BS ISO IEC 11694-3-2015 Identification cards Optical memory cards Linear recording method Optical properties and characteristics《识别卡 光记忆卡 线性记录方法 光属性和特性》.pdf

1、BSI Standards Publication BS ISO/IEC 11694-3:2015 Identification cards Optical memory cards Linear recording method Part 3: Optical properties and characteristicsBS ISO/IEC 11694-3:2015 BRITISH STANDARD National foreword This British Standard is the UK implementation of ISO/IEC 11694-3:2015. It supe

2、rsedes BS ISO/IEC 11694-3:2008 which is withdrawn. The UK participation in its preparation was entrusted to Technical Committee IST/17, Cards and personal identification. A list of organizations represented on this committee can be obtained on request to its secretary. This publication does not purp

3、ort to include all the necessary provisions of a contract. Users are responsible for its correct application. The British Standards Institution 2015. Published by BSI Standards Limited 2015 ISBN 978 0 580 85942 7 ICS 35.240.15 Compliance with a British Standard cannot confer immunity from legal obli

4、gations. This British Standard was published under the authority of the Standards Policy and Strategy Committee on 31 July 2015. Amendments issued since publication Date Text affectedBS ISO/IEC 11694-3:2015 Identification cards Optical memory cards Linear recording method Part 3: Optical properties

5、and characteristics Cartes didentification Cartes mmoire optique Mthode denregistrement linaire Partie 3: Proprits et caractristiques optiques INTERNATIONAL STANDARD ISO/IEC 11694-3 Reference number ISO/IEC 11694-3:2015(E) Fourth edition 2015-07-01 ISO/IEC 2015 BS ISO/IEC 11694-3:2015ii ISO/IEC 2015

6、 All rights reserved COPYRIGHT PROTECTED DOCUMENT ISO/IEC 2015, Published in Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized otherwise in any form or by any means, electronic or mechanical, including photocopying, or posting on t

7、he internet or an intranet, without prior written permission. Permission can be requested from either ISO at the address below or ISOs member body in the country of the requester. ISO copyright office Ch. de Blandonnet 8 CP 401 CH-1214 Vernier, Geneva, Switzerland Tel. +41 22 749 01 11 Fax +41 22 74

8、9 09 47 copyrightiso.org www.iso.org ISO/IEC 11694-3:2015(E)BS ISO/IEC 11694-3:2015ISO/IEC 11694-3:2015(E)Foreword iv Introduction v 1 Scope .1 2 Normative references 1 3 Reading/writing test conditions 1 3.1 Test methods . 1 3.2 Default test environment and conditioning . 1 4 Optical characteristic

9、s 1 4.1 Minimum performance characteristics . 1 4.1.1 Background reflectivity 2 4.1.2 Track guide contrast . 2 4.1.3 Written or preformatted data contrast 2 4.1.4 Card surface reflectivity . 2 4.2 Preformatted data characteristics 2 4.3 Written data characteristics 2 4.4 Optical path length 2 4.5 Op

10、tical retardation 2 5 Reading characteristics . 2 6 Defects .3 6.1 Density . 3 6.2 Transparent layer . 3 ISO/IEC 2015 All rights reserved iii Contents PageBS ISO/IEC 11694-3:2015ISO/IEC 11694-3:2015(E) Foreword ISO (the International Organization for Standardization) and IEC (the International Elect

11、rotechnical Commission) form the specialized system for worldwide standardization. National bodies that are members of ISO or IEC participate in the development of International Standards through technical committees established by the respective organization to deal with particular fields of techni

12、cal activity. ISO and IEC technical committees collaborate in fields of mutual interest. Other international organizations, governmental and non-governmental, in liaison with ISO and IEC, also take part in the work. In the field of information technology, ISO and IEC have established a joint technic

13、al committee, ISO/IEC JTC 1. The procedures used to develop this document and those intended for its further maintenance are described in the ISO/IEC Directives, Part 1. In particular the different approval criteria needed for the different types of document should be noted. This document was drafte

