BS QC 300201-1985 Specification for harmonized system of quality assessment for electronic components Fixed capacitors for use in electronic equipment Blank detail specification fi.pdf

1、BRITISH STANDARD CONFIRMED JUNE 1999 BS QC 300201:1985 IEC 384-15-3: 1984 QC300201 Incorporating Amendment No. 1 Specification for Harmonized system of quality assessment for electronic components Fixed capacitors for use in electronic equipment Blank detail specification: Fixed tantalum capacitors

2、with solid electrolyte and porous anode Assessment level EBSQC300201:1985 BSI 04-2000 ISBN 0 580 34760 5 Amendments issued since publication Amd. No. Date of issue Comments 5945 September 1988 Indicated by a sideline in the marginBSQC300201:1985 BSI 04-2000 i Contents Page National foreword ii Intro

3、duction 1 Section 1. General data 1.1 Recommended method(s) of mounting 3 1.2 Dimensions 3 1.3 Ratings and characteristics 3 1.4 Related documents 4 1.5 Marking 4 1.6 Ordering information 4 1.7 Certified records of released lots 5 1.8 Additional information 5 1.9 Additional or increased severities o

4、r requirements to those specified in the generic and/or sectional specification 5 Section 2. Inspection requirements 2.1 Procedures 6 Table I 3 Table IIA Values of capacitance and of voltage-related to case sizes 3 Table IIB Characteristics at high and low temperature 4 Table IIC Impedance at. . . k

5、Hz (if applicable) 4 Table III Other characteristics 5 Table IV 6BSQC300201:1985 ii BSI 04-2000 National foreword This Part of this British Standard has been prepared under the direction oftheElectronic Components Standards Committee. It is identical with IECPublication384-15-3: “Fixed capacitors fo

6、r use in electronic equipment. Blank detail specification: Fixed tantalum capacitors with solid electrolyte and porous anode. Assessment level E” published by the International Electrotechnical Commission (IEC). Terminology and conventions. The text of the International Standard has been approved as

7、 suitable for publication as a British Standard without deviation. Some terminology and certain conventions are not identical with those used in British Standards. Cross-references. The British Standard which implements IEC Publications QC 001001:1986 and QC 001002:1986 is BS 9000: “General requirem

8、ents for a system for electronic components of assessed quality”: Part 3:1987 “Specification for national implementation of the IECQ basic rules and rules of procedure”. Scope. This standard lists the ratings, characteristics and inspection requirements which shall be included as mandatory requireme

9、nts in accordance with BS QC 300200. Detail specification layout. In the event of conflict between the requirements of this specification and the provisions of BS9000 the latter shall take precedence except that the front page layout will be in accordance with PD 9004:1986 “BS9000, CECC and IECQ UK

10、administrative guide” Circular Letter No.15. A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligatio

11、ns. International Standard Corresponding British Standard IEC 384-1:1982 (QC 300000:1982) BS QC 300000:1983 Fixed capacitors for use in electronic equipment. Generic specification (Identical) IEC 384-15:1982 (QC 300200:1982) BS QC 300200:1983 Sectional specification: Fixed tantalum capacitors with n

12、on-solid or solid electrolyte (Identical) IEC 410:1973 BS 6001: Sampling procedures for inspection by attributes: Part 1:1972: Specification for sampling plans indexed by acceptable quality level (AQL) for lot-by-lot inspection Summary of pages This document comprises a front cover, an inside front

13、cover, pages i and ii, pages1 to 12 and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front cover.BSQC300201:1985 BSI 04-2000 1 Introduction Blank detail specification A blank de

14、tail specification is a supplementary document to the Sectional Specification and contains requirements for style and layout and minimum content of detail specifications. Detail specifications not complying with these requirements may not be considered as being in accordance with IEC specifications

15、nor shall they so be described. In the preparation of detail specifications the content of Sub-clause1.4 of the sectional specification shall be taken into account. The numbers between brackets on the first page correspond to the following information which shall be inserted in the position indicate

16、d. Identification of the detail specification 1 The “International Electrotechnical Commission” or the National Standards Organization under whose authority the detail specification is drafted. 2 The IEC or National Standards number of the detail specification, date of issue and any further informat

17、ion required by the national system. 3 The number and issue number of the IEC or national Generic Specification. 4 The IEC number of the blank detail specification. Identification of the capacitor 5 A short description of the type of capacitor. 6 Information on typical construction (when applicable)

18、. NOTEWhen the capacitor is not designed for use in printed board applications, this shall be clearly stated in the detail specification in this position. 7 Outline drawing with main dimensions which are of importance for interchangeability and/or reference to the national or international documents

19、 for outlines. Alternatively, this drawing may be given in an appendix to the detail specification. 8 Application or group of applications covered and/or assessment level. NOTEThe assessment level(s) to be used in a detail specification shall be selected from the sectional specification, Sub-clause3

