1、IEEE Std 299-2006(Revision of IEEE Std 299-1997)IEEE Standard Method for Measuringthe Effectiveness of ElectromagneticShielding EnclosuresI E E E3 Park Avenue New York, NY 10016-5997, USA28 February 2007 IEEE Electromagnetic Compatibility SocietySponsored by theStandards Development CommitteeRecogni
2、zed as an IEEE Std 299-2006(R2012) American National Standard (ANSI) (Revision of IEEE Std 299-1997) IEEE Standard Method for Measuring the Effectiveness of Electromagnetic Shielding Enclosures Sponsor Standards Development Committee of the IEEE Electromagnetic Compatibility Society Approved 29 Dece
3、mber 2006 American National Standards Institute Reaffirmed 8 June 2012 Approved 15 September 2006 IEEE-SA Standards Board Abstract: Uniform measurement procedures and techniques are provided for determining the effectiveness of electromagnetic shielding enclosures at frequencies from 9 kHz to 18 GHz
4、 (extendable to 50 Hz and 100 GHz, respectively) for enclosures having all dimension greater than or equal to 2.0 m. The types of enclosures covered include, but are not limited to, single-shield or double-shield structures of various construction, such as bolted demountable, welded, or integral wit
5、h a building; and made of materials such as steel plate, copper or aluminum sheet, screening, hardware cloth, metal foil, or shielding fabrics. Keywords: electromagnetic shielding, screened rooms, shielded enclosures, shielded rooms, shielding, shielding effectiveness _ The Institute of Electrical a
6、nd Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2007 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 28 February 2007. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent +1 978
7、750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. iv Copyright 2007 IEEE. All rights reserved. Introduction This document provides a standard set of methods and procedures for determining t
8、he shielding effectiveness (SE) of shielding enclosures. The enclosures of concern include those used for testing groups of equipment, vehicles, computing systems, and smaller units whose electromagnetic (EM) emission and susceptibility require determination without disturbance from other sources. T
9、his standard incorporates the basic concepts of MIL-STD-285,athe SE measurement reference for many years, which was cancelled by the U.S. Department of Defense in 1997. Those concepts have been expanded upon to increase the applicability of the measurement techniques to enclosures having a wide vari
10、ety of applications and constructed from a large number of materials with varying methods of fabrication and assembly. The basic premise of MIL-STD-285 is still in position: the shield effect is to provide an insertion loss to outside influence. IEEE Std 299-2006 offers testing based upon the perfor
11、mance specifications of the shield, rather than a fixed set of parameters that may not be applicable to the shield in question. The specific test procedures and frequency ranges are selected as appropriate for the enclosure being tested. The most important factor considered during the development of
12、 this revision was the concept that measurement of EM SE is a requirement not unique to walk-in sized enclosures. There are no widely accepted standards in use to describe test methods and techniques for measuring SE of physically small enclosures. The Standards Development Committee of the IEEE Ele
13、ctromagnetic Compatibility Society directed the current Working Group to plan for developing new parts of IEEE Std 299 for addressing the testing of these smaller enclosures. Thus, this document will continue to provide a standardized test method for EM shielded enclosures having all dimensions grea
14、ter than or equal to 2 m. New parts of IEEE Std 299 will be developed soon to address these smaller enclosures. Notice to users Errata Errata, if any, for this and all other standards can be accessed at the following URL: http:/ standards.ieee.org/reading/ieee/updates/errata/index.html. Users are en
15、couraged to check this URL for errata periodically. Interpretations Current interpretations can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/interp/ index.html. _ aMIL publications are available from Customer Service, Defense Printing Service, 700 Robbins Ave., Bldg. 4D, P
16、hiladelphia, PA 19111-5094, USA. This introduction is not part of IEEE Std 299-2006, IEEE Standard Method for Measuring the Effectiveness of Electromagnetic Shielding Enclosures. v Copyright 2007 IEEE. All rights reserved. Patents Attention is called to the possibility that implementation of this st
17、andard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE shall not be responsible for identifying patents or patent applications for which
