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本文(IEC TS 62492-1-2008 Industrial process control devices - Radiation thermometers - Part 1 Technical data for radiation thermometers《工业过程控制装置 辐射温度计 第1部分 辐射温度计的技术数.pdf)为本站会员(deputyduring120)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

IEC TS 62492-1-2008 Industrial process control devices - Radiation thermometers - Part 1 Technical data for radiation thermometers《工业过程控制装置 辐射温度计 第1部分 辐射温度计的技术数.pdf

1、 IEC/TS 62492-1 Edition 1.0 2008-04 TECHNICAL SPECIFICATION SPCIFICATION TECHNIQUE Industrial process control devices Radiation thermometers Part 1: Technical data for radiation thermometers Dispositifs de commande des processus industriels Pyromtres Partie 1: Donnes techniques pour les pyromtres IE

2、C/TS 62492-1:2008 THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2008 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, wi

3、thout permission in writing from either IEC or IECs member National Committee in the country of the requester. If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or your local IEC member National Co

4、mmittee for further information. Droits de reproduction rservs. Sauf indication contraire, aucune partie de cette publication ne peut tre reproduite ni utilise sous quelque forme que ce soit et par aucun procd, lectronique ou mcanique, y compris la photocopie et les microfilms, sans laccord crit de

5、la CEI ou du Comit national de la CEI du pays du demandeur. Si vous avez des questions sur le copyright de la CEI ou si vous dsirez obtenir des droits supplmentaires sur cette publication, utilisez les coordonnes ci-aprs ou contactez le Comit national de la CEI de votre pays de rsidence. IEC Central

6、 Office 3, rue de Varemb CH-1211 Geneva 20 Switzerland Email: inmailiec.ch Web: www.iec.ch About the IEC The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes International Standards for all electrical, electronic and related technologies.

7、 About IEC publications The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the latest edition, a corrigenda or an amendment might have been published. Catalogue of IEC publications: www.iec.ch/searchpub The IEC on-line Catalogue enables

8、 you to search by a variety of criteria (reference number, text, technical committee,). It also gives information on projects, withdrawn and replaced publications. IEC Just Published: www.iec.ch/online_news/justpub Stay up to date on all new IEC publications. Just Published details twice a month all

9、 new publications released. Available on-line and also by email. Electropedia: www.electropedia.org The worlds leading online dictionary of electronic and electrical terms containing more than 20 000 terms and definitions in English and French, with equivalent terms in additional languages. Also kno

10、wn as the International Electrotechnical Vocabulary online. Customer Service Centre: www.iec.ch/webstore/custserv If you wish to give us your feedback on this publication or need further assistance, please visit the Customer Service Centre FAQ or contact us: Email: csciec.ch Tel.: +41 22 919 02 11 F

11、ax: +41 22 919 03 00 A propos de la CEI La Commission Electrotechnique Internationale (CEI) est la premire organisation mondiale qui labore et publie des normes internationales pour tout ce qui a trait llectricit, llectronique et aux technologies apparentes. A propos des publications CEI Le contenu

12、technique des publications de la CEI est constamment revu. Veuillez vous assurer que vous possdez ldition la plus rcente, un corrigendum ou amendement peut avoir t publi. Catalogue des publications de la CEI: www.iec.ch/searchpub/cur_fut-f.htm Le Catalogue en-ligne de la CEI vous permet deffectuer d

13、es recherches en utilisant diffrents critres (numro de rfrence, texte, comit dtudes,). Il donne aussi des informations sur les projets et les publications retires ou remplaces. Just Published CEI: www.iec.ch/online_news/justpub Restez inform sur les nouvelles publications de la CEI. Just Published d

14、taille deux fois par mois les nouvelles publications parues. Disponible en-ligne et aussi par email. Electropedia: www.electropedia.org Le premier dictionnaire en ligne au monde de termes lectroniques et lectriques. Il contient plus de 20 000 termes et dfinitions en anglais et en franais, ainsi que

15、les termes quivalents dans les langues additionnelles. Egalement appel Vocabulaire Electrotechnique International en ligne. Service Clients: www.iec.ch/webstore/custserv/custserv_entry-f.htm Si vous dsirez nous donner des commentaires sur cette publication ou si vous avez des questions, visitez le F

16、AQ du Service clients ou contactez-nous: Email: csciec.ch Tl.: +41 22 919 02 11 Fax: +41 22 919 03 00 IEC/TS 62492-1 Edition 1.0 2008-04 TECHNICAL SPECIFICATION SPCIFICATION TECHNIQUE Industrial process control devices Radiation thermometers Part 1: Technical data for radiation thermometers Disposit

17、ifs de commande des processus industriels Pyromtres Partie 1: Donnes techniques pour les pyromtres INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE S ICS 25.040.40; 17.200.20 PRICE CODE CODE PRIX ISBN 2-8318-9722-X 2 TS 62492-1 IEC:2008 CONTENTS FOREWORD.3 1 Scope

18、.5 2 Normative references .5 3 Terms, definitions and abbreviations 5 3.1 Terms and definitions 5 3.2 Abbreviations 7 4 Technical data8 4.1 Types of technical data .8 4.1.1 Metrological data.8 4.1.2 Equipment features .20 Annex A (informative) .21 Figure 1 Demonstration of the response time to a ris

