BS QC 400201-1984 Specification for harmonized system of quality assessment for electronic components Fixed resistors for use in electronic equipment Blank detail specification fix.pdf

1、BRITISH STANDARD BSQC 400201:1993 IEC 115-4-1: 1983 Incorporating Amendment No. 1 Specification for Harmonized system ofquality assessment for electronic components Fixed resistors for use in electronicequipment Blankdetail specification: Fixedpowerresistors Assessmentlevel EBSQC400201:1993 BSI 04-2

2、000 ISBN 0 580 34762 1 Amendments issued since publication Amd. No. Date Comments 7965 January 1994 Indicated by a sideline in the marginBSQC400201:1993 BSI 04-2000 i Contents Page National foreword ii Introduction 1 Section 1. General data 1.1 Recommended method(s) of mounting (to be inserted) 2 1.

3、2 Dimensions, ratings and characteristics 2 1.3 Related documents 2 1.4 Marking 2 1.5 Ordering information 3 1.6 Certified records of released lots 3 1.7 Additional information (not for inspection purposes) 3 1.8 Additional or increased severities or requirements to those specified in the generic an

4、d/or sectional specification 3 Section 2. Inspection requirements 2.1 Procedures 3 Table I 2 Table II 3BSQC400201:1993 ii BSI 04-2000 National foreword This Part of this British Standard has been prepared under the direction of the Electronic Components Standards Committee. It is identical with IEC

5、Publication115-4-1 (QC400201): “Fixed resistors for use in electronic equipment. Blank detail specification: Fixed power resistors. Assessment level E” published in1983and Amendment1 published in1993 by the International Electrotechnical Commission (IEC). Terminology and conventions. The text of the

6、 International Standard has been approved as suitable for publication as a British Standard without deviation. Some terminology and certain conventions are not identical with those used in British Standards. Cross-references. The British Standard harmonized with QC001001 and QC001002 is BS9000 “Gene

7、ral requirements for electronic components of assessed quality”. In adopting the IEC text as a National Standard it has been noted that there is an omission from boxes2and4of the specification number in the IEC Quality Assessment System for Electronic Components (IECQ). This has been drawn to the at

8、tention of the IEC TC40 Secretariat and the specification number has been inserted where necessary in this standard. Scope. This standard lists the ratings, characteristics and inspection requirements which shall be included as mandatory requirements in accordance with BS QC400201. Detail specificat

9、ion layout. In the event of conflict between the requirements of this specification and the provisions of BS9000 the latter shall take precedence except that the front page layout will be in accordance with BS9000 Circular Letter No15. A British Standard does not purport to include all the necessary

10、 provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. International Standards Corresponding British Standards IEC 115-1:1982 (QC 400000:1982) BS 9940 Harmonize

11、d system of quality assessment for electronic components. Fixed resistors for use in electronic equipment: Part 0:1983 Generic specification (Identical) IEC 115-4:1982 (QC 400200:1982) Part 0.0:1983 Sectional specification: Fixed precision resistors (Identical) IEC 410:1973 BS 6001:1972. Sampling pr

12、ocedures and tables for inspection by attributes (Technically equivalent) Summary of pages This document comprises a front cover, an inside front cover, pages i and ii, pages1 to 8 and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This wi

13、ll be indicated in the amendment table on the inside front cover.BSQC400201:1993 BSI 04-2000 1 Introduction Blank detail specification A blank detail specification is a supplementary document to the Sectional Specification and contains requirements for style and layout and minimum content of detail

14、specifications. Detail specifications not complying with these requirements shall not be considered as being in accordance with IEC specifications nor shall they so be described. In the preparation of detail specifications the content of Sub-clause1.4 of the Sectional Specification shall be taken in

15、to account. The numbers between brackets on page 1 correspond to the following information which shall be inserted in the position indicated: Identification of the detail specification 1 The “International Electrotechnical Commission” or the National Standards Organization under whose authority the

16、detail specification is drafted. 2 The IEC or National Standards number of the detail specification, date of issue and any further information required by the national system. 3 The number and issue number of the IEC or national Generic Specification. 4 The IEC number of the blank detail specificati

17、on. Identification of the resistor 5 A short description of the type of resistor. 6 Information on typical construction (when applicable). NOTEWhen the resistor is not designed for use in printed board applications, this shall be clearly stated in the detail specification in this position. 7 Outline

18、 drawing with main dimensions which are of importance for interchangeability and/or reference to the national or international documents for outlines. Alternatively, this drawing may be given in an appendix to the detail specification. 8 Application or group of applications covered and/or assessment

19、 level. NOTEThe assessment level(s) to be used in a detail specification shall be selected from the sectional specification, Sub-clause3.3.3. This implies that one blank detail specification may be used in combination with several assessment levels, provided the grouping of the tests does not change

