ANSI INCITS 307-1997 Information Technology - Serial Storage Architecture - Physical Layer 2 (SSA-PH2).pdf

1、ANSI INCITS 307-1997 (R2002)(formerly ANSI NCITS 307-1997)for Information Technology Serial Storage Architecture Physical Layer 2 (SSA-PH2)American National Standardfor Information Technology Serial Storage Architecture Physical Layer 2 (SSA-PH2)ANSI NCITS 307-1997SecretariatInformation Technology I

2、ndustry CouncilApproved December 2, 1998American National Standards Institute, Inc.AbstractThis standard describes the Serial Storage Architecture Physical Layer 2 (SSA-PH2). SSA defines a se-rial interface hierarchy to be used for purposes within its distance and performance characteristics, includ

3、-ing but not limited to storage subsystems.The Serial Storage Architecture fills a need in the evolution from parallel to serial interfaces for storagedevices. It meets the space constraints and cabling considerations for high-density storage arrays with acommensurate improvement in reliability (an

4、architected error recovery, redundant paths to devices, awrap mode for self-test, line fault detection, and a balanced signaling scheme that achieves a low errorrate) and configurability (the ability to hot-plug devices, the self-configuration capability, the 20 meterlength of cable segments).The ph

5、ysical layer allows for a CMOS implementation to achieve an economical and small package size,an efficient use of bandwidth, a small frame size to reduce buffer expense, and the capability for self-con-figuration are also needed. The physical requirements include 20-meter distance per cable segment,

6、 asmall number of signals to limit connector and cable expense, and a low-voltage implementation.Approval of an American National Standard requires review by ANSI that therequirements for due process, consensus, and other criteria for approvalhave been met by the standards developer.Consensus is est

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12、n National StandardPublished byAmerican National Standards Institute, Inc.11 West 42nd Street, New York, NY 10036Copyright 1998 by Information Technology Industry Council (ITI) All rights reserved.No part of this publication may be reproduced in anyform, in an electronic retrieval system or otherwis

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17、d to avoid infringe-ment in the use of this standard. iContentsPageForeword.ivIntroduction .vi1Scope . 11.1 SSA-PH2 characteristics 11.2 SSA family of standards . 22References . 32.1 Normative references . 32.2 Informative references 33Definitions, symbols, and abbreviations . 33.1 Definitions. 33.2

18、 Symbols and abbreviations 44Conventions 65Modulation 66Data Rate . 67Electrical requirements. 67.1 Line driver. 87.2 Line receiver. 177.3 Line segment termination . 207.4 Ground shift 217.5 Port connection. 227.6 System level noise margin 268Interconnections . 278.1 Internal connectors. 278.2 Inter

19、nal Port Connections. 438.3 Internal options bay connections 458.4 Internal device power connections . 468.5 External connections 47Tables1SSA physical interconnect schemes 62Driver output spectral content. 133Driver system operating parameters 144Driver test parameters 145Line driver operating requ

20、irements at the port connector. 156Electrical requirements for Line Driver termination. 167Receiver system operating parameters 198Receiver test parameters . 199Receiver operating requirements at the port connector . 2010Electrical requirements for line segment termination 21iiPage11Internal connect

21、or options 2812Pinouts for internal port device connectors 4313Pinout for 4-line internal port device connections. 4414Pinout for 5-line internal port device connections. 4415Pinout for 6-line internal port device connections. 4516TTL input pin parameters . 4517TTL output pin parameters . 4518Option

22、s connector pinouts 4619Power connector pinouts 4720External micro-miniature D device connector pinout 5121External micro-miniature D cable pinouts. 5122External HSSDC device connector pinout 5423External HSSDC cable pinouts 5524Transfer impedance requirements for external SSA connections 56Figures1

23、Relationship of the SSA standards. 22Electrical configuration for SSA serial links 73Test points 84SSA Line Driver implementation example 95Relationship between LineOut currents at the port connector . 106Test environment for drivers. 117Test environment for driver spectral content 128Driver output

