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BS QC 410402-1992 Specification for harmonized system of quality assessment for electronic components Potentiometers for use in electronic equipment Blank detail specification rota.pdf

1、BRITISH STANDARD BS QC 410402:1992 IEC 393-3-1: 1992 Specification for Harmonized system of quality assessment for electronic components Potentiometers for usein electronic equipment Blank detail specification Rotary precision potentiometers Assessment level EBS QC410402:1992 BSI 11-1999 ISBN 0 580

2、35658 2 Amendments issued since publication Amd. No. Date CommentsBS QC410402:1992 BSI 11-1999 i Contents Page National foreword ii Introduction 1 Section 1. General data 1 General data 3 Section 2. Inspection and requirements 2 Inspection and requirements 5 Table I 2 Table II 5BS QC410402:1992 ii B

3、SI 11-1999 National foreword This British Standard has been prepared under the direction of the Electronic Components Standards Policy Committee (ECL/-). It is identical with IEC393-3-1:1992 (QC 410402) “Potentiometers for use in electronic equipment. Part 3 Blank detail specification: Lead screw ac

4、tuated and rotary potentiometers Assessment level E”, published by the International Electrotechnical Commission (IEC) and is a harmonized specification within the IECQ system of quality assessment for electronic components. IEC393-3-1 was prepared by IEC Technical Committee No. 40, Capacitors and r

5、esistors for electronic equipment, and the United Kingdom participation in the drafting was provided by Technical Committee ECL/4, Capacitors and resistors for electronic equipment. Scope. This standard lists the ratings, characteristics and inspection requirements which shall be included as mandato

6、ry requirements in accordance with BS QC410400 in any detail specifications for these components. The British Standard which implements the IECQ Rules of Procedure is BS9000 “General requirements for a system for electronic components of assessed quality” Part 3:1991 “Specification for the national

7、implementation of the IECQ System”. The Technical Committee has reviewed the provisions of IEC63 and IEC410 to which reference is made in the text and has decided that they are acceptable for use in conjunction with this standard. Detail specifications. Detail specifications shall comply with the re

8、quirements of this Blank Detail Specification and BS QC001002:1991 “Rules of Procedure of the IEC Quality Assessment System for Electronic Components (IECQ)”. A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for the

9、ir correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. Cross-references International Standard Corresponding British Standard IEC 393-1:1989 BS QC 410000:1990 Harmonized system of quality assessment for electronic components: potentiomet

10、ers for use in electronic equipment. Generic specification (Identical) IEC 393-3:1992 BS QC 41400:1992 Harmonized system of quality assessment for electronic components. Potentiometers for use in electronic equipment. Sectional specification for rotary preset potentiometers (Identical) Summary of pa

11、ges This document comprises a front cover, an inside front cover, pages i and ii, pages 1 to 17 and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front cover.BS QC410402:1992 BSI

12、 11-1999 1 Introduction Blank detail specification A blank detail specification is a supplementary document to the Sectional Specification and contains requirements for style and layout and minimum content of detail specifications. Detail Specifications not complying with these requirements shall no

13、t be considered as being in accordance with IEC specifications nor shall they so be described. In the preparation of detail specifications the content of Sub-clause1.4 of the Sectional Specification shall be taken into account. The numbers between brackets on page 2 correspond to the following infor

14、mation which shall be inserted in the position indicated. Identification of the detail specification (1) The “International Electrotechnical Commission” or the National Standards Organisation under whose authority the detail specification is drafted. (2) The IEC or National Standards number of the d

15、etail specification, date of issue and any further information required by the national system. (3) The number and issue number of the IEC or national Generic Specification. (4) The IEC number of the blank detail specification. Identification of the potentiometer (5) A short description of the type

16、of potentiometer. (6) Information on typical construction (if applicable) for example: wirewound, 10turns helical. NOTEWhen the potentiometer is not designed for use in printed board applications, this shall be clearly stated in the detail specification in this position. (7) Outline drawing with mai

17、n dimensions which are of importance for interchangeability and/or reference to the national or international documents for outlines. Alternatively, this drawing may be given in an Appendix to the detail specification. (8) Application or group of applications covered and/or assessment level. NOTEThe

18、 assessment level(s) to be used in a detail specification shall be selected from the sectional specification, Sub-clause3.3.3. This implies that one blank detail specification may be used in combination with several assessment levels, provided the grouping of the tests does not change. (9) Reference

19、 data on the most important properties, to allow comparison between the various potentiometer types.BS QC410402:1992 2 BSI 11-1999 Table I (1) IEC 393-3-1-XXX QC 410402-XXX (2) ELECTRONIC COMPONENTS OF ASSESSED QUALITY IN ACCORDANCE WITH: IEC 393-3-1 QC 410402 (4) (3) ROTARY PRECISION POTENTIOMETERS

