BS QC 400302-1992 Specification for harmonized system of quality assessment for electronic components Fixed resistors for use in electronic equipment Blank detail specification Fix.pdf

1、BRITISH STANDARD BS QC 400302:1992 IEC 115-5-2: 1992 Specification for Harmonized system of quality assessment for electronic components Fixed resistors for use in electronic equipment Blankdetail specification Fixed precision resistors Assessment level FBS QC400302:1992 BSI 12-1999 ISBN 0 580 35648

2、 5 Amendments issued since publication Amd. No. Date of issue CommentsBS QC400302:1992 BSI 12-1999 i Contents Page National foreword ii Introduction 1 Section 1. General data 2 1.1 Recommended method(s) of mounting 2 1.2 Dimensions, ratings and characteristics 2 1.3 Related documents 3 1.4 Marking 3

3、 1.5 Ordering information 3 1.6 Certified records of released lots 3 1.7 Additional information 3 1.8 Additional or increased severities or requirements to those specified in the generic and/or sectional specification 3 Section 2. Inspection requirements 3 2.1 Procedures 3 Table I 2 Table II 4BS QC4

4、00302:1992 ii BSI 12-1999 National foreword This British Standard has been prepared under the direction of the Electronic Components Standards Policy Committee (ECL/-). It is identical with IEC 115-5-2:1992 (QC 400302) “Fixed Resistors for use in electronic equipment. Part 5 Blank detail specificati

5、on: Fixed precision resistors. Assessment level F”, published by the International Electrotechnical Commission (IEC) and is a harmonized specification within the IECQ System of quality assessment for electronic components. IEC 115-5-2 was prepared by IEC Technical Committee No. 40, Capacitors and re

6、sistors for electronic equipment, and the United Kingdom participation in the drafting was provided by Technical Committee ECL/4, Capacitors and resistors for electronic equipment. Scope. This standard lists the ratings, characteristics and inspection requirements which shall be included as mandator

7、y requirements in accordance withBSQC400300 in any detail specification for these components. The British Standard which implements the IECQ Rules of Procedure is BS 9000 “General requirements for a system for electronic components of assessed quality” Part 3:1991 “Specification for the national imp

8、lementation of the IECQ System”. The Technical Committee has reviewed the provisions ofIEC63 andIEC410 to which reference is made in the text and has decided that they are acceptable for use in conjunction with this standard. Detail Specifications. Detail specifications shall comply with the require

9、ments of this Blank Detail Specification andBSQC001002:1991 “Rules of Procedure of the IEC Quality Assessment System for Electronic Components (IECQ)”. A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their corr

10、ect application. Compliance with a British Standard does not of itself confer immunity from legal obligations. Cross-references International Standard Corresponding British Standard IEC 115-1:1982 (QC 400000) BS QC 400000:1990 Harmonized system of quality assessment for electronic components. Fixed

11、resistors for use in electronic equipment. Generic specification (Identical) IEC 115-5:1982 (QC 400300) BS 9940 Harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Part 03.0:1983 Sectional specification: fixed precision resistors (Ident

12、ical) Summary of pages This document comprises a front cover, an inside front cover, pages i and ii, pages 1 to 9 and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front cover.BS

13、 QC400302:1992 BSI 12-1999 1 Introduction Blank detail specification A blank detail specification is a supplementary document to the Sectional Specification and contains requirements for style and layout and minimum content of detail specifications. Detail specifications not complying with these req

14、uirements shall not be considered as being in accordance with IEC specifications nor shall they so be described. In the preparation of detail specifications the content of Sub-clause1.4 of the Sectional Specification shall be taken into account. The numbers between brackets on page 2 correspond to t

15、he following information which shall be inserted in the position indicated. Identification of the detail specification (1) The “International Electrotechnical Commission” or the National Standards Organisation under whose authority the detail specification is drafted. (2) The IEC or National Standar

16、ds number of the detail specification, date of issue and any further information required by the national system. (3) The number and issue number of the IEC or national Generic specification. (4) The IEC number of the blank detail specification. Identification of the resistor (5) A short description

17、 of the type of resistor. (6) Information on typical construction (when applicable). NOTEWhen the resistor is not designed for use in printed board applications, this shall be clearly stated in the detail specification in this position. (7) Outline drawing with main dimensions which are of importanc

18、e for interchangeability and/or reference to the national or international documents for outlines. Alternatively, this drawing may be given in an appendix to the detail specification (8) Application or group of applications covered and/or assessment level. NOTEThe assessment level(s) to be used in a

19、 detail specification shall be selected from the sectional specification, Sub-clause3.3.3. This implies that one blank detail specification may be.used in combination with several assessment levels, provided the grouping of the tests does not change. (9) Reference data on the most important properti

20、es, to allow comparison between the various resistor types.BS QC400302:1992 2 BSI 12-1999 Section 1. General data 1.1 Recommended method(s) of mounting (to be inserted) (See Sub-clause1.4.2 of IEC Publication115-5.) 1.2 Dimensions, ratings and characteristics Table I All dimensions are in millimetre

