1、IEEE Std 1623-2004IEEE Standards1623TMIEEE Guide for the FunctionalSpecification of Medium Voltage(1 kV35 kV) Electronic Shunt Devicesfor Dynamic Voltage Compensation3 Park Avenue, New York, NY 10016-5997, USAIEEE Power Engineering SocietySponsored by theSubstations CommitteeIEEE Standards11 May 200
2、5Print: SH95322PDF: SS95322Recognized as anAmerican National Standard (ANSI)The Institute of Electrical and Electronics Engineers, Inc.3 Park Avenue, New York, NY 10016-5997, USACopyright 2005 by the Institute of Electrical and Electronics Engineers, Inc.All rights reserved. Published 11 May 2005. P
3、rinted in the United States of America.IEEE is a registered trademark in the U.S. Patent +1 978 750 8400. Permission to photocopy portions of any individual standard for educationalclassroom use can also be obtained through the Copyright Clearance Center.iiiCopyright 2005 IEEE. All rights reserved.I
4、ntroductionSeveral utilities are experimenting with electronic devices to reduce voltage fluctuations. Industrialcustomers with sensitive loads are installing different electronic devices to mitigate voltage fluctuations. Asignificant number of these devices are installed every year. Most of these d
5、evices are bought usingspecifications provided by various manufacturers. Technical literature describes the operation of specificdevices and provides results of computer simulations to prove the effectiveness of the devices. However, nodocument defines the technical data that has to be collected and
6、 used for the specification of a new device.The working group collected specifications from different manufacturers and utilities. These documentshave been combined together to define a comprehensive method for the specification of future devices. Thisguide is not a tutorial. The application of its
7、content to prepare a specification requires technical knowledgeand understanding. Each user should modify the material to meet with user specific conditions. This guidedoes not include all topics necessary for every application and does not address the commercial aspect of thespecifications.Notice t
8、o usersErrataErrata, if any, for this and all other standards can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL forerrata periodically.InterpretationsCurrent interpretations can be accessed at the following U
9、RL: http:/standards.ieee.org/reading/ieee/interp/index.html.PatentsAttention is called to the possibility that implementation of this standard may require use of subject mattercovered by patent rights. By publication of this standard, no position is taken with respect to the existence orvalidity of
10、any patent rights in connection therewith. The IEEE shall not be responsible for identifyingpatents or patent applications for which a license may be required to implement an IEEE standard or forconducting inquiries into the legal validity or scope of those patents that are brought to its attention.
11、This introduction is not part of IEEE Std 1623-2004, IEEE Guide for the Functional Specification ofMedium Voltage (1 kV35 kV) Electronic Shunt Devices for Dynamic Voltage Compensation.ivCopyright 2005 IEEE. All rights reserved.ParticipantsAt the time this guide was completed, the Power Electronics E
12、quipment Working Group had the followingmembership: George G. Karady, ChairNeil Woodley, Vice ChairThe following members of the individual balloting committee voted on this standard. Balloters may havevoted for approval, disapproval, or abstention. When the IEEE-SA Standards Board approved this stan
13、dard on 15 November 2004, it had the followingmembership:Don Wright, ChairSteve M. Mills, Vice ChairJudith Gorman, Secretary*Member EmeritusAlso included are the following nonvoting IEEE-SA Standards Board liaisons:Satish K. Aggarwal, NRC RepresentativeRichard DeBlasio, DOE RepresentativeAlan Cookso
14、n, NIST RepresentativeJennie SteinhagenIEEE Standards Project EditorStephan Arnold Hubert Bilodeau Jacques Brochu Tom Cease Jeff FleemanBrian GemmellChris HorwillWilliam O. Kramer Thomas W. LaRose Stig Nilsson Duane TorgersonTerry TreasureJohn SchwarzenbergerRonald SharpTeruo YoshinoWilliam Ackerman
15、Hubert BilodeauMichael BioThomas BlairWilliam BrumsickleTommy CooperLuis CoronadoR. DaubertMatthew DavisFrank DenbrockDr. Guru Dutt DhingraPaul DrumAmir El-SheikhAhmed ElneweihiGary EngmannEdward Horgan Jr.George KaradyMark KempkerJoseph L. KoepfingerThomas LaRoseStephen R. LambertWayne Litzenberger
16、Fortin MarcelFrank MayleMark McGranaghanG. MichelGeorges MontilletJohn RandolphPaulo RibeiroMichael RobertsDevki SharmaJames E. SmithShigeru TanabeEric UdrenRaul VelazquezHemant VoraKenneth WhiteJames WilsonChuck AdamsStephen BergerMark D. BowmanJoseph A. BruderBob DavisRoberto de Marca BoissonJulia
17、n Forster*Arnold M. GreenspanMark S. HalpinRaymond HapemanRichard J. HollemanRichard H. HulettLowell G. JohnsonJoseph L. Koepfinger*Hermann KochThomas J. McGeanDaleep C. MohlaPaul NikolichT. W. OlsenRonald C. PetersenGary S. RobinsonFrank StoneMalcolm V. ThadenDoug ToppingJoe D. WatsonContents1. Ove
18、rview 11.1 Scope . 11.2 Purpose 11.3 Application 12. Normative References 23. Definitions 34. System description 35. Project description 56. Scope of supply and schedule. 76.1 Scope of supply and warranty 76.2 Equipment, material, and services furnished by the user or its agent 76.3 Schedule 87. Use
19、r furnished site and environmental data 88. Power system characteristics 89. Shunt compensation device characteristics 99.1 Rating 99.2 Losses 109.3 Harmonic performance 109.4 Audible noise. 109.5 Electromagnetic interference (telephone and radio) 109.6 Cooling and ventilation 119.7 Enclosures 1210.
