ANSI TIA EIA 455-2C-1998 Impact Test Measurements for Fiber Optic Devices《光纤设备的抗冲击试验测量》.pdf

1、o eV I l l P I U w .I G c STDeEIA TIA-455-2C-ENGL 1918 W 3234LOO ObL3b77 7L ANSIITIA/EIA-455-2 C-1998 Approv8d: Jn8 9, 998 TIAIEIA STANDARD FOTP-2 Impact Test Measurements for Fiber Optic Devices (Revision of EIA/TIA-455-2B) JULY 1998 TELECOMMUNICATIONS INDUSTRY ASSOCIATION Electronic Industria Alll

2、unce Copyright Electronic Industries Alliance Provided by IHS under license with EIANot for ResaleNo reproduction or networking permitted without license from IHS-,-,-NOTICE TIA/EIA Engineering Standards and Publications are designed to serve the public interest through eliminating misunderstandings

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5、 internationally. Standards and Publications are adopted by WEIA in accordance with the American National Standards Institute (ANSI) patent policy. By such action, TIA/ELA does not assume any liability to any patent owner, nor does it assume any obligation whatever to parties adopting the Standard o

6、r Publication. This Standard does not purport to address ail safety problems associated with its use or aii applicable regulatory requirements. It is the responsibility of the user of this Standard to establish appropriate safety and health practices and to determine the applicability of regulatory

7、limitations before its use. (From Standards Proposai Nos. 3810 and 3810-1, formulated under the cognizance of the “iA FO-6.3 Subcommittee on Fiber Optic Interconnecting Devices). Published by IELECOMMUNICATIONS INDUSTRY ASSOCIATION 1998 Standards and Technology Department 2500 Wilson Boulevard Arlin

8、gton, VA 22201 PRICE: Please refer to current Catalog of EU, JEDEC, and TIA STANDARDS and ENGINEERING PUBLICATIONS or call Global Engineering Documents, USA and Canada (1-800-8547179) International (303-397-7956) AU rights reserved printed in U.S.A. Copyright Electronic Industries Alliance Provided

9、by IHS under license with EIANot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STD*EIA TIA-455-2C-ENGL 1798 W 3234b00 ObL3b77 554 H TINE IA-455-2C FOTP-2 Impact test measurements for fi ber optic devices Contents Foreword 1 Introduction 2 Normative references 3 Appar

10、atus 4 Sampling and specimens 5 Procedu res 6 7 Documentation 8 Specification information . 9 Informative References . Annex A - Comparison between this FOTP and IEC or ITU-T requirements Table I . Calculations or interpretation of results Table 2 . Figure I Figure 2 Figure 3 . 111 1 1 2 6 6 9 11 12

11、 12 13 8 8 3 4 5 i Copyright Electronic Industries Alliance Provided by IHS under license with EIANot for ResaleNo reproduction or networking permitted without license from IHS-,-,- STD-EIA TIA-455-2C-ENGL 1998 I3234b00 OL13bO 27b I TINE IA-455-2C FOTP-2 Impact test measurements for fiber optic devi

12、ces Foreword (This Foreword is informative only and is not part of this Standard.) This document comes from TIA Standards Proposal No. 3345, formulated under the cognizance of TIA-6, Committee on Fiber Optics and FO-6.3, Subcommittee on Fiber Optic interconnecting Devices. .- - This Specification fo

13、rms a part of the series of test procedures included within Recommended Standard EIAL7A-455. NOTE - This FOTP was previously published in EIA/TIA-455-2B as FOTP-2. There are two annexes, which are informative. Key words: impact, fiber optic devices, drop test, shock. iii Previous page is blank Copyr

14、ight Electronic Industries Alliance Provided by IHS under license with EIANot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STD-EIA TIA-455-2C-ENGL 1998 R 3234bUO bL3b8L LO2 9 - TINEIA-455-2C 1 Introduction 1.1 Intent The intent of this test is to determine the abili

15、ty of a fiber optic component or assembly (device) to withstand impacts of the type that might be encountered in normal service. This test is normally intended to be performed only on devices designed to meet impact requirements. 1.2 Failure modes c- Typical indications of damage to a fiber optic de

16、vice resulting from this test include, but are not limited to: - inability to mate or unmate, - broken parts or accessories, - power transmission change, - damage to seals. 2 Normative references Test or inspection requirements may include, but are not limited to, the following references: ASTM A 65

17、9-85, Standard specification for steel, carbon (0.76 maximum to 0.25 maximum percent), hot-rolled sheet and strip, commercial quality. E IA/TIA-455-A, Standard fesf procedures for fiber optic fibers, cables, transducers, sensors, connecting and terminating devices, and other fiber optic components.

