IEEE 48-2009 - IEEE Standard for Test Procedures and Requirements for Alternating-Current Cable Terminations Used on Shielded Cables Having Laminated Insulation Rated 2.5 kV through 765 kV.pdf

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17、#23#23#23#23IEEE Std 48-2009 (Revision of IEEE Std 48-1996) IEEE Standard for Test Procedures and Requirements for Alternating-Current Cable Terminations Used on Shielded Cables Having Laminated Insulation Rated 2.5 kV through 765 kV or Extruded Insulation Rated 2.5 kV through 500 kV Sponsor Insulat

18、ed Conductors Committee of the IEEE Power +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. iv Copyright 2009 IEEE. All rights reserved. Introduction This introduction is not part of

19、 IEEE Std 48-2009, IEEE Standard for Test Procedures and Requirements for Alternating-Current Cable Terminations Used on Shielded Cables Having Laminated Insulation Rated 2.5 kV through 765 kV or Extruded Insulation Rated 2.5 kV through 500 kV. This standard supersedes IEEE Std 48-1996, IEEE Standar

20、d Test Procedures and Requirements for Alternating-Current Cable Terminations 2.5 kV through 765 kV. This standard has been harmonized with IEEE Std 404-2006 B21ato allow for simultaneous testing of terminations and joints. Definitions specific to this standard are contained in Clause 3. All other d

21、efinitions and terminology used herein can be found in The IEEE Standards Dictionary: Glossary of Terms Table 1 is for cable terminations rated 2.5 kV to 46 kV, and the Table 2 is for cable terminations rated 69 kV to 500 kV. In Clause 8, 8.2.1, provisions have been made to allow either the 10 s or

22、the 60 s precipitation test. Subclause 8.4.3 for leak test has been completely rewritten. Clause 9 has been expanded to include a pollution severity guide to assist the user in defining a particular environment and helping determine the type of termination and creepage length needed. Clause 10 has b

23、een added to discuss the effects of solar radiation and test methods are recommended. The user is also advised to refer to the manufacturer for contamination testing, particularly if difficult environments are encountered. Notice to users Laws and regulations Users of these documents should consult

24、all applicable laws and regulations. Compliance with the provisions of this standard does not imply compliance to any applicable regulatory requirements. Implementers of the standard are responsible for observing or referring to the applicable regulatory requirements. IEEE does not, by the publicati

25、on of its standards, intend to urge action that is not in compliance with applicable laws, and these documents may not be construed as doing so. aThe numbers in brackets correspond to those of the bibliography in Annex A. bThe IEEE Standards Dictionary: Glossary of Terms & Definitions is available a

26、t http:/shop.ieee.org/. v Copyright 2009 IEEE. All rights reserved. Copyrights This document is copyrighted by the IEEE. It is made available for a wide variety of both public and private uses. These include both use, by reference, in laws and regulations, and use in private self-regulation, standar

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30、t the IEEE at the address listed previously. For more information about the IEEE Standards Association or the IEEE standards development process, visit the IEEE-SA web site at http:/standards.ieee.org. Errata Errata, if any, for this and all other standards can be accessed at the following URL: http

31、:/standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL for errata periodically. Interpretations Current interpretations can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/interp/ index.html. Patents Attention is called to the poss

32、ibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE is not responsible for identifying Essential

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34、ble or non-discriminatory. Users of this standard are expressly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. vi Copyright 20

35、09 IEEE. All rights reserved. Participants At the time this standard was submitted to the IEEE-SA Standards Board for approval, the B1W Working Group had the following membership: Jim Braun, Chair Bill Taylor, Vice Chair Edward Bradley Thomas C. Champion John DuPont Jon Erickson Robert Fulcomer Robe

36、rt Gear Richie Harp Rick Hartlein Wolfgang Haverkamp Gael R. Kennedy Albert Kong Glenn Luzzi John Makel Mike Malia Ewell T. Robeson Gregory Stano Frank Stepniak Milan Uzelac Harry Yaworski The following members of the individual balloting committee voted on this standard. Balloters may have voted fo

37、r approval, disapproval, or abstention. Ali Al Awazi Earle Bascom William Bloethe Harvey Bowles A James Braun Kent Brown Vern Buchholz Thomas C. Champion Robert Christman John Cooper Tommy Cooper F. A. Denbrock John Densley Gary L. Donner Randall Dotson Dana Dufield Donald Dunn Gary Engmann Marcel F

38、ortin Robert Fulcomer Robert Gear Steven Graham Randall Groves Jeffrey Hartenberger Wolfgang Haverkamp Steven Hensley Lee Herron Lauri Hiivala David Horvath Edward M. Jankowich A. S. Jones Gael R. Kennedy Jim Kulchisky Chung-Yiu Lam Glenn Luzzi Keith Malmedal William McBride John Merando Gary Michel

39、 C. Michael Miller Rachel I. Mosier Jerry Murphy Michael S. Newman Joe Nims Neal Parker Christopher Petrola Iulian Profir Madan Rana Robert Resuali Johannes Rickmann Michael Roberts Bartien Sayogo Michael Smalley Jerry Smith Nagu Srinivas Gregory Stano John Vergis Martin Von Herrmann Waldemar Von Mi

40、ller Timmy Wright Tiebin Zhao vii Copyright 2009 IEEE. All rights reserved. When the IEEE-SA Standards Board approved this standard on 17 June 2009, it had the following membership: Robert M. Grow, Chair Thomas Prevost, Vice Chair Steve M. Mills, Past Chair Judith Gorman, Secretary John Barr Karen B

41、artleson Victor Berman Ted Burse Richard DeBlasio Andy Drozd Mark Epstein Alexander Gelman Jim Hughes Rich Hulett Young Kyun Kim Joseph L. Koepfinger* John Kulick David Law Ted Olsen Glenn Parsons Ron Petersen Narayanan Ramachandran Jon Rosdahl Sam Sciacca *Member Emeritus Also included are the foll

42、owing nonvoting IEEE-SA Standards Board liaisons: Howard Wolfman, TAB Representative Michael Janezic, NIST Representative Satish Aggarwal, NRC Representative Lisa Perry IEEE Standards Program Manager, Document Development Soo H. Kim IEEE Standards Program Manager, Technical Program Development viii

43、Copyright 2009 IEEE. All rights reserved. Contents 1. Scope . 1 2. Normative references. 2 3. Definitions. 2 4. Service conditions . 3 4.1 Standard service conditions . 3 4.2 Nonstandard service conditions. 4 5. Rating . 4 6. Product markings. 6 7. Test requirements . 6 7.1 Design tests. 6 7.2 Routine tests . 7 7.3 Installed field tests. 8 8. Test procedures. 13 8.1 Preparation of test specimen. 13 8.2 Standard test conditions.