IEEE 1671.3-2007 - IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML (eXtensible Markup Language) .pdf

1、 IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML (eXtensible Markup Language): Exchanging UUT (Unit Under Test) Description Information Sponsored by the IEEE Standards Coordinating Committee 20 on Test and Diagnosis for Electronic Systems IEE

2、E 3 Park Avenue New York, NY 10016-5997 USA IEEE Standards Coordinating Committee 20 IEEE Std 1671.3-2007 IEEE Std 1671.3TM-2007 IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML (eXtensible Markup Language): Exchanging UUT (Unit Under Test) De

3、scription Information Sponsor IEEE Standards Coordinating Committee 20 on Test and Diagnosis for Electric Systems Approved 5 December 2007 IEEE-SA Standards Board Approved as a Full-Use Standard 9 December 2009 IEEE-SA Standards Board Abstract: This document specifies an exchange format, using XML,

4、for identifying all of the hardware, software, and documentation associated with a unit under test (UUT). This UUT may be tested and diagnosed using a test program set (TPS) on an automatic test system (ATS). Keywords: automatic test equipment (ATE), Automatic Test Markup Language (ATML), ATML insta

5、nce document, automatic test system (ATS), unit under test (UUT), XML schema The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2014 by The Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 11 July 20

6、14. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center.iv Copyright 2014 IEEE. All rights res

7、erved. Introduction This introduction is not part of IEEE Std 1671.3-2007, IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML (eXtensible Markup Language): Exchanging UUT (Unit Under Test) Description Information. The benefits of using standards

8、 in test-related applications have long been recognized. The scope for standardization extends from low-level standards associated with test instrument control to high-level standards associated with specifying tests in an implementation-independent manner. In the 1960s, Aeronautical Radio, Incorpor

9、ated (ARINC) started the development of the Abbreviated Test Language for Avionics Systems. In 1976, management of the ATLAS standard was passed to the IEEE, and the ATLAS acronym was changed to Abbreviated Test Language for All Systems to reflect its broader field of applications. Within the IEEE,

10、development of ATLAS and ATLAS-related standards was vested in an ad hoc committee, which later became the IEEE Standards Coordinating Committee 20 (SCC20). In the mid-1980s, SCC20 broadened the scope of its activities to embrace other standards projects related to test and diagnosis, including Auto

11、matic Test Program Generation (ATPG), Test Equipment Description Language (TEDL), Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE), A Broad Based Environment for Test (ABBET), Software Interface to Maintenance Information and Collection Analysis (SIMICA), Receive

12、r Fixture Interface (RFI), Signal and Test Definition (STD), and Automatic Test Markup Language (ATML). The parent standard, IEEE Std 1671TM,aprovides the framework for a family of standards providing specifications for test-related applications and environments. This family incorporates language-in

13、dependent elements within a wide variety of test environments, including built-in test (BIT) systems, automatic test systems (ATS), and manual test environments. Each of these interfaces is specified in the form of a XML schema. This child, or “dot,” standard, also known as an ATML component standar

14、d, provides for the definition of the UUTDescription and UUTInstance XML schemas, and contains references to examples. The XML schemas and examples accompany this standard. These XML schemas provide for the identification and definition of a UUT. XML schemas define the basic information required wit

15、hin any test application and provide a vehicle for formally defining the test environment by defining a class hierarchy corresponding to these basic information entities and provide several methods within each to enable basic operations to be performed on these entities. ATML component standards wit

16、hin the ATML framework define the particular requirements within the test environment. Notice to users Laws and regulations Users of these documents should consult all applicable laws and regulations. Compliance with the provisions of this standard does not imply compliance to any applicable regulat

17、ory requirements. Implementers of the standard are responsible for observing or referring to the applicable regulatory requirements. IEEE does not, by the publication of its standards, intend to urge action that is not in compliance with applicable laws, and these documents may not be construed as d

18、oing so. aIEEE publications are available from the Institute of Electrical and Electronics Engineers, 445 Hoes Lane, Piscataway, NJ 08854, USA (http:/standards/ieee.org/). v Copyright 2014 IEEE. All rights reserved. Copyrights This document is copyrighted by the IEEE. It is made available for a wide

19、 variety of both public and private uses. These include both use, by reference, in laws and regulations, and use in private self-regulation, standardization, and the promotion of engineering practices and methods. By making this document available for use and adoption by public authorities and priva