18、FOTP-13 (EIA/TiA-455-13A), Visual and mechanical inspection of fiber, cable, connectors, and/or other fiber optic devices. FOTP-20 (EIA/TIA-455-20A), Measurement of change in optical transmittance. 1 Copyright Electronic Industries Alliance Provided by IHS under license with EIANot for ResaleNo repr

19、oduction or networking permitted without license from IHS-,-,-TINE I A-4 55-2 C FOTP-61 (EIAlTIA-455-61 A), OTDR measurement of fiber or cable attenuation. IEC-I 300-2-1 2, I st Edition, 1995, Fibre optic interconnecting devices and passive components - basic test and measurement procedures - impact

20、 test. 3 Apparatus 3.1 Mechanical test apparatus The test apparatus shall be one of the following: NOTE - The original Method A is no longer considered a desirable test method and is not included in this FOTP. The test method does not represent the type of impact that a fiber optic device would expe

21、rience in normal service. Detail Specifications should be revised to use alternative methods. The Method A described in the current FOTP is a new test method. - “)In process of revision. Pending publication of this revision, use EIAlTIA-455-61. 2 Copyright Electronic Industries Alliance Provided by

22、IHS under license with EIANot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STD-EIA TIA-455-2C-ENGL B978 I 323YbE0 0513b3 T85 W TINEIA-455-2C 3.1.1 Method A Use a test fixture similar to that shown in Figure 1. The fixture shall consist of a clamp for securing cable

23、pigtails and a steel block with a 13 mm (0.5 in) minimum thickness. Clamp the cable pigtail so that, with the device hanging under its own weight, the end of the device extends to the center of the steel block. /- CLAMP DEVICE UNDER TEST i- I Figure I. impact test apparatus for Method A. 3 Copyright

24、 Electronic Industries Alliance Provided by IHS under license with EIANot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STD-EIA TIA-455-2C-EMGL 1778 II 3234b00 DbB3b84 911 TINEIA-455-2C 0.60 m I 3.1.2 Method B 1 I / I I J I / / / / Use a test fixture similar to that

25、shown in Figure 2, suitably designed to securely hold the cable at one end. Mount the fixture to a wall or other rigid structure at a height of 600 mm (24 in) above the impact surface. The impact surface shall be a concrete slab at least 100 mm (4 in) thick. Figure 2. Impact test apparatus for Metho

26、d B. 3.1.3 Method C Use a test fixture similar to that shown in Figure 3. Unless otherwise specified, the weight of the drop impact carriage shall be 0.45 kg (1 Ib). The carriage shall freely slide on the guide shafts. When properly secured, the sample under test shall not be damaged by the connecto

27、r clamp fixture. The impact pad shall be a 3 mm (0.125 in) thick mild steel (Grade Designation 1020 per ASTM A 659) plate fastened to the base of the impact carriage. - 4 Copyright Electronic Industries Alliance Provided by IHS under license with EIANot for ResaleNo reproduction or networking permit

28、ted without license from IHS-,-,-STD-EIA TIA-q55-2C-ENGL 1998 M 3234bU0 UbL3b85.858 9 TINEIA-455-2C C -1.5 m- I I - I -0.30m -1 HEIGHT ADJUSTABLE CARRIAGE RELEASE IGUIDE SHAFT I IMPACTPAD 1 FOR FIBER OPTIC DEVICE 7 I 11.55 m I 1, I - -.0.46 m -1 Figure 3. Impact test apparatus for Method C. 5 Copyri

29、ght Electronic Industries Alliance Provided by IHS under license with EIANot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STD-EIA TIA-455-2C-ENGL 1998 E 323Lib00 ObL368b 794 m TINE IA4 55-2 C 3.2 Optical test apparatus - Use optical test equipment as specified in FO

30、TP-20, or equipment listed in other test method(s) as specified in the Detail Specification. 4 Sampling and specimens A test sample shall consist of the component or device specified and shall be terminated to a cable as intended for normal service, complete with accessories. Dust caps shall be atta

31、ched to the fiber optic device before the test, unless otherwise specified in the Detail Specification. 4.1 MethodA Unless otherwise specified, the length of the cable shall be 1.5 m (4.9 fi). 4.2 Method B Unless otherwise specified, the length of the cable shall be 2 m (7 ft). - 4.3 Method C Unless

32、 otherwise specified, the length of the cable shall be 2 m (7 ft). 5 Procedures 5.1 Preconditioning Unless otherwise specified in the Detail Specification, precondition the test specimens for a minimum period of 24 hours under the standard atmospheric condition of ElMIA- 455. 6 Copyright Electronic