20、 (5) Outline drawing and dimensions: ( angle projection) (7) (When necessary the dimensions may be given in an Appendix to the detail specification) Typical construction: (6) Terminal connections: Assessment level(s): E (8) Information on the availability of components qualified to this detail speci

21、fication is given in the Qualified Products List. (9) Style Rated dissipation at 70 C (W) Limiting element voltage (V d.c. or a.c. r.m.s.) Isolation voltage (V d.c. or a.c. peak) Normal air pressure Low air pressureBS QC410402:1992 BSI 11-1999 3 Section 1. General data 1 General data 1.1 Recommended

22、 method(s) of mounting (to be inserted) (See Sub-clause1.4.2 of IEC Publication393-3). 1.2 Dimensions (When necessary the dimensions may be given in an Appendix to the detail specification). All dimensions are in millimetres or inches and millimetres. 1.3 Ratings and characteristics 1.3.1 Derating P

23、otentiometers covered by this specification are derated according to the following curve: (A suitable curve to be included in the detail specification) NOTESee also Sub-clause2.2.3 of the sectional specification. 1.4 Related documents 1.5 Marking The marking of the component and package shall be in

24、accordance with the requirements of IECPublication393-3, Sub-clause1.5. NOTEThe details of the marking of the component and package shall be given in full in the detail specification. Resistance range a The range of values in each law and in each style is given in the Qualified Products List. Tolera

25、nces on rated resistance % Resistance law and degree of conformity Temperature characteristic of resistance (20 C to 70 C) (%R/R) k % Temperature coefficient k 10 6 / C Climatic category -/-/- Low air pressure 8,5 kpa (85 mbar) Limits of resistance change (a to c) (after 1 000 h electrical endurance

26、 test) ( %R + 7) Starting torque mN.m to mN.m Number of turns of actuating device Total mechanical travel U . Effective electrical travel U . Ineffective travel (clockwise) k . Ineffective travel (anti-clockwise) k . Limiting moving contact current mA Terminal resistance 7 Residual resistance (if ap

27、plicable) 7 Minimum effective resistance 7 a The preferred values are those of the E-series of IEC Publication 63. Generic Specification: IEC Publication 393-1 (1989): Potentiometers for use in electronic equipment. Part 1: Generic Specification. Sectional Specification: IEC Publication 393-3 (1991)

28、: Potentiometers. Part 3: Sectional Specification: Rotary precision potentiometers.BS QC410402:1992 4 BSI 11-1999 1.6 Ordering information Orders for potentiometers covered by this specification shall contain, in clear or in coded form the following minimum information: a) Rated resistance and toler

29、ance on rated resistance. b) Resistance law (if other than linear) and degree of conformity. c) Number and issue reference of the detail specification and style reference. d) Spindle and bush dimension, if not implicit in the style reference. 1.7 Certified records of released lots Required/not requi

30、red. 1.8 Additional information (Not for inspection purposes) (The detail specification may include information such as circuit diagrams, curves, drawings and notes needed for the clarification of the detail specification). 1.9 Additional or increased severities or requirements to those specified in

31、 the generic and/or sectional specification NOTEAdditions or increased requirements should be specified only when essential.BS QC410402:1992 BSI 11-1999 5 Section 2. Inspection requirements 2 Inspection and requirements 2.1 Procedures 2.1.1 For Qualification Approval the procedure shall be in accord

32、ing with the Sectional Specification, IEC Publication393-3, sub-clause3.2. 2.1.2 For Quality Conformance Inspection the test schedule (Table II) includes sampling, periodicity, severities and requirements. The formation of inspection lots is covered by Sub-clause3.3.1 of the Sectional Specification.

33、 For the quality conformance inspection the values representative of the whole approved range shall be tested within one year (Groups A, B and C only). NOTEWhen drying is called for, procedure I of the Generic specification, IEC Publication393-1, Sub-Clause4.3 shall be used. Table II NOTE 1Sub-claus

34、e numbers of tests and performance requirements refer to the Generic Specification for potentiometers, IEC Publication 393-1, except for severities for environmental tests and limits of change in resistance or output ratio, which have to be selected from the relevant clauses of the Sectional Specifi

35、cation, IEC Publication 393-3. NOTE 2Inspection Levels and AQLs are selected from IEC Publication 410: Sampling Plans and Procedures for Inspection by Attributes. NOTE 3In this table: p=periodicity (in months) n=sample size c=acceptance criterion (permitted number of defectives) D=destructive ND=non

