BS QC 030000-1993 Harmonized system of quality assessment for electronic components Rectangular connectors for frequencies below 3 MHz Generic specification General requirements an.pdf

1、BRITISH STANDARD BS QC 030000:1993 IEC 807-1: 1991 Harmonized system of quality assessment for electronic components Rectangular connectors for frequencies below 3 MHz Part 1: Generic specification General requirements and guide for the preparation of detail specifications for connectors with assess

2、ed qualityBSQC030000:1993 This British Standard, having been prepared under the directionof the Electronic Components Standards Policy Committee, was published under the authority of the Standards Board and comes into effect on 15 July 1993 BSI 04-2000 The following BSI references relate to the work

3、 on this standard: Committee reference ECL/21 Special announcement in BSINews January 1993 ISBN 0 580 21873 2 Committees responsible for this British Standard The preparation of this British Standard was entrusted by the Electronic Components Standards Policy Committee (ECL/-) to Technical Committee

4、 ECL/21, upon which the following bodies were represented: EEA (the Association of Electronics, Telecommunications and Business Equipment Industries) Electronic Components Industry Federation Ministry of Defence National Supervising Inspectorate The following bodies were also represented in the draf

5、ting of the standard, through subcommittees and panels: Association of Manufacturers Allied to the Electrical and Electronic Industry (BEAMA Ltd.) British Telecommunications plc Society of British Aerospace Companies Limited Amendments issued since publication Amd. No. Date CommentsBSQC030000:1993 B

6、SI 04-2000 i Contents Page Committees responsible Inside front cover National foreword ii 1 General 1 1.1 Scope and object 1 1.2 Normative references 1 2 Technical characteristics 2 3 Quality assessment procedures 4 4 General requirements, tests and test schedules 14 5 Preparation of detail specific

7、ations 20 Annex A (normative) Common lettering system (to be used in drawings) 23 Table 1a Qualification approval test schedule for connectors 7 Table 1b Qualification approval test schedule for connectors mounted on cable adaptors 9 Table 2a Quality conformance inspection, lot-by-lot tests 12 Table

8、 2b Quality conformance insertion, periodic tests 13 List of references Inside back coverBSQC030000:1993 ii BSI 04-2000 National foreword This British Standard has been prepared under the direction of the Electronic Components Standards Policy Committee. It is identical with IEC807-1:1991 (QC030000)

9、 Rectangular connectors for frequencies below 3MHz Part1: Generic specification General requirements and guide for the preparation of detail specifications for connectors with assessed quality, published by the International Electrotechnical Commission (IEC), and is a harmonized specification in the

10、 IECQ system of quality assessment for electronic components. IEC 807-1 was prepared by IEC Subcommittee48B, Connectors, of IEC Technical Committee No.48, Electromechanical components for electronic equipment, and the United Kingdom participation in the drafting was provided by Subcommittee ECL/21/2

11、, Connectors for electronic equipment, of Technical Committee ECL/21, Electromechanical components for electronic equipment. The British Standard which implements the IECQ Rules of Procedure is BS9000 General requirements for a system for electronic components of assessed quality Part3:1991Specifica

12、tion for the national implementation of the IECQ System. Cross-references International Standard Corresponding British Standard IEC 68-1:1988 BS 2011 Environmental testing Part 1.1:1989 General and guidance (Identical) BS 6001 Sampling procedures for inspection by attributes Part 1:1991 Specificatio

13、n for sampling plans indexed by acceptable quality level (AQL) for lot-by-lot IEC 410:1973 inspection (Technically equivalent) BS 5772 Basic testing procedures and measuring methods for electromechanical components for electronic equipment IEC 512-3:1976 Part 3:1979 Current-carrying capacity tests (

14、Identical) IEC 512-4:1976 Part 4:1979 Dynamic stress tests (Identical) IEC 512-6:1984 Part 6:1984 Climatic tests and soldering tests (Identical) IEC 512-8:1984 Part 8:1985 Connector tests (mechanical) and mechanical tests on contacts and terminations (Identical) QC 001002:1986 BS QC 001002:1991 Rule

15、s of Procedure of the IEC Quality Assessment System for Electronic Components (IECQ) (Identical) ISO 129:1985 BS 308 Engineering drawing practice Part 2:1985: Recommendations for dimensioning and tolerancing of size (Technically equivalent) ISO 286-1:1988 BS 4500 ISO limits and fits Section 1.1:1990