24、spectral content 139SSA driver pulse mask . 1310Line Driver termination schematic 1611SSA receiver test environment. 1712Receiver pulse mask 1913Definition of ground shift. 2114Lines and line segments. 2215Port connection and Port Connection segments 2316Port connection segment test load . 2417Compl

25、ex Port Connection 2518Port connection coupler 2519Complex Port Connection examples using PCCs 2620Internal unitized backplane connector overview. 30iiiPage21Internal unitized backplane connector detail (side view) 3022Internal unitized backplane connector detail (end view) . 3123Internal cable and

26、backplane port connector detail 3224Internal cable and backplane option connector detail. 3225Internal cable and backplane power connector detail. 3326Internal cable and backplane connector contact detail. 3427Internal cable and backplane connector contact wipe detail 3428Internal cable and backplan

27、e port connector detail (2 ports shown) 3529Internal cable and backplane option and power connector detail. 3630Internal unitized device connector overview . 3731Internal unitized device connector detail (top view) 3832Internal unitized device connector detail (end view) . 3933Internal device port c

28、onnector detail. 4034Internal device options connector detail . 4035Internal device power connector detail . 4136Internal device connector retention detail . 4237Internal device connector pin sequencing detail. 4238External micro-miniature D device connector interface 4939External micro-miniature D

29、cable connector interface 5040External HSSDC device connector interface 5341External HSSDC cable connector interface 5442Typical construction of external cable. 55AnnexesATransfer impedance testing procedure . 57BInternal connector testing procedure 63CExternal micro-miniature D connector testing pr

30、ocedure 71DExternal HSSDC connector testing procedure . 81ENulling of intersymbol jitter 83FLine fault detection scheme example . 84GCircuit for degrading signal amplitude and introducing 85common mode levels 85HPreferred test configurations for SSA links . 87IImplementation guidelines 88JReference

31、for copper, polymer dielectric, non-equalized SSA Cable Assemblies. 91KThe use of fiberoptic Port Connection Couplers with SSA . 93ivForeword(This foreword is not part of American National Standard NCITS 307-1997.)This standard was developed by Task Group T10.1 of Accredited Standards Commit-tee NCI

32、TS during 1996-97. The standards approval process started in 1997.Annexes A through E are normative, annexes F through K are informative annexesand are not part of the standard.Requests for interpretation, suggestions for improvement and addenda, or defect re-ports are welcome. They should be sent t

33、o the NCITS Secretariat, Information Tech-nology Industry Council, 1250 Eye Street, NW, Suite 200, Washington, DC 20005-3922.This standard was processed and approved for submittal to ANSI by AccreditedStandards Committee on Information Technology, NCITS. Committee approval of thestandard does not ne

34、cessarily imply that all committee members voted for approval.At the time it approved this standard, the NCITS Committee had the following mem-bers:James D. Converse, ChairKaren Higginbottom, Vice ChairKate McMillan, SecretaryOrganization Represented Name of RepresentativeAMP, IncBen Bennett Edward

35、Kelly (Alt.)Apple Computer, IncDavid K. Michael Jerry Kellenbenz (Alt.)ATb) copper cable operation at 40 MB/s;c) full duplex operation to achieve an aggregate 80 MB/s between two ports; andd) other capabilities that fit within the scope of SSA-PH2 (ANSI NCITS 307-1997) that may beproposed during the

36、 development phase by the participants in the project.This document defines the SSA physical layer 2 (ANSI NCITS 308-1997) of the Serial StorageArchitecture (SSA). SSA defines a serial interface hierarchy to be used for purposes within its distanceand performance characteristics, including but not l

37、imited to storage subsystems. This standard isintended to be used with an upper layer protocol e.g., SCSI-2 Protocol (ANSI X3.294-1996) or SCSI-3Protocol (ANSI NCITS 309-1997) and a transport layer e.g., SSA Transport Layer 2 (ANSI NCITS 308-1997).A major goal of the SSA-PH2 standard (ANSI NCITS 307