21、s or inches and millimetres. (1) IEC 115-5-2-XXX QC 400302-XXX (2) ELECTRONIC COMPONENTS OF ASSESSED QUALITY IN ACCORDANCE WITH: IEC 115-5-2 QC 400302 (4) (3) FIXED PRECISION RESISTORS (5) Outline drawing: (see Table I) (. . . angle projection) (7) Insulated/non-insulated (6) (Other shapes are permi

22、tted within the dimensions given) Assessment level(s): F (8) Stability class: . . . % Information on the availability of components qualified to this detail specification is given in the Qualified Products List. (9) Style Rated dissipation at 70 C (W) Limiting element voltage (V d.c. or a.c. r.m.s.)

23、 Isolation voltage (V d.c. or a.c. peak) Maximum dimensions d nom: L D Tol.: Resistance range a . . . to. . . 7 Tolerance on rated resistance . . . % Climatic category -/-/- Low air pressure 8,5 kPa (85 mbar) Stability class . . .% Limits for change of resistance: for long-term tests (. . . %R + . .

24、 . 7) for short-term tests (. . . %R + . . . 7) Temperature coefficient !:. . . 10p 6 / C a The preferred values are those of the E-series of IEC Publication 63: Preferred Number Series for Resistors and Capacitors.BS QC400302:1992 BSI 12-1999 3 1.2.1 Derating Resistors covered by this specification

25、 are derated according to the curve: (A suitable curve to be included in the detail specification) NOTESee also Sub-clause2.2.3 of the sectional specification. 1.3 Related documents 1.4 Marking The marking of the components and packaging shall be in accordance with the requirements of IEC Publicatio

26、n 115-1, Sub-clause2.4. NOTEThe details of the marking of the component and packaging shall be given in full in the detail specification. 1.5 Ordering information Orders for resistors covered by this specification shall contain, in clear or in coded form, the following minimum information: a) Rated

27、resistance. b) Tolerance on rated resistance. c) Number and issue number reference of the detail specification and style reference. 1.6 Certified records of released lots Required/not required. 1.7 Additional information (not for inspection purposes) 1.8 Additional or increased severities or require

28、ments to those specified in the generic and/or sectional specification NOTEAdditions or increased requirements should be specified only when essential. Section 2. Inspection requirements 2.1 Procedures 2.1.1 For Qualification Approval the procedure shall be in accordance with the Sectional Specifica

29、tion, IEC Publication 115-5, Sub-clause3.2. 2.1.2 For Quality Conformance Inspection the test schedule (Table II) includes sampling, periodicity, severities and requirements. The formation of inspection lots is covered by Sub-clause3.3.1 of the Sectional Specification. NOTEWhen drying is called for,

30、 Procedure I of Sub-clause4.3 of the Generic Specification, IEC Publication 115-1, shall be used. Generic Specification: IEC Publication 115-1 (1982): Fixed Resistors for Use in Electronic Equipment. Part 1: Generic specification. Amendment No. 2 (1987). Sectional Specification: IEC Publication 115-

31、5 (1983): Part 5: Sectional Specification: Fixed Precision Resistors.BS QC400302:1992 4 BSI 12-1999 Table II NOTE 1Sub-clause numbers of test and performance requirements refer to the Generic Specification, IEC Publication 115-1, except for resistance change requirements, which shall be selected fro

32、m theTable I andTable II of the sectional specification, as appropriate. NOTE 2Inspection Levels and AQLs are selected from IEC Publication 410: Sampling Plans and Procedures for Inspection by Attributes. NOTE 3In this table: p =periodicity (in months) n =sample size c =acceptance criterion (permitt

33、ed number of defectives) D =destructive ND =non-destructive IL =inspection level AQL =acceptable quality level IEC Publication 410 Sub-clause number and Test (see Note 1) D or ND Conditions of test (see Note 1) IL AQL Performance requirements (see Note 1) (see Note 2) Group A Inspection (lot-by-lot)

34、 Sub-group A1 ND II 1,0% 4.4.1 Visual examination As in 4.4.1 Legible marking and as specified in 1.4 of this specification 4.4.2 Dimensions (gauging) A gauge-plate of .mmshall be used (if applicable) As specified inTable I of this specification Sub-group A2 ND II 0,25 % 4.5 Resistance As in 4.5.2BS

35、 QC400302:1992 BSI 12-1999 5 Table II Sub-clause number and Test (see Note 1) D or ND Conditions of test (see Note 1) IL AQL Performance requirements (see Note 1) (see Note 2) Group B Inspection (lot-by-lot) Sub-group B1 D S-3 1,0% 4.7 Voltage proof (Insulated resistorsonly) Method: . . . No breakdo

