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本文(ANSI IEEE C62.41.2 CORR 1-2012 Recommended Practice on Characterization of Surges in Low-Voltage (1000 V and Less) AC Power Circuits Corrigendum 1 Deletion of Table A.2 and Associa.pdf)为本站会员(progressking105)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

ANSI IEEE C62.41.2 CORR 1-2012 Recommended Practice on Characterization of Surges in Low-Voltage (1000 V and Less) AC Power Circuits Corrigendum 1 Deletion of Table A.2 and Associa.pdf

1、 IEEE Recommended Practice on Characterization of Surges in Low-Voltage (1000 V and Less) AC Power Circuits Corrigendum 1: Deletion of Table A.2 and Associated Text Sponsored by the Surge Protective Devices Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA 25 January 2013 IEEE Power and Energ

2、y Society IEEE Std C62.41.2-2002_Cor 1-2012 (Corrigendum to IEEE Std C62.41.2-2002) IEEE Std C62.41.2-2002_Cor 1-2012 (Corrigendum to IEEE Std C62.41.2-2002) IEEE Recommended Practice on Characterization of Surges in Low-Voltage (1000 V and Less) AC Power Circuits Corrigendum 1: Deletion of Table A.

3、2 and Associated Text Sponsor Surge Protective Devices Committee of the IEEE Power and Energy Society Approved 5 December 2012 IEEE-SA Standards Board Abstract: Deletion of Table A.2 and associated text is addressed in this corrigendum. Keywords: IEEE C62.41.2, surge protective devices (SPDs), wavef

4、orms The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2013 by The Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 25 January 2013. Printed in the United States of America. IEEE is a registered tra

5、demark in the U.S. Patent +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. Copyright 2013 IEEE. All rights reserved. iv Notice to users Laws and regulations Users of IEEE Standards

6、documents should consult all applicable laws and regulations. Compliance with the provisions of any IEEE Standards document does not imply compliance to any applicable regulatory requirements. Implementers of the standard are responsible for observing or referring to the applicable regulatory requir

7、ements. IEEE does not, by the publication of its standards, intend to urge action that is not in compliance with applicable laws, and these documents may not be construed as doing so. Copyrights This document is copyrighted by the IEEE. It is made available for a wide variety of both public and priv

8、ate uses. These include both use, by reference, in laws and regulations, and use in private self-regulation, standardization, and the promotion of engineering practices and methods. By making this document available for use and adoption by public authorities and private users, the IEEE does not waiv

9、e any rights in copyright to this document. Updating of IEEE documents Users of IEEE Standards documents should be aware that these documents may be superseded at any time by the issuance of new editions or may be amended from time to time through the issuance of amendments, corrigenda, or errata. A

10、n official IEEE document at any point in time consists of the current edition of the document together with any amendments, corrigenda, or errata then in effect. In order to determine whether a given document is the current edition and whether it has been amended through the issuance of amendments,

11、corrigenda, or errata, visit the IEEE-SA Website at http:/standards.ieee.org/index.html or contact the IEEE at the address listed previously. For more information about the IEEE Standards Association or the IEEE standards development process, visit IEEE-SA Website at http:/standards.ieee.org/index.h

12、tml. Errata Errata, if any, for this and all other standards can be accessed at the following URL: http:/standards.ieee.org/findstds/errata/index.html. Users are encouraged to check this URL for errata periodically. Patents Attention is called to the possibility that implementation of this standard

13、may require use of subject matter covered by patent rights. By publication of this standard, no position is taken by the IEEE with respect to the existence or validity of any patent rights in connection therewith. If a patent holder or patent applicant has filed a statement of assurance via an Accep

14、ted Letter of Assurance, then the statement is listed on the IEEE-SA Website at http:/standards.ieee.org/about/sasb/patcom/patents.html. Letters of Assurance may indicate whether the Submitter is willing or unwilling to grant licenses under patent rights without compensation or under reasonable rate

15、s, with reasonable terms and conditions that are demonstrably free of any unfair discrimination to applicants desiring to obtain such licenses. Copyright 2013 IEEE. All rights reserved. v Essential Patent Claims may exist for which a Letter of Assurance has not been received. The IEEE is not respons

16、ible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of Patents Claims, or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any l

17、icensing agreements are reasonable or non-discriminatory. Users of this standard are expressly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standar

18、ds Association. Copyright 2013 IEEE. All rights reserved. vi Participants At the time this IEEE recommended practice was completed, the Surge Characterization on Low-Voltage Circuits Working Group had the following membership: Douglas Dorr, Chair Raymond Hill, Vice Chair Ken Brown William Bush Josep