14、d in accordance with the editorial rules of the ISO/IEC Directives, Part 2 (see www.iso.org/directives). Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. ISO and IEC shall not be held responsible for identifying any or all such pat

15、ent rights. Details of any patent rights identified during the development of the document will be in the Introduction and/or on the ISO list of patent declarations received (see www.iso.org/patents). Any trade name used in this document is information given for the convenience of users and does not

16、 constitute an endorsement. For an explanation on the meaning of ISO specific terms and expressions related to conformity assessment, as well as information about ISOs adherence to the WTO principles in the Technical Barriers to Trade (TBT) see the following URL: Foreword - Supplementary information

17、 The committee responsible for this document is ISO/IEC JTC 1, Information technology, SC 17, Cards and personal identification. This fourth edition cancels and replaces the third edition (ISO/IEC 11694-3:2008), which has been technically revised. ISO 11694 consists of the following parts, under the

18、 general title Identification cards Optical memory cards Linear recording method: Part 1: Physical characteristics Part 2: Dimensions and location of the accessible optical area Part 3: Optical properties and characteristics Part 4: Logical data structures Part 5: Data format for information interch

19、ange for applications using ISO/IEC 116944 Part 6: Use of biometrics on an optical memory cardiv ISO/IEC 2015 All rights reservedBS ISO/IEC 11694-3:2015ISO/IEC 11694-3:2015(E) Introduction This part of ISO/IEC 11694 is one of a series of International Standards defining the parameters for optical me

20、mory cards and the use of such cards for the storage and interchange of digital data. These International Standards recognize the existence of different methods for recording and reading information on optical memory cards, the characteristics of which are specific to the recording method employed.

21、In general, these different recording methods will not be compatible with each other. Therefore, the International Standards are structured to accommodate the inclusion of existing and future recording methods in a consistent manner. This part of ISO/IEC 11694 is specific to optical memory cards usi

22、ng the linear recording method. Characteristics which apply to other specific recording methods shall be found in separate standard documents. This part of ISO/IEC 11694 defines the optical properties and characteristics and the extent of compliance with, addition to, and/or deviation from the relev

23、ant base document, ISO/IEC 11693-1. ISO/IEC 2015 All rights reserved vBS ISO/IEC 11694-3:2015BS ISO/IEC 11694-3:2015Identification cards Optical memory cards Linear recording method Part 3: Optical properties and characteristics 1 Scope This part of ISO/IEC 11694 specifies the optical properties and

24、 characteristics of optical memory cards using the linear recording method. 2 Normative references The following documents, in whole or in part, are normatively referenced in this document and are indispensable for its application. For dated references, only the edition cited applies. For undated re

25、ferences, the latest edition of the referenced document (including any amendments) applies. ISO/IEC 11693-1, Identification cards Optical memory cards Part 1: General characteristics ISO/IEC 11694-4, Identification cards Optical memory cards Linear recording method Part 4: Logical data structures IS

26、O/IEC 10373-5, Identification cards Test methods Part 5: Optical memory cards 3 Reading/writing test conditions 3.1 Test methods The test methods specified in ISO/IEC 10373-5 shall apply. 3.2 Default test environment and conditioning The default test environment and conditioning parameters specified

27、 in ISO/IEC 11693-1 apply. 4 Optical characteristics These characteristics are expected to be achieved under the test conditions defined in ISO/IEC 10373-5. If test conditions change, then the optical characteristics specified herein will change. Please refer to Figure 1 for a definition of the para

28、meters to be measured. 4.1 Minimum performance characteristics The values contained in this subclause represent the minimum acceptable levels for interchange purposes. Therefore, they represent characteristics that optical cards shall meet or surpass during their useful life, exclusive of physical d

29、amage to the card. NOTE Useful life may be defined differently from application to application and is therefore left to the card manufacturer and the card issuer to properly define for their particular implementation. INTERNATIONAL ST ANDARD ISO/IEC 11694-3:2015(E) ISO/IEC 2015 All rights reserved 1

