ANSI IEEE 1584-2002 Guide for Performing Arc-Flash Hazard Calculations (Includes Access to Additional Content)《电弧闪光危害计算的实施导则》.pdf

1、 Access to Additional Content for IEEE 1584, Dated: August 2002 (Click here to view the publication) This Page is not part of the original publication This page has been added by IHS as a convenience to the user in order to provide access to additional content as authorized by the Copyright holder o

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5、brought to its attention.Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on December 30, 2009 at 13:17 from IEEE Xplore. Restrictions apply. Copyright 2002 IEEE. All rights reserved.iiiIntroduction(This introduction is not part of IEEE Std 1584-2002, IEEE Guide for Performing A

6、rc-Flash Hazard Calculations.)A technical paper by Lee, “The other electrical hazard: electric arc blast burns” B19 provided insight thatelectrical arc burns make up a substantial portion of the injuries from electrical malfunctions.aHe identiedthat electrical arcing is the term applied to current p

7、assing through vapor of the arc terminal conductivemetal or carbon material. The extremely high temperatures of these arcs can cause fatal burns at up to about5 ft and major burns at up to about 10 ft distance from the arc. Additionally, electrical arcs expel droplets ofmolten terminal material that

8、 shower the immediate vicinity, similar to, but more extensive than that fromelectrical arc welding. These ndings started to ll a void created by early works that identied electricalshock as the major electrical hazard. Mr. Lees work also helped establish a relationship between time tohuman tissue c

9、ell death and temperature, as well as a curable skin burn time-temperature relationship.Once forensic analysis of electrical incidents focused on the arc-ash hazard, experience over a period oftime indicated that Ralph Lees formulas for calculating the distance-energy relationship from source of arc

10、did not serve to reconcile the greater thermal effect on persons positioned in front of opened doors orremoved covers, from arcs inside electrical equipment enclosures. A technical paper by Doughty, Neal, and Floyd, “Predicting incident energy to better manage the electric archazard on 600 v power d

11、istribution systems” B4 presented the ndings from many structured tests usingboth “arcs in open air” and “arcs in a cubic box.” These three phase tests were performed at the 600 V ratingand are applicable for the range of 16 000 to 50 000 A short-circuit fault current. It was established that thecon

12、tribution of heat reected from surfaces near the arc intensies the heat directed toward the opening ofthe enclosure.The focus of industry on electrical safety and recognition of arc-ash burns as having great signicancehighlighted the need for protecting employees from all arc-ash hazards. The limita

13、tions on applying theknown “best available” formulas for calculating the “curable” and “incurable” burn injuries have beenovercome. This guide does that with new, empirically derived models based on statistical analysis and curvetting of the overall test data available.Conducting an arc-ash hazard a

14、nalysis has been difcult. Not enough arc-ash incident energy testing hadbeen done from which to develop models that accurately represent all the real applications. The availablealgorithms are difcult for engineers in ofces to solve and near impossible for people in the eld to apply.This working grou

15、p has overseen a signicant amount of testing and has developed new models of incidentenergy. The arc-ash hazard calculations included in this guide will enable quick and comprehensivesolutions for arcs in single- or three- phase electrical systems either of which may be in open air or in a box,regar

16、dless of the low or medium voltage available.WarrantyTHE IEEE DOES NOT WARRANT OR REPRESENT THE ACCURACY OR CONTENT OF THE WORKAND EXPRESSLY DISCLAIMS ANY EXPRESS OR IMPLIED WARRANTY, INCLUDING ANYIMPLIED WARRANTY OF MERCHANTABILITY OR FITNESS FOR A SPECIFIC PURPOSE ORTHAT THE USE OF THE WORK IS FRE

17、E FROM PATENT INFRINGEMENT. THE WORK ISSUPPLIED ONLY “AS IS.”USE AT YOUR OWN RISK.aThe numbers in brackets correspond to those of the bibliography in Annex F.Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on December 30, 2009 at 13:17 from IEEE Xplore. Restrictions apply. ivCo

18、pyright 2002 IEEE. All rights reserved.AcknowledgmentsMany organizations and individuals made cash or in-kind contributions that enabled the test program onwhich this guide is based. The IEEE Std 1584-2002 working group and IEEE gratefully acknowledge thesecontributions.SponsorsCooper BussmannCooper

19、 Crouse-HindsDuPont NomexKinectrics Inc.U. S. Navy NAVSEA CommandSquare D CompanySupportersAgrium Inc.The Dow Chemical Company Eastman KodakL Bruce McClungContributorsDuke EnergyEastman ChemicalSKM SystemsSophisticated statistical analysis was required to develop the empirically derived model which

20、is presentedin this guide. The IEEE Std 1584-2002 working group recognizes and thanks Dr. David Berengut for hiswork on this analysis.The “Bolted Fault Calculator” worksheet in the “IEEE_1584_Bolted_Fault_Cal.xls” was contributed byPaul and Dick Porcaro. The IEEE Std 1584-2002 working group recogniz