20、te users, the IEEE does not waive any rights in copyright to this document. Updating of IEEE documents Users of IEEE standards should be aware that these documents may be superseded at any time by the issuance of new editions or may be amended from time to time through the issuance of amendments, co

21、rrigenda, or errata. An official IEEE document at any point in time consists of the current edition of the document together with any amendments, corrigenda, or errata then in effect. In order to determine whether a given document is the current edition and whether it has been amended through the is

22、suance of amendments, corrigenda, or errata, visit the IEEE Standards Association Web site at http:/ieeexplore.ieee.org/xpl/standards.jsp, or contact the IEEE at the address listed previously. For more information about the IEEE Standards Association or the IEEE standards development process, visit

23、the IEEE-SA Web site at http:/standards.ieee.org. Errata Errata, if any, for this and all other standards can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL for errata periodically. Interpretations Current int

24、erpretations can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/interp/index.html. Patents Attention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is

25、taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of Patents Claims or determining whether an

26、y licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this standard are expressly advised that determination of the validity of any patent rights, and the risk of infringe

27、ment of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association vi Copyright 2014 IEEE. All rights reserved. Participants At the time this standard was submitted to the IEEE-SA Standards Board for approval, the Test Information Integ

28、ration (TII) Subcommittee had the following membership: Chris Gorringe, Co-chair Mike Seavey, Co-chair Sherif Abdelwahed Nasir Ahmed Hakan Akgun Stephen Allen Anthony Alwardt Jack Amsell Brian Anderson Bill Ash Wesley Barnishan Keith Beard Dennis Beaugrand John Berlekamp Gregory Bowman Malcolm Brown

29、 Antonius Bunsen Darryl Busch Giampiero Casalegno Steve Cmiel Kevin Coggins Matt Cornish James Darlington Bernard Dathy Timothy Davis David B. Droste James Dumser Gail Edwards Heiko Ehrenberg Tamara Einspanjer William Eklow Huseyin Ellezer Keith Ellis Jennifer Fetherman Ken Finklea Melissa Ford Robe

30、rt Fox Kenneth Fox Brit Frank Thomas Gaudette Thomas Gauntner Scott Gearhart George E. Geathers Anthony Geneva William Gerstein Gerald Goldemund Jose Gonzalez Jay Guruswamy Michelle Harris Michael Harrison Robert Hayes Alicia Helton Luis Hernandez Hans Hopf Orman Horton Ashley M. Hulme John Irizarry

31、 Ivor Isaacs Anand Jain Denton Jarvis Carey Jimmerson Gary Jones Patrick Kalgren Mark Kaufman John Knowles Harry Lambert Guy Larcom Phillip Liang Jay Lindsey Teresa P. Lopes Michael Malesich Stephen Mann Jon McCombs David Mills Scott Misha Mukund U. Modi Ion A. Neag Angela Nielson Steven ODonnell Le

32、slie A. Orlidge Steven Osella Robert Peterson Duy-Huan Pham Dan Pleasant Hugh Pritchett John E. Ralph Narayanan Ramachandran Rabindranath Raul Peter Richardson Robert A. Robinson David A. Rohacek John Rosenwald William Ross Ace Rossi Paul Salopek Thomas Sarfi Howard Savage Michel Schieber John Shepp

33、ard Henry Silcock Mark Skiba Roger Sowada Rob Spinner Joseph J. Stanco Michael Stora Kim Stowers Walter Struppler Ronald G. Taylor David Thomas Kirk Thompson Sharayu Tulpule Vincent J. Tume Joerg Urban David Walihermfechtel Phil Williams Timothy J. Wilmering Todd Zervasvii Copyright 2014 IEEE. All r

34、ights reserved. The following members of the individual balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention. Bakul Banerjee Malcom Brown Keith Chow C. J. Clark Timothy W. Davis Thomas J. Dineen David B. Droste James Dumser Tamara Einspanjer W

35、illiam B. Frank David M. Friscia Thomas Gaudette Thomas Gauntner George E. Geathers Michael D. Geipel Chris C. Gorringe Randall C. Groves Werner Hoelzl Ashley M. Hulme Anand Jain John Knowles Adam W. Ley Teresa P. Lopes William F. Maciejewski Gary L. Michel Scott Misha Mukund U. Modi Ion A. Neag Mic