18、a license may be required to implement an IEEE standard or for conducting inquiries into the legal validity or scope of those patents that are brought to its attention. Participants The many contributions to this standard by the members of the P299 Working Group are gratefully acknowledged. The supp
19、ort of the Vice Chairs, Norman Wehling (retired) and Dr. Croisant, was invaluable, as were the editing efforts of Mark Bushnell and improvements to the figures by Joseph Weibler. Professor Sarto was also extremely helpful in clarifying many of the concepts and equations. Special appreciation is exte
20、nded to Don Sweeney who served and liaison from the EMC Society Standards Development Committee and “Angel” for the project. At the time this standard was completed, the P299 Working Group had the following membership: Dale G. Svetanoff, Chair (July 1995 to present) William Croisant, Vice Chair (Jan
21、uary 2001 to present) Norman Wehling, Vice Chair (July 1995 to December 2000) Gianluca Arcari Robert Bonsen Ed Bronaugh Mark Bushnell Joe Butler Nigel Carter Johan Catrysse Paul Cook Frederick Eriksen Ahmad Fallah Robert Harriman Michael Hatfield L. O. “Bud” Hoeft Christopher Holloway D. Mark Johnso
22、n Mark Katrancha James Klouda Galen Koepke David Larrabee Andy Marvin Michael McInerney Ade Ogunsola Jacques Rajade Dale Reynolds Peter Richeson Maria Sabrina Sarto Walter Scott Doug Smith James Whalen Joseph Weibler John Wyncott The following members of the individual balloting committee voted on t
23、his standard. Balloters may have voted for approval, disapproval, or abstention. David Baron Stephen Berger Mark Bushnell Jim Carlo Johan Catrysse Keith Chow Guru Dutt Dhingra Tim Harrington Werner Hoelzl Daniel Hoolihan Efthymios Karabetsos Yuri Khersonsky Ronald Kollman John Kraemer Yeou-Song Lee
24、Li Li Edward McCall Kermit Phipps Werner Schaefer Dale G. Svetanoff Donald Sweeney When the IEEE-SA Standards Board approved this standard on 15 September 2006, it had the following membership: Steve M. Mills, Chair Richard H. Hulett, Vice Chair Don Wright, Past Chair Judith Gorman, Secretary Mark D
25、. Bowman Dennis B. Brophy William R. Goldbach Arnold M. Greenspan Robert M. Grow Joanna N. Guenin Julian Forster* Mark S. Halpin Kenneth S. Hanus William B. Hopf Joseph L. Koepfinger* David J. Law Daleep C. Mohla T. W. Olsen Glenn Parsons Ronald C. Petersen Tom A. Prevost Greg Ratta Robby Robson Ann
26、e-Marie Sahazizian Virginia Sulzberger Malcolm V. Thaden Richard L. Townsend Walter Weigel Howard L. Wolfman *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Satish K. Aggarwal, NRC Representative Richard DeBlasio, DOE Representative Alan H. Cookson, NIST
27、Representative Don Messina IEEE Standards Program Manager, Document Development William Ash IEEE Standards Program Manager, Technical Program Development vi Copyright 2007 IEEE. All rights reserved. Contents 1. Overview 1 1.1 Scope . 1 1.2 Purpose 1 1.3 Application 1 2. Normative references 2 3. Def
28、initions 2 3.1 General terminology 2 3.2 Technical terminology. 3 4. Preliminary procedures. 3 4.1 Background 3 4.2 Test plan 4 4.3 Calibration . 4 4.4 Reference level and dynamic range. 4 4.5 Preliminary shield check procedures . 4 4.6 Test/witness personnel. 4 5. Detailed procedures 4 5.1 Backgrou
29、nd 4 5.2 Recommended standard measurement frequencies . 5 5.3 Pass/fail requirements 6 5.4 Shielding effectiveness calculation 6 5.5 Preparation procedures 7 5.6 Low-frequency measurements (9 kHz to 20 MHz) . 7 5.7 Resonant range measurements (20 MHz to 300 MHz) 11 5.8 High-frequency measurements (3
30、00 MHz to 18 GHz) 18 6. Quality assurance technical report 24 6.1 Abbreviated test report 24 6.2 Full test report 24 Annex A (informative) Rationale. 26 A.1 Basis 26 A.2 Considerations pertinent to the objectives of 1.2 26 A.3 Cavity resonances . 27 A.4 Measurement locations . 30 A.5 Measurement equ
31、ipment. 30 vii Copyright 2007 IEEE. All rights reserved. Annex B (informative) Mathematical formulas 31 B.1 Specific mathematical formulations 31 B.2 Low-range (50 Hz to 20 MHz) shielding effectiveness 31 B.3 Resonant range (20 MHz to 300 MHz) shielding effectiveness 32 B.4 High-range (300 MHz to 10
32、0 GHz) shielding effectiveness. 32 B.5 Nonlinear (logarithmic) calculations. 32 B.6 Dynamic range considerations 33 Annex C (informative) Miscellaneous supporting information 34 C.1 Coplanar versus coaxial loops. 34 C.2 Nonlinearity of high-permeability ferromagnetic enclosures 34 C.3 Selecting meas
33、urement frequencies 34 Annex D (informative) Guidelines for the selection of measurement techniques 37 D.1 Types of enclosures 37 D.2 Performance requirements 37 D.3 Equipment requirements. 38 D.4 Regulatory agency conflicts 38 Annex E (informative) Preliminary measurements and repairs 39 E.1 Backgr