21、es and thanks them for thiscontribution.The calculators can be accessed via the auxiliary les, “IEEE_1584_Bolted_Fault_Cal.xls” and“IEEE_1584_Arc_Flash_Hazard.xls”, and test data can be accessed via the auxiliary les, “Data_set.xls”,“Test_results_database.xls”, and “CL_Fuse_test_data.xls” provided w

22、ith this standard (CD ROM for printversions and spreadsheet les for the PDF version).Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on December 30, 2009 at 13:17 from IEEE Xplore. Restrictions apply. Copyright 2002 IEEE. All rights reserved.vParticipantsAt the time this standa

23、rd was completed, the working group had the following membership:Craig M. Wellman,ChairL. Bruce McClung, Vice ChairThe following members of the balloting committee voted on this standard. Balloters may have voted forapproval, disapproval, or abstention. Allen H. BinghamJames E. BowenE. William BussJ

24、ohn CadickMicheal I. CallananDonald M. ColaberardinoAnthony CortezGreg CrawfordStephen CressD. Ray CrowDaniel DoanPaul DobrowskyMike DohertyRichard L. DoughtyRay DuffJohn GallagherTammy GammonGeorge D. GregoryHugh HoaglandDennis JohnsonJane JonesRay JonesWilliam C. JordanHerman (Buddy) KempKevin Lip

25、pertKen MastrulloDaleep C. MohlaAli NasleTom NealDavid ONeillDavid A. PaceRobert PettisMelvin K. SandersVincent SaporitaBrian SavariaFarrokh ShokoohNathan SpiveyConrad St. PierreAlan TurnerWilliam E. VeerkampGeorge WeitzenfeldGary WetzelKenneth P. WhiteKathleen WilmerBrian WrightAlonza W. BallardLou

26、is A. BarriosHenry A. BeckerJames E. BowenFrederick BriedKristine K. BuchholzDonald M. ColaberardinoGary DiTroiaDaniel DoanPaul DobrowskyGary DonnerRichard L. DoughtyBruce G. DouglasKimberly EastwoodH. Landis FloydGeorge D. GregoryMark S. HalpinErling C. HeslaJim D. HillDanny LiggettL. Bruce McClung

27、Michael McNeilDaleep C. MohlaWilliam J. MoylanPaul W. MyersDaniel R. NeeserArthur S. NeubauerDavid ONeillTed W. OlsenDavid A. PaceLorraine K. PaddenGiuseppe PariseJohn E. PropstFranklin RobertsMelvin K. SandersVincent SaporitaSukanta SenguptaDennis R. ThonsgardMichael K. ToneyWilliam E. VeerkampMich

28、ael WactorCraig M. WellmanDonald W. ZipseAuthorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on December 30, 2009 at 13:17 from IEEE Xplore. Restrictions apply. viCopyright 2002 IEEE. All rights reserved.When the IEEE-SA Standards Board approved this standard on 12 September 2002,

29、it had the followingmembership:James T. Carlo,ChairJames H. Gurney,Vice ChairJudith Gorman,Secretary*Member EmeritusAlso included is the following nonvoting IEEE-SA Standards Board liaison:Alan Cookson, NIST RepresentativeSatish K. Aggarwal, NRC RepresentativeNoelle D. HumenickIEEE Standards Project

30、 EditorSid BennettH. Stephen BergerClyde R. CampRichard DeBlasioHarold E. EpsteinJulian Forster*Howard M. FrazierToshio FukudaArnold M. GreenspanRaymond HapemanDonald M. HeirmanRichard H. HulettLowell G. JohnsonJoseph L. Koepnger*Peter H. LipsNader MehravariDaleep C. MohlaWilliam J. MoylanMalcolm V.

31、 ThadenGeoffrey O. ThompsonHoward L. WolfmanDon WrightAuthorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on December 30, 2009 at 13:17 from IEEE Xplore. Restrictions apply. Copyright 2002 IEEE. All rights reserved.viiContents1. Overview11.1 Scope11.2 Purpose.12. References23. Defi

32、nitions24. Analysis process.44.1 Cautions and disclaimers.44.2 Step 1: Collect the system and installation data.54.3 Step 2: Determine the system modes of operation.74.4 Step 3: Determine the bolted fault currents.74.5 Step 4: Determine the arc fault currents74.6 Step 5: Find the protective device c

33、haracteristics and the duration of the arcs.74.7 Step 6: Document the system voltages and classes of equipment.84.8 Step 7: Select the working distances84.9 Step 8: Determine the incident energy for all equipment94.10 Step 9: Determine the flash-protection boundary for all equipment95. Model for inc

