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BS PD IEC TR 62689-100-2016 Current and voltage sensors or detectors to be used for fault passage indication purposes Requirements and proposals for the IEC 61850 series d.pdf

1、Current and voltage sensors or detectors, to be used for fault passage indication purposes Part 100: Requirements and proposals for the IEC 61850 series data model extensions to support fault passage indicators applications PD IEC/TR 62689-100:2016 BSI Standards Publication WB11885_BSI_StandardCovs_

2、2013_AW.indd 1 15/05/2013 15:06National foreword This Published Document is the UK implementation of IEC/TR 62689-100:2016. The UK participation in its preparation was entrusted to Technical Committee PEL/38, Instrument transformers. A list of organizations represented on this committee can be obtai

3、ned on request to its secretary. This publication does not purport to include all the necessary provisions of a contract. Users are responsible for its correct application. The British Standards Institution 2016. Published by BSI Standards Limited 2016 ISBN 978 0 580 93493 3 ICS 17.220.20 Compliance

4、 with a British Standard cannot confer immunity from legal obligations. This Published Document was published under the authority of the Standards Policy and Strategy Committee on 31 December 2016. Amendments/corrigenda issued since publication Date Text affected PUBLISHED DOCUMENT PD IEC/TR 62689-1

5、00:2016 IEC TR 62689-100 Edition 1.0 2016-10 TECHNICAL REPORT Current and voltage sensors or detectors, to be used for fault passage indication purposes Part 100: Requirements and proposals for the IEC 61850 series data model extensions to support fault passage indicators applications INTERNATIONAL

6、ELECTROTECHNICAL COMMISSION ICS 17.220.20 ISBN 978-2-8322-3724-3 Registered trademark of the International Electrotechnical Commission Warning! Make sure that you obtained this publication from an authorized distributor. colour inside PD IEC/TR 62689-100:2016 2 IEC TR 62689-100:2016 IEC 2016 CONTENT

7、S FOREWORD. 6 INTRODUCTION . 8 1 Scope 9 2 Normative references 9 3 Terms, definitions and abbreviated terms . 9 3.1 Terms and definitions 9 3.2 Abbreviated terms . 10 3.2.1 Generic abbreviated terms . 10 3.2.2 Proposed specifically for the data model part of this document 11 3.2.3 Existing abbrevia

8、ted terms used in IEC 61850 (all parts) data object names model . 12 3.3 Fault classification definitions 22 4 Requirements and use cases . 23 4.1 General . 23 4.2 Common actors . 24 4.3 Use cases: fault indication and report 33 4.3.1 Generic use case Not fault type specific 33 4.3.2 Overcurrent non

9、 directional Fault Localization and Indication (F1C/NC) . 51 4.3.3 Phase to earth faults, non directional fault detection (F2) 52 4.3.4 Overcurrent and phase to earth non directional faults detection (F3) . 52 4.3.5 Overcurrent, directional and non directional, fault detection (F4) . 53 4.3.6 Overcu

10、rrent, non directional, phase to earth faults, directional and non directional fault detection (F5) 53 4.3.7 Overcurrents and phase to earth faults, directional and non directional fault detection (F6) . 53 4.4 Use cases related to “other functions” 53 4.4.1 Report on device health . 53 4.4.2 Monito

11、r substation environment 53 4.4.3 Monitor external communication . 53 4.4.4 Monitor energy flow (energy flow related use cases) . 53 4.4.5 Contribute to distributed automatic FLISR . 59 4.4.6 Contribute to distributed automatic VVC . 75 4.4.7 Contribute to distributed DER management 75 4.5 Use cases

12、 related to “Product life cycle” 75 4.5.1 IED configuration via CID file . 75 5 Information Models 100 5.1 Mapping of requirements on LNs . 100 5.1.1 General . 100 5.1.2 Mapping of the requirements of Fault Identification and report . 100 5.1.3 Mapping of the requirements of “other functions” 101 5.

