1、ANSI N42.17A-2003(Revision of ANSI N42.17A-1989)IEEE StandardsN42.17AAmerican National Standard for Performance Specifications for Health Physics InstrumentationPortableInstrumentation for Use inNormal Environmental ConditionsPublished by The Institute of Electrical and Electronics Engineers, Inc.3
2、Park Avenue, New York, NY 10016-5997, USA29 April 2004Accredited by the American National Standards InstituteSponsored by theNational Committee on Radiation Instrumentation, N42IEEE StandardsPrint: SH95202PDF: SS95202Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by I
3、HS under license with IEEENot for ResaleNo reproduction or networking permitted without license from IHS-,-,-The Institute of Electrical and Electronics Engineers, Inc.3 Park Avenue, New York, NY 10016-5997, USACopyright 2004 by the Institute of Electrical and Electronic Engineers, Inc.All rights re
4、served. Published 29 April 2004. Printed in the United States of America.Print: ISBN 0-7381-3910-6 SH95202PDF: ISBN 0-7381-3911-4 SS95202No part of this publication may be reproduced in any form, in an electronic retrieval system or otherwise, without the prior written permission from the publisher.
5、ANSI N42.17A-2003American National Standard for Performance Specifications for Health Physics Instrumentation-Portable Instrumentation for Use in Normal Environmental ConditionsSponsorNational Committee on Radiation Instrumentation, N42Accredited by the American National Standards InstituteSecretari
6、atThe Institute of Electrical and Electronics Engineers, Inc.Approved 29 September 2003American National Standards InstituteAbstract: This standard establishes the minimum performance criteria for health physicsinstrumentation for use in ionizing radiation fields. Testing methods are included to est
7、ablish theacceptability of each type of instrumentation.Keywords: health physics, instrumentation, normal environment, portable survey, surveyCopyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEENot for ResaleNo reproduction or networking permi
8、tted without license from IHS-,-,-American National StandardAn American National Standard implies a consensus of those substantially concerned with its scope and pro-visions. An American National Standard is intended as a guide to aid the manufacturer, the consumer, andthe general public. The existe
9、nce of an American National Standard does not in any respect preclude any-one, whether he has approved the standard or not, from manufacturing, marketing, purchasing, or usingproducts, processes, or procedures not conforming to the standard. American National Standards are subjectto periodic reviews
10、 and users are cautioned to obtain the latest editions.CAUTION NOTICE: This American National Standard may be revised or withdrawn at any time. The pro-cedures of the American National Standards Institute require that action be taken to affirm, revise, or with-draw this standard no later than five y
11、ears from the date of publication. Purchasers of American NationalStandards may receive current information on all standards by calling or writing the American NationalStandards Institute.Authorization to photocopy portions of any individual standard for internal or personal use is granted by theIns
12、titute of Electrical and Electronics Engineers, Inc., provided that the appropriate fee is paid to CopyrightClearance Center. To arrange for payment of licensing fee, please contact Copyright Clearance Center, Cus-tomer Service, 222 Rosewood Drive, Danvers, MA 01923 USA; +1-978-750-8400. Permission
13、to photo-copy portions of any individual standard for educational classroom use can also be obtained through theCopyright Clearance Center.Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEENot for ResaleNo reproduction or networking permitte
14、d without license from IHS-,-,-Copyright 2004 IEEE. All rights reserved. iiiIntroduction(This introduction is not part of ANSI N42.17A-2003, Performance Specifications for Health Physics Instrumentation-Portable Instrumentation for Use in Normal Environmental Conditions.)This standard is the respons
15、ibility of the Accredited American National Standards Institute Committee onRadiation Instrumentation, N42, which delegated its development to Subcommittee N42.RPI onRadiological Protection Instrumentation. N42 was the balloting group and approved the standard on N42letter ballot of 23 December 2002
16、. ParticipantsAt the time this standard was approved, the Accredited Standards Committee on Radiation Instrumentation,N42 had the following members:Louis Costrell, ChairMichael P. Unterweger, Vice ChairSue Vogel, Administrative SecretaryOrganization Represented Name of RepresentativeAmerican Confere
17、nce of Governmental Industrial HygienistsJesse LiebermanBartlett Services.Morgan CoxBattelle Northwest Laboratories Joseph C. McDonaldBicron Joseph G. BellianChew, M.H. . Jack M. SelbyCommerce Dept, U.S. NIST . Michael P. UnterwegerLouis Costrell (Alt.)Consultant Frank X. MasseEberline Instruments .
