准 便携式调查仪器》.pdf)为本站会员(syndromehi216)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

IEEE N323AB-2013 en Radiation Protection Instrumentation Test and Calibration Portable Survey Instruments《辐射防护仪器的试验和校准 便携式调查仪器》.pdf

1、 American National Standard for Radiation Protection Instrumentation Test and Calibration, Portable Survey Instruments Sponsored by the National Committee on Radiation Instrumentation, N42 IEEE 3 Park Avenue New York, NY 10016-5997 USA Accredited by the American National Standards Institute ANSI N32

2、3AB-2013 (Revision and Redesignation of ANSI N323A-1997 and ANSI N323B-2002) ANSI N323AB-2013 (Revision and Redesignation of ANSI N323A-1997 and ANSI N323B-2002) American National Standard for Radiation Protection Instrumentation Test and Calibration, Portable Survey Instruments Sponsor National Com

3、mittee on Radiation Instrumentation, N42 Accredited by the American National Standards Institute Secretariat Institute of Electrical and Electronics Engineers, Inc. Approved 16 December 2013 American National Standards Institute Abstract: Testing, calibration, and calibration frequency requirements

4、for portable radiation detectors used to directly measure alpha, beta, photon, and neutron radiation are defined. Also defined are the calibration and testing requirements for alpha and beta-gamma measurements of surface contamination levels using portable radiation detectors. Portable radiation det

5、ectors may be battery or line powered. Keywords: ANSI N323AB, calibration, calibration frequency, portable radiation detectors, testing The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2014 by The Institute of Electrical and Electronic

6、s Engineers, Inc. All rights reserved. Published 20 June 2014. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent +1-978-750-8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyri

7、ght Clearance Center. Important Notices and Disclaimers Concerning IEEE Standards Documents IEEE documents are made available for use subject to important notices and legal disclaimers. These notices and disclaimers, or a reference to this page, appear in all standards and may be found under the hea

8、ding “Important Notice” or “Important Notices and Disclaimers Concerning IEEE Standards Documents.” Notice and Disclaimer of Liability Concerning the Use of IEEE Standards Documents IEEE Standards documents (standards, recommended practices, and guides), both full-use and trial-use, are developed wi

9、thin IEEE Societies and the Standards Coordinating Committees of the IEEE Standards Association (“IEEE-SA”) Standards Board. IEEE (“the Institute”) develops its standards through a consensus development process, approved by the American National Standards Institute (“ANSI”), which brings together vo

10、lunteers representing varied viewpoints and interests to achieve the final product. Volunteers are not necessarily members of the Institute and participate without compensation from IEEE. While IEEE administers the process and establishes rules to promote fairness in the consensus development proces

11、s, IEEE does not independently evaluate, test, or verify the accuracy of any of the information or the soundness of any judgments contained in its standards. IEEE does not warrant or represent the accuracy or content of the material contained in its standards, and expressly disclaims all warranties

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13、 addition, IEEE disclaims any and all conditions relating to: results; and workmanlike effort. IEEE standards documents are supplied “AS IS” and “WITH ALL FAULTS.” Use of an IEEE standard is wholly voluntary. The existence of an IEEE standard does not imply that there are no other ways to produce, t

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20、tions Manual shall not be considered or inferred to be the official position of IEEE or any of its committees and shall not be considered to be, or be relied upon as, a formal position of IEEE. At lectures, symposia, seminars, or educational courses, an individual presenting information on IEEE stan

21、dards shall make it clear that his or her views should be considered the personal views of that individual rather than the formal position of IEEE. Comments on Standards Comments for revision of IEEE Standards documents are welcome from any interested party, regardless of membership affiliation with

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26、s Documents Users of IEEE Standards documents should be aware that these documents may be superseded at any time by the issuance of new editions or may be amended from time to time through the issuance of amendments, corrigenda, or errata. An official IEEE document at any point in time consists of t

27、he current edition of the document together with any amendments, corrigenda, or errata then in effect. Every IEEE standard is subjected to review at least every ten years. When a document is more than ten years old and has not undergone a revision process, it is reasonable to conclude that its conte

28、nts, although still of some value, do not wholly reflect the present state of the art. Users are cautioned to check to determine that they have the latest edition of any IEEE standard. In order to determine whether a given document is the current edition and whether it has been amended through the i

29、ssuance of amendments, corrigenda, or errata, visit the IEEE-SA website at http:/ieeexplore.ieee.org/xpl/standards.jsp or contact IEEE at the address listed previously. For more information about the IEEE SA or IEEEs standards development process, visit the IEEE-SA website at http:/standards.ieee.or

30、g. Errata Errata, if any, for all IEEE standards can be accessed on the IEEE-SA website at the following URL: http:/standards.ieee.org/findstds/errata/index.html. Users are encouraged to check this URL for errata periodically. Patents Attention is called to the possibility that implementation of thi

31、s standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken by the IEEE with respect to the existence or validity of any patent rights in connection therewith. If a patent holder or patent applicant has filed a statement of assurance v