13、1.4 Mapping of the requirements of “product life cycle” (FieldComp remote configuration) . 103 6 Logical node classes . 103 6.1 General . 103 6.2 Package LNGroupL . 104 6.2.1 General . 104 6.2.2 LICH LN . 106 PD IEC/TR 62689-100:2016IEC TR 62689-100:2016 IEC 2016 3 6.2.3 LN: Common LD Settings Name:

14、 LCLD . 107 6.3 Package LNGroupM 108 6.3.1 General . 108 6.3.2 LN: Energy Name: MMTNExt 109 6.3.3 LN: Energy Name: MMTRExt 111 6.3.4 LN: Measurement Name: MMXNExt 113 6.3.5 LN: Measurement Name: MMXUExt 114 6.4 Package LNGroupS . 116 6.4.1 General . 116 6.4.2 LN: Current presence monitoring Name: SC

15、PI 117 6.4.3 LN: Fault Passage Indicator Name: SFPI 118 6.4.4 LN: Fault indicator statistic calculation Name: SFST . 120 6.4.5 LN: Voltage presence indicator Name: SVPI . 121 7 Data object name semantics and enumerations 123 7.1 Data semantics . 123 7.2 Enumerated data attribute types 126 7.2.1 Gene

16、ral . 126 7.2.2 CIDHandlingResultKind enumeration 127 7.2.3 CIDHandlingStatusKind enumeration 128 7.2.4 CurrentTransformersArrangementKind enumeration 128 7.2.5 FaultConfirmationModeKind enumeration . 128 7.2.6 FaultPermanenceKind enumeration 129 7.2.7 PwrFlwSignKind enumeration . 129 8 SCL enumerat

17、ions (from DOEnumsJAHWG51) . 129 9 References 130 Annex A (informative) Interpretation of logical node tables 131 A.1 General interpretation of logical node tables 131 A.2 Conditions for element presence . 131 Bibliography . 134 Figure 1 Actors global hierarchy . 25 Figure 2 System Actors SGAM posit

18、ioning (function) 26 Figure 3 System Actors SGAM positioning (not function related) . 27 Figure 4 Fault indication Main use case . 35 Figure 5 Fault detection and indication T1 . 36 Figure 6 Fault detection and indication T2 37 Figure 7 Fault detection and indication for FPI T3,T4 (with communicatio

19、n to HV/MV SS) in the context of FLISR as described in 4.4.5 38 Figure 8 Fault detection and indication for FPI T3,T4 (without communication to HV/MV SS) in the context of FLISR as described in 4.4.5 39 Figure 9 Voltage presence/absence 52 Figure 10 Energy flow related use cases 54 Figure 11 Sequenc

20、e diagram for monitoring energy flows use cases . 55 Figure 12 Logical selectivity FLI along the MV feeder . 61 Figure 13 Logical selectivity FLI inside the EU plant 62 Figure 14 Logical selectivity FLI along the MV feeder and anti-islanding . 63 Figure 15 Use case fault location indication . 64 PD

21、IEC/TR 62689-100:2016 4 IEC TR 62689-100:2016 IEC 2016 Figure 16 For further analysis 65 Figure 17 IED configuration process via CID . 77 Figure 18 FieldComp configuration Main UC 78 Figure 19 FieldComp asset management 79 Figure 20 Grid and topology planning . 79 Figure 21 Communication network pla

22、nning 80 Figure 22 First FieldComp connection to communication network 81 Figure 23 New FieldComp configuration via CID Remote + local (successful case) . 82 Figure 24 New FieldComp configuration via CID Remote + local (unsuccessful case corrupted CID) . 83 Figure 25 Existing FieldComp on-line recon

23、figuration (topology successful case). 84 Figure 26 Possible arrangement of LNs to support fault passage indication . 101 Figure 27 Possible arrangement of LNs to support “Energy flow related use cases“ . 102 Figure 28 Possible arrangement of LNs to support CID Handling . 103 Figure 29 Class diagram

24、 LogicalNodesJAHWG51:LogicalNodesJAHWG51 . 104 Figure 30 Statechart diagram LNGroupL:LNGroupL . 105 Figure 31 Class diagram LNGroupL:LNGroupL 106 Figure 32 Class diagram LNGroupM:LNGroupM 109 Figure 33 Class diagram LNGroupS:LNGroupS . 117 Figure 34 Class diagram DOEnumsJAHWG51:DOEnumsJAHWG51 . 127

25、Table 1 Generic acronyms and abbreviated terms . 10 Table 2 Abbreviated terms for data object names . 11 Table 3 Abbreviated terms of IEC 61850 (all parts) for data object names . 12 Table 4 Fault types 23 Table 5 List of common actors 28 Table 6 Data objects of LICH . 107 Table 7 Data objects of LC