38、-1997) is to define a physical layer acceptable todevice vendors, looking for an evolution from parallel SCSI or SSA-PH1 (ANSI X3.293-1996), and systemsdesigners looking for opportunities to more fully exploit the capabilities inherent to a serial bus.1.1 SSA-PH2 characteristicsThis standard defines

39、 the physical medium (e.g., encoding, modulation, clocking, line drivers/receivers,connectors, and cables).The essential characteristics of SSA-PH2 (ANSI NCITS 307-1997) include:a) links using copper Cable Assemblies have been demonstrated to operate at 40 MB/s up to 20 mwith on-chip CMOS drivers;b)

40、 support for optical transducers that allow longer distance connections;c) the link makes optimum use of the physical medium by using full-duplex communication to avoidarbitration overhead and turn-around delay;d) full duplex communication achieves an aggregate 80 MB/s bandwidth (40 MB/s in each dir

41、ection)between two ports;e) the cables and connectors are physically compatible with small form factor devices;f) device connector capable of mating with both backplanes and cables;g) an electrically balanced design that reduces EMI and crosstalk; andANSI NCITS 307-19972h) a measurement scheme focus

42、ing on interoperability at separable connectors without requiring anyinternal physical access.1.2 SSA family of standardsThe relationships of the SSA family of standards is illustrated in figure 1.1.2.1 SSA-S2PSerial Storage Architecture - (SSA-S2P) SCSI-2 Protocol (ANSI X3.294-1996) defines the SCS

43、I-2 Protocolused to run on top of the SSA transport layers 1 or 2.1.2.2 SSA-S3PSerial Storage Architecture - (SSA-S3P) SCSI-3 Protocol (ANSI NCITS 309-1997) defines the SCSI-3Protocol used to run on top of the SSA transport layer 2.1.2.3 SSA-TL1Serial Storage Architecture - (SSA-TL1) Transport Layer

44、 1 (ANSI X3.295-1996) defines the Transportlayer that runs SSA-S2P and runs on SSA-PH1.1.2.4 SSA-TL2Serial Storage Architecture - (SSA-TL2) Transport Layer 2 (ANSI NCITS 308-1997) defines the Transportlayer that runs SSA-S2P and SSA-S3P and run on SSA-PH1 or SSA-PH2.1.2.5 SSA-PH1Serial Storage Archi

45、tecture - (SSA-PH1) Physical Layer 1 (ANSI X3.293-1996) defines the Physical layerthat runs SSA-TL1 and SSA-TL2, and consists of the electrical characteristics of the interface and theconnectors.1.2.6 SSA-PH2Serial Storage Architecture - (SSA-PH2) Physical Layer (ANSI NCITS 307-1997) defines the Phy

46、sicallayer that runs SSA-TL2, and consists of the electrical characteristics of the interface and the connectors.Figure 1 - Relationship of the SSA standardsANSI NCITS 307-199732. References2.1 Normative referencesThe following standards contain provisions which, through reference in this text, cons

47、titute provisions ofthis American National Standard. At the time of publication, the editions indicated were valid. Allstandards are subject to revision, and parties to agreements based on this American National Standardare encouraged to investigate the possibility of applying the most recent editio

48、ns of the standards listedbelow.Members of IEC and ISO maintain registers of currently valid International Standards, and ANSI maintainsregisters for American National Standards.ANSI NCITS 308-1997, Information Technology - Serial Storage Architecture - Transport Layer 2 (SSA-TL2)ANSI/EIA 364 (1994)

49、, Electrical Connectors Test Procedure (parts 13, 20, 21, 23, 31, 41, and 46)IEC 512, Electromechanical components for electronic equipment; basic testing procedures andmeasuring methodsIEC 512-2 (1985), Part 2 - Insulation resistanceIEC 512-4 (1976), Part 4 - Dynamic stress testsIEC 512-5 (1992), Part 5 - Impact tests (free components), static load tests (fixed components), endurancetests and overload testsIEC 512-6 (1984), Part 6 - Climatic tests and soldering testsIEC 512-7 (1993), Part 7 - Mechanical operating tests and sealing testsIEC 512-11-7 (1996) Part 11 - Climatic tests -