BS PD CEN ISO TS 17200-2015 Nanotechnology Nanoparticles in powder form Characteristics and measurements《纳米技术 粉末状的纳米颗粒 特征和测量》.pdf

1、BSI Standards Publication Nanotechnology Nanoparticles in powder form Characteristics and measurements PD CEN ISO/TS 17200:2015National foreword This Published Document is the UK implementation of CEN ISO/TS 17200:2015. It is identical to ISO/TS 17200:2013. The UK participation in its preparation wa

2、s entrusted to Technical Committee NTI/1, Nanotechnologies. A list of organizations represented on this committee can be obtained on request to its secretary. This publication does not purport to include all the necessary provisions of a contract. Users are responsible for its correct application. T

3、he British Standards Institution 2015. Published by BSI Standards Limited 2015 ISBN 978 0 580 88463 4 ICS 07.030 Compliance with a British Standard cannot confer immunity from legal obligations. This Published Document was published under the authority of the Standards Policy and Strategy Committee

4、on 31 May 2015. Amendments/corrigenda issued since publication Date Text affected PUBLISHED DOCUMENT PD CEN ISO/TS 17200:2015 TECHNICAL SPECIFICATION SPCIFICATION TECHNIQUE TECHNISCHE SPEZIFIKATION CEN ISO/TS 17200 May 2015 ICS 07.030 English Version Nanotechnology - Nanoparticles in powder form - C

5、haracteristics and measurements (ISO/TS 17200:2013) Nanotechnologies - Nanoparticules sous forme de poudre - Caractristiques et mesures (ISO/TS 17200:2013) Nanotechnologien - Nanopartikel in Pulverform - Eigenschaften und Messung (ISO/TS 17200:2013) This Technical Specification (CEN/TS) was approved

6、 by CEN on 16 May 2015 for provisional application. The period of validity of this CEN/TS is limited initially to three years. After two years the members of CEN will be requested to submit their comments, particularly on the question whether the CEN/TS can be converted into a European Standard. CEN

7、 members are required to announce the existence of this CEN/TS in the same way as for an EN and to make the CEN/TS available promptly at national level in an appropriate form. It is permissible to keep conflicting national standards in force (in parallel to the CEN/TS) until the final decision about

8、 the possible conversion of the CEN/TS into an EN is reached. CEN members are the national standards bodies of Austria, Belgium, Bulgaria, Croatia, Cyprus, Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Lat

9、via, Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and United Kingdom. EUROPEAN COMMITTEE FOR STANDARDIZATION COMIT EUROPEN DE NORMALISATION EUROPISCHES KOMITEE FR NORMUNG CEN-CENELEC Management Centre: Avenue Mar

10、nix 17, B-1000 Brussels 2015 CEN All rights of exploitation in any form and by any means reserved worldwide for CEN national Members. Ref. No. CEN ISO/TS 17200:2015 E PD CEN ISO/TS 17200:2015CEN ISO/TS 17200:2015 (E) 2 Contents Page Foreword 3 PD CEN ISO/TS 17200:2015CEN ISO/TS 17200:2015 (E) 3 Fore

11、word The text of ISO/TS 17200:2013 has been prepared by Technical Committee ISO/TC 229 “Nanotechnologies” of the International Organization for Standardization (ISO) and has been taken over as CEN ISO/TS 17200:2015 by Technical Committee CEN/TC 352 “Nanotechnologies” the secretariat of which is held

12、 by AFNOR. Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. CEN and/or CENELEC shall not be held responsible for identifying any or all such patent rights. According to the CEN-CENELEC Internal Regulations, the national standards o

13、rganizations of the following countries are bound to announce this Technical Specification: Austria, Belgium, Bulgaria, Croatia, Cyprus, Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Lux

14、embourg, Malta, Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the United Kingdom. Endorsement notice The text of ISO/TS 17200:2013 has been approved by CEN as CEN ISO/TS 17200:2015 without any modification. PD CEN ISO/TS 17200:2015 ISO/TS

15、17200:2013(E) ISO 2013 All rights reserved iii Contents Page Foreword iv Introduction v 1 Scope . 1 2 Normative references 1 3 T erms and definitions . 1 4 Fundamental characteristics with corresponding measurement methods .2 5 Sample preparation . 2 6 Measurement methods 3 6.1 Chemical composition