20、. 9 Reference data on the most important properties, to allow comparison between the various resistor types. 1 IEC 115-4-1-XXX QC 400201-XXX 2 ELECTRONIC COMPONENTS OF ASSESSED QUALITY IN ACCORDANCE WITH: IEC 115-4-1 QC 400201 4 3 FIXED POWER RESISTORS 5 Outline drawing: (seeTable I) (Firstangleproj

21、ection) 7 Insulated/non-insulated 6 Assessment level(s): E 8 (Other shapes are permitted within the dimensions given) Stability class: .% Information on the availability of components qualified to this detail specification is given, in the Qualified Products List.BSQC400201:1993 2 BSI 04-2000 Sectio

22、n 1. General data 1.1 Recommended method(s) of mounting (to be inserted) (See Sub-clause1.4.2 of IEC Publication115-4.) 1.2 Dimensions, ratings and characteristics Table I All dimensions are in millimetres or inches and millimetres. 1.2.1 Derating Resistors covered by this specification are derated

23、according to the following curve: NOTESee also Sub-clause2.2.3 of the sectional specification. 1.3 Related documents 1.4 Marking The marking of the components and packing shall be in accordance with the requirements of IECPublication115-1, Sub-clause2.4. NOTEThe details of the marking of the compone

24、nt and packing shall be given in full in the detail specification. Maximum dimensions d nom. : Style Rated dissipation at 70 C (W) Limiting element voltage (V d.c. or a.c. r.m.s.) Isolation voltage (V d.c. or a.c. peak) L D Tol.: Resistance range a . to. Tolerances on rated resistance . .% Climatic

25、category / Low air pressure 8.5 kPa (85 mbar) Stability class .% Limits for change of resistance: for long-term tests (. % R + . 7) for short-term tests (. % R + . 7) Variation of resistance with temperature .% or : . 10 6 / C Temperature rise u . C a The preferred values are those of the E-series o

26、f IEC Publication 63: Preferred Number Series for Resistors and Capacitors. R R - (A suitable curve to be included in the detail specification) Generic Specification: IEC Publication 115-1:1982: Fixed Resistors for Use in Electronic Equipment.Part 1: Generic Specification. Sectional Specification: I

27、EC Publication 115-4:1982: Part 4: Sectional Specification: Fixed Power Resistors.BSQC400201:1993 BSI 04-2000 3 1.5 Ordering information Orders for resistors covered by this specification shall contain, in clear or in coded form, the following minimum information: a) Rated resistance. b) Tolerance o

28、n rated resistance. c) Number and issue number reference of the detail specification and style reference. 1.6 Certified records of released lots Required/not required. 1.7 Additional information (not for inspection purposes) 1.8 Additional or increased severities or requirements to those specified i

29、n the generic and/or sectional specification NOTEAdditions or increased requirements should be specified only when essential. Section 2. Inspection requirements 2.1 Procedures 2.1.1 For Qualification Approval the procedure shall be in accordance with the Sectional Specification, IEC Publication115-4

30、, Sub-clause3.2. 2.1.2 For Quality Conformance Inspection the test schedule (Table II) includes sampling, periodicity, severities and requirements. The formation of inspection lots is covered by Sub-clause3.3.1 of the Sectional Specification. NOTEWhen drying is called for, Procedure 1 of Sub-clause4

31、.3 of the Generic Specification, IEC Publication115-1, shall be used. Table II NOTE 1Sub-clause numbers of tests and performance requirements refer to the Generic Specification, IEC Publication115-1, except for resistance change requirements, which shall be selected from Table I and Table II of the

32、sectional specification, as appropriate. NOTE 2Inspection Levels and AQLs are selected from IEC Publication410: Sampling Plans and Procedures for Inspection by Attributes. NOTE 3In this table: p = periodicity (in months) n = sample size c = acceptance criterion (permitted number of defectives) D = d

33、estructive ND = non-destructive IL = inspection level IEC Publication 410 AQL = acceptable quality level Sub-clause number and Test (see Note 1) D or ND Conditions of test (seeNote1) IL AQL Performance requirements (seeNote 1) (see Note 2) Group A inspection (lot-by-lot) Sub-group A1 ND S-4 1.0% 4.4

34、.1 Visual examination As in 4.4.1. Legible marking and as specified in1.4 of this specification BSQC400201:1993 4 BSI 04-2000 Table II Sub-clause number and Test (see Note 1) D or ND Conditions of test (seeNote1) IL AQL Performance requirements (seeNote 1) (see Note 2) Sub-group A2 ND S-4 1.0% 4.4.2

35、 Dimensions (gauging) A gauge-plate of. mm shall be used (ifapplicable) As specified in Table I of this specification 4.5 Resistance As in 4.5.2 Group B inspection (lot-by-lot) Sub-group B1 ND S-3 1.0% 4.7 Voltage proof (Insulated resistors only) Method: . No breakdown or flashover Sub-group B2 D S-