34、ound . 39 E.2 Frequencies for preliminary check 39 E.3 Preliminary check procedures . 39 viii Copyright 2007 IEEE. All rights reserved. IEEE Standard Method for Measuring the Effectiveness of Electromagnetic Shielding Enclosures 1. 1.11.21.3Overview Scope This standard provides uniform measurement p
35、rocedures for determining the effectiveness of electromagnetic (EM) shielding enclosures at frequencies from 9 kHz to 18 GHz (extendable down to 50 Hz and up to 100 GHz). The owner of the shielding enclosure shall provide the frequencies at which the shield will be tested, and the shielding effectiv
36、eness (SE) limits for pass/fail. This standard suggests a range of test frequencies that would provide very high confidence in the effectiveness of the shield. This standard dose not define SE limits for pass or fail. Purpose The purpose of this standard is to provide the following: a) A standard pr
37、ocedure for the measurement of the effectiveness of shielded enclosures, in a broad range of radio frequencies (RFs), including a minimum set of recommended frequencies b) Identical procedures applicable to frequencies other than the standard set c) An optional measurement technique to detect the no
38、nlinear behavior of high-permeability ferromagnetic enclosures (see Annex C) Application The measurement procedures provided in this standard apply to any enclosure having a smallest linear dimension greater than or equal to 2.0 m. Separate methods, to be provided in the future, shall be used for en
39、closures with any dimension smaller than 2.0 m. In the case of enclosures that are to be used in anechoic or semianechoic applications, this procedure shall apply prior to the installation of any RF absorber materials. 1 Copyright 2007 IEEE. All rights reserved. IEEE Std 299-2006 IEEE Standard Metho
40、d for Measuring the Effectiveness of Electromagnetic Shielding Enclosures 2 Copyright 2007 IEEE. All rights reserved. 2. Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated r
41、eferences, the latest edition of the referenced document (including any amendments or corrigenda) applies. ANSI C63.2, American Standard for Electromagnetic Noise and Field Strength Instrumentation, 10 kHz to 40 GHzSpecifications.1ANSI/NCSL Z540, U.S. Guide to the Expression of Uncertainty in Measur
42、ement. IEEE 100, The Authoritative Dictionary of IEEE Standards Terms, Seventh Edition.2, 3IEEE Std 291, IEEE Standard Method for Measuring Electromagnetic Field Strength of Sinusoidal Continuous Waves, 30 Hz to 30 GHz. IEEE Std 473, IEEE Recommended Practice for an Electromagnetic Site Survey (10 k
43、Hz to 10 GHz).4IEEE Std C95.1, IEEE Standard for Safety Levels with Respect to Human Exposure to Radio Frequency Electromagnetic Fields, 3 kHz to 300 GHz. ISO/IEC 17025, General Requirements for the Competence of Testing and Calibration Laboratories.5NIST TN 1297, Guidelines for Evaluating and Expre
44、ssing the Uncertainty of NIST Measurement Results, Barry N. Taylor and Chris E. Kuyatt.6UKAS LAB 34, The Expression of Uncertainty in EMC Testing.73. Definitions For the purposes of this standard, the following terms and definitions apply. The Authoritative Dictionary of IEEE Standards Terms should
45、be referenced for terms not defined in this clause. 3.1 General terminology 3.1.1 shall: Indicates mandatory requirements strictly to be followed in order to conform to the standard and from which no deviation is permitted (shall equals is required to). 1ANSI publications are available from the Sale
46、s Department, American National Standards Institute, 25 West 43rd Street, 4th Floor, New York, NY 10036, USA (http:/www.ansi.org/). 2IEEE publications are available from the Institute of Electrical and Electronics Engineers, 445 Hoes Lane, Piscataway, NJ 08855-1331, USA (http:/standards.ieee.org/).
47、3The IEEE standards or products referred to in this clause are trademarks of the Institute of Electrical and Electronics Engineers, Inc. 4IEEE Std 473 has been withdrawn; however, copies can be obtained from Global Engineering, 15 Inverness Way East, Englewood, CO 80112-5704, USA, tel. (303) 792-218
48、1 (http:/ 5ISO/IEC publications are available from the ISO Central Secretariat, Case Postale 56, 1 rue de Varemb, CH-1211, Genve 20, Switzerland/Suisse (http:/www.iso.ch/). ISO/IEC publications are also available in the United States from Global Engineering Documents, 15 Inverness Way East, Englewoo
49、d, CO 80112, USA (http:/ Electronic copies are available in the United States from the American National Standards Institute, 25 West 43rd Street, 4th Floor, New York, NY 10036, USA (http:/www.ansi.org/). 6NIST publications are available from the Superintendent of Documents, U.S. Government Printing Office, Washington, DC 20402-9325 USA (http:/www.nist.gov/). 7UKAS publication are available from the United Kingdom Accreditation Service, 8500 21-47 High Street, Feltham Middlesex
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