ANSI TIA-455-177-B-2003 FOTP-177 IEC-60793-1-43 Optical Fibres C Part 1-43 Measurement Methods and Test Procedures C Numerical Aperture (REPLACES TIA EIA-455-7 AND TIA EIA-455-47)《.pdf

1、 TIA STANDARD FOTP-177 IEC-60793-1-43 Optical Fibres Part 1-43: Measurement Methods and Test Procedures Numerical Aperture TIA-455-177-B (Revision of TIA-455-177-A) THIS DOCUMENT REPLACES TIA/EIA-455-7 AND TIA/EIA-455-47 AUGUST 2003 TELECOMMUNICATIONS INDUSTRY ASSOCIATION Representing the telecommun

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23、ts 15 Inverness Way East Englewood, CO 80112-5704 U.S.A. or call U.S.A. and Canada 1-800-854-7179, International (303) 397-7956 TIA FOREWORD This document, which is an adoption of IEC 60793-1-43, replaces the existing TIA-455-177-A, FOTP-177 Numerical Aperture Measurement of Graded-Index Optical Fib

24、ers, with the new title: FOTP-177: Measurement Methods and Test Procedures Numerical Aperture. This action was taken under the cognizance of FO-4.6. The adoption of this document is intended to replace the following documents: FOTP-7: Numerical Aperture of Step-Index Multimode Optical Fibers by Outp

25、ut Far-Field Radiation Pattern Measurement FOTP-47: Output Far-Field Radiation Pattern Measurement Note: Theoretical numerical aperture, which is obtained from refractive index profile measurements, is considered as a glass geometry attribute. 60793-1-43 IEC:2001 adopted as TIA-455-177-B iCONTENTS 1

26、 Scope 1 2 Normative references .1 3 Overview of method1 4 Reference test method .2 5 Apparatus 2 6 Sampling and specimens7 7 Procedure 7 8 Calculations .7 9 Results.8 10 Specification information 8 Figure 1 Technique 1 Angular scan .4 Figure 2 Technique 2 Angular scan .5 Figure 3 Technique 3 Scan o

27、f the spatial field pattern .5 60793-1-43 IEC:2001 adopted as TIA-455-177-B ii60793-1-43 IEC:2001 adopted as TIA-455-177-B iiiINTERNATIONAL ELECTROTECHNICAL COMMISSION _ OPTICAL FIBRES Part 1-43: Measurement methods and test procedures Numerical aperture FOREWORD 1) The IEC (International Electrotec

28、hnical Commission) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of the IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To thi

29、s end and in addition to other activities, the IEC publishes International Standards. Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental org

30、anizations liaising with the IEC also participate in this preparation. The IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of the IEC on t

31、echnical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested National Committees. 3) The documents produced have the form of recommendations for international use and are publishe

32、d in the form of standards, technical specifications, technical reports or guides and they are accepted by the National Committees in that sense. 4) In order to promote international unification, IEC National Committees undertake to apply IEC International Standards transparently to the maximum exte

33、nt possible in their national and regional standards. Any divergence between the IEC Standard and the corresponding national or regional standard shall be clearly indicated in the latter. 5) The IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any equ

34、ipment declared to be in conformity with one of its standards. 6) Attention is drawn to the possibility that some of the elements of this International Standard may be the subject of patent rights. The IEC shall not be held responsible for identifying any or all such patent rights. International Sta

35、ndard IEC 60793-1-43 has been prepared by subcommittee 86A: Fibres and cables, of IEC technical committee 86: Fibre optics. This standard, together with the other standards in the IEC 60793-1-4X series, replaces the second edition of IEC 60793-1-4, of which it constitutes a technical revision. The t

36、ext of this standard is based on the following documents: FDIS Report on voting 86A/672/FDIS 86A/696/RVD Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IE

37、C Directives, Part 3. IEC 60793-1-1 and IEC 60793-1-2 cover generic specifications. 60793-1-43 IEC:2001 adopted as TIA-455-177-B ivIEC 60793-1-4X consists of the following parts, under the general title: Optical fibres: Part 1-40: Measurement methods and test procedures Attenuation Part 1-41: Measur

38、ement methods and test procedures Bandwidth Part 1-42: Measurement methods and test procedures Chromatic dispersion Part 1-43: Measurement methods and test procedures Numerical aperture Part 1-44: Measurement methods and test procedures Cut-off wavelength Part 1-45: Measurement methods and test proc

39、edures Mode field diameter Part 1-46: Measurement methods and test procedures Monitoring of changes in optical transmittance Part 1-47: Measurement methods and test procedures Macrobending loss Part 1-48: Measurement methods and test procedures Under consideration Part 1-49: Measurement methods and

40、test procedures Under consideration The committee has decided that the contents of this publication will remain unchanged until 2003. At this date, the publication will be reconfirmed; withdrawn; replaced by a revised edition, or amended. 60793-1-43 IEC:2001 adopted as TIA-455-177-B vINTRODUCTION Pu

41、blications in the IEC 60793-1 series concern measurement methods and test procedures as they apply to optical fibres. Within the same series several different areas are grouped, as follows: parts 1-10 to 1-19: General parts 1-20 to 1-29: Measurement methods and test procedures for dimensions parts 1

42、-30 to 1-39: Measurement methods and test procedures for mechanical characteristics parts 1-40 to 1-49: Measurement methods and test procedures for transmission and optical characteristics parts 1-50 to 1-59: Measurement methods and test procedures for environmental characteristics. 60793-1-43 IEC:2

43、001 adopted as TIA-455-177-B vi60793-1-43 IEC:2001 adopted as TIA-455-177-B 1OPTICAL FIBRES Part 1-43: Measurement methods and test procedures Numerical aperture 1 Scope This part of IEC 60793 establishes uniform requirements for measuring the numerical aperture of optical fibre, thereby assisting i

44、n the inspection of fibres and cables for commercial purposes. The numerical aperture (NA) of category A1 graded-index multimode fibre is an important parameter that describes a fibres light-gathering ability. It is used to predict launching efficiency, joint loss at splices, and micro/macrobending

45、performance. 2 Normative references None. 3 Overview of method This test procedure describes a method for measuring the angular radiant intensity (far-field) distribution from an optical fibre. The numerical aperture of a category A1 graded-index multimode optical fibre can be calculated from the re

46、sults of this measurement using equation (11) for NA in the far field, NAff,as described in 8.1. The maximum theoretical NA of a graded index multimode fibre is defined as follows: NAth= sin g84m(1) where NAth is the maximum theoretical numerical aperture; g84mis the largest incident meridional ray

47、angle that will be guided by the fibre. In terms of the fibre index profile: NAth=2221nn g16(2)where n1is the maximum refractive index of the core, and n2is the refractive index of the cladding or NAth= n1g392 (3) 60793-1-43 IEC:2001 adopted as TIA-455-177-B 2where 121nnn g16g32g39 for g39 2 f tan g

48、41 (6) where D12is the diameter of the relay lens, in mm; f is the focal length of the transform lens, in mm; sin g41 is the numerical aperture, NA. Figure 1 Technique 1 Angular scan IEC 676/01 60793-1-43 IEC:2001 adopted as TIA-455-177-B 5Figure 2 Technique 2 Angular scan Figure 3 Technique 3 Scan

49、of the spatial field pattern 5.2.3.3 Scanning system Provide a method of scanning the far-field pattern with respect to the pinhole aperture and detector. 5.2.3.4 System calibration Perform a calibration to measure the conversion factor that relates the distance of movement of the scanning system to the actual distance scanned in