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本文(IEEE C57 19.04-2018 Performance Characteristics and Dimensions for High Current Power Transformer Bushings with Rated Continuous Current in Excess of 5000 A in Bus Enclosures.pdf)为本站会员(周芸)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

IEEE C57 19.04-2018 Performance Characteristics and Dimensions for High Current Power Transformer Bushings with Rated Continuous Current in Excess of 5000 A in Bus Enclosures.pdf

1、IEEE Standard for Performance Characteristics and Dimensions for High Current Power Transformer Bushings with Rated Continuous Current in Excess of 5000 A in Bus Enclosures IEEE Std C57.19.04-2018 IEEE Power and Energy Society Sponsored by the Transformers Committee IEEE 3 Park Avenue New York, NY 1

2、0016-5997 USAIEEE Std C57.19.04-2018 IEEE Standard for Performance Characteristics and Dimensions for High Current Power Transformer Bushings with Rated Continuous Current in Excess of 5000 A in Bus Enclosures Sponsor Transformers Committee of the IEEE Power and Energy Society Approved 7 May 2018 IE

3、EE-SA Standards BoardAbstract: The electrical, dimensional, and related special requirements for high current rating power transformer bushings within bus enclosures that have rated continuous current in excess of 5000 A are addressed in this standard. Bushings covered by this standard are intended

4、for use as components of liquid-filled transformers, including but not limited to Generator Step-Up (GSU) Transformers. Keywords: basic impulse insulation levels (BILs), bushings, cantilever test, capacitance, creepage distance, generator step-up (GSU) transformers, isolated-phase bus, line-to-groun

5、d voltage, metal-enclosed bus, nominal system voltage, power transformer bushings, power factor The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2018 by The Institute of Electrical and Electronics Engineers, Inc. All rights reserved. P

6、ublished 6 June 2018. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent fitness for a particular purpose; non-infringement; and quality, accuracy, effectiveness, currency, or completeness of material. In addition, IEEE disclaims any and all conditions relatin

7、g to: results; and workmanlike effort. IEEE standards documents are supplied “AS IS” and “WITH ALL FAULTS.” Use of an IEEE standard is wholly voluntary. The existence of an IEEE standard does not imply that there are no other ways to produce, test, measure, purchase, market, or provide other goods a

8、nd services related to the scope of the IEEE standard. Furthermore, the viewpoint expressed at the time a standard is approved and issued is subject to change brought about through developments in the state of the art and comments received from users of the standard. In publishing and making its sta

9、ndards available, IEEE is not suggesting or rendering professional or other services for, or on behalf of, any person or entity nor is IEEE undertaking to perform any duty owed by any other person or entity to another. Any person utilizing any IEEE Standards document, should rely upon his or her own

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12、ANY WAY OUT OF THE PUBLICATION, USE OF, OR RELIANCE UPON ANY STANDARD, EVEN IF ADVISED OF THE POSSIBILITY OF SUCH DAMAGE AND REGARDLESS OF WHETHER SUCH DAMAGE W AS FORESEEABLE.4 Copyright 2018 IEEE. All rights reserved. Translations The IEEE consensus development process involves the review of docum

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15、make it clear that his or her views should be considered the personal views of that individual rather than the formal position of IEEE. Comments on standards Comments for revision of IEEE Standards documents are welcome from any interested party, regardless of membership affiliation with IEEE. Howev

16、er, IEEE does not provide consulting information or advice pertaining to IEEE Standards documents. Suggestions for changes in documents should be in the form of a proposed change of text, together with appropriate supporting comments. Since IEEE standards represent a consensus of concerned interests

17、, it is important that any responses to comments and questions also receive the concurrence of a balance of interests. For this reason, IEEE and the members of its societies and Standards Coordinating Committees are not able to provide an instant response to comments or questions except in those cas

18、es where the matter has previously been addressed. For the same reason, IEEE does not respond to interpretation requests. Any person who would like to participate in revisions to an IEEE standard is welcome to join the relevant IEEE working group. Comments on standards should be submitted to the fol

19、lowing address: Secretary, IEEE-SA Standards Board 445 Hoes Lane Piscataway, NJ 08854 USA Laws and regulations Users of IEEE Standards documents should consult all applicable laws and regulations. Compliance with the provisions of any IEEE Standards document does not imply compliance to any applicab

20、le regulatory requirements. Implementers of the standard are responsible for observing or referring to the applicable regulatory requirements. IEEE does not, by the publication of its standards, intend to urge action that is not in compliance with applicable laws, and these documents may not be cons

21、trued as doing so. Copyrights IEEE draft and approved standards are copyrighted by IEEE under US and international copyright laws. They are made available by IEEE and are adopted for a wide variety of both public and private uses. These include both use, by reference, in laws and regulations, and us

22、e in private self-regulation, standardization, and the promotion of engineering practices and methods. By making these documents available for use and adoption by public authorities and private users, IEEE does not waive any rights in copyright to the documents.5 Copyright 2018 IEEE. All rights rese

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25、sers of IEEE Standards documents should be aware that these documents may be superseded at any time by the issuance of new editions or may be amended from time to time through the issuance of amendments, corrigenda, or errata. An official IEEE document at any point in time consists of the current ed