19、h DeGregoria Lou Farquohar James Funke Martin Guy Andi Haa Ronald Hotchkiss Charles Jensen Joseph L. Koepfinger James Moellmann Carey Mossop Richard Odenberg Thomas Phipps Alan Rebek Anthony Surtees Mark Wingate The following members of the individual balloting committee voted on this recommended pr

20、actice. Balloters may have voted for approval, disapproval, or abstention. William Ackerman Samuel Aguirre Robert Ashton Steven Bezner Thomas Bishop Thomas Blackburn William Bloethe Chris Brooks William Brumsickle Michael Champagne Suresh Channarasappa Bryan Cole Stephen Conrad Jerry Corkran Chuanyo

21、u Dai Carlo Donati Gary Donner Douglas Dorr Randall Dotson Neal Dowling Charles Drexler Ernest Duckworth Gary Engmann Rabiz Foda James Funke Jalal Gohari Randall Groves Thomas Gruzs Dennis Hansen Lee Herron Gary Heuston Raymond Hill Ronald Hotchkiss Charles Jensen Andrew Jones Yuri Khersonsky Chad K

22、iger Jim Kulchisky Chung-Yiu Lam Paul Lindemulder William Lumpkins Greg Luri Albert Martin Michael Maytum Omar Mazzoni Gary Michel Daleep Mohla Jerry Murphy Arun Narang Dennis Neitzel Michael S. Newman NickS.A Nikjoo Joe Nims Richard Odenberg Hans-Wolf Oertel Lorraine Padden Donald Parker Bansi Pate

23、l Thomas Phipps Percy Pool Alvaro Portillo Iulian Profir Michael Roberts Charles Rogers Thomas Rozek Bartien Sayogo Suresh Shrimavle Gil Shultz Charles Simmons James Smith Jerry Smith Gary Stoedter John Tengdin David Tepen Donald Turner John Vergis Daniel Ward Kenneth White Ernesto Jorge Wiedenbrug

24、James Wilson Jian Yu Copyright 2013 IEEE. All rights reserved. vii When the IEEE-SA Standards Board approved this recommended practice on 5 December 2012, it had the following membership: Richard H. Hulett, Chair John Kulick, Vice Chair Robert M. Grow, Past Chair Konstantinos Karachalios, Secretary

25、Satish Aggarwal Masayuki Ariyoshi Peter Balma William Bartley Ted Burse Clint Chaplin Wael Diab Jean-Philippe Faure Alexander Gelman Paul Houz Jim Hughes Young Kyun Kim Joeseph L. Koepfinger* David J. Law Thomas Lee Hung Ling Oleg Logvinov Ted Olsen Gary Robinson Jon Walter Rosdahl Mike Seavy Yatin

26、Trivedi Paul Winston Yu Yuan *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Richard DeBlasio, DOE Representative Michael Janezic, NIST Representative Michelle Turner IEEE Standards Program Manager, Document Development Malia Zaman IEEE Standards Program

27、Manager, Technical Program Development Copyright 2013 IEEE. All rights reserved. viiiIntroduction This introduction is not part of IEEE Std C62.41.2-2002_Cor 1-2012, IEEE Recommended Practice for on Characterization of Surges in Low-Voltage ( 1000 V and Less) AC Power CircuitsCorrigendum 1: Deletion

28、 of Table A.2 and Associated Text. Annex A of IEEE Std C62.41.2, introduced the Scenario II lightning event. This event is used to characterize the (less frequent) direct strike lightning discharge to a structure, and the expected waveforms and current magnitudes. In contrast, the Scenario I event i

29、s used to characterize the (more common) event of surges impinging on a structure by way of the incoming power service connections. Table A.2 was introduced as an attempt to provide an equivalency between the commonly used 8/20 waveform and the 10/350 waveform used to classify surge protective devic

30、es (SPDs) intended for Class 1 applications in various IEC standards. This table sought to provide a degree of comparison between the energy levels of an 8/20 waveform, to that of a 10/350 waveform. It was suggested that the amplitude of an 8/20 waveform would have to be ten times higher to be equiv

31、alent to the amplitude of the 10/350 waveform. Put simply, Table A.2 suggested that an SPD which could withstand 100 kA 8/20 might equally be expected to withstand 10 kA 10/350. Further investigation by Working Group 3.6.4, responsible for the creation of this standard, has determined that it is not

32、 a simple exercise to correlate the stress which an SPD may experience when subjected to an 8/20 waveform to that of a 10/350 waveform. For example, the specific energy (charge deposition) imposed by a 10/350 test waveform will contribute significant joule heating in a very short time. On the other