16、3 6.2 Specific surface area by BET method . 4 6.3 Crystal structure by XRD method . 4 6.4 Average crystallite size by XRD (Scherrer formula) method 4 6.5 Average and standard deviation of the measured primary particle sizes by TEM method 4 7 Test report . 4 Annex A (informative) A pplicability of th

17、is T echnical Specification . 6 Bibliography 7 PD CEN ISO/TS 17200:2015 ISO/TS 17200:2013(E) Foreword ISO (the International Organization for Standardization) is a worldwide federation of national standards bodies (ISO member bodies). The work of preparing International Standards is normally carried

18、 out through ISO technical committees. Each member body interested in a subject for which a technical committee has been established has the right to be represented on that committee. International organizations, governmental and non-governmental, in liaison with ISO, also take part in the work. ISO

19、 collaborates closely with the International Electrotechnical Commission (IEC) on all matters of electrotechnical standardization. The procedures used to develop this document and those intended for its further maintenance are described in the ISO/IEC Directives, Part 1. In particular the different

20、approval criteria needed for the different types of ISO documents should be noted. This document was drafted in accordance with the editorial rules of the ISO/IEC Directives, Part 2. www.iso.org/directives Attention is drawn to the possibility that some of the elements of this document may be the su

21、bject of patent rights. ISO shall not be held responsible for identifying any or all such patent rights. Details of any patent rights identified during the development of the document will be in the Introduction and/or on the ISO list of patent declarations received. www.iso.org/patents Any trade na

22、me used in this document is information given for the convenience of users and does not constitute an endorsement. The committee responsible for this document is ISO/TC 229, Nanotechnologies.iv ISO 2013 All rights reserved PD CEN ISO/TS 17200:2015 ISO/TS 17200:2013(E) Introduction As is commonly not

23、iced for every technology concerned with the development of new materials, and for nanotechnology in particular, information sharing on material characteristics by sellers and buyers, and sometimes also by regulators, is important and is facilitated by the development of appropriate material specifi

24、cations. For a comprehensive exchange of information, it is essential to agree on the description of the material characteristics. However, many characteristics of nanomaterials cannot be determined using general and well-established measurement methods. This may become the cause for inconsistency i

25、n experimental results and induce confusion in commerce and technology transfer. Furthermore, the rapid discovery of new materials from nanotechnology increases the number of characteristics that need to be specified for an appropriate dissemination of information. In order to address this need, a s

26、ystematic arrangement of characteristics has been carried out across different fields of application specific to each nano-object by identifying a list of fundamental characteristics commonly used in these circumstances and by developing tailor-made technical specifications for the list, as seen in

27、ISO/TS 11931 and ISO/TS 11937. Another approach that was followed for ISO/TS 12805 resulted in the development of a list of characteristics applicable to specifying nano-objects that are useful to the wider community of users of information on nano-objects. To increase the reach of outcomes from the

28、se efforts, members of ISO/TC 229 have discussed and planned the systematic development of an ISO technical specification for defining a list of fundamental characteristics that are widely applicable to a broad range of nano-objects. This Technical Specification is intended to define the list of fun

29、damental characteristics universally for nanoparticles in powder form, which covers a very broad range of nano-objects. In order to develop a common understanding among sellers, buyers, and regulators, this Technical Specification uses the chemical composition, crystal structure, particle size, and

30、surface area as fundamental measures for characterizing nano-objects from a chemical, physical, and surface scientific point of view that is of significant interest to users of the nano-objects. However, since measurement procedures used for determining the characteristics of nano-objects often rely

31、 on various idealized assumptions, the resulting characteristics of nano-objects with identical name may not guarantee the equivalence of measured results. This issue can be addressed by adopting well-recognized measurement methods that can provide reliable measurement results. The measurement metho

32、ds adopted in this Technical Specification are well known in the industry. Instruments used for measurement and data processing software are well developed and provide reliable measurement results when operated under a valid quality system. The description of measurement methods is limited in this T

33、echnical Specification to important supplementary notices. For basic information about applying the methods, it is assumed that operating instructions are provided with any instruments, appropriate data processing software is available, and analysis has the required technical skills. The methods are

