ARMY MIL-B-48761 (4)-1985 BATTERY SINGLE CELL PRIMARY RESERVE《初级储备的电池组及单电池》.pdf

1、MIL-B-48761 (AR) AMENDMENT 4 30 October 1985 SUPERSEDING AMENDMENT 3 24 November 1981 MILITARY SPECIFICATION BATTERY,SINGLE CELL,PRIMARY RESERVE This Amendment forms a part of Military Specification MIL-B-48761(ARj, dated 17 March 1978, and is approved for use by the U.S. Army Armament, Munitions an

2、d Chemical Command, and is available for use by all Departments and Agencies of the Department of Defense. PAGE 2 Inspection Equipment Drawings-Delete “8841278 - Firing Pin“ and substitute “9275628 - Firing Pin“. PAGE 9 4.4.2.2, Terminal Plate Assy, Machined 9275568: Delete: Minor Defect 203 in its

3、entirety. Add : AOL Reqmt Para Insp Method - “Minor Exam or Test Gage 203. Height of terminal 0.65% 3.2 pin above inside shoulder,improper 205. Height of terminal 0.65% 3*2 Gage pin above outside shoulder,improper PAGE 10 . 4.4.2.3, Pin, Terminal 9275569: Delete: Minor Defect 201 in its entirety. FS

4、C 1345 DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited. 1 of 3 ,-, t Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-B-48761(AR) AMENDMENT 4 . PAGE 11 4.4.2.4, Plate, Terminal, 9275570: Change Next Higher Assembly

5、 from “9275603“ to “9275568“. Add : “Minor Exam or Test - AQL Reqmt Para Insp Method 204 Taper not present 1.0% 3.2 Visual“ PAGE 12 4.4.2.5 Cell Assembly, 9275571, Major Defect LO1 is revised as follows: Change Major Defect 101 from “Anode lead not positioned. . . . . n to “Screen lead not positione

6、d n PAGE 14 4.4.2.7, Screen Assembly, Anode 9275574. assembly; from “9275576“ to “9275572“ . Chanqe next higher Add : “Major Exam or Test Method AQL Reqmt Para 104 Length of lead 0.40% 3.2 from screen, improper 0.40% 3.2 105 Lencjth of lead overlap on screen,improper Insp Gage 6age“ Delete Minor Def

7、ects 201, 203, 204, and 205 in their entirety. Delete Notes 1, 2. and 3. PAGE 15 4.4.2.8, Lead, 9275575. Under Minor Defects, delete “None defined“ , add: “Minor -.-U Exam or Test - AQL Reqmt Para Insp Method 301 Lead thickness 0.65% 3.2 improper 202 Lead width 0.65% 3.2 improper Gage Gage“ 2 of 3 P

8、rovided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-* . MIL-B-487bL (4) 13 3933906 0324238 3 MIL-13-48761 (AR) AMENDMENT 4 4.4.2.19, Plate Assembly, Terminal, 9275603: Delete paragraph in its entirety. PAGE 34 4.4.6.2.1 - Delete “(Dwg. 8841278)“ and subst

9、tte“(Dwg.9275628). PAGE 35 / * 4.4.6.5.1 Gross Leak. Add to paragraph f( OP alternatively, each cell shall be subjected to the gross leak test using the fine leak test equipment of paragraph 4.4.605.2, provided the equipment has the caability of gross leak detection. Any cell failing to meet the lea

10、k rate of MIL-STD-202S3, Method 112B, Condition Bo shall be rejected. PAGE 38 Add “-A204“ after project number. NOTE: The margins of this amendment are marked with an asterisk vertical lines to indicate where changes (additions, modifications, corrections, deletions) from the previous amendment were

11、 made. This was done as a covenience only and the Government assumes no liability whatsoever for any inaccuracies in these notations. Bidders and contractors are cautioned to evaluate the requirements of this document based on the entire content irrespective of the marginal notations and relationship to the previous amendment. Custodian: Army - AR Preparing activity: Army - AR (Project 1345-A347 1 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-