33、hand, the much higher di/dt of the rising edge of a 100 kA 8/20 waveform to that of a 10kA 10/350 waveform, will impose more severe mechanical stresses. In other words, a simple equating of these two waveforms, by means of some ratio, is not possible since each create different stresses on the SPD a

34、nd exercise different aspects of the SPD construction and make up. Copyright 2013 IEEE. All rights reserved. ix Contents Annex A (informative) Senario II parameters 2 A.5 Proposed informativeInformative alternate waveforms and values 2 Copyright 2013 IEEE. All rights reserved. 1 IEEE Recommended Pra

35、ctice on Characterization of Surges in Low-Voltage (1000 V and Less) AC Power Circuits Corrigendum 1: Deletion of Table A.2 and Associated Text IMPORTANT NOTICE: IEEE Standards documents are not intended to ensure safety, health, or environmental protection, or ensure against interference with or fr

36、om other devices or networks. Implementers of IEEE Standards documents are responsible for determining and complying with all appropriate safety, security, environmental, health, and interference protection practices and all applicable laws and regulations. This IEEE document is made available for u

37、se subject to important notices and legal disclaimers. These notices and disclaimers appear in all publications containing this document and may be found under the heading “Important Notice” or “Important Notices and Disclaimers Concerning IEEE Documents.” They can also be obtained on request from I

38、EEE or viewed at http:/standards.ieee.org/IPR/disclaimers.html. NOTEThe editing instructions contained in this corrigendum define how to merge the material contained therein into the existing base standard and its amendments to form the comprehensive standard. The editing instructions are shown in b

39、old italic. Four editing instructions are used: change, delete, insert, and replace. Change is used to make corrections in existing text or tables. The editing instruction specifies the location of the change and describes what is being changed by using strikethrough (to remove old material) and und

40、erscore (to add new material). Delete removes existing material. Insert adds new material without disturbing the existing material. Insertions may require renumbering. If so, renumbering instructions are given in the editing instruction. Replace is used to make changes in figures or equations by rem

41、oving the existing figure or equation and replacing it with a new one. Editing instructions, change markings, and this NOTE will not be carried over into future editions because the changes will be incorporated into the base standard.11Notes in text, tables, and figures of a standard are given for i

42、nformation only and do not contain requirements needed to implement this standard. IEEE Std C62.41.2-2002_Cor 1-2012 IEEE Recommended Practice for on Characterization of Surges in Low-Voltage (1000 V and Less) AC Power Circuits Corrigendum 1: Deletion of Table A.2 and Associated Text Copyright 2013

43、IEEE. All rights reserved. 2Annex A (informative) Scenario II parameters Change the title of A.5 and the text as follows: A.5 Proposed informativeInformative alternate waveforms and values For all the reasons and limitations enumerated given in this informative annex, it is difficult, and might be m

44、isleading, to propose a unique waveform and a set of values to represent Scenario II events. Instead, TableA-2 has been developed through the consensus process for case-by-case application. The table shows several stress levels that might be considered as applicable to a particular situation, with t

45、he additional flexibility ofa negotiable level for those applications where the parties would have mutual acceptance of different conditions. One such flexibility is to use an empirical equivalency scaling factor relating the stress imposed by a 10/350 s waveform of a stated peak value to the corres

46、ponding stress imposed by an 8/20 swaveform with simply a higher peak value. Thus, SPDs intended for or inadvertently involved in (or unintended but still involved) for exit path application cannot receive a blanket performance requirement with pass/fail criteria. Rather, all the factors enumerated

47、above need be taken into consideration. In related IEC standards, the prime concern is energy-handling capability of SPDs involved in exit paths; therefore, a 10/350 waveform has been proposed by the IEC as a suitable and convenient waveform to represent the following three parameters of the first s

48、troke: peak current, charge and specific energy according to the IEC table (replicated in Figure A-2).Because the prime concern here is energy-handling capability of SPDs involved in exit paths, a 10/350swaveform has been proposed as one way to represent the three parameters of the first stroke: pea

49、k current,charge transfer, and specific energy according to Table 1 of IEC 61312-1:1995 B15. This waveform is intended to represent the imparted energy as well as the electrical imposes high levels of energy, current amplitude, and mechanical stresses imposed on SPDs involved in the exit path. Note that this waveform is not intended to represent the entire lightning flash. Subsequent strokes exhibit steeper fronts (see 7.4.2), and multiple strokes involve additional stresses beyond the first stroke, although their amplitude is generally lower than that of the

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