36、3 2.5% 4.17 Solderability Without ageing Method:. Good tinning as evidenced by free flowing of the solder with wetting of the terminations or solder shall flow within. s, asapplicable) 4.16 Robustness of terminations Tensile test Visual examination Resistance No visible damage %R u (.% R +. 7) 4.13

37、Overload See 2.3.4 of the sectional specification Visual examination Resistance No visible damage Legible marking %R u (.% R +. 7) Sub-group B3 ND S-3 2.5% 4.8.4.2 Temperature coefficient of resistance This test is applicable only when a temperature coefficient of resistance of less than 50 10 6 / C

38、 is claimed. One cycle of20 C to 70 C to20 C only :.10 6 / CBSQC400201:1993 BSI 04-2000 5 Table II Sub-clause number and Test (see Note 1) D or ND Conditions of test (see Note 1) Sample size and criterion of acceptability (see Note 3) Performance requirements (seeNote1) p n c Group C inspection (per

39、iodic) Sub-group C1A D 3 10 Half of the sample of Sub-group C1 4.16 Robustness of terminations Tensile, bending and torsion tests as applicable Visual examination Resistance No visible damage %R u (.% R +.7) 4.18 Resistance to soldering heat Method: . Visual examination Resistance No visible, damage

40、 Legible marking %R u (.% R +.7) Sub-group C1B D 3 10 Other half of the sample of Sub-group C1 4.19 Rapid change of temperature A= Lower category temperature B= Upper category temperature Visual examination Resistance No visible damage %R u (.% R +.7) 4.20 Bump (or shock, see4.21) Method of mounting

41、: see1.1 of this specification Acceleration:390m/s 2 Number of bumps: 4000 or Acceleration:98m/s 2 Number of bumps:1000 Visual examination Resistance No visible damage %R u (.% R +.7) 4.21 Shock (or bump, see4.20) Method of mounting: see1.1 of this specification Acceleration:490m/s 2 Duration of pul

42、se:11ms Pulse shape: half-sine Visual examination Resistance No visible damage %R u (.% R +.7) 4.22 Vibration Method of mounting: see1.1 of this specification Procedure B4 Frequency range: . Hz to . Hz (see2.3.2 of the sectional specification) Amplitude:0.75mm or acceleration98m/s 2(whichever is the

43、 less severe) Total duration:6h Visual examination Resistance No visible damage %R u (.% R +.7)BSQC400201:1993 6 BSI 04-2000 Table II Sub-clause number and Test (see Note 1) D or ND Conditions of test (see Note 1) Sample size and criterion of acceptability (see Note 3) Performance requirements (see

44、Note 1) p n c Sub-group C1 D 3 20 1 Combined sample ofspecimens of Sub-groups C1A andC1B 4.23 Climatic sequence Dry heat Damp heat, cyclic, Test Db, first cycle Cold Low air pressure 8.5 kPa (85 mbar) Damp heat, cyclic, Test Db, remaining cycles D.C. load (for non-wire-wound types only) Visual exami

45、nation No visible damage Legible marking Resistance Insulation resistance (Insulated resistors only) %R u (.% R +. 7) R W 100M7 Sub-group C2 D 3 20 1 4.25.1 Endurance at room temperature Duration: 1000h Examination at 48 h, 500 h and 1000h: Visual examination Resistance No visible damage %R u (.% R

46、+. 7) Examination at 1 000 h: Insulation resistance (Insulated resistors only) R W 1 G7 If required by the detail specification the test shall be extended to 8 000 h 12 20 Examination at 2 000 h, 4000 h and 8 000 h: Resistance %R u (.% R +. 7) (The results obtained are for information only) Sub-grou

47、p C3 ND 3 20 1 4.8 Variation of resistance with temperature Lower category, temperature/20 Cu .% or : . 10 6 / C 20 C/upper category temperatureu .% or : . 10 6 / C R R - R R -BSQC400201:1993 BSI 04-2000 7 Table II Sub-clause number and Test (see Note 1) D or ND Conditions of test (see Note 1) Sampl

48、e size and criterion of acceptability (see Note 3) Performance requirements (see Note 1) p n c Group D inspection (periodic) Sub-group D1 D 12 20 1 4.24 Damp heat, steady state 1) Sub-clause 4.24.2.1 1stgroup6 specimens 2ndgroup 7 specimens 3rdgroup 7 specimens 2) Sub-clause 4.24.2.2 1stgroup10 spec

49、imens 2ndgroup 10 specimens Visual examination No visible damage Legible marking Resistance Insulation resistance (Insulated resistors only) %R u (.% R +.7) R W 100 M7 Sub-group D2 ND 36 13 1 4.14 Temperature rise % u . C Sub-group D3 D 36 20 1 4.4.3 Dimensions (detail) As specified inTable I of this specification 4.25.3 Endurance at upper category temperature Duration: 1000 h Examination at 48 h, 500 h and100