ANSI NEMA C136.2-2015 Roadway and Area Lighting Equipment Dielectric Withstand and Electrical Transient Immunity Requirements.pdf

1、NEMA Standards PublicationNational Electrical Manufacturers AssociationANSI C136.2-2015Roadway and Area Lighting Equipment Dielectric Withstand and Electrical Transient Immunity RequirementsANSI C136.2-2015 American National Standard for Roadway and Area Lighting Equipment Dielectric Withstand and E

2、lectrical Transient Immunity Requirements Secretariat: National Electrical Manufacturers Association Approved November 3, 2015 American National Standards Institute, Inc. ANSI C136.2-2015 Page ii 2015 National Electrical Manufacturers Association NOTICE AND DISCLAIMER The information in this publica

3、tion was considered technically sound by the consensus of persons engaged in the development and approval of the document at the time it was developed. Consensus does not necessarily mean that there is unanimous agreement among every person participating in the development of this document. American

4、 National Standards Institute (ANSI) standards and guideline publications, of which the document contained herein is one, are developed through a voluntary consensus standards development process. This process brings together volunteers and/or seeks out the views of persons who have an interest in t

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13、 process, consensus, and other criteria for approval have been met by the standards developer. Consensus is established when, in the judgment of the ANSI Board of Standards Review, substantial agreement has been reached by directly and materially affected interests. Substantial agreement means signi

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18、merican National Standards may receive current information on all standards by calling or writing the American National Standards Institute. Published by National Electrical Manufacturers Association 1300 North 17th Street, Suite 900 Rosslyn, VA 22209 www.nema.org 2015 National Electrical Manufactur

19、ers Association All rights reserved including translation into other languages, reserved under the Universal Copyright Convention, the Berne Convention for the Protection of Literary and Artistic Works, and the International and Pan American Copyright Conventions. No part of this publication may be

20、reproduced in any form, in an electronic retrieval system or otherwise, and without the prior written permission of the publisher. Printed in the United States of America. ANSI C136.2-2015 Page iv 2015 National Electrical Manufacturers Association This page intentionally left blank. ANSI C136.2-2015

21、 Page v 2015 National Electrical Manufacturers Association CONTENTS Page Foreword . Error! Bookmark not defined. 1 General . 1 1.1 Scope 1 1.2 Limitations . 1 1.3 Compliance Reporting . 1 2 Normative References 2 3 Informative References 2 4 Insulation Requirements . 3 4.1 General 3 4.2 Voltage Rati

22、ng . 3 5 General Testing Requirements 3 5.1 Test Samples 3 5.1.1 Optional Modular Devices . 3 5.1.2 Control Device Receptacles 3 5.2 Test Setup . 3 5.2.1 General 4 5.2.2 Temperature Measurements . 4 6 Dielectric Withstand Test 4 6.1 General Requirements 4 6.1.1 Test Potential Generator . 4 6.1.2 Ele

23、ctrical Connections . 4 6.1.3 Electrical Disconnections 4 6.2 Test Procedure 5 6.3 Pass/Fail Criteria . 5 7 Electrical Transient Immunity Tests . 5 7.1 General Requirements 5 7.1.1 Input Voltage . 5 7.1.2 Dut Power Supply 6 7.1.3 Stabilization and Thermal Equilibrium . 6 7.1.4 Pre-Test DUT Character

24、ization . 7 7.1.5 Test Potential Generators . 7 7.1.6 Test Waveform Injection . 7 7.1.7 Order of Testing 7 7.1.8 Shorting Cap Failure During Testing . 7 7.1.9 Post-Test DUT Characterization . 8 7.1.10 Pass/Fail Criteria . 8 7.2 Ring Wave Test Procedure . 8 7.3 Combination Wave Test Procedure 9 7.4 E

25、lectrical Fast Transient Test Procedure 10 TABLES Page Table 1 Recommended electrical transient immunity levels for common outdoor lighting applications . 2 Table 2 Dielectric withstand test specification 5 Table 3 0.5 S100kHz Ring wave test specification . 9 Table 4 1.250 S820 S Combination wave te

26、st specification . 9 Table 5 Electrical fast transient (EFT) test specification . 10 ANSI C136.2-2015 Page vi 2015 National Electrical Manufacturers Association Foreword At the time this standard was approved the ANSI C136 committee was composed of the following members: Alabama Power Company Americ

27、an Electric Lighting Caltrans Ceravision City of Kansas City, Missouri Cree, Inc. Duke Energy Duke Energy Florida Eatons Cooper Lighting Edison Electric Institute Electric Power Research Institute (EPRI) EYE Lighting International of N.A., Inc. Florida Power fax 303-397-2740; e-mail: ; website: . 3

28、INFORMATIVE REFERENCES This standard is intended to be used in conjunction with the following publications. The latest edition of the publication applies (including amendments). ANSI C136.2-2015 Page 3 2015 National Electrical Manufacturers Association UL 1449 3rdEdition, Surge Protective Devices UL

29、 1598 3rdEdition, Luminaires 4 INSULATION REQUIREMENTS 4.1 GENERAL Insulation requirements apply to the electrical insulation between ungrounded, current-carrying members and non-current-carrying members that may be grounded by design or accident. 4.2 INSULATION VOLTAGE RATING The electrical insulat

