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ANSI IEEE C63.5-2017 American National Standard for Electromagnetic Compatibility Radiated Emission Measurements in Electromagnetic Interference (EMI) Control Calibration and Quali.pdf

1、 American National Standard for Electromagnetic Compatibility Radiated Emission Measurements in Electromagnetic Interference (EMI) ControlCalibration and Qualification of Antennas (9 kHz to 40 GHz) Accredited by the American National Standards Institute IEEE 3 Park Avenue New York, NY 10016-5997 USA

2、 Accredited Standards Committee C63Electromagnetic Compatibility ANSI C63.5-2017 (Revision of ANSI C63.5-2006) C63ANSI C63.5-2017 (Revision of ANSI C63.5-2005) American National Standard for Electromagnetic CompatibilityRadiated Emission Measurements in Electromagnetic Interference (EMI) ControlCali

3、bration and Qualification of Antennas (9 kHz to 40 GHz) Accredited Standards Committee C63Electromagnetic Compatibility accredited by the American National Standards Institute Secretariat Institute of Electrical and Electronics Engineers, Inc. Approved 31 January 2017 American National Standards Ins

4、titute Copyright 2017 IEEE. All rights reserved. 2 Abstract: Methods for determining antenna factors of antennas used for radiated emission measurements in electromagnetic interference (EMI) control from 9 kHz to 40 GHz are provided. Antennas included are linearly polarized antennas such as loops, r

5、ods (monopoles), tuned dipoles, biconical dipoles, log-periodic dipole arrays, biconical and log-periodic dipole array hybrids, broadband horns, etc., that are used in measurements prescribed by ANSI C63.4 and ANSI C63.10. The antenna calibration methods include standard site method (i.e., three-ant

6、enna method), reference antenna method, equivalent capacitance substitution method, standard transmit loop method, standard antenna method, and standard field method. Keywords: ANSI C63.5, antenna factors, equivalent capacitance substitution, linearly polarized antennas, near-free space, reference a

7、ntenna method, standard antenna method, standard site method, standard transmit loop method The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2017 by The Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Publi

8、shed 8 May 2017. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent (978) 750-8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. Errata Users are encourag

9、ed to check the IEEE Errata URL (http:/standards.ieee.org/findstds/errata/index.html), and the one for ASC C63at http:/www.c63.org/explanations_interpretations_request.htm, for errata periodically. Interpretations (ASC C63standards) Current interpretations are essential to the understanding of all A

10、SC C63standards. To assist in the meanings of requirements, informative interpretations are available at the following URL: http:/www.c63.org/documents/misc/posting/new_interpretations.htm. Users are cautioned that, although interpretations do not and cannot change the requirements of a standard, th

11、ey serve to clarify the meanings of requirements. All interpretations are informative rather than normative, until such time as the standard is revised (consistent with ASC C63ANSI-accredited operating procedures) to incorporate the interpretation as a normative requirement. Copyright 2017 IEEE. All

12、 rights reserved. 3 Important Notices and Disclaimers Concerning IEEE Standards Documents IEEE documents are made available for use subject to important notices and legal disclaimers. These notices and disclaimers, or a reference to this page, appear in all standards and may be found under the headi

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42、sit the IEEE-SA Website at http:/standards.ieee.org. Errata Errata, if any, for all IEEE standards can be accessed on the IEEE-SA Website at the following URL: http:/standards.ieee.org/findstds/errata/index.html. Users are encouraged to check this URL for errata periodically. Patents Attention is ca

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48、 the IEEE Standards Association. Copyright 2017 IEEE. All rights reserved. 6 Participants At the time this standard was completed, the Accredited Standards Committee C63Electromagnetic Compatibility had the following membership: Daniel Hoolihan, Chair Dan Sigouin, Vice Chair Gerald D. Ramie, Secreta

49、ry Sue Vogel, Secretariat Organization Represented Name of Representative Advanced Compliance Solutions, Inc. William (Mac) Elliott . Sam Wismer (Alt.) American Council of Independent Laboratories (ACIL) . Richard Reitz American Radio Relay League (ARRL) Edward F. Hare . Kermit Carlson (Alt.) Apple, Inc. . Jyun-cheng Chen Michael ODwyer (Alt.) Bay Area Compliance Laboratories Corporation . Harry H. Hodes . Lisa Tang (Alt.) Bureau Veritas . Jonathan Stewart Yunus Faziloglu Cisco Systems . Andy Griffin Dave Case (Alt.) Dell Inc. . Richard Worley Element Materials Tech

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