33、Industries Alliance Provided by IHS under license with EIANot for ResaleNo reproduction or networking permitted without license from IHS-,-,-TINEIA-455-2C 5.2 Inspection Inspect the component or device before undergoing the test in accordance with the requirements of FOTP-13. 5.3 Transmittance measu

34、rements Measure and record the optical transmittance before the test using the methods of FOTP-20, or using alternative methods as specified by the Detail Specification. Any optical surfaces that typically are cleaned before use (e.g., connector endfaces) shall be cleaned before the transmittance me

35、asurement is performed. 5.4 Impact test procedures using different methods . - Perform the test as required by one of the following methods. 5.4.1 Method A Clamp the cable pigtail so that, with the device hanging under its own weight, the end of the device extends to the center of the steel block. T

36、hen raise the device to the height of the clamp, and with the cable extended, release so as to strike the block. Drop the device eight times. The device should not be allowed to bounce, but restrained to only one impact. If specified in the Detail Specification, rotate the test specimen 45 degrees b

37、etween successive drops. 5.4.2 Method B Securely fasten the cable attached to the sample component or device to the wall- mounted fixture such that the cable assembly can be fully extended. - Unless otherwise specified in the Detail Specification: 5.4.2.1 Drop the cable assembly repeatedly, observin

38、g the height sequence (highest drop first) and the number of drops as specified in Table 1 for the designated service class. 5.4.2.2 Extend the cable assembly to its full length from the test fixture to a drop height specified in Table I. Allow the cable and the attached component or device to freel

39、y fall and strike the impact pad as shown in Figure I. The device should not be allowed to bounce, but restrained to only one impact. If specified in the Detail Specification, rotate the test specimen 45 degrees between successive drops. 7 Copyright Electronic Industries Alliance Provided by IHS und

40、er license with EIANot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STD-EIA TIA-LI55-2C-ENGL 1998 D 3234b00 Ob23b88 5b7 II Drop Height i 6 mm (i 0.25 in.) Number of drops by service class Light Moderate Severe 2.4 m (8 ft) - 8 8 1.8 m (6 ft) 8 - 8 1.2 m (4 ft) - 8 8

41、 0.6 m (2 ft) - - 8 - - 0.1 m (4 in) 8 Total Drops 8 16 40 TINE IA-455-2C 1 Table I - Drop height and number of drops for Method B Drop Height i 6 mm (i 0.25 in.) 0.9 m (3 ft) 0.6 m (2 ft) 0.3 m (1 ft) Number of drops by service class Light Moderate Severe - - 8 8 - 8 - - - 5.4.3 Method C Unless oth

42、erwise specified in the Detail Specification, securely fasten the sample component or device, with the cable attached, in the test fixture clamp such that the cable is horizontal with respect to the impact carriage. Unless otherwise specified in the Detail Specification: 5.4.2.1 Allow the impact car

43、riage to freely fall on to the component or device under test for the number of drops specified in Table 2. The device should not be allowed to bounce, but restrained to only one impact. 5.4.2.2 The drop height and number of drops shall be in accordance with the service class as specified in Table 2

44、. Table 2 - Drop height and number of drops for Method C ,I 1 - Total Drops 8 8 8 Copyright Electronic Industries Alliance Provided by IHS under license with EIANot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STD-EIA TIA-455-2C-ENGL 1918 E 3234bOO Ob13b89 4T3 TINEI

45、A-455-2C 5.5 Post4 m pact inspect i on At the conclusion of the impact test, repeat the inspection procedure in 5.2, checking for physical and cosmetic changes. 5.6 Transmittance change -. When transmittance change measurements for a device are required by the Detail Specification, repeat the proced

46、ure in 5.3 upon completion of the impact test and post- test inspection. The transmittance change measurement is required for U.S. Military applications. 6 Calculations or interpretations of results 6.1 Comparisons among different test methods The purpose of the impact test methods is to apply a vel

47、ocity shock, consisting of a sudden change in velocity, to the device under test. The tests are designed to change velocity in a time that is short compared with the natural periods of vibration of the device under test. Two primary forms of this test exist: dropping the device under test onto a har

48、d, solid surface (Methods A & B), or dropping an impact carriage onto the device under test (Method C). To accomplish this, the impact surfaces shall have large enough mass, and be solid enough to absorb the impact energy with negligible deflection. -. As described in 6.1.1 and 6.1.2, the choice of

49、method may depend on the intended purpose of the test. We can define the impact as: Impact = E/At, (1) where E is the energy imparted to the device under test, and At is the time over which the energy is imparted to the device. Using conservation of energy, E can be expressed in terms of either the initial potential energy stored in the syste