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本文(IEC 62363-2008 Radiation protection instrumentation - Portable photon contamination meters and monitors《辐射防护仪器 便携式光子污染测量计和监控器》.pdf)为本站会员(appealoxygen216)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

IEC 62363-2008 Radiation protection instrumentation - Portable photon contamination meters and monitors《辐射防护仪器 便携式光子污染测量计和监控器》.pdf

1、 IEC 62363 Edition 1.0 2008-04 INTERNATIONAL STANDARD NORME INTERNATIONALE Radiation protection instrumentation Portable photon contamination meters and monitors Instrumentation pour la radioprotection Appareils portables de mesure et de surveillance de la contamination par des photons IEC 62363:200

2、8 THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2008 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission

3、 in writing from either IEC or IECs member National Committee in the country of the requester. If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or your local IEC member National Committee for furt

4、her information. Droits de reproduction rservs. Sauf indication contraire, aucune partie de cette publication ne peut tre reproduite ni utilise sous quelque forme que ce soit et par aucun procd, lectronique ou mcanique, y compris la photocopie et les microfilms, sans laccord crit de la CEI ou du Com

5、it national de la CEI du pays du demandeur. Si vous avez des questions sur le copyright de la CEI ou si vous dsirez obtenir des droits supplmentaires sur cette publication, utilisez les coordonnes ci-aprs ou contactez le Comit national de la CEI de votre pays de rsidence. IEC Central Office 3, rue d

6、e Varemb CH-1211 Geneva 20 Switzerland Email: 0Hinmailiec.ch Web: 1Hwww.iec.ch About the IEC The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes International Standards for all electrical, electronic and related technologies. About IEC p

7、ublications The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the latest edition, a corrigenda or an amendment might have been published. Catalogue of IEC publications: 2Hwww.iec.ch/searchpub The IEC on-line Catalogue enables you to se

8、arch by a variety of criteria (reference number, text, technical committee,). It also gives information on projects, withdrawn and replaced publications. IEC Just Published: 3Hwww.iec.ch/online_news/justpub Stay up to date on all new IEC publications. Just Published details twice a month all new pub

9、lications released. Available on-line and also by email. Electropedia: 4Hwww.electropedia.org The worlds leading online dictionary of electronic and electrical terms containing more than 20 000 terms and definitions in English and French, with equivalent terms in additional languages. Also known as

10、the International Electrotechnical Vocabulary online. Customer Service Centre: 5Hwww.iec.ch/webstore/custserv If you wish to give us your feedback on this publication or need further assistance, please visit the Customer Service Centre FAQ or contact us: Email: 6Hcsciec.ch Tel.: +41 22 919 02 11 Fax

11、: +41 22 919 03 00 A propos de la CEI La Commission Electrotechnique Internationale (CEI) est la premire organisation mondiale qui labore et publie des normes internationales pour tout ce qui a trait llectricit, llectronique et aux technologies apparentes. A propos des publications CEI Le contenu te

12、chnique des publications de la CEI est constamment revu. Veuillez vous assurer que vous possdez ldition la plus rcente, un corrigendum ou amendement peut avoir t publi. Catalogue des publications de la CEI: 7Hwww.iec.ch/searchpub/cur_fut-f.htm Le Catalogue en-ligne de la CEI vous permet deffectuer d

13、es recherches en utilisant diffrents critres (numro de rfrence, texte, comit dtudes,). Il donne aussi des informations sur les projets et les publications retires ou remplaces. Just Published CEI: 8Hwww.iec.ch/online_news/justpub Restez inform sur les nouvelles publications de la CEI. Just Published

14、 dtaille deux fois par mois les nouvelles publications parues. Disponible en-ligne et aussi par email. Electropedia: 9Hwww.electropedia.org Le premier dictionnaire en ligne au monde de termes lectroniques et lectriques. Il contient plus de 20 000 termes et dfinitions en anglais et en franais, ainsi

