1、_ Copyright 1985 byThe Institute of Electrical and Electronics Engineers, Inc.345 East 47th Street, New York, NY 10017, USANo part of this publication may be reproduced in any form, in an electronic retrieval system or otherwise, without the priorwritten permission of the publisher.IEEE Std 671-1985
2、 (R2008)IEEE Standard Specification FormatGuide and Test Procedure forNongyroscopic Inertial Angular Sensors:Jerk, Acceleration, Velocity, andDisplacementSponsorGyro and Accelerometer Panelof theIEEE Aerospace Electronic Systems SocietyReaffirmed 19 June 2003Approved 6 May 1992American National Inst
3、itute Reaffirmed 10 December 2008Approved 23 June 1983IEEE-SA Standards BoardAuthorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on April 22, 2009 at 10:46 from IEEE Xplore. Restrictions apply.IEEE Standards documents are developed within the Technical Committees of the IEEE Societ
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11、e an instant response to interpretation requestsexcept in those cases where the matter has previously received formal consideration.Comments on standards and requests for interpretations should be addressed to:Secretary, IEEE Standards Board345 East 47th StreetNew York, NY 10017USAAuthorized license
12、d use limited to: IEEE Standards Staff. Downloaded on January 27, 2009 at 15:01 from IEEE Xplore. Restrictions apply.Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on April 22, 2009 at 10:46 from IEEE Xplore. Restrictions apply.iiiForeword(This Foreword is not a part of IEEE S
13、td 671-11985, IEEE Standard Specification Format Guide and Test Procedure forNongyroscopic Inertial Angular Sensors: Jerk, Acceleration, Velocity, and Displacement.)This standard was prepared by the Gyro and Accelerometer Panel of the Aerospace and Electronic Systems Society ofthe Institute of Elect
14、rical and Electronics Engineers. It is a guide for the preparation of a specification and testprocedure for an inertial angular sensor. It is intended to provide a common meeting ground of terminology andpractice for manufacturers and users of an array of sensors which have been developed to meet ne
15、eds not easily met bytraditional spinning rotor gyroscopes. These needs have included greater dynamic range, lower noise, lower power,longer service life, and greater ruggedness. To cover this variety, the standard is written in black box input versusoutput terms which could be applied to any inerti
16、al angular sensor, including laser and conventional gyroscopes. It isnot intended to compete with existing standards for specific devices with highly specific models and error sources,such as spring restrained rate gyros. Rather, the standard is to provide a uniform guide for those inertial angular
17、sensorswhich have not been covered elsewhere.The sensors described may have analog or digital outputs and may measure angular jerk, acceleration, rate ordisplacement with or without response down to zero frequency.This standard consists of a main text and three appendixes. The main text is a specifi
18、cation format guide and testprocedure for inertial angular sensors. The specification format guide is intended to provide a common format formanufacturers and users in the preparation of an angular sensor specification. The test procedure is intended to providea means of verifying that the specifica
19、tions have indeed been met.Appendix A is a compilation of block diagrams characterizing the dynamic response of several types of inertialangular sensors.Appendix B describes the modifications of some of the tests of this standard which are necessary to accommodatesensor classes other than the sensor
20、 which is used as an example in this standard, or for those sensors which haveunusual error sources requiring specialized testing. The special problems and techniques of dynamic angular testing isalso discussed in Appendix B.Appendix C discusses some of the necessary accommodations which shall be ma
21、de to the described tests of thisstandard when testing sensors with digital, rather than analog, outputs.The user is cautioned not to overspecify; only those parameters that are required to guarantee proper performance inthe specific application should be controlled. In general, the specification sh
22、ould contain only those requirements thatcan be verified by test or inspection. Parameters in addition to those given in this format are not precluded.Blank spaces permit the insertion of specific parameter values and their tolerances. Brackets are used to enclosealternate choices of dimensional uni
23、ts, signs, axes, etc. The choices shown are the recommended options, but are notmeant to include all possibilities. Boxed statements are included for information only and are not part of thespecification format. The figures presented are to be used as a guide for the preparation of specific figures
24、or drawings.The terminology used conforms to ANSI/IEEE Std 100-1984, IEEE Standard Dictionary of Electrical and ElectronicsTerms and IEEE Std 528-1984, IEEE Standard Inertial Sensor Terminology. The units used conform to ANSI/IEEEStd 268-1982, American National Standard Metric Practice. In this stan
25、dard, the symbol g is used to denote a unit ofacceleration equal in magnitude to the local value of gravity at the test site or other specified value of gravity. Thissymbol is thus distinguished from g which is the standard symbol for gram.Authorized licensed use limited to: IEEE Standards Staff. Do
26、wnloaded on January 27, 2009 at 15:01 from IEEE Xplore. Restrictions apply.Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on April 22, 2009 at 10:46 from IEEE Xplore. Restrictions apply.ivThis publication represents a group effort on a large scale. The major contributors to th
27、is standard were as follows:J. F. Conroy, Chair R. F. AsmarC. E. BossonA. T. CampbellJ. W. DaviesH. B. DiamondR. H. FallA. H. FerrarisT. A. FuhrmanK. N. GreenR. E. HartzellM. G. KoningE. L. LadenheimT. C. LearD. R. MorrisH. D. MorrisG. E. MorrisonG. C. Murray*D. F. NiemanR. B. PetersS. C. PiccioneM.
