ISO 10110-7-2008 Optics and photonics - Preparation of drawings for optical elements and systems - Part 7 Surface imperfection tolerances《光学和光子学 光学元件和设备制图的准备工作 .pdf

1、INTERNATIONALSTANDARDISO10110-7Second edition2008-02-15Reference numberISO 10110-7:2008(E) ISO 2008Optics and photonics Preparation of drawings for optical elements and systems Part 7:Surface imperfection tolerancesOptique et photonique Indications sur les dessins pour lments et systmes optiques Par

2、tie 7: Tolrances dimperfection de surfaceISO 10110-7:2008(E)ii ISO 2008 All rights reservedPDF disclaimerThis PDF file may contain embedded typefaces. In accordance with Adobes licensing policy, this file may be printed or viewed but shallnot be edited unless the typefaces which are embedded are lic

3、ensed to and installed on the computer performing the editing. Indownloading this file, parties accept therein the responsibility of not infringing Adobes licensing policy. The ISO Central Secretariataccepts no liability in this area.Adobe is a trademark of Adobe Systems Incorporated.Details of the

4、software products used to create this PDF file can be found in the General Info relative to the file; the PDF-creationparameters were optimized for printing. Every care has been taken to ensure that the file is suitable for use by ISO member bodies. In theunlikely event that a problem relating to it

5、 is found, please inform the Central Secretariat at the address given below.COPYRIGHT PROTECTED DOCUMENT ISO 2008 All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means,electronic or mechanical, including photocopying an

6、d microfilm, without permission in writing from either ISO at the address below orISOs member body in the country of the requester.ISO copyright officeCase postale 56 CH-1211 Geneva 20Tel. + 41 22 749 01 11Fax + 41 22 749 09 47E-mail copyrightiso.orgWeb www.iso.orgPublished in SwitzerlandISO 10110-7

7、:2008(E) ISO 2008 All rights reserved iiiForewordISO (the International Organization for Standardization) is a worldwide federation of national standards bodies(ISO member bodies). The work of preparing International Standards is normally carried out through ISOtechnical committees. Each member body

8、 interested in a subject for which a technical committee has beenestablished has the right to be represented on that committee. International organizations, governmental andnon-governmental, in liaison with ISO, also take part in the work. ISO collaborates closely with the InternationalElectrotechni

9、cal Commission (IEC) on all matters of electrotechnical standardization.International Standards are drafted in accordance with the rules given in the ISO/IEC Directives, Part 2.The main task of technical committees is to prepare International Standards. Draft International Standardsadopted by the te

10、chnical committees are circulated to the member bodies for voting. Publication as anInternational Standard requires approval by at least 75 % of the member bodies casting a vote.Attention is drawn to the possibility that some of the elements of this document may be the subject of patentrights. ISO s

11、hall not be held responsible for identifying any or all such patent rights.ISO 10110-7 was prepared by Technical Committee ISO/TC 172, Optics and photonics, Subcommittee SC 1,Fundamental standards.This second edition cancels and replaces the first edition (ISO 10110-7:1996), which has been technical

12、lyrevised.ISO 10110 consists of the following parts, under the general title Optics and photonics Preparation ofdrawings for optical elements and systems: Part 1: General Part 2: Material imperfections Stress birefringence Part 3: Material imperfections Bubbles and inclusions Part 4: Material imperf

13、ections Inhomogeneity and striae Part 5: Surface form tolerances Part 6: Centring tolerances Part 7: Surface imperfection tolerances Part 8: Surface texture Part 9: Surface treatment and coating Part 10: Table representing data of optical elements and cemented assemblies Part 11: Non-toleranced data

14、 Part 12: Aspheric surfaces Part 14: Wavefront deformation tolerance Part 17: Laser irradiation damage thresholdISO 10110-7:2008(E)iv ISO 2008 All rights reservedIntroductionA localized surface imperfection, such as a dig or a scratch resulting from handling or manufacture, can degradethe perceived

15、quality of an optical component. Dark-field inspection reveals the location of very smallimperfections. The use of an appearance comparison scale, together with tolerance levels agreed by themanufacturer and user, permits classification of a component as “accept” or “reject”. This form of subjective

16、inspection based on visibility or a visual assessment of area, although economic and fast, lacks precision.Measurement is only required as a second stage operation following inspection necessary to determine locationand to select a surface imperfection worthy of study, see ISO 14997. In such cases,