16、 Specification for bases of tolerances, deviations and fits (Identical) ISO 286-2:1988 Section 1.2:1990 Tables of commonly used tolerance and grades and limits deviations for holes and shafts (Identical)BSQC030000:1993 BSI 04-2000 iii The Technical Committee has reviewed the provisions of ISO1101:19

17、83, IEC512-2:1985 and IEC512-7:1985 to which normative reference is made in the text, and has decided that they are acceptable for use in conjunction with this standard. NOTETextual error. In the title of Table 2b, “insertion” should read “inspection”. A British Standard does not purport to include

18、all the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. Summary of pages This document comprises a front cover, an inside front cover, pagesi to

19、iv, pages1to24, an inside back cover and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front cover.iv blankBSQC030000:1993 BSI 04-2000 1 Section 1. General 1.1 Scope and object T

20、his part of IEC 807 is applicable to rectangular connectors designed for use in equipment for telecommunication, electronic data processing and in electronic equipment or devices employing similar techniques. This generic specification shall be used in conjunction with the relevant detail specificat

21、ion(s). Connectors designated especially for applications at frequencies exceeding 3MHz are not covered in this generic specification. The object of this part of IEC807 is to establish uniform specifications, test type requirements and quality assessment procedures for rectangular connectors and to

22、establish rules for the preparation of detail specifications for connectors of assessed quality. In the event of conflict between this generic specification and the detail specification, the requirements of the detail specifications shall prevail. 1.2 Normative references The following standards con

23、tain provisions which, through reference in this text, constitute provisions of this part of IEC807. At the time of publication, the editions indicated were valid. All standards are subject to revision, and parties to agreements based on this part of IEC 807 are encouraged to investigate the possibi

24、lity of applying the most recent editions of the standards indicated below. Members of IEC and ISO maintain registers of currently valid International Standards. IEC 27, Letter symbols to be used in electrical technology. IEC 50(581):1978, International electrotechnical vocabulary (IEV), Chapter581:

25、 Electromechanical components for electronic equipment. IEC 68-1:1988, Environmental testing Part1: General and guidance. IEC 410:1973, Sampling plans and procedures for inspection by attributes. IEC 512, Electromechanical components for electronic equipment, basic testing procedures and measuring m

26、ethods. IEC 512-2:1985, Electromechanical components for electronic equipment, basic testing procedures and measuring methods. Part2: General examination, electrical continuity and contact resistance tests, insulation tests and voltage stress tests. IEC 512-3:1976, Electromechanical components for e

27、lectronic equipment, basic testing procedures and measuring methods. Part3: Current-carrying capacity tests. IEC 512-4:1976, Electromechanical components for electronic equipment, basic testing procedures and measuring methods. Part4: Dynamic stress tests. IEC 512-5:1977, Electromechanical component

28、s for electronic equipment, basic testing procedures and measuring methods. Part 5: Impact tests (free components), static load tests (fixed components), endurance tests and overload tests. IEC 512-5A:1980, First supplement. IEC 512-5B:1981, Second supplement. IEC 512-6:1984, Electromechanical compo

29、nents for electronic equipment, basic testing procedures and measuring methods. Part6: Climatic tests and soldering tests. IEC 512-7:1988, Electromechanical components for electronic equipment, basic testing procedures and measuring methods. Part7: Mechanical operating tests and sealing tests. IEC 5

30、12-8:1984, Electromechanical components for electronic equipment, basic testing procedures and measuring methods. Part8: Connector tests (mechanical) and mechanical tests on contacts and terminations. Amendment No.1(1985). IEC 512-9:1977, Electromechanical components for electronic equipment, basic

31、testing procedures and measuring methods. Part9: Cable-clamping tests, explosion hazard tests, chemical resistance tests, fire hazard tests, r.f. resistance tests, capacitance tests, shielding and filtering tests and magnetic interference tests. Amendment No.1(1982). BSQC030000:1993 2 BSI 04-2000 IE

32、C QC 001002:1986, Rules of procedure of the IEC quality assessment system for electronic components(IECQ). ISO 129:1985, Technical drawings Dimensioning General principles, definitions, methods of execution and special indications. ISO 286-1:1988, ISO system of limits and fits Part1: Bases of tolera

33、nces, deviations and fits. ISO 286-2:1988, ISO system of limits and fits Part2: Tables of standard tolerance grades and limit deviations for holes and shafts. ISO 1000:1981, SI units and recommendations for use of their multiples and of certain other units. ISO 1101:1983, Technical drawing Geometric