30、BS ISO/IEC 11694-3:2015ISO/IEC 11694-3:2015(E) 4.1.1 Background reflectivity The reflectivity of the area measured midway between adjacent track guides shall be between 27 % and 68 %. The reflectivity within one card shall not vary more than 10 % relative to the mean value. 4.1.2 Track guide contras

31、t The contrast of preformatted track guides, measured when scanning perpendicular to the guides, shall have a minimum contrast of 0,3 when compared to the measured background signal level. NOTE Track guide contrast is the background signal level minus the track guide signal level divided by the back

32、ground signal level. 4.1.3 Written or preformatted data contrast Written or preformatted data bits shall have a minimum contrast of 0,3 when compared to the measured background signal level. NOTE Written data contrast is the background signal level minus the written data signal level divided by the

33、background signal level. 4.1.4 Card surface reflectivity The reflectivity at the entry face of the data side of the card shall be less than or equal to 7 %. 4.2 Preformatted data characteristics To ensure compatibility, the values for low frequency recovery, amplitude comparison, and signal overlap

34、(S O ) divided by high frequency amplitude (A HF ), shall all be verifiable when scanning a portion of the accessible optical area containing preformatted data. The actual values shall be as specified in ISO/IEC 11694-4. 4.3 Written data characteristics To ensure compatibility, the values for low fr

35、equency recovery, amplitude comparison, and signal overlap (S O ) divided by high frequency amplitude (A HF ), shall all be verifiable when scanning a portion of the accessible optical area containing written data. The actual values shall be as specified in ISO/IEC 11694-4. 4.4 Optical path length T

36、he optical path length shall be in the range of 1,036 mm to 1,431 mm and the variation shall not exceed 15% in any single card, or in cards of different lots. 4.5 Optical retardation The variation in optical retardation through the transparent layer from card to card and within a card is not specifi

37、ed in this part of ISO/IEC 11694. 5 Reading characteristics The card shall be subjected to 10 000 successive read passes in the same region within the accessible optical area. The orientation of the card shall then be changed by 90 and the reflectivity of that region examined. The relative change in

38、 reflectivity shall not exceed 10%.2 ISO/IEC 2015 All rights reservedBS ISO/IEC 11694-3:2015ISO/IEC 11694-3:2015(E) 6 Defects These defect criteria apply unless other specific defect criteria are specified in ISO/IEC 11694-4. A defect is any anomaly located within the accessible optical area whose c

39、ross-section exceeds 2,5 m. It is assumed that defects are nominally circular in their cross-section. NOTE Both drop-ins and drop-outs are considered defects. 6.1 Density The raw uncorrected defect ratio within the entire accessible optical area shall be less than 5,0 10 -4 . 6.2 Transparent layer T

40、he transparent layer shall have no defects whose cross-section exceeds 100 m. B HF HF HF LF O LF LF NOTE 1 Low frequency recovery - the high reflectance value of the low frequency data pattern (H LF ) divided by the background reflectance (R B ). NOTE 2 Amplitude comparison - the high frequency ampl

41、itude (A HF ) divided by the low frequency amplitude (A LF ). NOTE 3 High frequency amplitude (A HF ) - the high reflectance value of the high frequency data pattern (H HF ) minus the low reflectance value of the high frequency data pattern (L HF ). NOTE 4 Low frequency amplitude (A LF ) - the high

42、reflectance value of the low frequency data pattern (H LF ) minus the low reflectance value of the low frequency data pattern (L LF ). NOTE 5 Signal overlap (S O ) - the high reflectance value of the high frequency data pattern (H HF ) minus the low reflectance value of the low frequency data patter

43、n (L LF ). Figure 1 Contrast parameters ISO/IEC 2015 All rights reserved 3BS ISO/IEC 11694-3:2015ISO/IEC 11694-3:2015(E) ISO/IEC 2015 All rights reserved ICS 35.240.15 Price based on 3 pagesThis page deliberately left blankBSI is the national body responsible for preparing British Standards and othe

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