15、que les termes quivalents dans les langues additionnelles. Egalement appel Vocabulaire Electrotechnique International en ligne. Service Clients: 10Hwww.iec.ch/webstore/custserv/custserv_entry-f.htm Si vous dsirez nous donner des commentaires sur cette publication ou si vous avez des questions, visit

16、ez le FAQ du Service clients ou contactez-nous: Email: 11Hcsciec.ch Tl.: +41 22 919 02 11 Fax: +41 22 919 03 00 IEC 62363 Edition 1.0 2008-04 INTERNATIONAL STANDARD NORME INTERNATIONALE Radiation protection instrumentation Portable photon contamination meters and monitors Instrumentation pour la rad

17、ioprotection Appareils portables de mesure et de surveillance de la contamination par des photons INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE V ICS 13.280 PRICE CODE CODE PRIX ISBN 2-8318-9733-5 2 62363 IEC:2008 CONTENTS FOREWORD. 0H5 1 Scope and object 1H7 2

18、 Normative references . 2H7 3 Terms and definitions . 3H8 4 Units 4H12 5 General characteristics. 5H12 5.1 Classification. 6H12 5.2 Detection assemblies 7H12 5.3 Ease of decontamination . 8H12 5.4 Sealing 9H13 5.5 Alarm threshold. 10H13 5.6 Pulse height thresholds . 11H13 5.7 Measurement assembly in

19、dications . 12H13 5.7.1 Meter display. 13H13 5.7.2 Audible indication 14H14 5.7.3 Additional indication 15H14 5.7.4 Monitors 16H14 5.8 Effective range of measurement 17H14 5.9 Mechanical shocks 18H14 5.10 Setting up and maintenance facilities for electronic equipment 19H14 6 General test procedures

20、. 20H15 6.1 Nature of tests. 21H15 6.2 Test conditions 22H15 6.2.1 Reference and standard test conditions. 23H15 6.2.2 Tests performed under standard test conditions 24H15 6.2.3 Tests performed with variation of influence quantities 25H15 6.3 Reference radionuclides 26H15 6.4 Background. 27H15 6.5 S

21、tatistical fluctuations . 28H16 6.6 Test source . 29H16 7 Electrical characteristics. 30H16 7.1 Statistical fluctuations . 31H16 7.1.1 Requirements 32H16 7.1.2 Method of test . 33H16 7.2 Response time 34H17 7.2.1 Requirements 35H17 7.2.2 Method of test . 36H17 7.3 Interrelationship between response

22、time and statistical fluctuations 37H17 7.4 Warm-up time test . 38H18 7.4.1 Requirements 39H18 7.4.2 Method of test . 40H18 7.5 Overload protection. 41H18 7.5.1 Requirements 42H18 7.5.2 Method of test . 43H18 7.6 Power supplies battery operation 44H18 62363 IEC:2008 3 7.6.1 General . 45H18 7.6.2 Req

23、uirements primary batteries (non-rechargeable) . 46H18 7.6.3 Requirements secondary batteries (rechargeable) 47H19 7.6.4 Method of test . 48H19 8 Radiation characteristics 49H20 8.1 General . 50H20 8.2 Detector profile 51H20 8.2.1 Requirements 52H20 8.2.2 Method of test . 53H20 8.3 Surface emission

24、rate response 54H20 8.3.1 General . 55H20 8.3.2 Type test . 56H20 8.3.3 Method of test . 57H21 8.3.4 Routine test. 58H22 8.4 Relative intrinsic error . 59H22 8.4.1 Requirements 60H22 8.4.2 Method of test . 61H22 8.5 Variation of surface emission rate response with photon radiation energy . 62H22 8.5

25、.1 Requirements 63H22 8.5.2 Method of test . 64H23 8.6 Variation of response with absorption 65H23 8.6.1 Requirement 66H23 8.6.2 Method of test . 67H24 8.7 Response to beta radiation 68H24 8.7.1 Requirement 69H24 8.7.2 Method of test . 70H24 8.8 Response to background photon radiation. 71H24 8.8.1 R