17、a drawing notationindicating this level of inspection is required and can be added to the specification. This process, not dependingon the eye, is more time consuming and is usually only carried out when a surface imperfection could influenceperformance as, for example, in laser or low-light level s

18、ystems or when a more precise measure is demanded.INTERNATIONAL STANDARD ISO 10110-7:2008(E) ISO 2008 All rights reserved 1Optics and photonics Preparation of drawings for optical elements and systems Part 7:Surface imperfection tolerances1ScopeISO 10110 specifies the presentation of design and func

19、tional requirements for single optical elements and foroptical assemblies in technical drawings used for their manufacture and inspection.This part of ISO 10110 specifies the indication of the level of acceptability of surface imperfections within theeffective aperture of individual optical elements

20、 and optical assemblies. These include localized surfaceimperfections, edge chips and long scratches.It is to be noted that the acceptance level for localized imperfections is specified taking into account functionaleffects (affecting image formation or durability of the optical element) as well as

21、cosmetic (appearance) effects.This part of ISO 10110 applies to transmitting and reflecting surfaces of finished optical elements, whether ornot they are coated, and to optical assemblies. It recognizes that permissible imperfections may be specifiedaccording to the area affected by imperfections on

22、 components or in optical assemblies.2 Normative referencesThe following referenced documents are indispensable for the application of this document. For datedreferences, only the edition cited applies. For undated references, the latest edition of the referenced document(including any amendments) a

23、pplies.ISO 10110-1:2006, Optics and photonics Preparation of drawings for optical elements and systems Part 1: GeneralISO 14997:2003, Optics and optical instruments Test methods for surface imperfections of optical elements3 Terms and definitionsFor the purposes of this document, the following terms

24、 and definitions apply.See Figure 1 for an illustration of the classification of imperfections.3.1 localized surface imperfectionlocalized artifact within the effective aperture of an optical surface, optical element or optical assembly producedby improper treatment during or after fabrication or in

25、 useNOTE 1 Examples of localized artifacts are scratches, pits, sleeks, scuffs and fixture marks. Also included are localizedcoating blemishes such as grey spots and colour sites that absorb or reflect light differently from the bulk of the coating.Imperfections can be on or under a surface. ISO 980

26、2 includes a glossary of terms in use.NOTE 2 Surface imperfections in optical assemblies can occur on any surface of the assembly.ISO 10110-7:2008(E)2 ISO 2008 All rights reserved3.2 long scratchthin surface imperfection longer than NOTE These tend to be more visible than shorter defects of the same

27、 width because of their length.3.3 edge chiplocalized artifact around the periphery of an elementNOTE Even if edge chips are outside the optically effective area, they can detrimentally affect the performance of opticalsystems by disturbing the sealing of elements, or by giving rise to a source of s

28、cattered light or to sites of crack propagation.4 Indication in drawings4.1 GeneralA code number and a numerical term give the indication of permissible surface and localized imperfections. Thecode number for surface imperfections is 5/ and the code number for surface imperfections in optical assemb

29、liesis 15/.In ISO 14997:2003 Method I, a hierarchy of inspection levels is described. Preference for visual comparisononly (level 2 inspection), or an objective measurement only (level 7 inspection) may be recorded with a notationas described in 4.2.4.4.2 Affected area method for optical elements an

30、d assemblies4.2.1 Surface imperfections4.2.1.1 GeneralThe drawing indication for number and size of surface imperfections, which are permissible within the effectiveaperture of a surface, isFigure 1 Classification of imperfections2mm5/N AISO 10110-7:2008(E) ISO 2008 All rights reserved 3and for loca

31、lized surface imperfections in optical assemblies it isThe indication in the form specifies the number, , of allowed imperfections of maximum permittedsize, and the grade number, , which is equal to the square root of the area of the maximum allowedimperfection, expressed in millimetres.4.2.1.2 Coat

32、ing blemishesIt is possible to specify the level of acceptability of coating blemishes separately from that of the localizedsurface imperfections, if desired.Following the indication for surface imperfections and separated from it by a semicolon, the indication forcoating blemishes, which are permis

33、sible within the effective aperture of a surface or assembly, iswhereis the designation for coating blemishes;is the number of allowed blemishes of maximum permitted size;is the grade number as defined in 4.2.1.1.The imperfection indication including coating blemishes isfor surfaces andfor assemblie