20、.5.4. This implies that one blank detail specification may be used in combination with several assessment levels, provided the grouping of the tests does not change. 9 Reference data on the most important properties, to allow comparison between the various capacitor types.BSQC300201:1985 2 BSI 04-20

21、00 1 IEC 384-15-3-XXX QC 300201-XXX 2 ELECTRONIC COMPONENTS OF ASSESSED QUALITY IN ACCORDANCE WITH: IEC 384-15-3 QC 300201 4 3 FIXED TANTALUM CAPACITORS WITH SOLID ELECTROLYTE AND POROUSANODE WITH LEAD ORTAG TERMINATIONS (Sub-family 3) 5 Outline drawing: (see Table I) (. . . angle projection) 7 Typi

22、cal construction: 6 Assessment level(s): E 8 (Other shapes are permitted within the dimensions given) Performance grade: Information on the availability of components qualified to this detail specification is given in the Qualified Products List. 9BSQC300201:1985 BSI 04-2000 3 Section 1. General Dat

23、a 1.1 Recommended method(s) of mounting (to be inserted) (See Sub-clause1.4.2 of IEC Publication384-15) 1.2 Dimensions Table I 1.3 Ratings and characteristics Capacitance range (seeTable IIA) Tolerance on rated capacitance Rated voltage (seeTable IIA) Category voltage (if applicable) (seeTable IIA)

24、Climatic category Rated temperature Variation of capacitance with temperature (seeTable IIB) Tangent of loss angle (seeTable IIB) Leakage current (seeTable IIB) Impedance (if applicable) (seeTable IIC) Reverse voltage (if required) Table IIA Values of capacitance and of voltage related to case sizes

25、 Case size reference Dimensions (in millimetres or inches and millimetres) L H d . . . . . . . . . NOTE 1When there is no case size reference,Table I may be omitted and the dimensions shall be given inTable IIA, which then becomesTable I. NOTE 2The dimensions shall be given as maximum dimensions or

26、as nominal dimensions with a tolerance. NOTEOther presentations of the above information may be necessary, but the above presentation should be followed as much as possible. Rated voltage Category voltage a Case size Case size Case size Case size Rated capacitance (in 4F) a If different from the rat

27、ed voltage.BSQC300201:1985 4 BSI 04-2000 Table IIB Characteristics at high and low temperature Table IIC Impedance at . . . kHz (ifapplicable) 1.4 Related documents 1.5 Marking The marking of the capacitor and the packing shall be in accordance with the requirements of IECPublication384-15, Sub-clau

28、se1.6. NOTEThe details of the marking of the component and packing shall be given in full in the detail specification. 1.6 Ordering information Orders for capacitors covered by this specification shall contain, in clear or in coded form, the following minimum information: a) Rated capacitance. b) To

29、lerance on rated capacitance. c) Rated d.c. voltage. d) Number and issue reference of the detail specification and style reference. U R C R Capacitance change Maximum values Tan Leakage current (%) (%) (4A) (V) (4F) A R B A b 20 C F B b 20 C R F B a A= Lower category temperature B= Upper category te

30、mperature R= Rated temperature a Measured with category voltage b If applicable Case size Impedance (7) 1 2 3 4 Generic specification: IEC Publication 384-1:1982: Fixed Capacitors for Use in Electronic Equipment. Part 1: Generic Specification. Sectional specification: IEC Publication 384-15:1982: Pa

31、rt 15: Sectional Specification: Fixed Tantalum Capacitors with Non-solid or Solid Electrolyte.BSQC300201:1985 BSI 04-2000 5 1.7 Certified records of released lots Required/not required. 1.8 Additional information (not for inspection purposes) 1.9 Additional or increased severities or requirements to

32、 those specified in the generic and/or sectional specification NOTEAdditions or increased requirements should be specified only when essential. Table III Other characteristics This table is to be used for defining characteristics which are additional to or more severe than those given in the section

33、al specification.BSQC300201:1985 6 BSI 04-2000 Section 2. Inspection requirements 2.1 Procedures 2.1.1 For Qualification Approval, the procedures shall be in accordance with the Sectional Specification, IEC Publication384-15, Sub-clause3.4. 2.1.2 For Quality Conformance Inspection, the test schedule

34、(Table IV) includes sampling, periodicity, severities and requirements. The formation of inspection lots is covered by Sub-clause3.5.1 of the Sectional Specification. Table IV NOTE 1Sub-clause numbers of tests and performance requirements refer to the Sectional Specification, IEC Publication384-15 a

35、nd Section 1 of this specification. NOTE 2Inspection Levels and AQLs are selected from IEC Publication410: Sampling Plans and Procedures for Inspection by Attributes. NOTE 3In this table: p = periodicity (in months) n = sample size c = acceptance criterion (permitted number of defectives) D = destru

