ANSI INCITS ISO IEC 10373-6 AMD 1-2007 Identification cards Test methods Part 6 Proximity cards Amendment 1 Protocol test methods for proximity.pdf

1、INCITS/ISO/IEC 10373-6:2001/Amd.1:20072008 (ISO/IEC 10373-6:2001/Amd.1:2007, IDT) Identification cards Test methods Part 6: Proximity cards Amendment 1: Protocol test methodsfor proximityINCITS/ISO/IEC 10373-6:2001/Amd.1:20072008(ISO/IEC 10373-6:2001/Amd.1:2007,IDT)INCITS/ISO/IEC 10373-6:2001/Amd.1:

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5、etariat at the address given below. Adopted by INCITS (InterNational Committee for Information Technology Standards) as an American National Standard. Date of ANSI Approval: 7/2/2008 Published by American National Standards Institute, 25 West 43rd Street, New York, New York 10036 Copyright 2008 by I

6、nformation Technology Industry Council (ITI). All rights reserved. These materials are subject to copyright claims of International Standardization Organization (ISO), International Electrotechnical Commission (IEC), American National Standards Institute (ANSI), and Information Technology Industry C

7、ouncil (ITI). Not for resale. No part of this publication may be reproduced in any form, including an electronic retrieval system, without the prior written permission of ITI. All requests pertaining to this standard should be submitted to ITI, 1250 Eye Street NW, Washington, DC 20005. Printed in th

8、e United States of America INCITS/ISO/IEC 10373-6:2001/Amd.1:20072008 ITIC 2008 All rights reserved iii Contents Page Foreword . iv Annex G (normative) Additional PICC test methods 4 G.1 PICC-test-apparatus and accessories 4 G.1.1 Emulating the I/O protocol 4 G.1.2 Generating the I/O character timin

9、g in reception mode 4 G.1.3 Measuring and monitoring the RF I/O protocol 4 G.1.4 Protocol Analysis 4 G.1.5 RFU fields 5 G.2 Relationship of test methods versus base standard requirement 5 G.3 Test method for initialisation of the PICC of type A. 6 G.3.1 Introduction . 6 G.3.2 Scenario 1: Polling 6 G

10、.3.3 Procedure 7 G.3.4 Testing of the PICC type A state transitions 7 G.3.5 Scenario 13: Handling of type A anticollision 27 G.3.6 Handling of RATS 29 G.3.7 Handling of PPS request . 30 G.3.8 Scenario 20: Handling of FSD . 31 G.4 Test method for initialisation of the PICC of type B. 32 G.4.1 Introdu

11、ction . 32 G.4.2 Scenario 21: Polling 32 G.4.3 Scenario 22: PICC Reception 33 G.4.4 Testing of the PICC Type B State Transitions 34 G.4.5 Scenario 28: Handling of type B anticollision 41 G.4.6 Handling of ATTRIB . 44 G.4.7 Scenario 31 Handling of Maximum Frame Size 45 G.5 Test methods for logical op

12、eration of the PICC of Type A/B . 45 G.5.1 Introduction . 45 G.5.2 PICC reaction to ISO/IEC 14443-4 Scenarios . 46 G.5.3 Handling of PICC error detection 56 G.5.4 PICC reaction on CID. 58 G.5.5 PICC reaction on NAD . 61 G.6 Reported results 63 NOTE The table of contents is given for convenience only

13、 and should not be inserted in the amended standard. INCITS/ISO/IEC 10373-6:2001/Amd.1:20072008 iv ITIC 2008 All rights reserved Foreword ISO (the International Organization for Standardization) and IEC (the International Electrotechnical Commission) form the specialized system for worldwide standar

14、dization. National bodies that are members of ISO or IEC participate in the development of International Standards through technical committees established by the respective organization to deal with particular fields of technical activity. ISO and IEC technical committees collaborate in fields of m