34、 applicable to situations where procedures are subcontracted to independent test laboratories. Since quantitative criteria concerning characteristics depend on the specific intentions among users, they are not described in this Technical Specification. These criteria are subject to agreement between

35、 users of this Technical Specification, namely, sellers, buyers, and regulators of nanoparticles in powder form. Nanotechnology is a rapidly growing and evolving field. Users of this Technical Specification should maintain familiarity with the legislative environment and latest developments in human

36、 and environmental health and safety regarding nanotechnology. If the seller or the buyer wishes to assess the environmental, safety, or health risks of the material, they may refer to ISO/TR 12885:2008 for further guidance. It has been assumed in the preparation of this Technical Specification that

37、 the execution of its provisions will be entrusted to appropriately qualified and experienced people. ISO 2013 All rights reserved v PD CEN ISO/TS 17200:2015 Nanotechnology Nanoparticles in powder form Characteristics and measurements 1 Scope This Technical Specification lists fundamental characteri

38、stics which are commonly determined for nanoparticles in powder form. The Technical Specification prescribes specific measurement methods for each of these characteristics. This Technical Specification does not specify acceptable quantitative criteria for the characteristics because they are subject

39、 to agreement between sellers, buyers, and regulators. Excluded in this Technical Specification are characteristics specifically related to health, safety, and environmental issues, as well as characteristics that pertain to specific applications of nanoparticles in powder form. 2 Normative referenc

40、es The following documents, in whole or in part, are normatively referenced in this document and are indispensable for its application. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. ISO

41、9277:2010, Determination of the specific surface area of solids by gas adsorption BET method ISO 13322-1, Particle size analysis Image analysis methods Part 1: Static image analysis methods ISO 14488, Particulate materials Sampling and sample splitting for the determination of particulate properties

42、 ISO/TS 27687, Nanotechnologies Terminology and definitions for nano-objects Nanoparticle, nanofibre and nanoplate 3 T erms a nd definiti ons For the purposes of this document, the terms and definitions given in ISO/TS 27687 and the following apply. 3.1 transmission electron microscopy TEM method th

43、at produces magnified images or diffraction patterns of the specimen by an electron beam which passes through the specimen and interacts with it SOURCE: ISO 29301:2010 3.2 X-ray diffraction XRD method to determine crystallographic and geometrical information about a sample by observing the diffracti

44、on pattern due to an X-ray beam scattered by a sample TECHNICAL SPECIFICATION ISO/TS 17200:2013(E) ISO 2013 All rights reserved 1 PD CEN ISO/TS 17200:2015 ISO/TS 17200:2013(E) 3.3 s p e c i f i c s u r f a c e a r e a absolute surface area of the sample divided by sample mass SOURCE: ISO 9277:2010,

45、definition 3.11 Note 1 to entry: In this Technical Specification, the absolute surface area is estimated by measuring the amount of physically adsorbed gas using the BET method. 14 3.4 Feret diameter distance between two parallel tangents on opposite sides of the image of a particle SOURCE: ISO 1332

46、2-1:2004 4 Fundamental characteristics with corresponding measurement methods The fundamental characteristics of nanoparticles in powder form are listed in Table 1, with unit and measurement method for each characteristic. The characteristics shall be measured using each measurement method listed an

47、d their results shall be reported as specified in Clause 7. Characteristics 1, 2, 3, and 4 shall be measured for crystalline nanoparticles in powder form. Characteristics 1, 2, and 5 shall be measured for non-crystalline nanoparticles in powder form. NOTE If necessary, characteristic 5 may also be m

48、easured for crystalline nanoparticles in powder form. Table 1 Fundamental characteristics with units and corresponding measurement methods Characteristics Unit Measurement methods (for detail, see Clause 6) 1) Chemical composition (in terms of the measurand, mass fraction of substance) 1 or g/g anal

49、ysis shown to provide metro- logically traceable results 2) Specific surface area m 2 /g BET method 3) Composition of crystal structure (in terms of the measurand, molar fraction of the substance) 1 or mol/mol XRD method 4) Average crystallite size nm XRD (Scherrer formula) method 5) Average and standard deviation of the measured primary particle sizes nm TEM method 5 Sample preparation The sample subjected to a measurement method shall be chosen as to be representative of the parent population of the nanoparticles in powder form. IS