20、 Reliability, availability and maintenance 1311. Control and diagnostics 1312. Protection 1413. Insulation and grounding 1514. Safety and signs 1515. Lead time 1516. Installation and spare parts . 1517. Equipment testing and system commissioning. 1618. Quality assurance 1619. Contractual generalitie
21、s 16Annex A (informative) Bibliography . 17vCopyright 2005 IEEE. All rights reserved. IEEE Guide for the Functional Specification of Medium Voltage(1 kV35 kV) Electronic Shunt Devices for Dynamic Voltage Compensation 1.1.11.21.3OverviewScopeThis document provides general guidelines for the preparati
22、on of a functional specification for solid-stateelectronic shunt devices used mainly for compensation of voltage fluctuation. The guide covers devicesrated to medium voltage (1 kV35 kV). This device contains in general: an inverter, rectifier or dcconverter, energy storage device, and coupling trans
23、former. The device typically is connected in parallelwith the network using a coupling transformer.Normally this device is not designed for flicker compensation. If flicker compensation is needed, thespecification has to be modified, and the manufacturer has to design the device for flicker compensa
24、tion.In order to interface these devices with the network, additional equipment should be provided, includingcurrent and potential transformers, bypass and isolation breakers, disconnect switches and three-phase low-voltage service for auxiliary power.PurposeThis guide includes technical clauses des
25、cribing the users requirements, including operation methods andenvironmental conditions. It specifies basic requirements of solid-state electronic shunt devices used forcompensation of voltage fluctuations by injection of reactive power.ApplicationThis guide should be considered as a general-purpose
26、 source and does not include all details needed for specific applications. Likewise, because the electronic device is typically designed to address a specificapplication, not every part of this guide may be applicable. The user of this guide should evaluate how andto what extent each clause applies
27、to the development of a specific device specification. 1Copyright 2005 IEEE. All rights reserved. IEEE Std 1623-2004Functional Specification of Medium Voltage Electronic Shunt Devices for Dynamic Voltage CompensationThe required environmental and electrical system information at the location of the
28、device appears inClause 7 and Clause 8 of this guide.2. Normative referencesThe following referenced documents are indispensable for the application of this standard. For datedreferences, only the edition cited applies. For undated references, the latest edition of the referenceddocument (including
29、any amendments or corrigenda) applies.Accredited Standards Committee C2, National Electrical Safety Code(NESC).1ANSI Std C37.06, American National Standard for AC High-Voltage Circuit Breakers Rated on a Symmetrical Current BasisPreferred Ratings and Related Required Capabilities.2IEEE Std 80, IEEE
30、Guide for Safety in AC Substation Grounding.3,4IEEE Std 139, IEEE Recommended Practice for the Measurement of Radio Frequency Emission fromIndustrial, Scientific, and Medical (ISM) Equipment Installed on Users Premises.IEEE Std 141, IEEE Recommended Practice for Electric Power Distribution for Indus
31、trial Plants (Red Book).IEEE Std 493 IEEE Recommended Practice for the Design of Reliable Industrial and Commercial PowerSystems (Gold Book). IEEE Std 519, IEEE Recommended Practices and Requirements for Harmonic Control in ElectricalPower Systems.IEEE Std 693, IEEE Recommended Practice for Seismic
32、Design of Substations.IEEE Std 1031, IEEE Guide for the Functional Specification of Transmission Static VAR Compensators.IEEE Std 1100, IEEE Recommended Practice for Powering and Grounding Electronic Equipment (IEEEEmerald Book). IEEE Std 1159, IEEE Recommended Practice for Monitoring Electric Power
33、 Quality.IEEE Std 1250, IEEE Guide for Service to Equipment Sensitive to Momentary Voltage Disturbances.IEEE Std C37.30, IEEE Standard Requirements for High-Voltage Switches.IEEE Std C37.90.1, IEEE Standard for Surge Withstand Capability (SWC) Tests for Relays and RelaySystems Associated with Electr
34、ic Power Apparatus. IEEE Std C37.100, IEEE Standard Definitions for Power Switchgear.IEEE Std C57.12.00, IEEE Standard General Requirements for Liquid-Immersed Distribution, Power,and Regulating Transformers.1The NESC is available from the Institute of Electrical and Electronics Engineers, Inc., 445