36、ctive ND = non-destructive IL = inspection level IEC Publication 410 AQL = acceptable quality level Sub-clause number and Test (see Note 1) D or ND Conditions of test (seeNote 1) I L A Q L Performance requirements (see Note 1) (see Note 2) Group A inspection (lot-by-lot) Sub-group A1 ND S-4 2.5% 4.1

37、 Visual examination As in4.1 Legible marking and as specified in1.5 of this specification 4.1 Dimensions (gauging) As specified in Table I of this specification Sub-group A2 ND II 1.0% 4.2.1 Leakage current Protective resistance: . . . 7 u . . . 4A, see Table IIB 4.2.2 Capacitance Frequency:. . . Hz

38、 Within specified tolerance 4.2.3 Tangent of loss angle Frequency: . . . Hz u . . . . seeTable IIB 4.2.4 Impedance (if applicable) Frequency:. . . Hz u . . . 7, see Table IIC BSQC300201:1985 BSI 04-2000 7 Table IV Sub-clause number and test (see Note 1) D or ND Conditions of test (seeNote 1) I L A Q

39、 L Performance requirements (see Note 1) (see Note 2) Group B inspection (lot-by-lot) Sub-group B1 D S-3 2.5% 4.5 Solderability Without ageing Method:. . . Good tinning as evidenced by free flowing of the solder with wetting of the terminations or solder shall flow within. . . s, as applicable Sub-g

40、roup B2 ND S-3 2.5% 4.15 Characteristics at highand low temperature (ifrequired) The capacitors shall be measured at each temperature step Step 1: 20 C For use as referencevalue Leakage current Capacitance Tangent of loss angle Step 2: Lower category temperature Capacitance u . . .% b Tangent of los

41、s angle a u . . . b Step 3: Rated temperature Leakage current u . . . 4A b Capacitance u . . .% b Tangent of loss angle a u . . . b Step 4: Upper category temperature Leakage current u . . .4A b Capacitance u . . .% b Tangent of loss angle a u . . . b a If applicable. b SeeTable IIB. %C C - %C C - %

42、C C -BSQC300201:1985 8 BSI 04-2000 Table IV Sub-clause number and Test (see Note 1) D or ND Conditions of test (see Note 1) Sample size and criterion ofacceptability (see Note 3) Performance requirements (see Note 1) p n c Group C inspection (periodic) Sub-group C1A D 6 9 1 Part of sample of Sub-gro

43、up C1 4.3.1 Initial measurement Capacitance 4.3 Robustness of terminations Visual examination No visible damage 4.4 Resistance to soldering heat Method: . . . 4.4.2 Final measurements Visual examination No visible damage Legible marking Sub-group C1B D 6 18 1 Other part of sample of Sub-group C1 4.6

44、.1 Initial measurement Capacitance 4.6 Rapid change of temperature A= Lower category temperature B= Upper category temperature Five cycles Duration t = 30 min Recovery: 16 h 4.6.3 Final measurements Leakage current u . . . 4A seeTable IIB Capacitance u . . .% of value measured in4.6.1 Tangent of los

45、s angle u . . ., seeTable IIB 4.7 Vibration Method of mounting: see1.1 ofthis specification Procedure B4 Frequency range:. . .Hz to. . .Hz Amplitude:. . . mm or acceleration: . . . m/s 2whicheveristhe less severe Duration:. . . h 4.7.2 Final inspection Visual examination No visible damage 4.8 Bump (

46、or shock, see4.9) Method of mounting: see1.1 ofthis specification Number of bumps: . . . acceleration: 390 m/s 2 Duration of pulse: 6 ms 4.9 Shock (or bump, see4.8) Method of mounting: see1.1 ofthis specification Acceleration. . . m/s 2 Duration of pulse:. . . ms 4.8.2 or4.9.2 Final measurement Visu

47、al examination No visible damage %C C -BSQC300201:1985 BSI 04-2000 9 Table IV Sub-clause number and Test (see Note 1) D or ND Conditions of test (see Note 1) Sample size andcriterion ofacceptability (see Note 3) Performance requirements (see Note 1) p n c Sub-group C1 D 6 27 1 Combined sample of spe

48、cimens of Sub-groups C1A and C1B 4.10 Climatic sequence 4.10.1 Initial measurement Capacitance 4.1.3.2 Dry heat Temperature: upper category temperature Duration: 16 h Visual examination No visible damage 4.10.3 Damp heat, cyclic, Test Db, first cycle 4.10.4 Cold Temperature: lower category temperatu

49、re Duration: 2 h Visual examination No visible damage 4.10.5 Low air pressure (ifrequired by the detail specification) Air pressure: 8.5 kPa (85mbar) 4.10.5.3 Intermediate measurement Visual examination No breakdown, flash-over or harmful deformation of the case 4.10.6 Damp heat, cyclic,Test Db, remaining cycles 4.10.7 Sealing (if required by the detail specification) Method:. . . According to the method selected 4.10.8 Final measurements Visua