IEEE C57.12.58-2017 Guide for Conducting a Transient Voltage Analysis of a Dry-Type Transformer Coil.pdf

1、IEEE Guide for Conducting a Transient Voltage Analysis of a Dry-Type Transformer Coil IEEE Std C57.12.58-2017 (Revision of IEEE Std C57.12.58-1991) IEEE Power and Energy Society Sponsored by the Transformers Committee IEEE 3 Park Avenue New York, NY 10016-5997 USAIEEE Std C57.12.58-2017 (Revision of

2、 IEEE Std C57.12.58-1991) IEEE Guide for Conducting a Transient Voltage Analysis of a Dry-Type Transformer Coil Sponsor Transformers Committee of the IEEE Power and Energy Society Approved 15 June 2017 IEEE-SA Standards BoardAbstract: General recommendations for measuring voltage transients in dry-t

3、ype distribution and power transformers are provided. Recurrent surge voltage generator circuitry, instrumentation, test sample, test point location, mounting the test coil, conducting the test, and reporting results are covered. Keywords: IEEE C57.12.58, impulse distribution, recurrent surge genera

4、tor, transient voltage analysis The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2017 by The Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 13 November 2017. Printed in the United States of Ameri

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34、submitted to the IEEE-SA Standards Board for approval, the following attendees of the Dry-Type Transformers Subcommittee provided input on the revision of this document: Roger C. Wicks, Chair James Antweiler R. Casey Ballard J. Arturo Del Rio Derek Foster Mark Gromlovits Phil Hopkinson Mohammad Iman

35、 John John Charles Johnson Sheldon Kennedy Aleksandr Levin Tim-Felix Mai Richard Marek Martin Navarro Klaus Papp Dhiru Patel Klaus Pointner Paulette Payne Powell Thomas Prevost Michael Sharp Sanjib Som David Stankes Vijay Tendulkar David Walker The following members of the individual balloting commi

36、ttee voted on this guide. Balloters may have voted for approval, disapproval, or abstention. Roy Alexander R. Casey Ballard Peter Balma Barry Beaster W.J. (Bill) Bergman Paul Cardinal John Crouse Gary Donner Jorge Fernandez Daher Bruce Forsyth Derek Foster Jalal Gohari Randall Groves Werner Hoelzl M

37、ohammad Iman Richard Jackson John John Charles Johnson Laszlo Kadar Jim Kulchisky Chung-Yiu Lam William Larzelere Aleksandr Levin Tim-Felix Mai Omar Mazzoni Daleep Mohla Daniel Mulkey Jerry Murphy K. R. M. Nair Martin Navarro Michael Newman Raymond Nicholas T. W . Olsen Lorraine Padden Mirko Palazzo

38、 Klaus Papp Bansi Patel Shawn Patterson Paulette Payne Powell Alvaro Portillo Iulian Profir Johannes Rickmann Thomas Rozek Ryandi Ryandi Bartien Sayogo Jeremy Smith Jerry Smith David Stankes Ralph Stell David Tepen James V an De Ligt Roger V erdolin John V ergis David Walker John Wang Kenneth White

39、Roger C. Wicks Jian Y u When the IEEE-SA Standards Board approved this guide on 15 June 2017, it had the following membership: Jean-Philippe Faure, Chair Gary Hoffman, Vice Chair John D. Kulick, Past Chair Konstantinos Karachalios, Secretary Chuck Adams Masayuki Ariyoshi Ted Burse Stephen Dukes Doug

40、 Edwards J. Travis Griffith Michael Janezic Thomas Koshy Joseph L. Koepfinger* Kevin Lu Daleep Mohla Damir Novosel Ronald C. Petersen Annette D. Reilly Robby Robson Dorothy Stanley Adrian Stephens Mehmet Ulema Phil Wennblom Howard Wolfman Y u Y uan *Member Emeritus7 Copyright 2017 IEEE. All rights r

41、eserved. Introduction This introduction is not part of IEEE Std C57.12.58-2017, IEEE Guide for Conducting a Transient V oltage Analysis of a Dry-Type Transformer Coil. This guide covers general recommendations for measuring voltage transients in dry-type distribution and power transformers. Insulati

42、on is recognized as one of the most important components of a transformer. Its major function is to prevent dielectric breakdown between parts with different voltage potentials. Insulation materials and components are also a part of the mechanical structure of the transformer. Any weakness of insula

43、tion may result in the failure of the transformer. Dielectric strength is a measure of the effectiveness with which insulation performs. It was once accepted that low-frequency tests alone were adequate to demonstrate the dielectric strength of transformers. As more became known about lightning phen

44、omena, and as impulse testing apparatus was developed, it became apparent that the distribution of impulse voltage stress through the transformer winding varies with the configuration of the windings. Impulse voltages are distributed initially on the basis of winding capacitances. If this initial di

45、stribution differs from the final low-frequency inductance distribution, the impulse energy will oscillate between the two distributions until the energy is dissipated and the inductance distribution is reached. In severe cases, these internal oscillations can produce voltages to ground that approac

46、h twice the applied voltage. Along with the variation in size of transformer windings and the physical configuration of the windings, the impulse voltage distribution when chopping the applied wave was considered by the task force that developed this guide. Since there was insufficient information o

47、n how to interpret the short-time oscillations on the insulation system, the inclusion of the chopped wave was deferred until a later date. This document was originally developed in 1991 to determine standard methods for examining the impulse voltage distribution within dry-type transformer windings

48、; to establish a means for defining the location and magnitude of maximum voltage stress in a dry-type transformer coil; and to support other IEEE standards such as the thermal evaluation document, IEEE Std C57.12.60 B6. 1 This updated version of IEEE Std C57.12.58 corrects some editorial and techni

49、cal issues from the original document. The task force involved in the revision of this document considered a more extensive revision of the document (incorporating use of commercial equipment and new software techniques), but due to a compressed time frame determined to defer this more extensive revision after the approval of this document. 1 The numbers in brackets correspond to those of the bibliography in Annex A.