18、 Mitchell TruittEntergy-ANO Ron SchwartzFemo-TECH Inc. Richard StraubGamma-Metrics Ernesto A. CorteGeneral Activities Inc. Karl ReinitzHealth Physics Society Joseph R. StencelInstitute of Electrical and Electronics Engineers, Inc. Louis CostrellJulian Forster (Alt.)Anthony J. Spurgin (Alt.)Michael P
19、. Unterweger (Alt.)Lawrence Berkeley National Laboratory Edward J. LampoLawrence Livermore National Laboratory . Gary JohnsonNASA, GFSC. H. Sachidananda BabuNuclear Standards Unlimited Al N. TschaecheOak Ridge National Laboratory Peter J. Chiaro, Jr.Charles L. Britton (Alt.)ORTEC Corp. . Ronald M. K
20、eyserOverhoff Technology Corp. Mario W. OverhoffSwinth Associates . Kenneth L. SwinthTennelec. Larry DarkenTennessee, University of William M. BuggThermo-electron. Richard P. OxfordTranslucent. G. Laurie MillerWisconsin Public Service Group Timothy MartinsonIndividual Members. Edward FairsteinPaul L
21、. PhelpsLee J. WagnerCopyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEENot for ResaleNo reproduction or networking permitted without license from IHS-,-,-iv Copyright 2004 IEEE. All rights reserved.At the time this standard was approved, Sub
22、committee N42.RPI had the following members:Jack M. Selby, ChairAt the time this standard was approved, the ANSI 42.17A Working Group had the following members:Peter Chiaro, Jr., ChairJoseph G. BellianPeter J. Chiaro, Jr. Morgan Cox Henry Fong Robert Ford Mark M. Hoover Joseph G. Johnson Michelle L.
23、 JohnsonR. L. KathrenMike Lantz Sergio Lopez Jimmy LittleJoseph C. McDonaldRichard P. Oxford Carl R. Siebentritt Al N. Tschaeche Ed WalkerChuan-Fu Wu Laird C. BeanDru CarsonClare GrehofskyMichelle JohnsonCyndi Jones Gary LabruyereRiasp MedoraKevin ReavesScott RogersDale SnowderCopyright The Institut
24、e of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEENot for ResaleNo reproduction or networking permitted without license from IHS-,-,-Copyright 2004 IEEE. All rights reserved. vContents1. Scope 11.1 Introduction 12. References 23. Definitions . 44. General test pr
25、ocedures 64.1 Applicability of tests 64.2 Standard test conditions. 64.3 Statistical fluctuations 65. General characteristics. 75.1 Units of readout . 75.2 Scaling factors 85.3 Ease of decontamination 85.4 Moisture protection 85.5 Alarm threshold . 85.6 Markings 95.7 Battery status indication. 95.8
26、Protection of switches 95.9 Zero set 105.10 AC power. 105.11 Battery power. 105.12 Battery power indicator . 105.13 AC-powered instruments with battery backup 116. Electronic and mechanical requirements and tests 116.1 Circuit verification. 116.2 Alarms 116.3 Response stability 126.4 Geotropism. 126
27、.5 Response time 136.6 Coefficient of variation 146.7 Line noise susceptibility 146.8 Electrostatic discharge (ESD) 157. Radiation response. 157.1 Accuracy 157.2 Probe surface sensitivity 167.3 Photon energy dependence 177.4 Beta energy dependence 187.5 Neutron energy dependence. 197.6 Photon radiat
28、ion overload 207.7 Angular dependence 20Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEENot for ResaleNo reproduction or networking permitted without license from IHS-,-,-vi Copyright 2004 IEEE. All rights reserved.8. Interfering response
29、. 218.1 Extracameral response . 218.2 Radio frequency (RF) 218.3 Conducted immunity 228.4 Magnetic fields 228.5 Interfering ionizing radiation. 239. Environmental factors 249.1 Temperature. 249.2 Temperature shock. 249.3 Humidity 259.4 Mechanical shock 269.5 Vibration 269.6 Ambient pressure . 2610.