15、utual interest. Other international organizations, governmental and non-governmental, in liaison with ISO and IEC, also take part in the work. In the field of information technology, ISO and IEC have established a joint technical committee, ISO/IEC JTC 1. International Standards are drafted in accor

16、dance with the rules given in the ISO/IEC Directives, Part 2. The main task of the joint technical committee is to prepare International Standards. Draft International Standards adopted by the joint technical committee are circulated to national bodies for voting. Publication as an International Sta

17、ndard requires approval by at least 75 % of the national bodies casting a vote. Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. ISO and IEC shall not be held responsible for identifying any or all such patent rights. Amendment 1 t

18、o ISO/IEC 10373-6:2001 was prepared by Joint Technical Committee ISO/IEC JTC 1, Information technology, Subcommittee SC 17, Cards and personal identification. INCITS/ISO/IEC 10373-6:2001/Amd.1:20072008 ITIC 2008 All rights reserved 1 Identification cards Test methods Part 6: Proximity cards AMENDMEN

19、T 1: Protocol test methods for proximity cards Page 1, Clause 2 Add the following to the list of normative references: ISO/IEC 14443-4, Identification cards Contactless integrated circuit(s) cards Proximity cards Part 4: Transmission protocol Page 2, Clause 3 Replace the first sentence with the foll

20、owing: For the purposes of this document, the terms, definitions, abbreviations and symbols given in ISO/IEC 14443-2, ISO/IEC 14443-3, ISO/IEC 14443-4 and the following apply. NOTE Elements in bold square brackets are optional. Page 2, Subclause 3.1 Add the following terms and definitions: 3.1.4 Cas

21、cadeLevels number of cascade levels of the PICC 3.1.5 Command Set set describing the PICC commands during initialization and anticollision NOTE See ISO/IEC 14443-3:2001, 6.3 for PICC type A and ISO/IEC 14443-3:2001, 7.5 for PICC type B. 3.1.6 Mute no response within a specified timeout, e.g. expirat

22、ion of FWT 3.1.7 PICC States different PICC states during initialization and anticollision NOTE See ISO/IEC 14443-3:2001, 6.2 for PICC type A and ISO/IEC 14443-3:2001, 7.4 for PICC type B. 3.1.8 Scenario defined typical protocol and application specific communication to be used with the test methods

23、 defined in this part of ISO/IEC 10373 INCITS/ISO/IEC 10373-6:2001/Amd.1:20072008 2 ITIC 2008 All rights reserved 3.1.9 Test Initial State TIS element from PICC States that is the PICC state before performing a specific PICC command from Command Set 3.1.10 Test Target State TTS element from PICC Sta

24、tes that is the PICC state after performing a specific PICC command from Command Set Page 2, Subclause 3.2 Add the following alphabetically to the list of abbreviations and symbols: ATA(cid) Answer to ATTRIB, i.e. (mbli+cid CRC_B), with mbli an arbitrary hex value (see ISO/IEC 14443-3:2001, 7.11) AT

25、TRIB(cid, fsdi) Default ATTRIB command with PUPI from ATQB, CID=cid and Maximum Frame Size Code value = fsdi i.e. (1D PUPI cid fsdi 01 00 CRC_B) SELECT(l) SELECT command of cascade level l, i.e. SELECT(1) = ( 93 70 UIDTX1 BCC CRC_A) SELECT(2) = ( 95 70 UIDTX2 BCC CRC_A) SELECT(3) = ( 97 70 UIDTX3 BC

26、C CRC_A) READY(l) READY state in cascade level l, l 1, 2, 3; i. e. READY(2) is a PICC cascade level 2 READY*(l) READY* state in cascade level l, l 1, 2, 3; i. e. READY*(2) is a PICC cascade level 2 REQB(s) REQB command with slot parameter s, s codes N as defined in ISO/IEC 14443-3:2001, 7.7.4 i.e. (

