ImageVerifierCode 换一换
格式:PDF , 页数:69 ,大小:2.22MB ,
资源ID:435446      下载积分:10000 积分
快捷下载
登录下载
邮箱/手机:
温馨提示:
如需开发票,请勿充值!快捷下载时,用户名和密码都是您填写的邮箱或者手机号,方便查询和重复下载(系统自动生成)。
如填写123,账号就是123,密码也是123。
特别说明:
请自助下载,系统不会自动发送文件的哦; 如果您已付费,想二次下载,请登录后访问:我的下载记录
支付方式: 支付宝扫码支付 微信扫码支付   
注意:如需开发票,请勿充值!
验证码:   换一换

加入VIP,免费下载
 

温馨提示:由于个人手机设置不同,如果发现不能下载,请复制以下地址【http://www.mydoc123.com/d-435446.html】到电脑端继续下载(重复下载不扣费)。

已注册用户请登录:
账号:
密码:
验证码:   换一换
  忘记密码?
三方登录: 微信登录  

下载须知

1: 本站所有资源如无特殊说明,都需要本地电脑安装OFFICE2007和PDF阅读器。
2: 试题试卷类文档,如果标题没有明确说明有答案则都视为没有答案,请知晓。
3: 文件的所有权益归上传用户所有。
4. 未经权益所有人同意不得将文件中的内容挪作商业或盈利用途。
5. 本站仅提供交流平台,并不能对任何下载内容负责。
6. 下载文件中如有侵权或不适当内容,请与我们联系,我们立即纠正。
7. 本站不保证下载资源的准确性、安全性和完整性, 同时也不承担用户因使用这些下载资源对自己和他人造成任何形式的伤害或损失。

版权提示 | 免责声明

本文(ANSI IEEE SI 10-2016 American National Standard for Metric Practice.pdf)为本站会员(inwarn120)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

ANSI IEEE SI 10-2016 American National Standard for Metric Practice.pdf

1、American National Standard for Metric Practice Co-Sponsors ASTM Committee E43 on SI Practice and IEEE Standards Coordinating Committee 14 (Quantities, Units, and Letter Symbols) IEEE 3 Park Avenue New York, NY 10016-5997 USA IEEE/ASTM SI 10-2016 (Revision of IEEE/ASTM SI 10-2010) IEEE/ASTM SI 10-201

2、6 (Revision of IEEE/ASTM SI 10-2010)American National Standard for Metric Practice Co-Sponsors ASTM Committee E43 on SI Practice and IEEE Standards Coordinating Committee 14 (Quantities, Units, and Letter Symbols) Approved 22 September 2016 IEEE-SA Standards BoardApproved 1 July 2016ASTM Internation

3、al Abstract: Guidance for the use of the modern metric system is given. Known as the International System of Units (abbreviated SI), the system is the basis for worldwide standardization of measurement units. Information is included on SI, a list of units recognized for use with SI, and a list of co

4、nversion factors, together with general guidance on proper style and usage. Keywords: conversion factors, International System, International System of Units, metric practice, metric system, rounding, SI, SI 10, Systme International dUnits The Institute of Electrical and Electronics Engineers, Inc.

5、3 Park Avenue, New York, NY 10016-5997, USA ASTM International100 Barr Harbor Drive, P.O. Box C700, West Conshohocken, PA 19428-2959, USA Copyright 2016 by The Institute of Electrical and Electronics Engineers, Inc. and ASTM International. All rights reserved. Published 10 March 2017. Printed in the

6、 United States of America. IEEE is a registered trademark in the U.S. Patent fitness for a particular purpose; non-infringement; and quality, accuracy, effectiveness, currency, or completeness of material. In addition, IEEE disclaims any and all conditions relating to: results; and workmanlike effor

7、t. IEEE standards documents are supplied “AS IS” and “WITH ALL FAULTS.” Use of an IEEE standard is wholly voluntary. The existence of an IEEE standard does not imply that there are no other ways to produce, test, measure, purchase, market, or provide other goods and services related to the scope of

8、the IEEE standard. Furthermore, the viewpoint expressed at the time a standard is approved and issued is subject to change brought about through developments in the state of the art and comments received from users of the standard. In publishing and making its standards available, IEEE is not sugges