30、Documentation. 2710.1 Operation and maintenance manual. 2710.2 Type test report 27Annex A (informative) Bibliography 28Annex B (informative) Tests performed with variation of influence quantities 29Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license wi
31、th IEEENot for ResaleNo reproduction or networking permitted without license from IHS-,-,-Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEENot for ResaleNo reproduction or networking permitted without license from IHS-,-,-American National
32、Standard for Performance Specifications for Health Physics Instrumentation-Portable Instrumentation for Use in Normal Environmental Conditions1. ScopeThis standard establishes the minimum performance criteria for health physics instrumentation for use inionizing radiation fields. Testing methods are
33、 included to establish the acceptability of each type ofinstrumentation. This standard does not specify which instruments or systems are required, nor does itconsider the number of specific applications of such instruments.1.1 IntroductionThe object of this standard is to provide basic performance r
34、equirements and verification test methods forportable instruments used in normal environmental conditions for radiation protection of personnel.As used in this standard, health physics instrumentation provides direct readout of, or readout related to,dose and dose-equivalent rate, or activity-per-un
35、it area (i.e., effective probe area). Included are portable rateand integrating devices for beta, photon, and neutron radiation and monitors for surface contamination(alpha, beta, and photon). Instruments used to measure the presence of low-energy beta emitters (i.e., lessthan 200 keV maximum energy
36、) are not addressed in this standard. Personnel dosimeters; instrumentsdesigned to be used as individual or personal monitors, or warning devices; environmental monitoringinstruments; and air monitors are outside the scope of this standard. Special purpose instrumentation, such asemergency post-acci
37、dent radiological monitors, may also fall under the scope of one or more related ANSIstandards. This standard is intended to supplement rather than replace these.In general, health physics instrumentation is considered to cover the dose and dose-equivalent rate rangesfor survey meters of 0.1 mrad/h
38、to 1000 rad/h (1 Gy/h to 10 Gy/h) and 0.1 mrem/h to 1000 rem/h (1 Sv/hto 10 Sv/h). It covers activity-per-unit-area ranges for surface contamination monitors of 50 disintegrationsper minute (dpm)/cm2to 104dpm/cm2(0.83 Bq/cm2to 167 Bq/ cm2) for beta/photon radiation and 1dpm/cm2to 104dpm/cm2(0.02 Bq/
39、cm2to 167 Bq/cm2) for alpha radiation.Copyright 2003 IEEE. All rights reserved. 1ANSIStd N42.17A-2003 AMERICAN NATIONAL STANDARD FOR PERFORMANCE SPECIFICATIONS Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEENot for ResaleNo reproduction o
40、r networking permitted without license from IHS-,-,-For specific characteristics, test requirements will vary with the use of the instrument. For example, therequirements for a laboratory instrument are not as demanding as requirements for an instrument to be usedin an uncontrolled environment. Tabl
41、e B.1 lists the characteristics in the standard and the associated clausewhere the requirements and test can be found.This standard specifies general characteristics; general test procedures; radiation characteristics; andelectrical, mechanical, safety, and environmental characteristics. Throughout
42、this standard, three verbs havebeen used to indicate the degree of rigor intended for each specific criterion. The word shall is used todenote a requirement, the word should to denote a recommendation, and the word may to denote apermissible practice.If the operational conditions for an instrument a
43、re less severe than the requirements of this standard, then theinstrument manufacturer and the purchaser may agree upon the instrument performance specifications;however, the instrument should be tested using the testing protocol of this standard.2. ReferencesThis standard shall be used in conjuncti
44、on with the following publications:ANSI Z540.2-1997, U.S. Guide to the Expression of Uncertainty in Measurement.1ICRU Report 12, Certification of Standardized Radioactive Sources, 1968.2ICRU Report 20, Radiation Protection Instrumentation and Its Application, 1971.ICRU Report 39, Determination of Do
45、se Equivalents Resulting from External Radiation Sources, 1985.ICRU Report 43, Determination of Dose Equivalents from External Radiation SourcesPart 2, 1988.ICRU Report 47, Measurement of Dose Equivalents from External Photon and Electron Radiations, 1992.ICRU Report 57, Conversion Coefficients for
46、Use in Radiological Protection Against External Radiation,1998.ICRU Report 60, Fundamental Quantities and Units for Ionizing Radiation, 1998.IEC 61187-1993, Electrical and electronic measuring equipmentDocumentation.3IEEE Std C62.41-1991, IEEE Recommended Practice for Surge Voltages in Low-Voltage A
47、C PowerCircuits.4,51ANSI publications are available from the Sales Department, American National Standards Institute, 25 West 43rd Street, 4th Floor, New York, NY 10036, USA (http:/www.ansi.org/).2ICRU publications are available from the National Council on Radiation Protection and Measurements, 791
48、0 Woodmont Avenue, Suite 800, Bethesda, MD 20814, USA.3IEC publications are available from the Sales Department of the International Electrotechnical Commission, Case Postale 131, 3, rue de Varemb, CH-1211, Genve 20, Switzerland/Suisse (http:/www.iec.ch/). IEC publications are also available in the
49、United States from the Sales Department, American National Standards Institute, 11 West 42nd Street, 13th Floor, New York, NY 10036, USA.4The IEEE standards or products referred to in Clause 2 are trademarks owned by the Institute of Electrical and Electronics Engineers, Incorporated. 5IEEE publications are available from the Institute of Electrical and Electronics Engineers, 445 Hoes La
copyright@ 2008-2019 麦多课文库(www.mydoc123.com)网站版权所有
备案/许可证编号:苏ICP备17064731号-1