36、hael S. Newman Leslie A. Orlidge Ulrich Pohl John E. Ralph Peter Richardson Gordon D. Robinson Robert A. Robinson David A. Rohacek Stephen Schwarm Mike Seavey Joseph J. Stanco Walter Struppler Ronald G. Taylor Vincent J. Tume John A. Vergis Timothy J. Wilmering Oren Yuen When the IEEE-SA Standards B

37、oard approved this standard on 5 December 2007, it had the following membership: Steve M. Mills, Chair Robert M. Grow, Vice Chair Don Wright, Past Chair Judith Gorman, Secretary Richard DeBlasio Alex Gelman William R. Goldbach Arnold M. Greenspan Joanna N. Guenin Kenneth S. Hanus William B. Hopf Ric

38、hard H. Hulett Hermann Koch Joseph L. Koepfinger* John Kulick David J. Law Glenn Parsons Ronald C. Petersen Tom A. Prevost Narayanan Ramachandran Greg Ratta Robby Robson Anne-Marie Sahazizian Virginia C. Sulzberger Malcolm V. Thaden Richard L. Townsend Howard L. Wolfman *Member Emeritus Also include

39、d are the following nonvoting IEEE-SA Standards Board liaisons: Satish K. Aggarwal, NRC Representative Michael H. Kelley, NIST Representative Don Messina IEEE Standards Program Manager, Document Development Bill Ash IEEE Standards Program Manager, Technical Program Development viii Copyright 2014 IE

40、EE. All rights reserved. Contents 1. Overview 1 1.1 Scope . 2 1.2 Purpose 2 1.3 Application 2 1.4 Conventions used within this document 2 2. Normative references 4 3. Definitions, acronyms, and abbreviations 4 3.1 Definitions . 4 3.2 Acronyms and abbreviations . 5 4. SchemaUUTDescription.xsd 5 4.1 G

41、eneral 5 4.2 Elements 6 4.3 Child elements . 7 4.4 Complex types 11 4.5 Inherited simple types .11 4.6 Inherited complex types 11 4.7 Inherited attribute groups 11 5. SchemaUUTInstance.xsd 12 5.1 General .12 5.2 Elements .12 5.3 Child elements 13 5.4 Complex types 13 5.5 Inherited simple types .13 5

42、.6 Inherited complex types 13 5.7 Inherited attribute groups 13 6. Conformance .13 7. Extensibility .14 Annex A (informative) UUTDescription and UUTInstance instance documents (.XML files) 15 A.1 UUTDescription 15 A.2 UUTInstance 16 Annex B (informative) User information and examples18 B.1 UUT test

43、descriptions and test cable designs .18 B.2 Widget.xml example 19 Annex C (informative) Glossary .20 Annex D (informative) Bibliography 21 1 Copyright 2014 IEEE. All rights reserved. IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML (eXtensible

44、 Markup Language): Exchanging UUT (Unit Under Test) Description Information IMPORTANT NOTICE: This standard is not intended to assure safety, security, health, or environmental protection in all circumstances. Implementers of the standard are responsible for determining appropriate safety, security,

45、 environmental, and health practices or regulatory requirements. This IEEE document is made available for use subject to important notices and legal disclaimers. These notices and disclaimers appear in all publications containing this document and may be found under the heading “Important Notice” or

46、 “Important Notices and Disclaimers Concerning IEEE Documents.” They can also be obtained on request from IEEE or viewed at http:/standards.ieee.org/IPR/disclaimers.html. 1. Overview The family of Automatic Test Markup Language (ATML) standards is being developed under the guidance of the Test Infor

47、mation Integration (TII) subcommittee of the IEEE Standards Coordinating Committee 20 (SCC20) to serve as standards for product test. The ATML family of standards specifies a comprehensive environment for integrating design data, test strategies, test requirements, test procedures, test results mana

48、gement, and test system implementations. The ATML framework is defined by IEEE Std 1671TM(ATML)1, 2. IEEE Std 1671is, therefore, a critical part of this ATML component. This standard (as well as the XML schemas and XML instance document examples3that accompany this standard) is intended to be used i

49、n documenting the unit under test (UUT) to be tested and diagnosed in an automatic or manual test environment. This information includes the UUT hardware, software, and documentation. The combination of this information may aid in improving the overall test process.1The IEEE standards referenced in this standard are trademarks of the Institute of Electrical and Electronics Engineers, Inc. 2Information on references can be found in Clause 2. 3The schemas and examples that accompany this standard shall be available at http:/standards.ieee.org/downloads/1671/1671.3-2007/