27、05 00 s CRC_B) WUPB(s) WUPB command with slot parameter s, s codes N as defined in ISO/IEC 14443-3:2001, 7.7.4 i.e. (05 00 8+s CRC_B) SLOTMARKER(n) Slot-MARKER command with slot number n, i.e. (16*(n-1)+5 CRC_B) RATS(cid, fsdi) Default RATS command with CID=cid and FSDI value = fsdi i.e. ( E0 fsdi*1

28、6+cid CRC_A) PPS(cid, dri, dsi) Default PPS request with CID=cid, DRI=dri and DSI=dsi, i.e. (D+cid 11 dsi*4 + dri CRC_A) SEL(c) Select code of level c (i.e. SEL(1) = 93, SEL(2) = 95, SEL(3) = 97) SAK(cascade) the SELECT(l) answer with the cascade bit (bit 3) set to 1 SAK(complete) the SELECT(l) answ

29、er with the cascade bit (bit 3) set to 0 UIDTXn transmitted UID 32-bit data at cascade level n (see Table 1 Mapping from UID to UIDTX) WUPB(s) WUPB command with slot parameter s, s codes N as defined in ISO/IEC 14443-3:2001, 7.7.4 i.e. (05 00 8+s CRC_B) INCITS/ISO/IEC 10373-6:2001/Amd.1:20072008 ITI

30、C 2008 All rights reserved 3 X Bit sequence consisting of the inverted bits of bit sequence X or any other bit sequence different from X. Xn Bit at position n of bit sequence X. First bit is at position 1 Xab Bit subsequence of bit sequence X consisting of the bits between position a and b included.

31、 If a b then the sequence is empty Xn Byte at position n of bit sequence X. First byte is at position 1 (i.e. Xn = X(n-1)*8+1n*8 ) Xab Bit subsequence of bit sequence X consisting of the bits between position a*8 and b*8, with bit b*8 not included. (i.e. Xab = X(a-1)*8+1(b-1)*8+1 ) I(c)n(inf ,CID=ci

32、d ,NAD=nad ,CRC) ISO/IEC 14443-4 I-Block with chaining bit c1,0, block number n1,0 and information field inf. By default no CID and no NAD will be transmitted. If CID=cid0.15 is specified, it will be transmitted as second parameter. If NAD=nad0.FF is specified it will be transmitted as third paramet

33、er. If the literal CRC is not specified, a valid CRC corresponding to the type of the PICC will be transmitted by default (i.e. CRC_A or CRC_B). R(ACK ,CID=cid ,CRC)n ISO/IEC 14443-4 R(ACK) Block with block number n. The definition of the optional CID and CRC symbols is as described in the I(c)n blo

34、ck above. R(NAK ,CID=cid,CRC)n ISO/IEC 14443-4 R(NAK) Block with block number n. The definition of the optional CID and CRC symbols is as described in the I(c)n block above. S(WTX)(n ,CID=cid,CRC) ISO/IEC 14443-4 S(WTX) block with parameter WTXM= n. The definition of the optional CID and CRC symbols

35、 is as described in the I(c)n block above. S(DESELECT ,CID=cid ,CRC) ISO/IEC 14443-4 S(DESELECT) block. The definition of the optional CID and CRC symbols is as described in the I(c)n block above. TEST_COMMAND1(1) Default test command consisting of one unchained I-block Note: This command depends on

36、 the negotiated maximum frame size value of the PICC TEST_COMMAND1(n), n 1 Default test command consisting of n chained I-blocks. (PCD chaining) Note: This command depends on the negotiated maximum frame size value of the PICC TEST_COMMAND1(n)k INF field of kth I-block chain of TEST_COMMAND1(n). Not

37、e: This I-block depends on the negotiated maximum frame size value of the PICC TEST_RESPONSE1(n) INF field of the response to TEST_COMMAND1(n). This response is assumed to be always unchained. TEST_COMMAND2(n), n 1 Default test command which expects a response consisting of n chained I-blocks. Note:

38、 This command depends on the negotiated maximum frame size value of the PCD. TEST_RESPONSE2(n) Response to TEST_COMMAND2(n) Note: This I-block depends on the negotiated maximum frame size value of the PCD. TEST_RESPONSE2(n)k INF field of kth I-block chain of TEST_RESPONSE2(n) Note: This I-block depe

39、nds on the negotiated maximum frame size value of the PCD. TEST_COMMAND3 Default test command consisting of one I-block which needs between n*FWT and (n+1)*FWT time for execution TEST_RESPONSE3 Response I-block to TEST_COMMAND3. This response is always assumed to be unchained. INCITS/ISO/IEC 10373-6

40、:2001/Amd.1:20072008 4 ITIC 2008 All rights reserved Table 1 Mapping from UID to UIDTX Cascade level Single UID PICC Double UID PICC Triple UID PICC UIDTX1 UID0 UID1 UID2 UID3 88 UID0 UID1 UID2 88 UID0 UID1 UID2 UIDTX2 - UID3 UID4 UID5 UID6 88 UID3 UID4 UID5 UIDTX3 - - UID6 UID7 UID8 UID9 Page 24 Ad

41、d the following annex after Annex F: Annex G (normative) Additional PICC test methods G.1 PICC-test-apparatus and accessories This clause defines the test apparatus and test circuits for verifying the operation of a PICC according to ISO/IEC 14443-3:2001. The test apparatus includes: Calibration coi

42、l (see 6.1 of ISO/IEC 10373-6) Test PCD assembly (see 6.2 of ISO/IEC 10373-6) Digital sampling oscilloscope (see 6.4 of ISO/IEC 10373-6) Care shall be taken to ensure that the results are not affected by the RF performance of the test circuits. G.1.1 Emulating the I/O protocol The PICC-test-apparatu

43、s shall be able to emulate the protocol type A, type B, which are required to test a PICC. G.1.2 Generating the I/O character timing in reception mode The PICC-test-apparatus shall be able to generate the I/O bit stream according to ISO/IEC 14443-3:2001. Timing parameters: start bit length, guard ti

44、me, bit width, request guard time, start of frame width, end of frame width shall be configurable. G.1.3 Measuring and monitoring the RF I/O protocol The PICC-test-apparatus shall be able to measure and monitor the timing of the logical low and high states of the RF Input/Receive line relative to th

45、e CLK frequency. The PICC-test-apparatus shall be able to monitor the PICC subcarrier. G.1.4 Protocol Analysis The PICC-test-apparatus shall be able to analyse the I/O-bit stream in accordance with protocol type A and type B as specified in ISO/IEC 14443-3,4 and extract the logical data flow for fur

46、ther protocol analysis. INCITS/ISO/IEC 10373-6:2001/Amd.1:20072008 ITIC 2008 All rights reserved 5 G.1.5 RFU fields RFU fields should be constantly monitored during the testing and shall always be verified to contain the assigned default value. A test shall fail and the tested PICC declared non-comp

47、liant in case an RFU field is not set to its default value at any time. G.1.5.1 RFU values Functional fields should be constantly monitored during the testing and shall always be verified to contain only functional values documented in the standard or proprietary values documented in the standard. A

48、 test shall fail and the tested PICC be declared non-compliant in case a functional field is not set to said values (and thus is set to an RFU or restricted value) at any time. G.1.5.2 Timing measurements The PICC-test-apparatus shall continuously monitor the following frame format and timing values

49、: For PICC Type A: Frame delay time PCD to PICC (see ISO/IEC 14443-3:2001, 6.1.2) Frame formats (see ISO/IEC 14443-3:2001, 6.1.5) Frame waiting time (see ISO/IEC 14443-4:2001, 7.2) For PICC Type B: Character, frame format and timing (see ISO/IEC 14443-3:2001, 7.1) Frame waiting time (see ISO/IEC 14443-4:2001, 7.2) A test shall fail and the tested PICC be declared non-compliant i