ISO 6342-2003 Micrographics - Aperture cards - Method of measuring thickness of buildup area《缩微摄影技术 开窗卡 增厚区厚度的测量方法》.pdf

1、INTERNATIONAL STANDARD ISO 6342 Second edition 2003-07-01 Reference number ISO 6342:2003(E) ISO 2003 Micrographics Aperture cards Method of measuring thickness of buildup area Micrographie Cartes fentre Mthode de mesurage de la zone de surpaisseurISO 6342:2003(E) ii ISO 2003 All rights reserved PDF

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5、ll rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from either ISO at the address below or ISOs member body in the country

6、 of the requester. ISO copyright office Case postale 56 CH-1211 Geneva 20 Tel. + 41 22 749 01 11 Fax + 41 22 749 09 47 E-mail copyrightiso.org Web www.iso.org Published in SwitzerlandISO 6342:2003(E) ISO 2003 All rights reserved iii Foreword ISO (the International Organization for Standardization) i

7、s a worldwide federation of national standards bodies (ISO member bodies). The work of preparing International Standards is normally carried out through ISO technical committees. Each member body interested in a subject for which a technical committee has been established has the right to be represe

8、nted on that committee. International organizations, governmental and non-governmental, in liaison with ISO, also take part in the work. ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of electrotechnical standardization. International Standards are d

9、rafted in accordance with the rules given in the ISO/IEC Directives, Part 2. The main task of technical committees is to prepare International Standards. Draft International Standards adopted by the technical committees are circulated to the member bodies for voting. Publication as an International

10、Standard requires approval by at least 75 % of the member bodies casting a vote. Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. ISO shall not be held responsible for identifying any or all such patent rights. ISO 6342 was prepare

11、d by Technical Committee ISO/TC 171, Document imaging applications, Subcommittee SC 2, Application issues. This second edition cancels and replaces the first edition (ISO 6342:1993), which has been technically revised.ISO 6342:2003(E) iv ISO 2003 All rights reserved Introduction Aperture cards are w

12、idely used in many microfilm systems. As the various kinds differ in the thickness of the buildup area, a method of measuring the buildup thickness is necessary.INTERNATIONAL STANDARD ISO 6342:2003(E) ISO 2003 All rights reserved 1 Micrographics Aperture cards Method of measuring thickness of buildu

13、p area 1S c o p e This International Standard specifies a method of measuring the thickness of the buildup area on aperture cards (camera and copy cards) for manufacturing and inspection purposes. 2 Normative references The following referenced documents are indispensable for the application of this

14、 document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. ISO 534:1988, Paper and board Determination of thickness and apparent bulk density or apparent sheet density ISO 6196-1:1993, Mic

15、rographics Vocabulary Part 1: General terms ISO 6196-4:1998, Micrographics Vocabulary Part 4: Materials and packaging 3 Terms and definitions For the purposes of this document, the terms and definitions given in ISO 6196-1 and ISO 6196-4 apply. 4 Apparatus 4.1 Dial micrometers, of the dead-weight ty

16、pe, either motor- or manually operated. The motor-operated micrometer is preferred. The lowering speed shall be approximately . The movable face or pressure foot shall be circular with a diameter of . The fixed face or anvil shall be of a size that allows the whole area of the pressure foot to be in

17、 contact with the anvil in the zero position. The pressure foot shall move on an axis perpendicular to the anvil. The pressure foot shall exert a steady pressure on the test sample of , based on the area of the pressure foot. Values of micrometer characteristics are given in Table 1, in accordance w

18、ith ISO 534:1988, Table 2. Table 1 Micrometer values Micrometer characteristic Maximum permitted value Indication error or Error of parallelism between pressure faces or Repeatability of measurement (as a standard deviation) or NOTE 1 The maximum permitted value of a micrometer characteristic is the

19、 greater of the two values quoted for it in this table. NOTE 2 Where a tolerance is expressed in the form of a percentage, it is based upon the thickness of the test piece under test. Thus, it is possible for a given micrometer to comply with the requirements of this table for some materials, but no

20、t for others. 0,8 mm/s 16 mm 0,5 mm 50 kPa 5 kPa 2,5 0,5 % 5 1% 2,5 0,5 %ISO 6342:2003(E) 2 ISO 2003 All rights reserved 5 Conditioning and testing atmosphere All test samples shall be conditioned, loosely assembled, for at least before testing. Samples shall be conditioned and tested at a temperatu

21、re of and a relative humidity of . 6 Measurement 6.1 General If a manually operated micrometer is used, the pressure foot shall either be lowered to within of the surface of the test sample and then released, or be lowered onto the surface at a velocity less than , but not less than , specified for

22、the motor-operated micrometer. The pressure foot shall maintain the dead- weight loading for at least . All measurements shall be made on the same card. 6.2 Card thickness Make at least four measurements at separate places with the pressure foot at least away from the edges of the card and the build

23、up area. The greatest of these measurements shall be taken as the thickness of the card. 6.3 Buildup-area thickness Make at least four measurements, one on each side of the buildup-area rectangle, as illustrated in Figure 1. The pressure foot shall be centred across the width of the buildup area (se

24、e Annex A). The greatest of these measurements shall be taken as the thickness of the buildup area. 6.4 Buildup thickness The buildup thickness of the aperture card shall be taken as the difference between the thickness of the buildup area, as measured in 6.3, and the thickness of the card of the sa

25、me test sample, as measured in 6.2. Key 1 outside perimeter of buildup area 2 inside perimeter of buildup area Figure 1 Pressure-foot position for measuring buildup-area thickness 6h 23 C 1 C (50 2) % 0,007 5 mm 12 mm/s 0,8 mm/s 2s 6,35 mmISO 6342:2003(E) ISO 2003 All rights reserved 3 Annex A (info

26、rmative) Centring of the pressure foot Because there are various types of unitised microfilm-carrier construction, centring of the pressure foot in accordance with 6.3 may require clarification. Care should be exercised in placing the pressure foot on the approximate centre of the buildup area. See section A-A in Figure A.1. a) Location of section A-A b) Film applied with bonding tape c) Film applied directly to card Figure A.1 Centring of the pressure footISO 6342:2003(E) ICS 37.080 Price based on 3 pages ISO 2003 All rights reserved