19、ing temperature step .18 Figure 2 Demonstration of the exposure time.19 Table 1 Measurement uncertainty (example 1).10 Table 2 Measurement uncertainty (example 2).10 Table A.1 Change in indicated temperature corresponding to a 1 % change in the radiation exchange with a radiation thermometer at 23 C

20、 21 TS 62492-1 IEC:2008 3 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ INDUSTRIAL PROCESS CONTROL DEVICES RADIATION THERMOMETERS Part 1: Technical data for radiation thermometers FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising

21、 all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards,

22、 Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparator

23、y work. International, governmental and non- governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizatio

24、ns. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of rec

25、ommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by

26、any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional p

27、ublication shall be clearly indicated in the latter. 5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any equipment declared to be in conformity with an IEC Publication. 6) All users should ensure that they have the latest edition of this publicati

28、on. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or f

29、or costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct

30、application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. The main task of IEC technical committees is to prepare In

31、ternational Standards. In exceptional circumstances, a technical committee may propose the publication of a technical specification when the required support cannot be obtained for the publication of an International Standard, despite repeated efforts, or the subject is still under technical develop

32、ment or where, for any other reason, there is the future but no immediate possibility of an agreement on an International Standard. Technical specifications are subject to review within three years of publication to decide whether they can be transformed into International Standards. IEC/TS 62492-1,

33、 which is a technical specification, has been prepared by subcommittee 65B: Devices and process analysis, of IEC technical committee 65: Industrial-process measurement, control and automation. The text of this technical specification is based on the following documents: 4 TS 62492-1 IEC:2008 Enquiry

34、 draft Report on voting 65B/622/DTS 65B/649/CC Full information on the voting for the approval of this technical specification can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. This Technical Specif

35、ication is one of a series of publications on radiation thermometers. Future parts of this series are planned with the following titles: Part 2: Determination of the technical data for radiation thermometers (under consideration); Part 3: Calibration of radiation thermometers (under consideration).

36、The committee has decided that the contents of this publication will remain unchanged until the maintenance result date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be transformed into an International

37、 standard, reconfirmed, withdrawn, replaced by a revised edition, or amended. TS 62492-1 IEC:2008 5 INDUSTRIAL PROCESS CONTROL DEVICES RADIATION THERMOMETERS Part 1: Technical data for radiation thermometers 1 Scope This Technical Specification applies to radiation thermometry. It defines the techni

38、cal data, i.e. metrological data to be given in data sheets and operating instructions for radiation thermometers with one wavelength range and one measurement field, to ensure that the data and terminology are used consistently. Technical data for radiation thermometers are frequently given using t

39、erms whose meaning is not clear and therefore open to misinterpretation. Moreover, the data are given for measuring conditions which are not standardised. Often, influence parameters and mutual interdependencies of technical data are not given. As a result, the user cannot easily compare the technic

40、al design and performance data of radiation thermometers and tests for compliance with the manufacturers specifications are difficult to carry out. The purpose of this Technical Specification is to facilitate comparability and testability. Therefore, unambiguous definitions are stipulated for statin

41、g technical data under standardised measuring conditions. NOTE 1 Infrared ear thermometers are excluded from this Specification. NOTE 2 It is not compulsory for manufacturers and sellers of radiation thermometers to include all items given in this Specification for a specific type of radiation therm

42、ometer. Only the relevant data should be stated and should comply with this Specification. 2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest editio

43、n of the referenced document (including any amendments) applies. Guide to the Expression of Uncertainty of Measurement (1995) BIPM, IEC, IFCC, ISO, IUPAC, IUPAP, OIML International Vocabulary of Basic and General Terms in Metrology (1993) BIPM, IEC, IFCC, ISO, IUPAC, IUPAP, OIML 3 Terms, definitions

44、 and abbreviations 3.1 Terms and definitions For the purposes of this document, the following terms and definitions apply. 3.1.1 measuring temperature range temperature range for which the radiation thermometer is designed 6 TS 62492-1 IEC:2008 3.1.2 measurement uncertainty (accuracy) parameter, ass

45、ociated with the result of a measurement, that characterises the dispersion of the values that could reasonably be attributed to the measurand 3.1.3 noise equivalent temperature difference parameter which indicates the contribution of the measurement uncertainty in C, which is due to instrument nois

46、e 3.1.4 measuring distance distance or distance range between the radiation thermometer and the target (measured object) for which the radiation thermometer is designed 3.1.5 field-of-view usually circular, flat surface of a measured object from which the radiation thermometer receives radiation 3.1

47、.6 distance ratio ratio of the measuring distance to the diameter of the field-of-view when the target is in focus 3.1.7 size-of-source effect difference in the radiance- or temperature reading of the radiation thermometer when changing the size of the radiating area of the observed source 3.1.8 emi

48、ssivity setting the emissivity of a surface is the ratio between the radiation emitted from this surface and the radiation from a blackbody at the same temperature. The emissivity describes a thermo- physical material characteristic, which in addition to the chemical composition of the material may

49、also be dependent on the surface structure (rough, smooth), the emission direction as well as on the observed wavelength and the temperature of the measured object. In most measuring situations a radiation thermometer is used on a surface with an emissivity significantly lower than 1. For this purpose most thermometers have the possibility of adjusting the emissivity setting. The temperature reading i

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