36、-destructive IL=inspection level IEC 410 AQL=acceptable quality level Sub-clause number and Test (See Note 1) D or ND Conditions of test (see Note 1) IL AQL Performance requirements (see Note 1) (See Note 2) Group A Inspection (lot-by-lot) Sub-group A1 ND I 1,5% 4.6 Element resistance As in 4.6.3 No

37、tes 4 to 11 on page 17BS QC410402:1992 6 BSI 11-1999 Table II Sub-clause number and Test (see Note 1) D or ND Conditions of test (see Note 1) IL AQL Performance requirements (see Note 1) (See Note 2) Sub-group A2 ND I 1,5% 4.4.1 Visual examination As in 4.4.1 Legible marking and as specified in 1.5

38、of this specification 4.4.2 Dimensions (gauging) As specified in this specification 4.18 Starting torque As specified in this specification 4.4.4 Total mechanical travel As specified in this specification Sub-group A3 ND S-2 4,0% 4.4.4 Total mechanical travel (Reference measurement for4.4.6) 4.4.6 E

39、ffective electrical travel Angle of effective electrical travel U . Angle of ineffective travel (anti-clockwise) k . Angle of ineffective travel (clockwise) k . 4.9 Resistance law (The detail specification shall prescribe the appropriate test conditions and performance requirements to be selected fr

40、om Subclause 2.1.5 of the sectional specification) 4.15 Rotational noise Method B (wirewound potentiometers only), % F O : k %R 4.29 Output smoothness (Applicable to non-wire-wound potentiometers only) k %U ac 4.12 Voltage proof (Insulated potentiometers only) (For mounting method see 1.1 of this sp

41、ecification and Note11) Normal air pressure As in 4.12.5 Notes 4 to 11 on page 17BS QC410402:1992 BSI 11-1999 7 Table II Sub-clause number and Test (see Note 1) D or ND Conditions of test (see Note 1) IL AQL Performance requirements (see Note 1) (see Note 2) Sub-group A4 ND S-2 1,5% 4.32 Solderabili

42、ty (if applicable) Method 1: Solder bath Good tinning as evidenced by free flowing of the solder with wetting of the terminations Temperature: 235 5 C Duration: 2 0,5 s or Method 2: Soldering iron Solderiron size B Temperature: 350 10 C Duration: 2 0,5 s 4.45 Solvent resistance of the marking (if ap

43、plicable) Solvent: Solvent temperature: Method 1 Rubbing material: cotton wool Legible marking Recovery: Sub-group A5 ND S-2 2,5% (If the design of the potentiometer is such that the tests in this sub-group are not applicable, then the detail specification may omit this sub-group) 4.23 Spindle run-o

44、ut Radial force: N Lengthofspindle from mounting face(1):mm Total indicator reading (1): k mm 4.24 Lateral run-out Radial force: N Axial force: N Mounting surface radius(r):mm Total indicator reading (r): k mm 4.25 Spigot diameter run-out Radial force: N Total indicator reading: k mm 4.26 Spindle en

45、d play Direction A Total indicator reading: k mm Direction B Total indicator reading: k mm Notes 4 to 11 on page 17BS QC410402:1992 8 BSI 11-1999 Table II Sub-clause number and Test (see Note 1) D or ND Conditions of test (see Note 1) Sample size & criterion of acceptability (see Note 3) Performance

46、 requirements (see Note 1) p n c Group B Inspection: Not Applicable Group C Inspection (periodic) Sub-group C1 ND 3 5 0 4.20 End stop torque (Not applicable to continuous rotation potentiometers) Visual examination As in 4.20.1 4.22 Thrust and pull on spindle (Not applicable if the test for spindle

47、end play has been performed in Sub-group A5) Three specimens Asspecified in 4.22.2 Continuity As in 4.22.2 Two specimens As specified in 4.22.3 Output ratio k % Sub-group C2A Part of the sample of Sub-groupC2 D 3 2 4.30 Robustness of terminations The tests appropriate to the type of termination Visu

48、al examination As in 4.30.8 Element resistance %R k (%R + 7) 4.33 Resistance to soldering heat (if applicable) Test Tb, Method 1B Temperature: 350 10 C Duration: 3,5 0,5 s or Method 2 Soldering iron: Size B Temperature: 350 10 C Duration: 10 1 s Element resistance %R k ( %R + 7) Terminal resistance:

49、 Resistance a to b k 7 Resistance b to c, and when applicable, between b and each tap termination k 7 k 7 Notes 4 to 11 on page 17 % U ab U ac -BS QC410402:1992 BSI 11-1999 9 Table II Sub-clause number and Test (see Note 1) D or ND Conditions of test (see Note 1) Sample size & criterion of acceptability (see Note 3) Performance requirements (see Note 1) p n c 4.44 Component solvent resistance (if applicable) Solvent Solvent

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