9、ting or rendering professional or other services for, or on behalf of, any person or entity nor is IEEE undertaking to perform any duty owed by any other person or entity to another. Any person utilizing any IEEE Standards document, should rely upon his or her own independent judgment in the exercis

10、e of reasonable care in any given circumstances or, as appropriate, seek the advice of a competent professional in determining the appropriateness of a given IEEE standard. IN NO EVENT SHALL IEEE BE LIABLE FOR ANY DIRECT, INDIRECT, INCIDENTAL, SPECIAL, EXEMPLARY, OR CONSEQUENTIAL DAMAGES (INCLUDING,

11、 BUT NOT LIMITED TO: PROCUREMENT OF SUBSTITUTE GOODS OR SERVICES; LOSS OF USE, DATA, OR PROFITS; OR BUSINESS INTERRUPTION) HOWEVER CAUSED AND ON ANY THEORY OF LIABILITY, WHETHER IN CONTRACT, STRICT LIABILITY, OR TORT (INCLUDING NEGLIGENCE OR OTHERWISE) ARISING IN ANY WAY OUT OF THE PUBLICATION, USE

12、OF, OR RELIANCE UPON ANY STANDARD, EVEN IF ADVISED OF THE POSSIBILITY OF SUCH DAMAGE AND REGARDLESS OF WHETHER SUCH DAMAGE WAS FORESEEABLE. Translations The IEEE consensus development process involves the review of documents in English only. In the event that an IEEE standard is translated, only the

13、 English version published by IEEE should be considered the approved IEEE standard. Official statements A statement, written or oral, that is not processed in accordance with the IEEE-SA Standards Board Operations Manual shall not be considered or inferred to be the official position of IEEE or any

14、of its committees and shall not be considered to be, or be relied upon as, a formal position of IEEE. At lectures, symposia, seminars, or educational courses, an individual presenting information on IEEE standards shall make it clear that his or her views should be considered the personal views of t

15、hat individual rather than the formal position of IEEE. Comments on standards Comments for revision of IEEE Standards documents are welcome from any interested party, regardless of membership affiliation with IEEE. However, IEEE does not provide consulting information or advice pertaining to IEEE St

16、andards documents. Suggestions for changes in documents should be in the form of a proposed change of text, together with appropriate supporting comments. Since IEEE standards represent a consensus of concerned interests, it is important that any responses to comments and questions also receive the

17、concurrence of a balance of interests. For this reason, IEEE and the members of its societies and Standards Coordinating Committees are not able to provide an instant response to comments or questions except in those cases where the matter has previously been addressed. For the same reason, IEEE doe

18、s not respond to interpretation requests. Any person who would like to participate in revisions to an IEEE standard is welcome to join the relevant IEEE working group. Comments on standards should be submitted to the following address: Secretary, IEEE-SA Standards Board 445 Hoes Lane Piscataway, NJ

19、08854 USA Laws and regulations Users of IEEE Standards documents should consult all applicable laws and regulations. Compliance with the provisions of any IEEE Standards document does not imply compliance to any applicable regulatory requirements. Implementers of the standard are responsible for obs

20、erving or referring to the applicable regulatory requirements. IEEE does not, by the publication of its standards, intend to urge action that is not in compliance with applicable laws, and these documents may not be construed as doing so. Copyrights IEEE draft and approved standards are copyrighted

21、by IEEE under U.S. and international copyright laws. They are made available by IEEE and are adopted for a wide variety of both public and private uses. These include both use, by reference, in laws and regulations, and use in private self-regulation, standardization, and the promotion of engineerin

22、g practices and methods. By making these documents available for use and adoption by public authorities and private users, IEEE does not waive any rights in copyright to the documents. Photocopies Subject to payment of the appropriate fee, IEEE will grant users a limited, non-exclusive license to ph

23、otocopy portions of any individual standard for company or organizational internal use or individual, non-commercial use only. To arrange for payment of licensing fees, please contact Copyright Clearance Center, Customer Service, 222 Rosewood Drive, Danvers, MA 01923 USA; +1 978 750 8400. Permission

