1、BSI Standards Publication Shunt capacitors for a.c. power systems having a rated voltage above 1 000 V Part 2: Endurance testing PD IEC/TS 60871-2:2014National foreword This Published Document is the UK implementation of IEC/TS 60871-2:2014. It supersedes BS 7264-2:1990 which is withdrawn. The UK pa
2、rticipation in its preparation was entrusted to Technical Committee PEL/33, Power capacitors. A list of organizations represented on this committee can be obtained on request to its secretary. This publication does not purport to include all the necessary provisions of a contract. Users are responsi
3、ble for its correct application. The British Standards Institution 2014. Published by BSI Standards Limited 2014 ISBN 978 0 580 79034 8 ICS 29.240.99; 31.060.70 Compliance with a British Standard cannot confer immunity from legal obligations. This Published Document was published under the authority
4、 of the Standards Policy and Strategy Committee on 31 December 2014. Amendments/corrigenda issued since publication Date Text affected PUBLISHED DOCUMENT PD IEC/TS 60871-2:2014IEC TS 60871-2 Edition 3.0 2014-11 TECHNICAL SPECIFICATION SPECIFICATION TECHNIQUE Shunt capacitors for a.c. power systems h
5、aving a rated voltage above 1 000 V Part 2: Endurance testing Condensateurs shunt pour rseaux courant alternatif de tension assigne suprieure 1 000 V Partie 2: Essais dendurance INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE K ICS 29.249.99; 31.060.70 PRICE CODE
6、 CODE PRIX ISBN 978-2-8322-1937-9 Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale Warning! Make sure that you obtained this publication from an authorized distributor. Attention! Veuillez vous assurer que vous avez o
7、btenu cette publication via un distributeur agr. 2 IEC TS 60871-2:2014 IEC 2014 CONTENTS FOREWORD . 3 1 Scope 5 2 Normative references 5 3 Terms and definitions 5 4 Quality requirements and tests 6 4.1 Test requirements General purpose . 6 4.2 Test procedure 6 4.2.1 General . 6 4.2.2 Routine test .
8、6 4.2.3 Conditioning of the units before the test . 6 4.3 Ageing test . 6 4.3.1 Initial capacitance and dielectric loss measurements . 6 4.3.2 Final capacitance and dielectric loss measurements 7 4.3.3 Acceptance criteria 7 4.4 Validity of test . 7 Annex A (normative) Requirements regarding comparab
9、le element design and test unit design 8 A.1 Test element design criteria 8 A.2 Test unit design 8 Annex B (informative) Definition of element and capacitor container dimensions 10 B.1 Flattened pressed element 10 B.2 Capacitor container . 10 Figure B.1 Flattened pressed element 10 Figure B.2 Capaci
10、tor container . 10 PD IEC/TS 60871-2:2014IEC TS 60871-2:2014 IEC 2014 3 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ SHUNT CAPACITORS FOR AC POWER SYSTEMS HAVING A RATED VOLTAGE ABOVE 1 000 V Part 2: Endurance testing FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide orga
11、nization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities,
12、 IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt
13、with may participate in this preparatory work. International, governmental and non- governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined b
14、y agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. 3
15、) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they ar
16、e used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and t
17、he corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsi
18、ble for any services carried out by independent certification bodies. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical commit
19、tees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publication
20、s. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent
21、 rights. IEC shall not be held responsible for identifying any or all such patent rights. The main task of IEC technical committees is to prepare International Standards. In exceptional circumstances, a technical committee may propose the publication of a technical specification when the required su
22、pport cannot be obtained for the publication of an International Standard, despite repeated efforts, or the subject is still under technical development or where, for any other reason, there is the future but no immediate possibility of an agreement on an International Standard. Technical specificat
23、ions are subject to review within three years of publication to decide whether they can be transformed into International Standards. IEC/TS 60871-2, which is a technical specification, has been prepared by IEC technical committee 33: Power capacitors and their applications. PD IEC/TS 60871-2:2014 4
24、IEC TS 60871-2:2014 IEC 2014 This third edition cancels and replaces the second edition published in 1999. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: a) The overvoltage cycling test has been m
25、oved to IEC 60871-1:2014. The text of this technical specification is based on the following documents: Enquiry draft Report on voting 33/536/DTS 33/565/RVC Full information on the voting for the approval of this technical specification can be found in the report on voting indicated in the above tab
26、le. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. A list of all parts in the IEC 60871 series, published under the general title Shunt capacitors for a.c. power systems having a rated voltage above 1 000 V, can be found on the IEC website. The committee has dec
27、ided that the contents of this publication will remain unchanged until the stability date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be transformed into an International standard, reconfirmed, withdr
28、awn, replaced by a revised edition, or amended. PD IEC/TS 60871-2:2014IEC TS 60871-2:2014 IEC 2014 5 SHUNT CAPACITORS FOR AC POWER SYSTEMS HAVING A RATED VOLTAGE ABOVE 1 000 V Part 2: Endurance testing 1 Scope This part of IEC 60871, which is a technical specification, applies to capacitors accordin
29、g to IEC 60871-1 and gives the requirements for ageing tests of these capacitors. 2 Normative references The following documents, in whole or in part, are normatively referenced in this document and are indispensable for its application. For dated references, only the edition cited applies. For unda