26、ition of the document together with any amendments, corrigenda, or errata then in effect. Every IEEE standard is subjected to review at least every 10 years. When a document is more than 10 years old and has not undergone a revision process, it is reasonable to conclude that its contents, although s

27、till of some value, do not wholly reflect the present state of the art. Users are cautioned to check to determine that they have the latest edition of any IEEE standard. In order to determine whether a given document is the current edition and whether it has been amended through the issuance of amen

28、dments, corrigenda, or errata, visit the IEEE Xplore at http:/ ieeexplore .ieee .or g/ or contact IEEE at the address listed previously. For more information about the IEEE-SA or IEEEs standards development process, visit the IEEE-SA Website at http:/ standards .ieee .or g. Errata Errata, if any, fo

29、r all IEEE standards can be accessed on the IEEE-SA Website at the following URL: http:/ standards .ieee .org/ findstds/ errata/ index .html. Users are encouraged to check this URL for errata periodically. Patents Attention is called to the possibility that implementation of this standard may requir

30、e use of subject matter covered by patent rights. By publication of this standard, no position is taken by the IEEE with respect to the existence or validity of any patent rights in connection therewith. If a patent holder or patent applicant has filed a statement of assurance via an Accepted Letter

31、 of Assurance, then the statement is listed on the IEEE- SA Website at http:/ standards .ieee .or g/ about/ sasb/ patcom/ patents .html. Letters of Assurance may indicate whether the Submitter is willing or unwilling to grant licenses under patent rights without compensation or under reasonable rate

32、s, with reasonable terms and conditions that are demonstrably free of any unfair discrimination to applicants desiring to obtain such licenses. Essential Patent Claims may exist for which a Letter of Assurance has not been received. The IEEE is not responsible for identifying Essential Patent Claims

33、 for which a license may be required, for conducting inquiries into the legal validity or scope of Patents Claims, or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-di

34、scriminatory. Users of this standard are expressly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association6 Copyright 2018 IEEE. All rig

35、hts reserved. Participants At the time this draft standard was completed, the BushingStandardization of GSU Bushings Working Group had the following membership: Scott Digby, Chair John D. Brafa, Vice Chair Richard von Gemmingen, Secretary Omar Ahmed Jeffrey Benach James Campbell Florian Costa Keith

36、Ellis Eduardo Garcia David Geibel John Graham Eric Humphrey Jose Izquierdo Wayne Johnson Randall Kyle Mario Locarno Kumar Mani Shankar Nambi Anthony Natale Leslie Recksiedler Sebastien Riopel Kirk Robbins Devki Sharma Fabian Stacy Craig Stiegemeier David Stockton Ajith V arghese Y ves V ermette Eric

37、 Weatherbee William Whitehead Shibao Zhang The following members of the balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention. Stephen Antosz Peter Balma Barry Beaster W.J. (Bill) Bergman Thomas Blackburn W Boettger J. Brafa Demetrio Bucaneg Jr

38、. Ted Burse Paul Cardinal Juan Castellanos John Crouse Willaim Darovny Scott Digby Gary Donner Joseph Foldi David Geibel David Gilmer Jalal Gohari Edwin Goodwin James Graham Randall Groves John Harley Roger Hayes Werner Hoelzl Jill Holmes Philip Hopkinson Daniel Huenger Richard Jackson John John Gae

39、l Kennedy Sheldon Kennedy James Kinney Axel Kraemer Jim Kulchisky John Lackey Chung-Yiu Lam Aleksandr Levin Weijun Li Thomas Lundquist Richard Marek J. Dennis Marlow Hugo Marroquin William McBride John McClelland Andrew McNulty Joseph Melanson Daniel Mulkey K.R.M. Nair Michael Newman Lorraine Padden

40、 Bansi Patel Poorvi Patel Christopher Petrola Alvaro Portillo Farnoosh Rahmatian Sebastien Riopel Richard Rohr Rodrigo Ronchi Thomas Rozek Daniel Sauer Mathieu Sauzay Bartien Sayogo Nikunj Shah Devki Sharma Hyeong Sim Richard Simonelli Jerry Smith Ronald Stahara James V an De Ligt Jason V arnell Rog

41、er V erdolin John V ergis Y ves V ermette David Wallach Joe Watson Eric Weatherbee Kenneth White Jennifer Y u Jian Y u Shibao Zhang7 Copyright 2018 IEEE. All rights reserved. When the IEEE-SA Standards Board approved this standard on 7 May 2018, it had the following membership: Jean-Phillipe Faure,

42、Chair Gary Hoffman, Vice Chair John D. Kulick, Past Chair Konstantinos Karachalios, Secretary Ted Burse Guido R. Hiertz Christel Hunter Joseph L. Koepfinger* Thomas Koshy Hung Ling Dong Liu Xiaohui Liu Kevin Lu Daleep Mohla Andrew Myles Paul Nikolich Ronald C. Petersen Annette D. Reilly Robby Robson Dorothy Stanley Mehmet Ulema Phil Wennblom Philip Winston Howard Wolfman Jingyi Zhou *Member Emeritus

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