28、 J. RupertW. F. SappB. SchwartzA. E. ScovilleN. F. SinnottC. O. Swanson*G. R. TaylorB. J. Wimber*Former ChairmanWhen the IEEE Standards Board approved this standard on June 23, 1983, it had the following membership:James H. Beall, Chair Edward Chelotti, Vice Chair Sava I. Sherr, Secretary J. J. Arch
29、ambaultJohn T. BoettgerJ. V. BonucchiRene CastenschioldEdward J. CohenLen S. CoreyDonald C. FleckensteinJay ForsterDonald N. HeirmanIrvin N. HowellJoseph L. Koepfinger*Irving KolodnyGeorge KonomosR. F. LawrenceJohn E. MayDonald T. Michael*John P. RiganatiFrank L. RoseRobert W. SeelbachJay A. Stewart
30、Clifford O. SwansonRobert E. WeilerW. B. WilkensCharles J. Wylie*Member emeritus.Authorized licensed use limited to: IEEE Standards Staff. Downloaded on January 27, 2009 at 15:01 from IEEE Xplore. Restrictions apply.Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on April 22, 2
31、009 at 10:46 from IEEE Xplore. Restrictions apply.vCLAUSE PAGE1. Scope.12. Applicable Documents 12.1 Specifications . 22.2 Standards 22.3 Drawings 22.4 Other Publications 23. Requirements 33.1 General . 33.2 Description . 33.3 Performance . 93.4 Environmental Requirements. 163.5 Reliability. 204. Qu
32、ality Assurance .204.1 Verification Methods . 204.2 Acceptance Tests 214.3 Qualification Tests . 244.4 Reliability Tests . 244.5 Standard Test Conditions . 244.6 Test Equipment 254.7 Test Methods 254.8 Data Submittal 485. Preparation for Delivery486. Notes .486.1 Intended Use 486.2 Ordering Data. 49
33、6.3 Model Equation 497. Definitions.49Annex A (Informative) Sensor Dynamic Block Diagrams .51Annex B (Informative) Notes on Dynamic Testing of Inertial Angular Sensors .53Annex C (Informative) Digital Sensors and Some Comments Concerning Their Test Methods.65Authorized licensed use limited to: IEEE
34、Standards Staff. Downloaded on January 27, 2009 at 15:01 from IEEE Xplore. Restrictions apply.Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on April 22, 2009 at 10:46 from IEEE Xplore. Restrictions apply.Authorized licensed use limited to: IEEE Standards Staff. Downloaded on
35、January 27, 2009 at 15:01 from IEEE Xplore. Restrictions apply.Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on April 22, 2009 at 10:46 from IEEE Xplore. Restrictions apply.Copyright 1985 IEEE All Rights Reserved 1IEEE Standard Specification Format Guide and Test Procedure fo
36、r Nongyroscopic Inertial Angular Sensors: Jerk, Acceleration, Velocity, and Displacement1. ScopeThis standard defines the requirements and test procedures for a single, multi- axis nongyroscopic angular jerk,acceleration, velocity, displacement sensor. The output is an analog electrical signal, a di
37、gital electrical pulse trainproportional to angular jerk, acceleration, velocity, displacement. The electronics are to be considered part of thesensor to the extent specified herein. All parameters specified in this standard refer to the overall sensor output unlessotherwise specified. The device wi
38、ll hereafter be referred to as the sensor.2. Applicable DocumentsThe following documents of the issue in effect on the date of invitation for bids or request for proposal form a part ofthe specification to the extent specified herein. In the event of any conflict between the requirements of this sta
39、ndardand the listed documents, the requirements of this standard shall govern.In some instances, the sensor mechanism and the electronics may be housed in separate packages. In these cases,the term sensor may be reserved for the mechanism, while the overall device is called the transducer,accelerome