36、wn or flashover 4.6 Insulation resistance (Insulated resistorsonly) R U 1G7 4.17 Solderability Without ageing Method: . . . Good tinning as evidenced by free flowing of the solder with wetting of the terminations or solder shall flow within. . . s, as applicable 4.13 Overload Test duration Rated dis

37、sipation 3 s 5 s 1W U1W Applied voltage: 2,5 times the rated voltage or twice the limiting element voltage, whichever is the less severe Visual examination No visible damage Legible marking Resistance %R k (. . .%R+. . . 7) 4.30 Solvent resistanceof the marking (if applicable) Solvent: . . . Solvent

38、 temperature:. . . Method 1 Rubbing material: cotton wool Legible marking Recovery: . . .BS QC400302:1992 6 BSI 12-1999 Table II Sub-clause number and Test (see Note 1) D or ND Conditions of test (see Note 1) IL AQL Performance requirements (see Note 1) (See Note 2) Sub-group B2 ND S-3 2,5% 4.8.4.2

39、Temperature coefficient of resistance This test is applicable only when a temperature coefficient of resistance of less than 50 10 p6 / C is claimed. One cycle of 20 C to 70 C to 20 C only !:. . . 10 p6 / C Sub-clause number and Test (see Note 1) D or ND Conditions of test (see Note 1) Sample size &

40、 criterion of acceptability (see Note 3) Performance requirements (see Note 1) p n c Group C Inspection (periodic) Not applicable Group D Inspection (periodic) Sub-group D1A D 6 7 Half of the sample of Sub-group D1 4.16 Robustness of terminations Tensile, bending and torsion tests as applicable Visu

41、al examination No visible damage Resistance %R k (. . .%R +. . . 7) 4.18 Resistance to soldering heat Method: . . . Visual examination No visible damage Legible marking Resistance %R k (. . .%R +. . . 7) 4.29 Component solvent resistance (if applicable) Solvent: . . . Solvent temperature: . . . Meth

42、od 2 See detail specification Recovery: . . .BS QC400302:1992 BSI 12-1999 7 Table II Sub-clause number and Test (see Note 1) D or ND Conditions of test (see Note 1) Sample size & criterion of acceptability (see Note 3) Performance requirements (see Note 1) p n c Sub-group D1B D 6 6 Other half of the

43、 sample of Sub-group D1 4.19 Rapid change of temperature F A : Lover category temperature F B : Upper category temperature Visual examination No visible damage Resistance %R k (. . .%R +. . . 7) 4.22 Vibration Method of mounting: see 1.1 of this specification Procedure B4 Frequency range: . . . to.

44、. . Hz (see 2.3.2 of the sectional specification) Amplitude: 0,75 mm or 98 m/s 2(whichever is the less severe) Total duration: 6 h Visual examination No visible damage Resistance %R k (. . .%R +. . . 7) Sub-group D1 D 6 13 1 Combined sample of specimens of Sub-groups D1A and D1B 4.23 Climatic sequen

45、ce Dry heat Damp heat, cyclic, Test Db, firstcycleBS QC400302:1992 8 BSI 12-1999 Table II Sub-clause number and Test (see Note 1) D or ND Conditions of test (see Note 1) Sample size & criterion of acceptability (see Note 3) Performance requirements (see Note 1) p n c Cold Low air pressure 8,5 kPa (8

46、5 mbar) Damp heat, cyclic, Test Db, remaining cycles D.C. load (for non-wirewound types only) Visual examination No visible damage Legible marking Resistance %R k (. . .%R+. . . 7) Insulation resistance (Insulated resistors only) R U 100 M7 Sub-group D2 D 6 13 1 4.25.1 Endurance at 70 C Duration: 1

47、000 h Examination at 48 h, 500 h and 1000 h: Visual examination No visible damage Resistance %R k (. . .%R +. . . 7) Examination at 1 000 h: Insulation resistance (Insulated resistors only) R U 1 G7 Sub-group D3 D 12 13 1 4.24 Damp heat, steadystate 1) Sub-clause 4.24.2.1 1st group: 4 specimens 2nd

48、group: 4 specimens 3rd group: 5 specimens 2) Sub-clause 4.24.2.2 1st group: 6 specimens 2nd group: 7 specimens Visual examination No visible damage Legible marking Resistance Insulation resistance (Insulated resistors only) %R k (. . .%R + . . . 7) R U 100 M7BS QC400302:1992 BSI 12-1999 9 Table II S

49、ub-clause number and Test (see Note 1) D or ND Conditions of test (see Note 1) Sample size & criterion of acceptability (see Note 3) Performance requirements (see Note 1) p n c Sub-group D4 ND 36 13 1 4.8 Variation of resistance with temperature Lower category temperature/20 C k . . .% or !: . . . 10 6 / Z C 20 C/upper category temperature k . . . % or !: . . . x 10 6 / Z C Sub-group D5 D 24 13 1 4.4.3 Dimensions (detail) As specified in Table I of this specification 4.25.3 Enduran