32、ia an Accepted Letter of Assurance, then the statement is listed on the IEEE-SA Website at http:/standards.ieee.org/about/sasb/patcom/patents.html. Letters of Assurance may indicate whether the Submitter is willing or unwilling to grant licenses under patent rights without compensation or under reas

33、onable rates, with reasonable terms and conditions that are demonstrably free of any unfair discrimination to applicants desiring to obtain such licenses. Essential Patent Claims may exist for which a Letter of Assurance has not been received. The IEEE is not responsible for identifying Essential Pa

34、tent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of Patents Claims, or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonabl

35、e or non-discriminatory. Users of this standard are expressly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. Participants At t

36、he time ANSI approved this standard, the Accredited Standards Committee on Radiation Instrumentation, N42, had the following members: Michael P. Unterweger, Chair Michael Kipness, Administrative Secretary Organization represented Name of representative Canberra Robert Huckins National Institute of S

37、tandards and Technology, U.S. Department of Commerce Leticia Pibida Computer Dependability Associates, LLC . Gary Johnson Consultant Frank X. Masse Department of Homeland SecurityPeter Shebell Harvard University Joseph Ring Health Physics Society Sandy Perle Institute of Electrical and Electronics E

38、ngineers, Inc Michael P. Unterweger International Medcom . Don Sythe Lawrence Berkeley National Laboratory .Edward J. Lampo Lawrence Livermore National Laboratory David Trombino National Aeronautics and Space Administration, Goddard Space Flight Center . R. Sachidananda Babu Nuclear Standards Unlimi

39、ted . Al N. Tschaeche (Deceased) Oak Ridge National Laboratory Peter J. Chiaro, Jr Charles Britton (Alt.) Ortec Corp. . Frank Sergent Pacific Northwest National Laboratory Richard Kouzes U.S. Army Chad B. McKee U.S. Nuclear Regulatory Commission . Cynthia G. Jones Members-At-Large . Morgan Cox Edwar

40、d Groeber Ronald M. Keyser Joseph C. McDonald Jack M. Selby (Deceased) Joseph Stencel Copyright 2014 IEEE. All rights reserved. vii At the time this standard was approved, ANSI N323AB Working Group had the following membership: Ed Walker, Chair Martin Brennan Bill Byrum Morgan Cox Dennis Hadlock Ric

41、k Hansen Mark Hoover Cyndi Jones Greg Komp Stan Mavrogainis Joe McDonald Wynn Sharai Shen Zhu Copyright 2014 IEEE. All rights reserved. viii Contents 1. Scope and purpose 22. Definitions 33. General requirements 83.1 Acceptance testing . 8 3.2 Instrument calibration .10 3.3 Field use 11 3.4 Recalibr

42、ation .12 3.5 Calibration frequency .13 4. Calibration facility requirements .144.1 Calibration standards 14 4.2 Calibration assemblies 15 4.3 Maintenance of calibration standards .15 4.4 Check sources .16 4.5 Calibration source quality .16 4.6 Calibration facility 17 5. Calibration protocol require

43、ments .185.1 General requirements 18 5.2 Specific requirements .18 5.3 Surface contamination measurement instruments.20 5.4 Hot swapping 23 6. Records 236.1 Instrument information .23 6.2 Facility documentation .24 Annex A (informative) Bibliography 26 Annex B (informative) Life-cycle approach for r

44、adiation detection instrumentation .29 Copyright 2014 IEEE. All rights reserved. ix American National Standard for Radiation Protection Instrumentation Test and Calibration, Portable Survey Instruments IMPORTANT NOTICE: IEEE Standards documents are not intended to ensure safety, health, or environme

45、ntal protection, or ensure against interference with or from other devices or networks. Implementers of IEEE Standards documents are responsible for determining and complying with all appropriate safety, security, environmental, health, and interference protection practices and all applicable laws a

46、nd regulations. This IEEE document is made available for use subject to important notices and legal disclaimers. These notices and disclaimers appear in all publications containing this document and may be found under the heading “Important Notice” or “Important Notices and Disclaimers Concerning IE

47、EE Documents.” They can also be obtained on request from IEEE or viewed at http:/standards.ieee.org/IPR/disclaimers.html. 1. Scope and purposeThis standard establishes specific calibration and calibration-related requirements for portable radiation protection instruments used for detection and measu

48、rement of levels of ionizing radiation fields or levels of radioactive surface contamination. For purposes of this standard, portable radiation protection instruments are those battery-powered instruments that are carried to a specific facility or location for use. Count rate meters and scalers, whe

49、n used with an appropriate detection probe for quantifying activity, can be considered portable radiation protection instruments and should be treated as a single unit for the purposes of this standard. NOTEThese instruments are normally hand-held during operation and may include alarming capability.1Portable radiation protection instruments provide direct readout of, or readout proportional to, dose or dose equivalent, dose rate or dose equivalent rate, or activity per unit area (i.e., active probe area). For the portable radiation protection instrumentation addressed in this

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