30、ion of primary circuit current-carrying members of luminaires or control devices shall be rated for 600 RMS volt 60-Hz AC operation. Luminaires or control devices designed with this class of insulation are intended for use on primary circuits operated under 600 RMS volts. 5 GENERAL TESTING REQUIREME

31、NTS 5.1 TEST SAMPLES The required tests are design tests, not production tests. They shall be made on at least one sample of each DUT design or design family. Many factors can impact the dielectric withstand and electrical transient immunity performance of luminaires and control devices. DUT manufac

32、turers that intend to characterize the performance a family of products with the DUT should take care in determining the worst-case family member. 5.1.1 Optional Modular Devices DUTs designed to allow for the connection of optional modular devices may be tested with or without compatible devices. Ex

33、amples of optional modular devices include (but are not limited to) internal (to a luminaire) in-line fuses, surge protection devices (SPDs), or control devices, as well as external (to a luminaire) shorting caps and control devices. The connection of any optional modular devices shall be documented

34、 in the test report. DUTs shall always include any modular devices required for basic operation. For example, luminaires that require the use of a ballast or driver for basic operation shall not be tested without a ballast or driver. 5.1.2 Control Device Receptacles Luminaires designed with receptac

35、les that allow for the connection of a control device typically require the insertion of some device in the receptacle in order to achieve normal, powered operation. Examples of compatible control devices for such luminaires include photocontrols and shorting caps,3both of which may or may not have

36、integral electrical transient immunity protection. Such luminaires shall be tested, at a minimum, with a shorting cap that does not have integral electrical transient immunity protection. Additional testing with other configurations may be optionally performed. Test results and configurations shall

37、be documented in the test report. 5.2 TEST SETUP 3. A shorting cap is a device that provides an electrical connection between line and load when a locking-type photocontrol is not used. ANSI C136.2-2015 Page 4 2015 National Electrical Manufacturers Association 5.2.1 General All tests shall be perfor

38、med on a powered DUT that is completely assembled and wired in the conventional manner, unless otherwise noted. Any switches or other electrical controls that must be configured to achieve nominal operation shall be in the conducting, or “on,” position. Non-current-carrying parts or decorative parts

39、 not likely to become energized shall not be required to be in place. Luminaires that use lamps, light engines, or other modular light sources shall be evaluated with a lamp, light engine, or modular light source installed. For luminaires designed to work with a common or widely available class of l

40、ight sources (e.g., 100W high-pressure sodium (HPS) lamps), a representative sample can be installed, in accordance with manufacturer recommendations. The installed lamp, light engine, or modular light source catalog number shall be documented in the test report. 5.2.2 Temperature Measurements The a

41、mbient temperature in which measurements are being taken shall be maintained at 77 5.4 degrees Fahrenheit (25 3 degrees Celsius), measured at a point not more than one meter from the luminaire and at the same height as the DUT. The temperature sensor shall be shielded from direct optical radiation f

42、rom the DUT and optical radiation from any other source. 6 DIELECTRIC WITHSTAND TEST 6.1 GENERAL REQUIREMENTS 6.1.1 Test Potential Generator The dielectric withstand test potential shall be applied to the DUT using a test potential generator (commonly referred to as a hipot tester) with a two-wire (

43、high voltage, return) output configuration. The dielectric withstand test shall be performed by applying a 60-Hz AC test potential or a DC test potential to the DUT. The selection of which test potential type to apply should be dictated by the DUT construction and documented in the test report. Magn

44、etically ballasted or un-ballasted DUTs should, unless noted otherwise, be tested using the 60-Hz AC configuration, while electronically ballasted or driven DUTs should, unless noted otherwise, be tested using the DC configuration. The hipot tester shall be capable of providing 60-Hz AC test potenti

45、als at varying RMS voltage set points and DC test potentials at varying voltage set points. The hipot tester shall have a minimum capacity of 10 times the volt-amperes draw of the DUT (e.g., 1000 VA for a DUT that draws 100 VA) and shall regulate its output voltage to within 3% of the established se

46、t point. The 60-Hz AC output configuration shall produce a sinusoidal voltage waveshape such that the RMS summation of the harmonic components does not exceed 3% of the fundamental during operation of the luminaire. 6.1.2 Electrical Connections The dielectric withstand test shall be performed by app

47、lying a test potential between all DUT current-carrying terminals (electrically tied together) and accessible non-current-carrying metal parts, including the electrically conductive DUT frame or enclosure. DUTs with non-conductive frames or enclosures (e.g., shorting caps or photocontrols with polym

48、eric enclosures) shall be tested with all exterior surfaces that are accessible when installed wrapped in a metal foil; in such cases the test voltage shall be applied between the current-carrying terminals and the metal foil. 6.1.3 Electrical Disconnections Solid-state components that are not relie

49、d upon to reduce the risk of electric shock and that can be damaged by the applied test potential may be disconnected prior to testing. Circuits containing such components may be re-wired for the purpose of the dielectric withstand test in order to reduce the likelihood of component damage while retaining the representative dielectric stress on the circuit. ANSI C136.2-2015 Page 5 2015 National Electrical Manufacturers Association Examples of components that may conduct current when the test potential is applied and may the