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IEEE C37.246-2017 - IEEE Guide for Protection Systems of Transmission-to-Generation Interconnections.pdf

1、IEEE Guide for Protection Systems of Transmission-to-Generation Interconnections IEEE Std C37.246-2017 IEEE Power and Energy Society Sponsored by the Power System Relaying and Control Committee IEEE 3 Park Avenue New York, NY 10016-5997 USAIEEE Std C37.246-2017 IEEE Guide for Protection Systems of T

2、ransmission-to-Generation Interconnections Sponsor Power System Relaying and Control Committee of the IEEE Power and Energy Society Approved 28 September 2017 IEEE-SA Standards BoardAbstract: This guide documents accepted protection practices for transmission-to-generation interconnections. It is in

3、tended to cover the protection system applications at the interconnections between transmission systems and generation facilities greater than 10 MVA. This guide does not cover distributed energy resources. Keywords: generation facility, generator owner, IEEE C37.246, interconnection, interconnectio

4、n protection, point of interconnection, power system, transmission owner, transmission system The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2018 by The Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Pub

5、lished 11 May 2018. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent fitness for a particular purpose; non-infringement; and quality, accuracy, effectiveness, currency, or completeness of material. In addition, IEEE disclaims any and all conditions relating

6、to: results; and workmanlike effort. IEEE standards documents are supplied “AS IS” and “WITH ALL FAULTS.” Use of an IEEE standard is wholly voluntary. The existence of an IEEE standard does not imply that there are no other ways to produce, test, measure, purchase, market, or provide other goods and

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11、Y WAY OUT OF THE PUBLICATION, USE OF, OR RELIANCE UPON ANY STANDARD, EVEN IF ADVISED OF THE POSSIBILITY OF SUCH DAMAGE AND REGARDLESS OF WHETHER SUCH DAMAGE W AS FORESEEABLE.4 Copyright 2018 IEEE. All rights reserved. Translations The IEEE consensus development process involves the review of documen

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14、ke it clear that his or her views should be considered the personal views of that individual rather than the formal position of IEEE. Comments on standards Comments for revision of IEEE Standards documents are welcome from any interested party, regardless of membership affiliation with IEEE. However

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18、wing address: Secretary, IEEE-SA Standards Board 445 Hoes Lane Piscataway, NJ 08854 USA Laws and regulations Users of IEEE Standards documents should consult all applicable laws and regulations. Compliance with the provisions of any IEEE Standards document does not imply compliance to any applicable

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27、ents, corrigenda, or errata, visit the IEEE Xplore at http:/ ieeexplore .ieee .or g/ or contact IEEE at the address listed previously. For more information about the IEEE-SA or IEEEs standards development process, visit the IEEE-SA Website at http:/ standards .ieee .or g. Errata Errata, if any, for

28、all IEEE standards can be accessed on the IEEE-SA Website at the following URL: http:/ standards .ieee .org/ findstds/ errata/ index .html. Users are encouraged to check this URL for errata periodically. Patents Attention is called to the possibility that implementation of this standard may require

29、use of subject matter covered by patent rights. By publication of this standard, no position is taken by the IEEE with respect to the existence or validity of any patent rights in connection therewith. If a patent holder or patent applicant has filed a statement of assurance via an Accepted Letter o

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32、or which a license may be required, for conducting inquiries into the legal validity or scope of Patents Claims, or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-disc

33、riminatory. Users of this standard are expressly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association.6 Copyright 2018 IEEE. All righ

34、ts reserved. Participants At the time this guide was completed, the C18 Working Group had the following membership: Alla Deronja, Chair Keith Houser, Vice Chair Abu Bapary Jeffrey Barsch Randall Cunico Will English Dominick Fontana Dale Fredrickson Nathan Gulczynski Mike Jensen Gerald Johnson (corre

35、sponding) Y uan Liao Heather Malson Rene Midence (corresponding) Dean Miller John Miller Adi Mulawarman (corresponding) Mukesh Nagpal James OBrien Mahendra Patel Manish Patel Neftaly Torres (corresponding) Ian Tualla Joe Uchiyama Joseph V alenzuela Solveig Ward Richard Y oung The following members o

36、f the individual balloting committee voted on this guide. Balloters may have voted for approval, disapproval, or abstention. Ali Al A wazi Radoslav Barac Thomas Barnes Jeffrey Barsch Michael Basler Philip Beaumont Martin Best Wallace Binder Thomas Blair William Bloethe Brian Boysen Clarence Bradley

37、Jeffrey Brogdon Demetrio Bucaneg William Bush William Byrd Paul Cardinal Randall Crellin Randall Cunico Jonathan Deverick Kevin Donahoe Gary Donner Michael Dood Ahmed El Sherbieny Dominick Fontana Dale Fredrickson Jean-Sebastien Gagnon Jalal Gohari Stephen Grier Randall Groves Nathan Gulczynski Roge

38、r Hedding Werner Hoelzl Robert Hoerauf Gerald Johnson Peter Kelly Yuri Khersonsky James Kinney Gary Kobet Boris Kogan Jim Kulchisky Mikhail Lagoda Chung-Yiu Lam Raluca Lascu Lawrenc Long Don Lukach Bruce Mackie Heather Malson Omar Mazzoni Walter McCannon Dean Miller Daleep Mohla Joe Mooney Brian Mug

39、alian Adi Mulawarman Jerry Murphy R. Murphy Bruce Muschlitz Anthony Napikoski Michael Newman James OBrien Lorraine Padden Subhash Patel Christopher Petrola Robert Pettigrew Charles Rogers Steven Sano Thomas Schossig Robert Seitz Hyeong Sim Philip Spotts Wayne Stec Gary Stoedter Michael Thompson Wayn

40、e Timm Demetrios Tziouvaras James V an De Ligt Tou V ang John V ergis Quintin V erzosa Christopher Walker John Wang Karl Weber Kenneth White Roger Whittaker Philip Winston Richard Y oung Jian Y u7 Copyright 2018 IEEE. All rights reserved. When the IEEE-SA Standards Board approved this guide on 28 Se

41、ptember 2017, it had the following membership: Jean-Phillipe Faure, Chair Gary Hoffman, Vice Chair John D. Kulick, Past Chair Konstantinos Karachalios, Secretary Chuck Adams Masayuki Ariyoshi Ted Burse Stephen Dukes Doug Edwards J. Travis Griffith Michael Janezic Thomas Koshy Joseph L. Koepfinger* Kevin Lu Daleep Mohla Damir Novosel Ronald C. Petersen Annette D. Reilly Robby Robson Dorothy Stanley Adrian Stephens Mehmet Ulema Phil Wennblom Howard Wolfman Y u Y uan *Member Emeritus

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