IEC 60512-15-1-2008 Connectors for electronic equipment - Tests and measurements - Part.15-1 Connector tests (mechanical) - Test 15a Contact retention in insert.pdf

1、 IEC 60512-15-1 Edition 1.0 2008-05 INTERNATIONAL STANDARD NORME INTERNATIONALE Connectors for electronic equipment Tests and measurements Part 15-1: Connector tests (mechanical) Test 15a: Contact retention in insert Connecteurs pour quipements lectroniques Essais et mesures Partie 15-1: Essais (mca

2、niques) des connecteurs Essai 15a: Rtention des contacts dans lisolant IEC 60512-15-1:2008 THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2008 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any

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6、tactez le Comit national de la CEI de votre pays de rsidence. IEC Central Office 3, rue de Varemb CH-1211 Geneva 20 Switzerland Email: inmailiec.ch Web: www.iec.ch About the IEC The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes Interna

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16、ntaires sur cette publication ou si vous avez des questions, visitez le FAQ du Service clients ou contactez-nous: Email: csciec.ch Tl.: +41 22 919 02 11 Fax: +41 22 919 03 00 IEC 60512-15-1 Edition 1.0 2008-05 INTERNATIONAL STANDARD NORME INTERNATIONALE Connectors for electronic equipment Tests and

17、measurements Part 15-1: Connector tests (mechanical) Test 15a: Contact retention in insert Connecteurs pour quipements lectroniques Essais et mesures Partie 15-1: Essais (mcaniques) des connecteurs Essai 15a: Rtention des contacts dans lisolant INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION EL

18、ECTROTECHNIQUE INTERNATIONALE E ICS 31.220.10 PRICE CODE CODE PRIX ISBN 2-8318-9767-X 2 60512-15-1 IEC:2008 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ CONNECTORS FOR ELECTRONIC EQUIPMENT TESTS AND MEASUREMENTS Part 15-1: Connector tests (mechanical) Test 15a: Contact retention in insert FOREWORD 1)

19、 The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical

20、 and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical

21、 committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non- governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organizat

22、ion for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical com

23、mittee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications

24、is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and

25、 regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any equipment declared to be in con

26、formity with an IEC Publication. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for

27、any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Norma

28、tive references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held respon

29、sible for identifying any or all such patent rights. International Standard IEC 60512-15-1 has been prepared by subcommittee 48B: Connectors, of IEC technical committee 48: Electromechanical components and mechanical structures for electronic equipment. This standard cancels and replaces test 15a of

30、 IEC 60512-8, issued in 1993. This standard is to be read in conjunction with IEC 60512-1 and IEC 60512-1-100 which explains the structure of the IEC 60512 series. 60512-15-1 IEC:2008 3 The text of this standard is based on the following documents: FDIS Report on voting 48B/1843/FDIS 48B/1895/RVD Fu

31、ll information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. A list of all parts of the IEC 60512 series, under the general title Connectors for e

32、lectronic equipment Tests and measurements, can be found on the IEC website. The committee has decided that the contents of this publication will remain unchanged until the maintenance result date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publica

33、tion. At this date, the publication will be reconfirmed; withdrawn; replaced by a revised edition; or amended. 4 60512-15-1 IEC:2008 CONNECTORS FOR ELECTRONIC EQUIPMENT TESTS AND MEASUREMENTS Part 15-1: Connector tests (mechanical) Test 15a: Contact retention in insert 1 Scope and object This part o

34、f IEC 60512, when required by the detail specification, is used for testing connectors within the scope of technical committee 48. This test may also be used for similar devices when specified in a detail specification. The object of this document is to detail a standard test method to assess the ef

35、fectiveness of the contact retaining system to withstand axial loads likely to be encountered during normal use. The contact retaining system may retain the contact in an insert or directly into a housing. 2 Normative references The following referenced documents are indispensable for the applicatio

36、n of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60512-1-1, Connectors for electronic equipment Tests and measurements Part 1-1: General examination Test 1a: Visual

37、examination 3 Preparations 3.1 Preparation of specimen The specimen shall consist of a connector with its terminations, wired as specified in the detail specification. Any accessory, which do not form part of the contact retention system, shall be removed. Any preconditioning given in the detail spe

38、cification shall be applied. 3.2 Equipment For the application of the axial loads, a suitable device able to provide the controls on the loads (intensity, rate of increase, time of constant load application) shall be required (e.g.: a universal materials testing machine). NOTE If the detail specific

39、ation requires special preconditioning of the specimen, all the necessary equipment detailed in the relevant documents describing such conditioning would also be required 3.3 Mounting If mounting of the specimen is appropriate, it shall be as specified in the detail specification. 4 Test method 4.1

40、Procedure Unless otherwise stated in the detail specification, 3 connectors shall be tested. 60512-15-1 IEC:2008 5 Unless otherwise specified in the detail specification, for test specimens having fewer than 6 positions, all contacts shall be tested. For test specimens with more than 6 positions, 20

41、 % of contact positions, but not less than 6 nor more than 10, shall be tested in each test specimen. For test specimens with more than 6 positions, the contacts tested shall be chosen at random but shall include at least one contact near the periphery and and least one near the centre of the insert

42、 or housing. A force shall be applied by movement of the mechanical device used to apply load at a constant rate not exceeding 25 mm/min, until the specified force is applied. This shall then be maintained for 10 s and then removed. The foregoing procedure shall be applied to the selected contacts i

43、n turn. 4.2 Measurements 4.2.1 Before testing Visual examination according to IEC 60512-1-1 shall be done. 4.2.2 During testing After the contact is seated on the contact retention device, displacement caused by the specified force shall be measured. Any residual displacement after the specified for

44、ce is removed shall be measured. These displacements shall be recorded. The maximum axial displacement for each contact shall be measured and recorded while under load. 4.2.3 After testing Visual examination according to IEC 60512-1-1 shall be done. The maximum axial displacement for each contact af

45、ter the load is applied shall be measured and recorded. 5 Details to be specified When this test is required by a detail specification, the following shall be given therein: a) number of connectors to be tested (if other than 3); b) preconditioning required; c) wiring of the specimen; d) axial load

46、to be applied; e) permitted displacement, if any (during and after the test); f) any deviation from the standard test method. _ 6 60512-15-1 CEI:2008 COMMISSION LECTROTECHNIQUE INTERNATIONALE _ CONNECTEURS POUR QUIPEMENTS LECTRONIQUES ESSAIS ET MESURES Partie 15-1: Essais (mcaniques) des connecteurs

47、 Essai 15a: Rtention des contacts dans lisolant AVANT-PROPOS 1) La Commission Electrotechnique Internationale (CEI) est une organisation mondiale de normalisation compose de lensemble des comits lectrotechniques nationaux (Comits nationaux de la CEI). La CEI a pour objet de favoriser la coopration i

48、nternationale pour toutes les questions de normalisation dans les domaines de llectricit et de llectronique. A cet effet, la CEI entre autres activits publie des Normes internationales, des Spcifications techniques, des Rapports techniques, des Spcifications accessibles au public (PAS) et des Guides

49、 (ci-aprs dnomms “Publication(s) de la CEI“). Leur laboration est confie des comits dtudes, aux travaux desquels tout Comit national intress par le sujet trait peut participer. Les organisations internationales, gouvernementales et non gouvernementales, en liaison avec la CEI, participent galement aux travaux. La CEI collabore troitemen