34、al tolerancing Tolerancing of form, orientation, location and run-out Generalities, definitions, symbols, indications on drawings. Section 2. Technical characteristics 2.1 Definitions For the purpose of this part of IEC 807, the following definitions apply. 2.1.1 connector type connectors within a p

35、articular subfamily. IEV581-08-05 2.1.2 connector style a particular connector within a type. IEV581-08-04 2.1.3 connector variant variations within a type and style, or within a group of related connectors. IEV581-08-06 2.1.4 examples family: connector: subfamily: rectangular connectors; type: rect

36、angular connectors with polarized guides or jackscrews; style: a particular external mounting configuration, e.g. rectangular flange mounting; variant: number of contacts, polarization, terminal, etc. 2.2 Classification into climatic categories The connectors are classified into climatic categories

37、in accordance with the general rules given in IEC68-1. The following preferred temperature ranges and severities of the damp heat, steady state test have been selected. Category Temperature range Damp heat steady state Days Climatic category C 10/070/04 25/070/10 25/085/10 25/085/21 40/085/21 40/085

38、/56 40/100/10 55/100/21 55/125/21 55/125/56 65/155/56 p 10 to + 70 p 25 to + 70 p 25 to + 85 p 25 to + 85 p 40 to + 85 p 40 to + 85 p 40 to + 100 p 55 to + 100 p 55 to + 125 p 55 to + 125 p 65 to + 155 4 10 10 21 21 56 10 21 21 56 56 Each performance level of a designated connector has only one clim

39、atic category and shall be specified in 6.1 of the detail specificationBSQC030000:1993 BSI 04-2000 3 2.3 Creepage and clearance distances Permissible operating voltages depend on the application and on the applicable or specified safety requirements. Therefore, creepage and clearance distances as we

40、ll as proof voltages under specified air pressure shall be specified in the detail specification. 2.4 Currents For each connector, the current-carrying capacity shall be specified in the detail specification, preferably by the current-temperature derating curve established in accordance with test5b:

41、 current temperature derating of IEC512-3or by at least one value of current and the associated temperature on this derating curve as well as the maximum operating temperature. 2.5 Marking 2.5.1 On the connector Each connector shall have the following information marked upon it: a) identification of

42、 the contact positions as indicated in the detail specification; If space does not permit full marking, as much as possible of the following shall be included in the order shown: b) IEC-type designation; c) mark of origin (manufacturers name or trade mark); d) date code. 2.5.2 On the package The inf

43、ormation b), c) and d) shall also be marked on the package. 2.6 IEC-type designation Connectors to which this standard applies shall be designated by the following indications and in the order given: a) the number of the detail specification; b) the letters “IEC”; c) a letter denoting the style of t

44、he connector (the system shall be specified in the detail specification); d) the number of contacts of connectors or of contact cavities of connector bodies; e) a letter denoting the type of the contact. The following letters shall be used: M = male contact F = female contact H = hermaphroditic cont

45、act f) a letter denoting the basic type of the terminations. The following letters shall be used: A = screw terminations S = solder terminations C = crimp terminations W = wrap terminations T = tab termination If necessary and explicitly specified in the detail specification, the IEC-type designatio

46、n may optionally be extended to cover further information, for example climatic category, termination information, etc. For connectors of assessed quality to a specified performance level, a digit shall be used to denote the performance level and a letter shall be used to denote the assessment level

47、. The digit and letter shall be included in this order as final characters of the type designation.BSQC030000:1993 4 BSI 04-2000 Section 3. Quality assessment procedures 3.1 Primary stage of manufacture The primary stage of manufacture as defined in 8.5.2 of IEC QC001002 is the first process subsequ

48、ent to the manufacture of finished piece parts and sub-assemblies. A sub-assembly is defined as the permanent assembly of two or more parts. This primary stage of manufacture and all subsequent processes shall be carried out under the direct surveillance of the manufacturers approved Chief Inspector

49、. They may be carried out by sub-contractors providing that equivalent disciplines apply. 3.2 Structurally similar rectangular connectors Connectors having the same basic design, common contact sizes and the same contact surface finish are considered to be structurally similar components as defined in 8.5.3 of IECQC001002. They may have differences in other features, such as number of contacts, overall size, mounting, termination technique, etc., but they all shall be produced by the same manufacturing processes and methods. Str