24、 to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. Updating of IEEE Standards documents Users of IEEE Standards documents should be aware that these documents may be superseded at any time by the issuance of ne

25、w editions or may be amended from time to time through the issuance of amendments, corrigenda, or errata. An official IEEE document at any point in time consists of the current edition of the document together with any amendments, corrigenda, or errata then in effect. Every IEEE standard is subjecte

26、d to review at least every ten years. When a document is more than ten years old and has not undergone a revision process, it is reasonable to conclude that its contents, although still of some value, do not wholly reflect the present state of the art. Users are cautioned to check to determine that

27、they have the latest edition of any IEEE standard. In order to determine whether a given document is the current edition and whether it has been amended through the issuance of amendments, corrigenda, or errata, visit the IEEE Xplore at http:/ieeexplore.ieee.org/ or contact IEEE at the address liste

28、d previously. For more information about the IEEE-SA or IEEEs standards development process, visit the IEEE-SA Website at http:/standards.ieee.org. Errata Errata, if any, for all IEEE standards can be accessed on the IEEE-SA Website at the following URL: http:/standards.ieee.org/findstds/errata/inde

29、x.html. Users are encouraged to check this URL for errata periodically. Patents Attention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken by the IEEE with respect to th

30、e existence or validity of any patent rights in connection therewith. If a patent holder or patent applicant has filed a statement of assurance via an Accepted Letter of Assurance, then the statement is listed on the IEEE-SA Website at http:/standards.ieee.org/about/sasb/patcom/patents.html. Letters

31、 of Assurance may indicate whether the Submitter is willing or unwilling to grant licenses under patent rights without compensation or under reasonable rates, with reasonable terms and conditions that are demonstrably free of any unfair discrimination to applicants desiring to obtain such licenses.

32、Essential Patent Claims may exist for which a Letter of Assurance has not been received. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of Patents Claims, or determining whether any li

33、censing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this standard are expressly advised that determination of the validity of any patent rights, and the risk of infringement

34、 of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. Participants This standard was developed by the IEEE/ASTM Committee for Maintaining IEEE/ASTM SI 10, a joint committee established by the sponsoring organizations. The prop

35、osed standard generated by this joint committee was then formally adopted by the IEEE and ASTM before transmission to the American National Standards Institute for approval as an American National Standard. At the time of the approval of this revision, the joint committee had the following membershi

36、p. Nonvoting members at the time of publication are marked with an asterisk (*): Bruce Barrow, Chair James R. Frysinger, Vice Chair Robert H. Bushnell, Secretary Nancy Bale Dennis Brownridge* Rodney Conn* Anthony French Uri Gat Stan Jakuba Bill Potts Howard Ressel* John T. Scott Ralph Showers* Barry

37、 N. Taylor* Ambler Thompson Paul Trusten* Gerry Uttrachi* Matthew Zotter* At the time this IEEE standard was completed, the joint committee had the following membership. Nonvoting members at the time of publication are marked with an asterisk (*): Rodney Conn, Chair Terry Bates, Vice Chair James R.

38、Frysinger, Secretary Gordon Aubrecht Bruce Barrow Lyle Bowman Robert Bushnell Mike Crewdson* Don Hillger Stanislav Jakuba John Nichols Jim Paschal* Richard Peppin* Howard Ressel* Terry Scott* Tom Walsh* The following members of the individual balloting committee voted on this standard. Balloters may

39、 have voted for approval, disapproval, or abstention. Samuel Aguirre Robert Aiello Mihaela Albu Dwight Alexander Saleman Alibhay Roberto Asano Curtis Ashton Gordon Aubrecht Robert Ballard Peter Balma Bakul Banerjee Cleon Barker Thomas Barnes Bruce Barrow Frank Basciano Earle Bascom III Ronald Bennel

40、l Jean-Marc Biasse Thomas Bishop Thomas Blackburn William Bloethe Anne Bosma Kenneth Bow Harvey Bowles Riccardo Brama Daniel Brosnan Gustavo Brunello Paul Cardinal Yesenia Cevallos Michael Champagne Suresh Channarasappa Arvind Chaudhary Donald Cherry Keith Chow C. Clair Claiborne Larry Conrad Stephe