40、ter, etc.Give identification number, title, date of issue, and revision letter of each listed document.Authorized licensed use limited to: IEEE Standards Staff. Downloaded on January 27, 2009 at 15:01 from IEEE Xplore. Restrictions apply.Authorized licensed use limited to: IHS Stephanie Dejesus. Dow
41、nloaded on April 22, 2009 at 10:46 from IEEE Xplore. Restrictions apply.2 Copyright 1985 IEEE All Rights ReservedIEEE Std 671-1985 IEEE STANDARD SPECIFICATION FORMAT GUIDE AND TEST2.1 Specifications2.1.1 Government2.1.2 Industry/Technical2.1.3 Company2.2 Standards2.2.1 Government2.2.2 Industry/Techn
42、ical2.2.2.1 ANSI/IEEE Std 100-1984, IEEE Standard Dictionary of Electrical and Electronics Terms.12.2.2.2 IEEE Std 528-1984, IEEE Standard Inertial Sensor Terminology.2.2.3 Company2.3 Drawings2.3.1 Government2.3.2 Industry/Technical2.3.3 Company2.4 Other Publications1These documents are available fr
43、om the Sales Department, IEEE Service Center, 445 Hoes Lane, Piscataway, NJ 08854. They are also availablefrom the Sales Department, American National Standards Institute, 1430 Broadway, New York, NY 10018.The units and symbols used in this standard comply with:ANSI/IEEE Std 260-1978 (R1985), IEEE S
44、tandard Letter Symbols for Units of Measurement (SI Units,Customary Inch-Pound Units, and Certain Other Units)ANSI/IEEE Std 268-1982, IEEE Standard Metric PracticeANSI/IEEE Std 315-1975, IEEE Standard Graphic Symbols for Electrical and Electronics DiagramsOther applicable documents should be listed
45、under the appropriate categories.Authorized licensed use limited to: IEEE Standards Staff. Downloaded on January 27, 2009 at 15:01 from IEEE Xplore. Restrictions apply.Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on April 22, 2009 at 10:46 from IEEE Xplore. Restrictions appl
46、y.Copyright 1985 IEEE All Rights Reserved 3PROCEDURE FOR NONGYROSCOPIC INERTIAL ANGULAR SENSORS IEEE Std 671-19853. Requirements3.1 General3.1.1 PrecedenceIn the event of conflict among the purchase agreement, this standard, and other documents referred to herein, the orderof precedence shall be as
47、follows:1) The purchase agreement2) This standard and its applicable drawings3) Other applicable documents3.1.2 OtherList other applicable general requirements.3.2 DescriptionThe angular jerk, acceleration, velocity, displacement sensor is a single, multi- axis, nongyroscopic device whichprovides an
48、 analog electrical signal, a digital electrical pulse rate proportional to angular jerk, acceleration, velocity,displacement, and associated electronics as shown in Fig 1.3.2.1 Mechanical and Thermal DesignThe following mechanical and thermal requirements apply to sensor package(s) to the extent spe
49、cified.3.2.1.1 Exterior SurfaceAll exterior surfaces shall withstand the environment specified herein and the handling expected in the normal courseof operation, testing, and maintenance without deterioration which causes nonconformance to this standard.List other applicable documents in order of precedence. See Section 2.If a torque balance capture loop is used, specify if it is to be part of the device or the test equipment. Theinformation shown in Fig 1 is intended to be suggestive only, due to the large variety of sensors which it canrepresent. Fi
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