30、ted references, the latest edition of the referenced document (including any amendments) applies. IEC 60871-1:2014, Shunt capacitors for a.c. power systems having a rated voltage above 1 000 V Part 1: General IEC TR 60996, Method for verifying accuracy of tan delta measurements applicable to capacit
31、ors 3 Terms and definitions For the purpose of this technical specification, the following terms and definitions apply in addition to those given in IEC 60871-1: 3.1 test unit one of the units to be manufactured or a special unit which, with respect to the properties to be checked by the ageing test
32、, is equivalent to the units to be manufactured Note 1 to entry: The restrictions on test unit design are detailed in Annex A. 3.2 comparable element design range of construction elements that will be comparable in performance, under the test procedure, with elements of the units to be manufactured
33、Note 1 to entry: See Annex A for detailed design limits. 3.3 inter-element insulation insulation between two series-connected elements, consisting of: the outer turns of the insulation layers around the electrodes in an element, or a separate insulation layer placed between the two elements Note 1 t
34、o entry: This separate insulation layer may protrude outside the width and (or) length dimension(s) of the flattened element (see Annex B). PD IEC/TS 60871-2:2014 6 IEC TS 60871-2:2014 IEC 2014 4 Quality requirements and tests 4.1 Test requirements General purpose The ageing test is a special test c
35、arried out in order to ascertain that the progression of deterioration resulting from increased voltage stress at elevated temperature does not cause untimely failure of the dielectric. It is a mean to ensure that basic material selection is properly made and that any rapid deterioration does not ta
36、ke place. The test should not be seen as a tool for any exact assessment of life characteristics of a dielectric. For that purpose various research and development activities are to be taken care of by the manufacturers. The ageing test shall be carried out as special tests by the manufacturer for a
37、 particular dielectric system, i.e. not for each particular capacitor rating. The test results are applicable to a wide range of capacitor ratings within the limits defined in Annex A. The purchaser shall, on request, be supplied with a certificate detailing the results of such tests. 4.2 Test proce
38、dure 4.2.1 General The ageing test shall be carried out in the sequence given below. The applied test voltage shall have a frequency of 50 Hz or 60 Hz, except for the test according to 4.2.2 where a d.c. voltage can be used according to 9.3 of IEC 60871-1:2014. 4.2.2 Routine test The test unit shall
39、 be subjected to the routine voltage test between the terminals (see IEC 60871-1) with an amplitude such that the correct test voltage is obtained across each element. 4.2.3 Conditioning of the units before the test The test unit shall be subjected to a voltage of not less than 1,1 U Nat an ambient
40、temperature of not less than +10 C for not less than 16 h. NOTE The conditioning is carried out to stabilize the dielectric properties of the test units. 4.3 Ageing test 4.3.1 Initial capacitance and dielectric loss measurements The capacitor unit shall be measured at 0,9 to 1,1 times the rated volt
41、age. The choice of temperature is left to the manufacturer. 4.3.1.1 Test method The ambient temperature during the ageing test shall be not less than 55 C. It is anticipated, given the limits for the test object specified in Annex A, that more than 60 C average dielectric temperature is achieved. If
42、 requested by the purchaser further details about the relation between external and internal (dielectric) temperatures should be given by the manufacturer. The dielectric temperature may be measured with thermocouples on specially prepared test units or estimated from previously established relation
43、ships between internal and external temperatures such as by use of resistive dummy capacitors described in IEC 60996. The ambient temperature shall be held constant with a tolerance of 2 C to +5 C. Prior to energization, the test units shall be stabilized in this ambient for 12 h. Due to the length
44、of this test, voltage interruptions are allowed. During these interruptions, the units shall remain in the PD IEC/TS 60871-2:2014IEC TS 60871-2:2014 IEC 2014 7 controlled ambient. If power is lost to the chamber, the ambient temperature shall be reattained for 12 h prior to re-energization of the un
45、its. The testing time shall depend on the test voltage. Either one of the following test conditions shall be used: Test voltage Duration h 1,25 U N3 000 1,40 U N1 000 4.3.2 Final capacitance and dielectric loss measurements The measurement shall be repeated under the same conditions as for the initi
46、al measurement, within a temperature tolerance of 5C. The measurements shall be made within two days after completing the tests in 4.1.3.2. 4.3.3 Acceptance criteria No breakdown shall occur when two units have been tested, or alternatively one breakdown is accepted when three units have been tested
47、. To verify no breakdown the capacitance measurements performed in 4.3.1 and 4.3.2 shall differ by less than an amount corresponding to breakdown of an element. 4.4 Validity of test The ageing test is a test on the elements (their dielectric design and composition), and on their processing (element
48、winding, drying and impregnation) when assembled in a capacitor unit. Each ageing test will also cover other capacitor designs, which are allowed to differ from the tested design within the limits stated in Annex A. A test performed at 50 Hz is also applicable for 60 Hz (and lower frequency) units a
49、nd vice versa. PD IEC/TS 60871-2:2014 8 IEC TS 60871-2:2014 IEC 2014 Annex A (normative) Requirements regarding comparable element design and test unit design A.1 Test element design criteria A tested element design is considered to be comparable with respect to the elements in the units to be manufactured if the following requirements are fulfilled: a) the tested element shall have the same or an inferior number of layers of solid materials in the dielectric and be impregna
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