26、equirement 72H24 8.8.2 Method of test . 73H25 8.9 Neutrons . 74H25 8.10 Detection limit (minimum detectable surface emission rate per unit area) 75H25 8.10.1 Requirement 76H25 8.10.2 Method of test . 77H25 9 Environmental characteristics. 78H25 9.1 Ambient temperature. 79H25 9.1.1 Requirements 80H25

27、 9.1.2 Methods of test 81H26 9.2 Relative humidity. 82H26 9.2.1 Requirements 83H26 9.2.2 Method of test . 84H26 9.3 Electromagnetic compatibility 85H26 10 Storage 86H27 10.1 General . 87H27 10.2 Mechanical shock 88H27 11 Documentation . 89H27 11.1 Identification certificate . 90H27 11.2 Operation an

28、d maintenance manual 91H27 4 62363 IEC:2008 Annex A (informative) Limit distances for typical detector volumes 92H31 Figure 1 Detector profile 93H29 Figure 2 Contiguous portions area for testing. 94H30 Table 1 Reference conditions and standard test conditions 95H28 Table 2 Test performed under stand

29、ard test conditions 96H28 Table 3 Test performed with variation of influence quantities . 97H29 Table A.1 Limit distance for various detector volumes and window types . 98H31 62363 IEC:2008 5 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ RADIATION PROTECTION INSTRUMENTATION PORTABLE PHOTON CONTAMINATI

30、ON METERS AND MONITORS FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning

31、 standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their pre

32、paration is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non- governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closel

33、y with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant

34、 subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the tech

35、nical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum ext

36、ent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for a

37、ny equipment declared to be in conformity with an IEC Publication. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committee

38、s and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications.

39、8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent ri

40、ghts. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 62363 has been prepared by subcommittee 45B: Radiation protection instrumentation, of IEC technical committee 45: Nuclear instrumentation. This standard should be regarded as a complemen

41、tary standard to IEC 60325, which is applicable to alpha and beta contamination monitoring assemblies. The text of this standard is based on the following documents: FDIS Report on voting 45B/579/FDIS 45B/590/RVD Full information on the voting for the approval of this standard can be found in the re

42、port on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. 6 62363 IEC:2008 The committee has decided that the contents of this publication will remain unchanged until the maintenance result date indicated on the IEC web site und

43、er “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. 62363 IEC:2008 7 RADIATION PROTECTION INSTRUMENTATION PORTABLE PHOTON CONTAMINATION METERS AND MONITORS 1 Scope and obj

44、ect This International Standard is applicable to portable and transportable contamination meters and monitors designed for the direct measurement or the direct detection of surface contamination by photon radiation emitting radionuclides and which comprise at least: a detection assembly (comprising

45、counter tube, scintillation detector or semiconductor detector, etc.), which may be connected either rigidly or by means of a flexible cable or incorporated into a single assembly; a measurement assembly. The standard is applicable to: photon surface contamination meters; photon surface contaminatio

46、n monitors. The standard is applicable to detection assemblies that are designed to measure photon contamination from radionuclides which emit photons with energy in excess of 5 keV. In particular, this standard should be used to assess the performance of assemblies used to demonstrate that material

47、 is free from surface contamination by photon emitting radionuclides. This standard is also applicable to special purpose assemblies and to assemblies specifically designed to provide limited spectroscopic information to the user. NOTE These detection assemblies may be used to measure photon emissio

48、ns from radionuclides that also emit alpha and beta radiations, where the alpha and beta emissions may be shielded due to the nature of the contamination. If shielding of the radioactive emissions occurs, then strictly speaking, the contamination is near to rather than on the surface of the article

49、being monitored. The object of this standard is to lay down standard requirements and to give examples of acceptable methods, and also to specify general characteristics, general test conditions, radiation characteristics, electrical safety, environmental characteristics, and the requirements of the identification certificate for photon contamination meters and monitors. 2 Normative references The following refe

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