26、LD . 108 Table 8 Data objects of MMTNExt 110 Table 9 Data objects of MMTRExt 112 Table 10 Data objects of MMXNExt 114 Table 11 Data objects of MMXUExt 115 Table 12 Data objects of SCPI . 117 Table 13 Data objects of SFPI 119 Table 14 Data objects of SFST . 120 Table 15 Data objects of SVPI 122 Table

27、 16 Attributes defined on classes of LogicalNodesJAHWG51 package 123 Table 17 Literals of CIDHandlingResultKind . 127 Table 18 Literals of CIDHandlingStatusKind . 128 Table 19 Literals of CurrentTransformersArrangementKind . 128 Table 20 Literals of FaultConfirmationModeKind . 128 Table 21 Literals

28、of FaultPermanenceKind 129 Table 22 Literals of PwrFlwSignKind 129 PD IEC/TR 62689-100:2016IEC TR 62689-100:2016 IEC 2016 5 Table A.1 Interpretation of logical node tables 131 Table A.2 Conditions for presence of elements within a context 132 PD IEC/TR 62689-100:2016 6 IEC TR 62689-100:2016 IEC 2016

29、 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ CURRENT AND VOLTAGE SENSORS OR DETECTORS, TO BE USED FOR FAULT PASSAGE INDICATION PURPOSES Part 100: Requirements and proposals for the IEC 61850 series data model extensions to support fault passage indicators applications FOREWORD 1) The International E

30、lectrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fiel

31、ds. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC

32、 National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non- governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardizat

33、ion (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has represent

34、ation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC can

35、not be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publicatio

36、ns. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity assessment services and, in some areas, ac

37、cess to IEC marks of conformity. IEC is not responsible for any services carried out by independent certification bodies. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including in

38、dividual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upo

39、n, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements

40、of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. The main task of IEC technical committees is to prepare International Standards. However, a technical committee may propose the publication of a Technical Rep

41、ort when it has collected data of a different kind from that which is normally published as an International Standard, for example “state of the art“. IEC TR 62689-100, which is a Technical Report, has been prepared by IEC technical committee 38: Instrument transformers, in cooperation with TC 57: P

42、ower systems management and associated information exchange. PD IEC/TR 62689-100:2016IEC TR 62689-100:2016 IEC 2016 7 The text of this Technical Report is based on the following documents: Enquiry draft Report on voting 38/499/DTR 38/519/RVC Full information on the voting for the approval of this te

43、chnical report can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. A list of all parts in the IEC 62689 series, published under the general title Current and voltage sensors or detectors, to be used f

44、or fault passage indication purposes, can be found on the IEC website. The committee has decided that the contents of this publication will remain unchanged until the stability date indicated on the IEC website under “http:/webstore.iec.ch“ in the data related to the specific publication. At this da

45、te, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. A bilingual version of this publication may be issued at a later date. IMPORTANT The colour inside logo on the cover page of this publication indicates that it contains colours which are considered to be u

46、seful for the correct understanding of its contents. Users should therefore print this document using a colour printer. PD IEC/TR 62689-100:2016 8 IEC TR 62689-100:2016 IEC 2016 INTRODUCTION This part of IEC 62689 has two main framework constraints with editorial and technical impacts as this docume

47、nt will be merged with IEC TR 61850-90-6 1 : IEC TR 62689-100 will exactly stick with the targeted document structure and principles, and this document intends to prepare the content of the future IEC 62689-3 2which will directly rely on the functional requirements expressed in IEC 62689-1 and IEC 6

48、2689-2. _ 1Under preparation. Stage at the time of publication: IEC PWI 61850-90-6:2016. 2Under preparation. Stage at the time of publication: IEC PWI 62689-3:2016. PD IEC/TR 62689-100:2016IEC TR 62689-100:2016 IEC 2016 9 CURRENT AND VOLTAGE SENSORS OR DETECTORS, TO BE USED FOR FAULT PASSAGE INDICAT

49、ION PURPOSES Part 100: Requirements and proposals for the IEC 61850 series data model extensions to support fault passage indicators applications 1 Scope This part of IEC 62689, which is a Technical Report, was prepared jointly with TC 57 with the scope to prepare requirements and proposals for the IEC 61850 series data model extensions to su

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