41、n Conrad Charles Cotton Geoffrey Darnton Matthew Davis Ronald Dean Davide de Luca Gary Donner Michael Dood Neal Dowling Edgar Dullni Robert Durham Sourav Dutta Douglas J. Edwards Heiko Ehrenberg Richard Ellis Hossam Fahmy Keith Flowers Joseph Foldi Gary Fox Avraham Freedman Nancy Frost James Frysing

42、er David Fuschi Shawn Galbraith Michael Garrels George Gela John Geldman Copyright 2016 IEEE/ASTM. All rights reserved. 7 Frank Gerleve Gregg Giesler James Gilb Jalal Gohari Edwin Goodwin Chris Gorringe David Gregson J Travis Griffith Randall Groves Michael Gundlach Bal Gupta Ajit Gwal Donald Hall J

43、. Harlow Daryl Harmon Lee Herron Guido Hiertz Lauri Hiivala Werner Hoelzl Ronald Hotchkiss Richard Hulett Noriyuki Ikeuchi Magdi Ishac Atsushi Ito Richard Jackson Vincent Jones Adri Jovin Laszlo Kadar Shinkyo Kaku Innocent Kamwa Efthymios Karabetsos Piotr Karocki John Kay Stuart Kerry Vladimir Khali

44、n Yuri Khersonsky Jean-Francois Kieffer Hermann Koch Richard Kolich Lawrence Kotewa Jim Kulchisky Saumen Kundu Thomas Kurihara Chung-Yiu Lam David Leciston Wei-Jen Lee Yeou Song Lee John Lemon Arthur H Light Paul Lindemulder O. Malik Jouni Malinen Roger Marks Jorge Marquez Lee Matthews Edward McCall

45、 Thomas McCarthy Peter Megna Joseph Melanson John Merando John Miller Daniel Mulkey Ryan Musgrove K. R. M. Nair Marie Nemier Gary Nissen Tim Olson Lorraine Padden Richard Paes Luke Parthemore Bansi Patel Mark Paulk Ronald Petersen Branimir Petosic Christopher Petrola Ghery Pettit David R. Phelps Per

46、cy Pool Alvaro Portillo Iulian Profir John Rama R. K. Rannow Sergio Rapuano Carl Reigart Annette Reilly Maximilian Riegel Michael Roberts Timothy Robirds Charles Rogers Ervin Root Terence Rout Thomas Rozek Daniel Sabin Bartien Sayogo Janek Schumann Mike Seavey Robert Seitz Mark Siira Carl Singer Jef

47、frey Sisson Jeremy Smith Jerry Smith Gary Smullin Ronald Stahara Joseph Stanco Thomas Starai Donald Steigerwalt John Stevens Brian Story Walter Struppler K. Stump Mark Sturza Marcy Stutzman Peter Sutherland David Tepen Phyllis Thomas Geoffrey Thompson Wayne Timm James Tomaseski Remi Tremblay Richard

48、 Tressler Thomas Tullia Joe Uchiyama James Van De Ligt John Vergis Matthew Wakeham David Walker Daniel Ward Joe Watson John Webb Hung-Yu Wei Kenneth White Alan Wilks Jan Wittenber Terry Woodyard Forrest Wright Guangning Wu Richard Young Jian Yu Oren Yuen 8 Copyright 2016 IEEE/ASTM. All rights reserv

49、ed. When the IEEE-SA Standards Board approved this on 22 September 2016, it had the following membership: John D. Kulick, Chair Jon Walter Rosdahl, Vice Chair Richard H. Hulett, Past Chair Konstantinos Karachalios, Secretary Masayuki Ariyoshi Ted Burse Stephen Dukes Jean-Philippe Faure J. Travis Griffith Gary Hoffman Michael Janezic Joseph L. Koepfinger* David J. Law Hung Ling Andrew Myles T. W. Olsen Glenn Parsons Ronald C. Petersen Annette D. Reilly Stephen J. Shellhammer Adrian P. Stephens Yatin Trivedi Philip Winston Don Wright Yu Yuan Daidi Zhong *Member Emeritus 9 Copyri

copyright@ 2008-2019 麦多课文库(www.mydoc123.com)网站版权所有
备案/许可证编号:苏ICP备17064731号-1