35、 Hoes Lane, Piscataway, NJ 08854, USA(http:/standards.ieee.org/).2ANSI publications are available from the Sales Department, American National Standards Institute, 25 West 43rd Street, 4th Floor,New York, NY 10036, USA (http:/www.ansi.org/).3IEEE publications are available from the Institute of Elec
36、trical and Electronics Engineers, Inc., 445 Hoes Lane, Piscataway, NJ08854, USA (http:/standards.ieee.org/).4The IEEE standards or products referred to in this clause are trademarks of the Institute of Electrical and Electronics Engineers, Inc.2Copyright 2005 IEEE. All rights reserved. IEEE Std 1623
37、-2004Functional Specification of Medium Voltage Electronic Shunt Devices for Dynamic Voltage CompensationIEEE Std C57.12.90, IEEE Standard Test Code for Liquid-Immersed Distribution, Power, andRegulating Transformers.IEEE Std C57.13, IEEE Standard Requirements for Instrument Transformers.IEEE Std C5
38、7.16, IEEE Standard Requirements, Terminology, and Test Code for Dry-Type Air-CoreSeries-Connected Reactors. IEEE Std C57.21, IEEE Standard Requirements, Terminology, and Test Code for Shunt Reactors RatedOver 500 kVA.IEEE Std C62.11, IEEE Standard for Metal-Oxide Surge Arresters for AC Power Circui
39、ts ( 1 kV).NFPA 70, National Electrical Code(NEC).5SEMI F47-0200 Specification for Semiconductor Processing Equipment Voltage Sag Immunity.63.4.DefinitionsFor the purposes of this guide, the following terms and definitions apply. The Authoritative Dictionary ofIEEE Standards B17, should be reference
40、d for terms not defined in this clause.3.1 voltage sag: A short duration decrease of the rms voltage value, at the power frequency. Typical valuesare between 0.1 and 0.9 pu, at the power frequency, for 0.5120 cycles in duration. (IEEE Std 1250)NOTEThe International Electrotechnical Commission (IEC)
41、terminology is voltage dip.83.2 voltage swell: A short duration increase of the rms voltage value, at the power frequency, typicalvalues are between 0.5120 cycles in duration. (IEEE Std 1250)3.3 voltage flicker: A slow, low frequency modulation of the sinusoidal voltage of the load or supply.3.4 two
42、-quadrant control: An inverter control algorithm, which makes the inverter capable of acceptingor delivering power between the dc bus and the line. (NASA-Kennedy Space Center, Technique OPS-7,AC - Variable Frequency Drive Systems). A shunt device using this control absorbs or generates reactivepower
43、.3.5 four-quadrant control: An inverter control algorithm, which allows real and reactive power (watts andvars) to be independently delivered to or extracted from a load. A shunt device, using this control generatesor absorbs both real and reactive power. System descriptionThe solid-state electronic
44、 shunt device is a power electronic primary power delivery (distribution) systemelement that is connected in parallel with a primary power delivery circuit typically via a couplingtransformer. The device will supply reactive power to, as well as absorb reactive power from, the powerdelivery system,
45、either to regulate voltage to a set point value or inject reactive power as specified by the 5The NEC is published by the National Fire Protection Association, Batterymarch Park, Quincy, MA 02269, USA (http:/ www.nfpa.org). Copies are also available from the Institute of Electrical and Electronics E
46、ngineers, Inc., 445 Hoes Lane, Piscataway,NJ 08854, USA (http:/standards.ieee.org/).6SEMI documents can be obtained from Semiconductor Equipment and Materials International, 3081 Zanker Road, San Jose, CA 95134 USA (http:/wps2a.semi.org/wps/portal).7The numbers in brackets correspond to those of the
47、 bibliography in Annex A.8Notes in text, tables, and figures are given for information only and do not contain requirements needed to implement this standard.3Copyright 2005 IEEE. All rights reserved. IEEE Std 1623-2004Functional Specification of Medium Voltage Electronic Shunt Devices for Dynamic V
48、oltage Compensationuser. The most frequent function of the device is to dynamically regulate the load voltage of a sensitiveload by rapid reactive power exchange.Optionally, the device may be equipped with a four-quadrant control and energy storage subsystem toallow voltage control by both real and
49、reactive power exchange with the system.Figure 1 shows an example for the circuit diagram of a solid-state electronic shunt device used forcompensating voltage fluctuations by reactive power injection or absorption. In case of a voltagedisturbance on the utility feeder, the device injects an appropriate amount of reactive power to maintain thefeeder voltage.CouplingTransformerSolid State (SS) Electronic Shunt DeviceCircuitBreakersTo SSDeviceAuxiliary PowerUtility feederOnly One Phase Shown for ClarityPTDisconnectSwitchac FilterEnergy
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