34、s.If no separate indication for coating blemishes is given, it shall be included in the permissible surfaceimperfection indication:4.2.1.3 Long scratchesFollowing the indication for surface imperfections (and coating blemishes, if given) and separated from them bya semicolon, the indication for long

35、 scratches (longer than ), which are permissible within the effectiveaperture of a surface, iswhereL is the indication for long scratches;is the number of allowed long scratches and the grade number;specifies the maximum allowed width of the scratches, expressed in millimetres.15/N AN A NACNprimeApr

36、imeCNprimeAprime5/N A;CNprimeAprime15/N A;CNprimeAprime5or15/N A2mmLNprimeprimeAprimeprimeNprimeprimeAprimeprimeISO 10110-7:2008(E)4 ISO 2008 All rights reservedThe imperfection indication including coating blemishes and long scratches isIf no separate indication for long scratches or coating blemis

37、hes is given, it shall be included in the permissiblesurface imperfection indication:4.2.1.4 Edge chipsFollowing the indication for surface imperfections (and coating blemishes, and/or long scratches, if given) andseparated from them by a semicolon, the indication for permissible edge chips iswhere

38、E is the designation for edge chips, and the grade number specifies the maximum permissible extentof a chip from the physical edge of the surface, or cell in the case of an optical assembly, measured parallel tothe surface, in millimetres. Any number of edge chips is permissible as long as their ext

39、ent from the edge doesnot exceed .If no explicit indication for edge chips is given, edge chips are allowed as long as they do not extend into theoptical effective diameter.4.2.1.5 Surface imperfection indicationThe complete imperfection indication, including coating blemishes, long scratches and ed

40、ge chips isTo summarise:5/ represents surface imperfections and 15/ represents surface imperfections in assemblies,respectively;for surface imperfections;for coating blemishes;for long scratches;for edge chips.NOTE Indications in the form and are indications of Method II of the first edition of this

41、 International Standard(ISO 10110-7:1996).If more than one type of surface imperfection is given, these surface imperfections or localized imperfections inoptical assemblies are permissible independent of each other.4.2.2 Imperfections with a smaller grade numberA larger number of surface imperfecti

42、ons (including coating blemishes) with a smaller grade number ispermitted, if the sum of their areas does not exceed the maximum total area.for surface imperfections;for coating blemishes.5or15/N A;CNprimeAprime;LNprimeprimeAprimeprime5or15/N AEAprimeprimeprimeAprimeprimeprimeAprimeprimeprime5or15/N

43、 A;CNprimeAprime;LNprimeprimeAprimeprime;EAprimeprimeprimeN ACNprimeAprimeLNprimeprimeAprimeprimeEAprimeprimeprime5/TV 5/RVN A2NprimeAprime2ISO 10110-7:2008(E) ISO 2008 All rights reserved 5When determining the number of permissible surface imperfections or localized imperfections in opticalassembli

44、es, those with a grade number of or smaller shall not be counted.A larger number of long scratches is allowed, provided that the sum of their widths does not exceed .In calculating this sum, scratches with widths less than shall not be counted.4.2.3 Concentrations of surface imperfectionsConcentrati

45、ons of surface imperfections are not allowed. A concentration occurs when more than of thenumber of allowed defects is found in any of the test region. If the total number of imperfections is less thanten, then two or more imperfections falling within a sub-area of the surface (which has a similar f

46、orm as thetest area) constitute a concentration.4.2.4 Test methodThe method for inspecting surfaces and for measuring grade numbers of imperfections is described inISO 14997.Inspection, as indicated in Annex D of ISO 14997:2003, may be carried out along one of three routes specifiedin the indication

47、 for surface imperfections (and coating blemishes, long scratches and/or edge chips, if given)and separated from them by a semicolon, as follows.Route 1, typically for mass-produced optics, stops at level 2. The indication is IV.Route 2 employs subjective comparison of grades with lines and dots of

48、known dimensions. The indicationis IS.Route 3 employs objective measurement of grades. The indication is IO.EXAMPLES If visual inspection only is required, this would be indicated by IV. If the grades of imperfections are assessedby subjective comparison this will be indicated by IS. IO will be used

49、 if objective comparison is specified.4.3 LocationThe indication shall be entered near the surface to which it refers. If necessary, the indication may be connectedto the element by a leader. It should preferably be associated with the other indications of surface tolerance(surface form tolerance and centring tolerance). An example of such an indication is given in Annex A ofISO 10110-1:2006.If two or more optical elements are to be cemented (or optically contacted), the surface imperfection t