34、ident energy calculations105.1 Ranges of models.105.2 Arcing current105.3 Incident energy.115.4 Lee method.125.5 Flash-protection boundary.125.6 Current limiting fuses135.7 Low-voltage circuit breakers.166. Methods of applying the model.176.1 IEEE Std 1584-2002 arc-flash calculator176.2 Integrated s

35、ystem analysis method187. Comparison of arc-flash calculation methods187.1 Table method in NFPA 70E-2000.187.2 Theory based model.187.3 Empirically derived models based on a curve fitting program187.4 Physical model based method with some verification testing.187.5 Empirically derived model based on

36、 statistical analysis and curve fitting programs198. Laboratory test programs.198.1 Overview of test programs.218.2 Physical test methodology.228.3 Design of experiments (DOE) method of planning and analyzing tests23Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on December 30

37、, 2009 at 13:17 from IEEE Xplore. Restrictions apply. viiiCopyright 2002 IEEE. All rights reserved.9. Development of model.249.1 Range of model249.2 Summary of conclusions from studies.249.3 Results by variable.249.4 Electrode gap and box gap.259.5 Grounding.269.6 Fault types269.7 Time.269.8 Frequen

38、cy.279.9 Electrode materials.279.10 Arc current279.11 Incident energy.339.12 Flash boundary.419.13 Current-limiting fuses429.14 Circuit breakers5910. Background on the arc-flash hazard6310.1 Early papers6310.2 History of regulation and standards.6410.3 The reality of arc-flash injuries and deaths64A

39、nnex A (informative) Typical required equipment information data collection form67Annex B (informative) Instructions and examples using IEEE Std 1584-2002 calculators75Annex C (informative) Description of arc-flash incidents80Annex D (informative) Test results database.95Annex E (informative) Units

40、of measure.96Annex F (informative) Bibliography.111Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on December 30, 2009 at 13:17 from IEEE Xplore. Restrictions apply. Copyright 2002 IEEE. All rights reserved.1IEEE Guide for Performing Arc-Flash Hazard Calculations1. Overview1.1

41、 ScopeThis guide provides techniques for designers and facility operators to apply in determining the arc-ashhazard distance and the incident energy to which employees could be exposed during their work on or nearelectrical equipment.1.2 PurposeThis guide presents methods for the calculation of arc-

42、ash incident energy and arc-ash boundaries inthree-phase ac systems to which workers may be exposed. It covers the analysis process from eld datacollection to nal results, presents the equations needed to nd incident energy and the ash-protectionboundary, and discusses software solution alternatives

43、. Applications cover an empirically derived modelincluding enclosed equipment and open lines for voltages from 208 V to 15 kV, and a theoretically derivedmodel applicable for any voltage. Included with the standard are programs with embedded equations, whichmay be used to determine incident energy a

44、nd the arc-ash-protection boundary.1Single-phase ac systems and dc systems are not included in this guide.1The calculators can be accessed via the auxiliary les, “IEEE_1584_Arc_Flash_Hazard.xls” and “IEEE_1584_Bolted_Fault_Cal.xls”,and test data can be accessed via the auxiliary les, “Data_set.xls”,

45、 “Test_results_database.xls”, and “CL_Fuse_test_data.xls”, providedwith this standard (CD ROM for print versions and spreadsheet les for the PDF version).Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on December 30, 2009 at 13:17 from IEEE Xplore. Restrictions apply. IEEEStd

46、1584-2002 IEEE GUIDE FOR PERFORMING2Copyright 2002 IEEE. All rights reserved.2. ReferencesThis guide shall be used in conjunction with the following standards. When the following standards aresuperseded by an approved revision, the revision shall apply.ASTM F-1506-01, Standard for Performance Specic

47、ation for Flame Resistant Textile Materials forWearing Apparel for Use by Electrical Workers Exposed to Momentary Electric Arc and Related ThermalHazards.2ASTM F-1959/F-1959M-99, Standard Test Method for Determining the Arc Thermal Performance Value ofMaterials for Clothing.CFR 29, Subpart R, Part 1

48、910.269, Occupational Safety and Health StandardsElectric Power Generation,Transmission, and Distribution.3CFR 29, Subpart S, Part 1910.301 through 1910.399, Occupational Safety and Health StandardsElectrical.IEEE Std 141-1993, IEEE Recommended Practice for Electric Power Distribution for Industrial

49、 Plants(IEEE Red Book).4, 5IEEE Std 142-1991, IEEE Recommended Practice for Grounding of Industrial and Commercial PowerSystems (IEEE Green Book).IEEE Std 242-2001, IEEE Recommended Practice for Protection and Coordination of Industrial andCommercial Power Systems (IEEE Buff Book).IEEE Std C37.010-1999, IEEE Application Guide for AC High-Voltage Circuit Breakers Rated on aSymmetrical Current Basis.IEEE Std C37.20.7-2001, IEEE Guide for Testing Medium-Voltage Metal-Enclosed Switchgear forInternal Arcing Faults.NFPA 70-2002